Archivio Istituzionale della RicercaINSINGA, GIORGIO
INSINGA, GIORGIO
Dipartimento di Automatica e Informatica
059760
Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis
In corso di stampa Anedda, Simone; Bernardi, Paolo; Coppetta, Matteo; Insinga, Giorgio; Montedoro, Tommaso; Ruospo, Annachiara; Ullmann, Rudolf; Tengler, Felix
A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories
2026 Bernardi, Paolo; Insinga, Giorgio; Battilana, Matteo; Beer, Peter; Carnevale, Giambattista; Coppetta, Matteo; Mautone, Nellina; Repele, Alberto; Scaramuzza, Pierre; Ullmann, Rudolf
Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs
2026 Filipponi, Gabriele; Schwachhofer, Denis; Angione, Francesco; Bertani, Claudia; Corbellini, Simone; Di Gruttola Giardino, Nicola; Garozzo, Giuseppe; Insinga, Giorgio; Tancorre, Vincenzo; Bernardi, Paolo
ARBoard: Augmented Reality for PCB Operations in Industry 5.0
2025 Insinga, Giorgio; Anzoino, Francesco; Bella, Pietro; Bernardi, Paolo; Filippetti, Luca; Khattar, Reem
Extended design and linearity analysis of a 6-bit low-area hybrid ADC design for local system-on-chip measurements
2025 Kolahimahmoudi, Nima; Insinga, Giorgio; Bernardi, Paolo
Test and diagnosis of memories embedded in Automotive SoCs
2025 Insinga, Giorgio
A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements
2024 Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs
2024 Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; Carnevale, Giambattista; Coppetta, Matteo; Mischo, Walter; Ullmann, Rudolf
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test
2023 Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip
2023 Insinga, Giorgio; Battilana, Matteo; Coppetta, Matteo; Mautone, Nellina; Carnevale, Giambattista; Giltrelli, Massimo; Scaramuzza, Pierre; Ullmann, Rudolf
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests
2023 Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip
2022 Bernardi, Paolo; Insinga, Giorgio; Paganini, Giovanni; Cantoro, Riccardo; Beer, Peter; Mautone, Nellina; Scaramuzza, Pierre; Carnevale, Giambattista; Coppetta, Matteo; Ullmann, Rudolf
Recent Trends and Perspectives on Defect-Oriented Testing
2022 Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.
Industrial best practice: cases of study by automotive chip- makers
2021 Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; Montfort, O.; Cantoro, R.; Insinga, G.; Venini, F.; Calao, P.; Bernardi, P.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis / Anedda, S., Bernardi, P., Coppetta, M., Insinga, G., Montedoro, T., Ruospo, A., Ullmann, R., Tengler, F.. - (In corso di stampa). (2026 IEEE European Test Symposium (ETS) Chania, Crete May 25-29, 2026). | In corso di stampa | Paolo BernardiGiorgio InsingaAnnachiara Ruospo + | RS3-3.pdf |
| A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories / Bernardi, P., Insinga, G., Battilana, M., Beer, P., Carnevale, G., Coppetta, M., Mautone, N., Repele, A., Scaramuzza, P., Ullmann, R.. - In: ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS. - ISSN 1539-9087. - 25:1(2026), pp. 1-15. [10.1145/3766550] | 1-gen-2026 | Bernardi, PaoloInsinga, Giorgio + | 3766550.pdf |
| Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs / Filipponi, G., Schwachhofer, D., Angione, F., Bertani, C., Corbellini, S., Di Gruttola Giardino, N., Garozzo, G., Insinga, G., Tancorre, V., Bernardi, P.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 1557-9956. - 75:2(2026), pp. 554-566. | 1-gen-2026 | Gabriele FilipponiFrancesco AngioneSimone CorbelliniNicola di Gruttola GiardinoGiorgio InsingaPaolo Bernardi + | Netlist-Independent_Functional_Stress_Pattern_Generation_Strategy_for_AI_HW_Accelerators_Embedded_into_SoCs.pdf |
| ARBoard: Augmented Reality for PCB Operations in Industry 5.0 / Insinga, G., Anzoino, F., Bella, P., Bernardi, P., Filippetti, L., Khattar, R.. - (2025). (2025 IEEE International Symposium on Emerging Metaverse (ISEMV) Honolulu, HI (USA) 19-20 October 2025) [10.1109/ISEMV67326.2025.00014]. | 1-gen-2025 | Insinga, GiorgioAnzoino, FrancescoBella, PietroBernardi, PaoloFilippetti, LucaKhattar, Reem | ARBoard_Augmented_Reality_for_PCB_Operations_in_Industry_5.0.pdf; ARBoard_6_pages_IEEE_ISEMV_2025___camera_ready (1).pdf |
