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A Fast Reliability Analysis of Image Segmentation Neural Networks Exploiting Statistical Fault Injections
2023 Gavarini, G; Ruospo, A; Sanchez, E
Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections
2023 Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika
Evaluation and mitigation of faults affecting Swin Transformers
2023 Gavarini, Gabriele; Ruospo, Annachiara; Sanchez, Ernesto
Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs
2023 Ruospo, Annachiara; Gavarini, Gabriele; Porsia, Antonio; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika
On the resilience of representative and novel data formats in CNNs
2023 Gavarini, G.; Ruospo, A.; Sanchez, E.
SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks
2023 Gavarini, G; Ruospo, A; Sanchez, E
Special Session: Approximation and Fault Resiliency of DNN Accelerators
2023 Ahmadilivani, Mh; Barbareschi, M; Barone, S; Bosio, A; Daneshtalab, M; Della Torca, S; Gavarini, G; Jenihhin, M; Raik, J; Ruospo, A; Sanchez, E; Taheri, M
Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries
2023 Turco, V.; Ruospo, A.; Gavarini, G.; Sanchez, E.; Sonza Reorda, M.
Open-Set Recognition: an Inexpensive Strategy to Increase DNN Reliability
2022 Gavarini, Gabriele; Stucchi, Diego; Ruospo, Annachiara; Boracchi, Giacomo; Sanchez, Ernesto
Selective Hardening of Critical Neurons in Deep Neural Networks
2022 Ruospo, Annachiara; Gavarini, Gabriele; Bragaglia, Ilaria; Traiola, Marcello; Bosio, Alberto; Sanchez, Ernesto
Test, Reliability and Functional Safety trends for Automotive System-on-Chip
2022 Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip
2022 Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A Fast Reliability Analysis of Image Segmentation Neural Networks Exploiting Statistical Fault Injections / Gavarini, G; Ruospo, A; Sanchez, E. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154488]. | 1-gen-2023 | Gavarini, GRuospo, ASanchez, E | A_Fast_Reliability_Analysis_of_Image_Segmentation_Neural_Networks_Exploiting_Statistical_Fault_Injections.pdf |
| Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections / Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE Design, Automation and Test in Europe Conference (DATE) tenutosi a Antwerp (Belgium) nel 17 - 19 April 2023) [10.23919/DATE56975.2023.10136998]. | 1-gen-2023 | Ruospo, AnnachiaraGavarini, GabrieleDe Sio, CorradoGuerrero Balaguera, Juan DavidSterpone, LucaSonza Reorda, MatteoSanchez, Ernesto + | date_2023_acceptedVersion.pdf; Assessing_Convolutional_Neural_Networks_Reliability_through_Statistical_Fault_Injections.pdf |
| Evaluation and mitigation of faults affecting Swin Transformers / Gavarini, Gabriele; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2023), pp. 1-7. (Intervento presentato al convegno 29th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2023) tenutosi a Chania,Crete (Greece) nel July 3rd - 5th, 2023) [10.1109/IOLTS59296.2023.10224882]. | 1-gen-2023 | Gabriele GavariniAnnachiara RuospoErnesto Sanchez | IOLTS23_TransformerCaseStudy.pdf; Evaluation_and_Mitigation_of_Faults_Affecting_Swin_Transformers.pdf |
| Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs / Ruospo, Annachiara; Gavarini, Gabriele; Porsia, Antonio; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno 28th IEEE European Test Symposium 2023 tenutosi a Venice (Italy) nel May 22 - 26, 2023) [10.1109/ETS56758.2023.10174176]. | 1-gen-2023 | Ruospo, AnnachiaraGavarini, GabrielePorsia, AntonioSonza Reorda, MatteoSanchez, Ernesto + | OnlineTestImages_ETS23.pdf; Image_Test_Libraries_for_the_on-line_self-test_of_functional_units_in_GPUs_running_CNNs.pdf |
