Archivio Istituzionale della RicercaSfoglia per Autore
Analysis of Single Event Effects on Embedded Processor
2021 Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca
On the Evaluation of SEEs on Open-Source Embedded Static RAMs
2021 Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis
2021 Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; Cai, Li; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
Analysis of Radiation-induced Transient Errors on 7nm FinFET Technology
2021 Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
A New Domains-based Isolation Design Flow for Reconfigurable SoCs
2021 Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca
SEU Evaluation of Hardened-by-Replication Software in RISC-V Soft Processor
2021 De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Sterpone, Luca
SEU Mitigation on SRAM-based FPGAs through Domains-based Isolation Design Flow
2021 Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca
A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication
2021 Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Processor
2022 DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Merodio Codinachs, David
A Placement-Oriented Mitigation Technique for Single Event Effect in Monolithic 3D IC
2022 Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
Design and Mitigation techniques of Radiation induced SEEs on Open-Source Embedded Static RAMs
2022 Azimi, S.; De Sio, C.; Portaluri, A.; Sterpone, L.
A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS
2022 Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.
Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs
2022 Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca
Analysis and Mitigation of Soft-Errors on High Performance Embedded GPUs
2022 Sterpone, L.; Azimi, S.; De Sio, C.; Parisi, F.
On the Reliability of Real-time Operating System on Embedded Soft Processor for Space Applications
2022 Portaluri, Andrea; Azimi, Sarah; DE SIO, Corrado; Rizzieri, Daniele; Sterpone, Luca
FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms
2022 De Sio, C.; Azimi, S.; Sterpone, L.
Layout-oriented Radiation Effects Mitigation in RISC-V Soft Processor
2022 Vacca, Eleonora; De Sio, Corrado; Azimi, Sarah
An Automated Continuous Integration Multitest Platform for Automotive Systems
2022 Du, Boyang; Azimi, Sarah; Moramarco, Annarita; Sabena, Davide; Parisi, Filippo; Sterpone, Luca
Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor
2022 De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David
Soft Error Reliability Prediction of SRAM-based FPGA Designs
2022 Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Sterpone, Luca; Merodio Codinachs, David; Poivey, Christian
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Analysis of Single Event Effects on Embedded Processor / Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 10:24(2021), p. 3160. [10.3390/electronics10243160] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoRizzieri, DanieleSterpone, Luca | electronics-10-03160 (1).pdf |
| On the Evaluation of SEEs on Open-Source Embedded Static RAMs / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-6. (Intervento presentato al convegno IEEE International Conference on Very Large Scale Integration (VLSI-SoC) nel 4-7 October 2021) [10.1109/VLSI-SoC53125.2021.9606985]. | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca | VLSI-SoC Camera Ready.pdf; On_the_Evaluation_of_SEEs_on_Open-Source_Embedded_Static_RAMs.pdf |
| Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis / Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; Cai, Li; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: NUCLEAR SCIENCE AND TECHNIQUES. - ISSN 1001-8042. - 32:10(2021). [10.1007/s41365-021-00943-6] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca + | Yang2021_Article_Single-event-effectPropagation (1).pdf |
| Analysis of Radiation-induced Transient Errors on 7nm FinFET Technology / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 126:(2021). [10.1016/j.microrel.2021.114319] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca | MicRel 2021.pdf; 1-s2.0-S0026271421002857-main.pdf |
| A New Domains-based Isolation Design Flow for Reconfigurable SoCs / Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-7. (Intervento presentato al convegno IEEE International Symposium on On-Line Testing and robust System Design (IOLTS 2021)) [10.1109/IOLTS52814.2021.9486687]. | 1-gen-2021 | Portaluri,AndreaDe Sio, CorradoAzimi, SarahSterpone,Luca | PaperID-30-IOLTS2021.pdf; A_New_Domains-based_Isolation_Design_Flow_for_Reconfigurable_SoCs.pdf |
| SEU Evaluation of Hardened-by-Replication Software in RISC-V Soft Processor / De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-6. (Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a Athens (GR) nel 6-8 October 2019) [10.1109/DFT52944.2021.9568342]. | 1-gen-2021 | De Sio, CorradoAzimi, SarahPortaluri, AndreaSterpone, Luca | DFT_CAMERA READY.pdf; SEU_Evaluation_of_Hardened-by-Replication_Software_in_RISC-_V_Soft_Processor.pdf |
