Archivio Istituzionale della RicercaIARIA, GIUSY
IARIA, GIUSY
Dipartimento di Automatica e Informatica
047390
A Multi-Phase Diagnostic Flow Combining Scan-Based Refinement and Targeted Functional Tests for Automotive SoCs
2026 Iaria, Giusy; Filipponi, Gabriele; Foscale, Tommaso; Bertani, Claudia; Garozzo, Giuseppe; Tancorre, Vincenzo; Bernardi, Paolo
A Comprehensive Scan Test Cost Model to Optimize the Production of very large SoCs
2025 Iaria, Giusy; Bernardi, Paolo; Bertani, Claudia; Cardone, Lorenzo; Garozzo, Giuseppe; Tancorre, Vincenzo
Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC
2025 Angione, Francesco; Bernardi, Paolo; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips
2024 Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A Multi-Phase Diagnostic Flow Combining Scan-Based Refinement and Targeted Functional Tests for Automotive SoCs / Iaria, G., Filipponi, G., Foscale, T., Bertani, C., Garozzo, G., Tancorre, V., Bernardi, P.. - In: IEEE ACCESS. - ISSN 2169-3536. - 14:(2026), pp. 116813-116825. [10.1109/ACCESS.2026.3718146] | 1-gen-2026 | Giusy IariaGabriele FilipponiTommaso FoscalePaolo Bernardi + | A_Multi-Phase_Diagnostic_Flow_Combining_Scan-Based_Refinement_and_Targeted_Functional_Tests_for_Automotive_SoCs.pdf |
| A Comprehensive Scan Test Cost Model to Optimize the Production of very large SoCs / Iaria, G., Bernardi, P., Bertani, C., Cardone, L., Garozzo, G., Tancorre, V.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:4(2025), pp. 1278-1292. [10.1109/TC.2024.3521246] | 1-gen-2025 | Iaria, GiusyBernardi, PaoloCardone, Lorenzo + | A_Comprehensive_Scan_Test_Cost_Model_to_Optimize_the_Production_of_Very_Large_SoCs.pdf |
| Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC / Angione, F., Bernardi, P., Iaria, G., Bertani, C., Tancorre, V.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:9(2025), pp. 3195-3209. [10.1109/tc.2025.3587515] | 1-gen-2025 | Angione, FrancescoBernardi, PaoloIaria, Giusy + | Automatic_Generation_of_System-Level_Test_for_Un-Core_Logic_of_Large_Automotive_SoC.pdf |
| Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips / Bernardi, P., Filipponi, G., Iaria, G., Bertani, C., Tancorre, V.. - In: ELECTRONICS. - ISSN 2079-9292. - 13:21(2024). [10.3390/electronics13214234] | 1-gen-2024 | Paolo BernardiGabriele FilipponiGiusy Iaria + | electronics-13-04234.pdf |