| On the resilience of representative and novel data formats in CNNs / Gavarini, G.; Ruospo, A.; Sanchez, E.. - (2023). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Juan-Les-Pins (FR) nel 03-05 October 2023) [10.1109/DFT59622.2023.10313551]. | 1-gen-2023 | Gavarini G.Ruospo A.Sanchez E. | On_the_resilience_of_representative_and_novel_data_formats_in_CNNs.pdf |
| SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks / Gavarini, G; Ruospo, A; Sanchez, E. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10173957]. | 1-gen-2023 | Gavarini, GRuospo, ASanchez, E | SCI-FI_a_Smart_aCcurate_and_unIntrusive_Fault-Injector_for_Deep_Neural_Networks.pdf |
| Special Session: Approximation and Fault Resiliency of DNN Accelerators / Ahmadilivani, Mh; Barbareschi, M; Barone, S; Bosio, A; Daneshtalab, M; Della Torca, S; Gavarini, G; Jenihhin, M; Raik, J; Ruospo, A; Sanchez, E; Taheri, M. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE 41st VLSI Test Symposium (VTS) tenutosi a San Diego (USA) nel 24-26 April 2023) [10.1109/VTS56346.2023.10140043]. | 1-gen-2023 | Barone, SBosio, AGavarini, GRuospo, ASanchez, E + | Special_Session_Approximation_and_Fault_Resiliency_of_DNN_Accelerators.pdf |
| Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries / Turco, V.; Ruospo, A.; Gavarini, G.; Sanchez, E.; Sonza Reorda, M.. - (2023). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Juan-Les-Pins (FR) nel 03-05 October 2023) [10.1109/DFT59622.2023.10313530]. | 1-gen-2023 | V. TurcoA. RuospoG. GavariniE. SanchezM. Sonza Reorda | Uncovering_hidden_vulnerabilities_in_CNNs_through_evolutionary-based_Image_Test_Libraries.pdf |
| Open-Set Recognition: an Inexpensive Strategy to Increase DNN Reliability / Gavarini, Gabriele; Stucchi, Diego; Ruospo, Annachiara; Boracchi, Giacomo; Sanchez, Ernesto. - ELETTRONICO. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2022) tenutosi a Torino nel September, 12th-14th 2022) [10.1109/IOLTS56730.2022.9897805]. | 1-gen-2022 | Gavarini, GabrieleRuospo, AnnachiaraSanchez, Ernesto + | postPrintIOLTS.pdf; Open-Set_Recognition_an_Inexpensive_Strategy_to_Increase_DNN_Reliability.pdf |
| Selective Hardening of Critical Neurons in Deep Neural Networks / Ruospo, Annachiara; Gavarini, Gabriele; Bragaglia, Ilaria; Traiola, Marcello; Bosio, Alberto; Sanchez, Ernesto. - ELETTRONICO. - (2022), pp. 136-141. (Intervento presentato al convegno 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems – DDECS 2022 tenutosi a Prague, Czech Republic nel April 6 – 8, 2022) [10.1109/DDECS54261.2022.9770168]. | 1-gen-2022 | Ruospo, AnnachiaraGavarini, GabrieleSanchez, Ernesto + | DDECS_2022__TMR_critical_neurons.pdf; Selective_Hardening_of_Critical_Neurons_in_Deep_Neural_Networks.pdf |
| Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022). (Intervento presentato al convegno IEEE European Test Symposium). | 1-gen-2022 | F. AngioneN. BellarminoP. BernardiR. CantoroC. de SioT. FoscaleG. GavariniA. RuospoE. SanchezG. SquilleroM. Sonza ReordaL. Sterpone + | 01_ETS_special_session_ABSTRACT.pdf |
| Test, Reliability and Functional Safety Trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022), pp. 1-10. (Intervento presentato al convegno 2022 IEEE European Test Symposium (ETS) tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. | 1-gen-2022 | F. AngioneN. BellarminoP. BernardiR. CantoroC. De SioT. FoscaleG. GavariniJ. GuerreroG. IariaR. MarianiA. RuospoG. SquilleroM. Sonza ReordaL. Sterpone + | 2022_ETS_SpecialSession.pdf; Test_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf |