Archivio Istituzionale della RicercaIARIA, GIUSY
IARIA, GIUSY
Dipartimento di Automatica e Informatica
047390
Enhancing Logic Diagnosis of field returns through Logic BIST in Automotive SoCs
2025 Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
Exploiting weak detections for optimizing pattern generation in Defect-Oriented Cell-Aware ATPG
2025 Ciullo, Alessandro; Eggersglüß, Stephan; Tille, Daniel; Glowatz, Andreas; Iaria, Giusy; Bernardi, Paolo
About the correlation between logical identified faulty gates and their layout characteristics
2023 Bernardi, Paolo; Cardone, Lorenzo; Iaria, Giusy; Appello, Davide; Garozzo, Giuseppe; Tancorre, Vincenzo
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip
2022 Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, Appello; Giuseppe, Garozzo; Vincenzo, Tancorre
A novel SEU injection setup for Automotive SoC
2022 Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; Tancorre, V.; Ugioli, R.
In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip
2022 Filipponi, G.; Iaria, G.; Sonza Reorda, M.; Appello, D.; Garozzo, G.; Tancorre, V.
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip
2022 Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Enhancing Logic Diagnosis of field returns through Logic BIST in Automotive SoCs / Bernardi, P., Filipponi, G., Iaria, G., Bertani, C., Tancorre, V.. - (2025). (2025 IEEE Latin American Test Symposium San Andres Islas (COL) 11-14 March 2025) [10.1109/LATS65346.2025.10963955]. | 1-gen-2025 | Paolo BernardiGabriele FilipponiGiusy Iaria + | LATS_2025.pdf; Enhancing_Logic_Diagnosis_of_Field_Returns_Through_Logic_BIST_in_Automotive_SoCs.pdf |
| Exploiting weak detections for optimizing pattern generation in Defect-Oriented Cell-Aware ATPG / Ciullo, A., Eggersglüß, S., Tille, D., Glowatz, A., Iaria, G., Bernardi, P.. - (2025), pp. 72-77. (IEEE International Test Conference ASIA 2025 Tokyo (JPN) December 16–19, 2025) [10.1109/ITC-Asia67627.2025.00021]. | 1-gen-2025 | Iaria, GiusyBernardi, Paolo + | Exploiting_weak_detections_for_optimizing_pattern_generation_in_Defect-Oriented_Cell-Aware_ATPG.pdf |
| About the correlation between logical identified faulty gates and their layout characteristics / Bernardi, P., Cardone, L., Iaria, G., Appello, D., Garozzo, G., Tancorre, V.. - (2023). (IEEE International Symposium on On-Line Testing and Robust System Design 03-05 July 2023 Crete, Greece) [10.1109/IOLTS59296.2023.10224897]. | 1-gen-2023 | Bernardi, PaoloCardone, LorenzoIaria, Giusy + | IOLTS_2023_FaultsLayoutAnalysis (4).pdf; About_the_Correlation_between_Logical_Identified_Faulty_Gates_and_their_Layout_Characteristics.pdf |
| A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip / Iaria, G., Angione, F., Bernardi, P., SONZA REORDA, M., Davide, A., Giuseppe, G., Vincenzo, T.. - (2022). (Latin American Test Symposium Montevideo (Uruguay) 05-08 September 2022) [10.1109/LATS57337.2022.9936975]. | 1-gen-2022 | Iaria GiusyFrancesco AngionePaolo BernardiMatteo Sonza Reorda + | A_novel_Pattern_Selection_Algorithm_to_reduce_the_Test_Cost_of_large_Automotive_Systems-on-Chip.pdf |
| A novel SEU injection setup for Automotive SoC / Iaria, G., Foscale, T., Bernardi, P., Presicce, L., Sonza Reorda, M., Appello, D., Tancorre, V., Ugioli, R.. - (2022), pp. 623-626. (2022 IEEE International Symposium on Industrial Electronics Anchorage, AK (USA) 01-03 June 2022) [10.1109/ISIE51582.2022.9831533]. | 1-gen-2022 | G. IariaT. FoscaleP. BernardiL. PresicceM. Sonza Reorda + | A_novel_SEU_injection_setup_for_Automotive_SoC.pdf |
| In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip / Filipponi, G., Iaria, G., Sonza Reorda, M., Appello, D., Garozzo, G., Tancorre, V.. - (2022), pp. 646-649. (2022 IEEE International Test Conference (ITC) Anaheim (USA) 23-30 September 2022) [10.1109/ITC50671.2022.00090]. | 1-gen-2022 | Filipponi, G.Iaria, G.Sonza Reorda, M. + | In-field_Data_Collection_System_through_Logic_BIST_for_large_Automotive_Systems-on-Chip.pdf |
| Test, Reliability and Functional Safety Trends for Automotive System-on-Chip / Angione, F., Appello, D., Aribido, J., Athavale, J., Bellarmino, N., Bernardi, P., Cantoro, R., De Sio, C., Foscale, T., Gavarini, G., Guerrero, J., Huch, M., Iaria, G., Kilian, T., Mariani, R., Martone, R., Ruospo, A., Sanchez, E., Schlichtmann, U., Squillero, G., et al.. - (2022), pp. 1-10. (2022 IEEE European Test Symposium (ETS) Barcelona (Spain) 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. | 1-gen-2022 | F. AngioneN. BellarminoP. BernardiR. CantoroC. De SioT. FoscaleG. GavariniJ. GuerreroG. IariaR. MarianiA. RuospoG. SquilleroM. Sonza ReordaL. Sterpone + | 2022_ETS_SpecialSession.pdf; Test_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf |