The world of embedded electronic systems is increasingly part of everyone's daily life. Therefore, the production of chip and embedded systems is becoming more complex and massive in recent years. This aspect is also responsible for the continuous and rapid growth of abnormal system behaviors. This paper aims to propose an automated setup that connects Functional Testing and Scan Technique, exploiting the versatility of the functional environment and the Design-for-Testability to reduce the time needed for the evaluation of device SEUs effects. Preliminary experimental results show it is possible to inject a single SEU in milliseconds while keeping high accuracy.

A novel SEU injection setup for Automotive SoC / Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; Tancorre, V.; Ugioli, R.. - (2022), pp. 623-626. ((Intervento presentato al convegno 2022 IEEE International Symposium on Industrial Electronics tenutosi a Anchorage, AK (USA) nel 01-03 June 2022 [10.1109/ISIE51582.2022.9831533].

A novel SEU injection setup for Automotive SoC

G. Iaria;T. Foscale;P. Bernardi;L. Presicce;M. Sonza Reorda;
2022

Abstract

The world of embedded electronic systems is increasingly part of everyone's daily life. Therefore, the production of chip and embedded systems is becoming more complex and massive in recent years. This aspect is also responsible for the continuous and rapid growth of abnormal system behaviors. This paper aims to propose an automated setup that connects Functional Testing and Scan Technique, exploiting the versatility of the functional environment and the Design-for-Testability to reduce the time needed for the evaluation of device SEUs effects. Preliminary experimental results show it is possible to inject a single SEU in milliseconds while keeping high accuracy.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11583/2962491