FLORIDIA, ANDREA

FLORIDIA, ANDREA  

Dipartimento di Automatica e Informatica  

045338  

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Targeting different defect-oriented fault models in IC testing: an experimental approach / Mirabella, N., Floridia, A., Cantoro, R., Grosso, M., Sonza Reorda, M.. - ELETTRONICO. - (2023), pp. 214-219. (26th Euromicro Conference Series on Digital System Design (DSD) Golem (ALB) 6-8 September, 2023) [10.1109/DSD60849.2023.00039]. 1-gen-2023 Mirabella, NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo DSD_Conference_paper_1.9_submitted.docx2023172914.pdfTargeting_different_defect-oriented_fault_models_in_IC_testing_an_experimental_approach.pdf
A comparative overview of ATPG flows targeting traditional and cell-aware fault models / Mirabella, N., Floridia, A., Cantoro, R., Grosso, M., Sonza Reorda, M.. - ELETTRONICO. - (2022), pp. 1-4. (29th IEEE International Conference on Electronics Circuits and Systems (ICECS) Glasgow 24th - 26th October 2022) [10.1109/ICECS202256217.2022.9971003]. 1-gen-2022 Mirabella, NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo ICECS_2022_1.2.pdfConference_paper_1.2_submitted.docxA_comparative_overview_of_ATPG_flows_targeting_traditional_and_cell-aware_fault_models.pdf
Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A.M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Sonza Reorda, M., Ullmann, R., Vanhooren, R., Xama, N., et al.. - (2022). (The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) Torino (Italy) 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. 1-gen-2022 P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdfRecent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf
A JTAG-based Fault Emulation Platform for Dependability Analyses of Processor-based ASICs / Floridia, A., Sanchez Sanchez, E.. - ELETTRONICO. - 2021 12th IEEE Latin America Symposium on Circuits and System:(2021), pp. 1-4. (12th IEEE Latin America Symposium on Circuits and System Arequipa (Perú) February 21-25, 2021) [10.1109/LASCAS51355.2021.9459158]. 1-gen-2021 Floridia, AndreaSanchez Sanchez, Ernesto A_JTAG-based_Fault_Emulation_Platform_for_Dependability_Analyses_of_Processor-based_ASICs.pdf
A Suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices / Ruospo, A., Piumatti, D., Floridia, A., Sanchez, E.. - ELETTRONICO. - (2021), pp. 1-6. (27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021 Torino, Italy 2021) [10.1109/IOLTS52814.2021.9486704]. 1-gen-2021 Ruospo A.Piumatti D.Floridia A.Sanchez E. FINAL_PUBLISHED.pdf
Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips / Floridia, A., Carmona, T.M., Piumatti, D., Ruospo, A., Sanchez, E., Luca, S.D., Martorana, R., Pernice, M.A.. - ELETTRONICO. - (2020), pp. 1235-1240. (2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) Grenoble, France 9-13 March, 2020) [10.23919/DATE48585.2020.9116239]. 1-gen-2020 Floridia, AndreaPiumatti, DavideRuospo, AnnachiaraSanchez, Ernesto + DATE_CACHES.pdfpost_print_IEEE.pdf
A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips / Floridia, A., Piumatti, D., Ruospo, A., Ernesto, S., Sergio De Luca, ., Rosario, M.. - ELETTRONICO. - (2019), pp. 1-10. (2019 IEEE International Test Conference (ITC) Washington (USA) 9 - 15 November, 2019) [10.1109/ITC44170.2019.9000129]. 1-gen-2019 Andrea FloridiaDavide PiumattiRUOSPO, ANNACHIARAErnesto Sanchez + pre_print_IEEE.pdfpost_print_IEEE.pdf
Hybrid on-line self-test architecture for computational units on embedded processor cores / Floridia, A., Mongano, G., Piumatti, D., Sanchez, E.. - IEEE DDECS19:(2019), pp. 1-6. (Design and Diagnostics of Electronic Circuits and Systems (DDECS) Cluj-Napoca April 24-26, 2019) [10.1109/DDECS.2019.8724647]. 1-gen-2019 Floridia, AndreaPiumatti, DavideSanchez, Ernesto + -
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions / Bernardi, P., Cantoro, R., Floridia, A., Piumatti, D., Pogonea, C., Ruospo, A., Sanchez, E., De Luca, S., Sansonetti, A.. - IEEE DATE 2019:(2019), pp. 920-923. (Design, Automation and Test in Europe; DATE 2019 ) [10.23919/DATE.2019.8714780]. 1-gen-2019 Bernardi, P.Cantoro, R.Floridia, A.Piumatti, D.Ruospo, A.Sanchez, E. + -
An analysis of test solutions for COTS-based systems in space applications / Cantoro, R., Carbonara, S., Floridia, A., Sanchez, E., Sonza Reorda, M., Mess, J.. - ELETTRONICO. - IEEE VLSI-SOC 2018:(2018), pp. 1-6. (2018 IFIP/IEEE 26th International Conference on Very Large Scale Integration (VLSI-SOC) Verona (Italy) 8-10 Ottobre 2018) [10.1109/VLSI-SoC.2018.8644846]. 1-gen-2018 Riccardo CantoroCARBONARA, SARAAndrea FloridiaErnesto SanchezMatteo Sonza Reorda + -
Development flow of on-line Software Test Libraries for asynchronous processor cores / Floridia, A., Ernesto, S., Andrikos, N.. - ELETTRONICO. - 2018:(2018). (2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design (IOLTS) Platja d’Aro (Spain) 2-4 July 2018) [10.1109/IOLTS.2018.8474126]. 1-gen-2018 Andrea FloridiaErnesto Sanchez + -
Hybrid on-line self-test strategy for dual-core lockstep processors / Floridia, A., Sanchez, E.. - ELETTRONICO. - 2018:(2018), pp. 1-6. (2018 IEEE 31st International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Chicago (USA) 8-10 Ottobre 2018) [10.1109/DFT.2018.8602982]. 1-gen-2018 FLORIDIA, ANDREAErnesto Sanchez -
Parallel software-based self-test suite for multi-core system-on-chip: Migration from single-core to multi-core automotive microcontrollers / Floridia, A., Piumatti, D., Sanchez, E., De Luca, S., Sansonetti, A.. - STAMPA. - (2018), pp. 1-6. (2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) Taormina, Italy 9-12 April 2018) [10.1109/DTIS.2018.8368558]. 1-gen-2018 Floridia, A.Piumatti, D.Sanchez, E. + -
On the Development of a High-Level Fault Simulator for the Analysis of Performance Faults on Speculative Modules / Floridia, A., Margelli, R., Sanchez, E.. - ELETTRONICO. - (2017), pp. 1-6. (18th IEEE Latin American Test Symposium (LATS), 2017 ) [10.1109/LATW.2017.7906746]. 1-gen-2017 FLORIDIA, ANDREASanchez, E + -