Multi-core processors are increasingly becoming popular even in safety-critical applications, and the compliance of such systems with functional safety standards is thus mandatory. The targeted reliability figures are achieved with a combination of different solutions, in particular a largely employed one is named Dual-Core Lockstep (DCLS) configuration. In this paper, a hybrid scheme for the on-line testing of the lockstep logic is proposed, allowing for non-intrusive run-time test of lockstep comparators. The proposed solution leverages test programs developed according to the Software-Based Self-Test (SBST) approach, used in conjunction with a specialized hardware module. The effectiveness of this approach was assessed on a modified version of the OpenRISC 1200 processor, considering stuck-at faults only.

Hybrid on-line self-test strategy for dual-core lockstep processors / Floridia, Andrea; Ernesto, Sanchez. - ELETTRONICO. - 2018:(2019), pp. 1-6. (Intervento presentato al convegno 2018 IEEE 31st International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a Chicago (USA) nel 8-10 Ottobre 2018) [10.1109/DFT.2018.8602982].

Hybrid on-line self-test strategy for dual-core lockstep processors

FLORIDIA, ANDREA;Ernesto Sanchez
2019

Abstract

Multi-core processors are increasingly becoming popular even in safety-critical applications, and the compliance of such systems with functional safety standards is thus mandatory. The targeted reliability figures are achieved with a combination of different solutions, in particular a largely employed one is named Dual-Core Lockstep (DCLS) configuration. In this paper, a hybrid scheme for the on-line testing of the lockstep logic is proposed, allowing for non-intrusive run-time test of lockstep comparators. The proposed solution leverages test programs developed according to the Software-Based Self-Test (SBST) approach, used in conjunction with a specialized hardware module. The effectiveness of this approach was assessed on a modified version of the OpenRISC 1200 processor, considering stuck-at faults only.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2712450
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