Archivio Istituzionale della RicercaINSINGA, GIORGIO
INSINGA, GIORGIO
Dipartimento di Automatica e Informatica
059760
A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements
In corso di stampa Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs
2024 Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; Carnevale, Giambattista; Coppetta, Matteo; Mischo, Walter; Ullmann, Rudolf
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test
2023 Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip
2023 Insinga, Giorgio; Battilana, Matteo; Coppetta, Matteo; Mautone, Nellina; Carnevale, Giambattista; Giltrelli, Massimo; Scaramuzza, Pierre; Ullmann, Rudolf
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests
2023 Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip
2022 Bernardi, Paolo; Insinga, Giorgio; Paganini, Giovanni; Cantoro, Riccardo; Beer, Peter; Mautone, Nellina; Scaramuzza, Pierre; Carnevale, Giambattista; Coppetta, Matteo; Ullmann, Rudolf
Recent Trends and Perspectives on Defect-Oriented Testing
2022 Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.
Industrial best practice: cases of study by automotive chip- makers
2021 Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; Montfort, O.; Cantoro, R.; Insinga, G.; Venini, F.; Calao, P.; Bernardi, P.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements / Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio. - (In corso di stampa). (Intervento presentato al convegno IEEE International conference on Design, Test & Technology of Integrated Systems (DTTIS) tenutosi a Aix-en-Provence (FR) nel 2024). | In corso di stampa | Bernardi,PaoloKolahimahmoudi,NimaInsinga,Giorgio | DTTIS24_6_pages.pdf |
| Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs / Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; Carnevale, Giambattista; Coppetta, Matteo; Mischo, Walter; Ullmann, Rudolf. - In: ELECTRONICS. - ISSN 2079-9292. - 13:2(2024). [10.3390/electronics13020303] | 1-gen-2024 | Bernardi, PaoloInsinga, GiorgioPaganini, Giovanni + | electronics-13-00303.pdf |
| A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test / Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio. - (2023), pp. 1-6. (Intervento presentato al convegno Conference on Very Large Scale Integration (VLSI-SoC 2023) tenutosi a Dubai (United Arab Emirates) nel October 16 - 18, 2023) [10.1109/VLSI-SoC57769.2023.10321848]. | 1-gen-2023 | Bernardi, PaoloKolahimahmoudi, NimaInsinga, Giorgio | A_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdf; A_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdf |
| Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip / Insinga, Giorgio; Battilana, Matteo; Coppetta, Matteo; Mautone, Nellina; Carnevale, Giambattista; Giltrelli, Massimo; Scaramuzza, Pierre; Ullmann, Rudolf. - ELETTRONICO. - (2023), pp. 1-6. (Intervento presentato al convegno European Test Symposium (ETS) 2023 tenutosi a Venice (IT) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174126]. | 1-gen-2023 | Insinga,Giorgio + | ETS_2023_Density-Oriented.pdf; Density-oriented_diagnostic_data_compression_strategy_for_characterization_of_embedded_memories_in_Automotive_Systems-on-Chip.pdf |
| Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests / Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio. - (2023). (Intervento presentato al convegno IEEE Latin-American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154486]. | 1-gen-2023 | Bernardi, PaoloFilipponi, GabrieleFoscale, TommasoInsinga, Giorgio | LATS_2023.pdf; Low_cost_external_serial_interface_watchdog_for_SoCs_and_FPGAs_automatic_characterization_tests.pdf |
| Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip / Bernardi, Paolo; Insinga, Giorgio; Paganini, Giovanni; Cantoro, Riccardo; Beer, Peter; Mautone, Nellina; Scaramuzza, Pierre; Carnevale, Giambattista; Coppetta, Matteo; Ullmann, Rudolf. - (2022), pp. 1-6. (Intervento presentato al convegno IEEE European Test Symposium tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810445]. | 1-gen-2022 | Paolo BERNARDIGiorgio INSINGAGiovanni PAGANINIRiccardo CANTORO + | Optimized_diagnostic_strategy_for_embedded_memories_of_Automotive_Systems-on-Chip.pdf |
| Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino (Italy) nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. | 1-gen-2022 | P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + | _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdf; Recent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf |
| Industrial best practice: cases of study by automotive chip- makers / Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; Montfort, O.; Cantoro, R.; Insinga, G.; Venini, F.; Calao, P.; Bernardi, P.. - (2021), pp. 1-6. (Intervento presentato al convegno 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) nel 06-08 October 2021) [10.1109/DFT52944.2021.9568350]. | 1-gen-2021 | Paganini, G.Cantoro, R.Insinga, G.Venini, F.Calao, P.Bernardi, P. + | Industrial_best_practice_cases_of_study_by_automotive_chip-_makers.pdf |