| Extended design and linearity analysis of a 6-bit low-area hybrid ADC design for local system-on-chip measurements / Kolahimahmoudi, N., Insinga, G., Bernardi, P.. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - 118:(2025). [10.1016/j.micpro.2025.105191] | 1-gen-2025 | Nima KolahimahmoudiGiorgio InsingaPaolo Bernardi | 1-s2.0-S0141933125000584-main.pdf |
| Test and diagnosis of memories embedded in Automotive SoCs / Insinga, Giorgio. - (2025 Mar 21), pp. 1-138. [10.13121/polito/porto/2998590] | 21-mar-2025 | INSINGA, GIORGIO | Insinga_PhD_Thesis.pdf; Insinga_phd_summary.pdf |
| A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements / Bernardi, P., Kolahimahmoudi, N., Insinga, G.. - (2024). (IEEE International conference on Design, Test & Technology of Integrated Systems (DTTIS) Aix-en-Provence (FR) 14-16 October 2024) [10.1109/DTTIS62212.2024.10780233]. | 1-gen-2024 | Bernardi, PaoloKolahimahmoudi, NimaInsinga, Giorgio | DTTIS24_6_pages.pdf; A_6-bit_Low-Area_Hybrid_ADC_Design_For_System-on-Chip_Measurements.pdf |
| Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs / Bernardi, P., Guerriero, A.M., Insinga, G., Paganini, G., Carnevale, G., Coppetta, M., Mischo, W., Ullmann, R.. - In: ELECTRONICS. - ISSN 2079-9292. - 13:2(2024). [10.3390/electronics13020303] | 1-gen-2024 | Bernardi, PaoloInsinga, GiorgioPaganini, Giovanni + | electronics-13-00303.pdf |
| A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test / Bernardi, P., Kolahimahmoudi, N., Insinga, G.. - (2023), pp. 1-6. (Conference on Very Large Scale Integration (VLSI-SoC 2023) Dubai (United Arab Emirates) October 16 - 18, 2023) [10.1109/VLSI-SoC57769.2023.10321848]. | 1-gen-2023 | Bernardi, PaoloKolahimahmoudi, NimaInsinga, Giorgio | A_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdf; A_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdf |
| Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip / Insinga, G., Battilana, M., Coppetta, M., Mautone, N., Carnevale, G., Giltrelli, M., Scaramuzza, P., Ullmann, R.. - ELETTRONICO. - (2023), pp. 1-6. (European Test Symposium (ETS) 2023 Venice (IT) 22-26 May 2023) [10.1109/ETS56758.2023.10174126]. | 1-gen-2023 | Insinga,Giorgio + | ETS_2023_Density-Oriented.pdf; Density-oriented_diagnostic_data_compression_strategy_for_characterization_of_embedded_memories_in_Automotive_Systems-on-Chip.pdf |
| Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests / Bernardi, P., Filipponi, G., Foscale, T., Insinga, G.. - (2023). (IEEE Latin-American Test Symposium Veracruz (Mexico) 21-24 March 2023) [10.1109/LATS58125.2023.10154486]. | 1-gen-2023 | Bernardi, PaoloFilipponi, GabrieleFoscale, TommasoInsinga, Giorgio | LATS_2023.pdf; Low_cost_external_serial_interface_watchdog_for_SoCs_and_FPGAs_automatic_characterization_tests.pdf |
| Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip / Bernardi, P., Insinga, G., Paganini, G., Cantoro, R., Beer, P., Mautone, N., Scaramuzza, P., Carnevale, G., Coppetta, M., Ullmann, R.. - (2022), pp. 1-6. (IEEE European Test Symposium Barcelona (Spain) 23-27 May 2022) [10.1109/ETS54262.2022.9810445]. | 1-gen-2022 | Paolo BERNARDIGiorgio INSINGAGiovanni PAGANINIRiccardo CANTORO + | Optimized_diagnostic_strategy_for_embedded_memories_of_Automotive_Systems-on-Chip.pdf |
| Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A.M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Sonza Reorda, M., Ullmann, R., Vanhooren, R., Xama, N., et al.. - (2022). (The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) Torino (Italy) 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. | 1-gen-2022 | P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + | _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdf; Recent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf |
| Industrial best practice: cases of study by automotive chip- makers / Abbati, L.D., Ullmann, R., Paganini, G., Coppetta, M., Zaia, L., Huard, V., Montfort, O., Cantoro, R., Insinga, G., Venini, F., Calao, P., Bernardi, P.. - (2021), pp. 1-6. (2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 06-08 October 2021) [10.1109/DFT52944.2021.9568350]. | 1-gen-2021 | Paganini, G.Cantoro, R.Insinga, G.Venini, F.Calao, P.Bernardi, P. + | Industrial_best_practice_cases_of_study_by_automotive_chip-_makers.pdf |