| SEU Mitigation on SRAM-based FPGAs through Domains-based Isolation Design Flow / Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2021). (Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2021 tenutosi a Vienna (Austria) nel 13-17 September 2021) [10.1109/RADECS53308.2021.9954492]. | 1-gen-2021 | Portaluri,AndreaDe Sio,CorradoAzimi,SarahSterpone,Luca | RADECS-Camera Ready.pdf; SEU_Mitigation_on_SRAM-based_FPGAs_through_Domains-based_Isolation_Design_Flow.pdf |
| A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - ELETTRONICO. - 29:8(2021), pp. 1596-1600. [10.1109/TVLSI.2021.3086897] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca | ToVLSI-Final Version.pdf; A_Radiation-Hardened_CMOS_Full-Adder_Based_on_Layout_Selective_Transistor_Duplication.pdf |
| Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Processor / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-6. (Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a Austin (USA) nel October, 2022) [10.1109/DFT56152.2022.9962341]. | 1-gen-2022 | Corrado De SioSarah AzimiLuca Sterpone + | DFT22_v2.2_cready.pdf; Analysis_of_Proton-induced_Single_Event_Effect_in_the_On-Chip_Memory_of_Embedded_Process.pdf |
| A Placement-Oriented Mitigation Technique for Single Event Effect in Monolithic 3D IC / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - ELETTRONICO. - (2022), pp. 1-4. (Intervento presentato al convegno IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design - SMACD 2022 tenutosi a Sardinia, Italy nel June 2022) [10.1109/SMACD55068.2022.9816235]. | 1-gen-2022 | Azimi, SarahDe Sio, CorradoSterpone, Luca | SMACD_CameraReady.pdf; A_Placement-Oriented_Mitigation_Technique_for_Single_Event_Effect_in_Monolithic_3D_IC.pdf |
| Design and Mitigation techniques of Radiation induced SEEs on Open-Source Embedded Static RAMs / Azimi, S.; De Sio, C.; Portaluri, A.; Sterpone, L. (IFIP ADVANCES IN INFORMATION AND COMMUNICATION TECHNOLOGY). - In: VLSI-SoC: Technology Advancement on SoC Design / Grimblatt V., Chang C.H., Reis R., Chattopadhyay A., Calimera A.. - [s.l] : Springer, 2022. - ISBN 978-3-031-16818-5. - pp. 135-153 [10.1007/978-3-031-16818-5_7] | 1-gen-2022 | S. AzimiC. De SioA. PortaluriL. Sterpone | springer_book_extended_vlsi_soc_2021_final.pdf |
| A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS / Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 138:(2022), pp. 1-5. [10.1016/j.microrel.2022.114733] | 1-gen-2022 | S. AzimiC. De SioA. PortaluriD. RizzieriL. Sterpone | MicRel_CMOSvsFinFET_V3_fin.pdf; 1-s2.0-S0026271422002578-main.pdf |
| Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs / Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 138:(2022). [10.1016/j.microrel.2022.114778] | 1-gen-2022 | Vacca, EleonoraAzimi, SarahSterpone, Luca | microelectronics_reliability_camera_ready.pdf; 3220228.3220229.pdf |
| Analysis and Mitigation of Soft-Errors on High Performance Embedded GPUs / Sterpone, L.; Azimi, S.; De Sio, C.; Parisi, F.. - ELETTRONICO. - (2022), pp. 91-98. (Intervento presentato al convegno 21st IEEE International Symposium on Parallel and Distributed Computing tenutosi a Basel (Switzerland) nel 11-13 July 2022) [10.1109/ISPDC55340.2022.00022]. | 1-gen-2022 | L. SterponeS. AzimiC. De Sio + | ISPDC_2022.pdf; Analysis_and_Mitigation_of_Soft-Errors_on_High_Performance_Embedded_GPUs.pdf |
| On the Reliability of Real-time Operating System on Embedded Soft Processor for Space Applications / Portaluri, Andrea; Azimi, Sarah; DE SIO, Corrado; Rizzieri, Daniele; Sterpone, Luca. - ELETTRONICO. - (2022), pp. 181-193. (Intervento presentato al convegno 35th GI/ITG International Conference on Architecture of Computing Systems tenutosi a Heilbronn (Germany) nel September, 2022) [10.1007/978-3-031-21867-5_12]. | 1-gen-2022 | Andrea PortaluriSarah AzimiCorrado De SioDaniele RizzieriLuca Sterpone | paper_26.pdf; 978-3-031-21867-5_12.pdf |
| FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms / De Sio, C.; Azimi, S.; Sterpone, L.. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - 10:2(2022), pp. 549-563. [10.1109/TETC.2022.3152668] | 1-gen-2022 | De Sio C.Azimi S.Sterpone L. | FireNN_cd_2.2.pdf; FireNN_Neural_Networks_Reliability_Evaluation_on_Hybrid_Platforms.pdf |
| Layout-oriented Radiation Effects Mitigation in RISC-V Soft Processor / Vacca, Eleonora; De Sio, Corrado; Azimi, Sarah. - ELETTRONICO. - (2022), pp. 215-220. (Intervento presentato al convegno 19th ACM International Conference on Computing Frontiers 2022 tenutosi a Torino nel May 2022) [10.1145/3528416.3530984]. | 1-gen-2022 | Vacca, EleonoraDe Sio, CorradoAzimi, Sarah | CF2022_camera_ready.pdf; 3528416.3530984.pdf |
| An Automated Continuous Integration Multitest Platform for Automotive Systems / Du, Boyang; Azimi, Sarah; Moramarco, Annarita; Sabena, Davide; Parisi, Filippo; Sterpone, Luca. - In: IEEE SYSTEMS JOURNAL. - ISSN 1932-8184. - ELETTRONICO. - 16:2(2022), pp. 2495-2506. [10.1109/JSYST.2021.3069548] | 1-gen-2022 | Du, BoyangAzimi, SarahMoramarco, AnnaritaSabena, DavideSterpone, Luca + | IEEESystem_2021.pdf; An_Automated_Continuous_Integration_Multitest_Platform_for_Automotive_Systems.pdf |
| Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor / De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-4. (Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022 tenutosi a Venice (IT) nel 03-07 October 2022) [10.1109/RADECS55911.2022.10412414]. | 1-gen-2022 | De Sio, CorradoAzimi, SarahPortaluri, AndreaRizzieri, DanieleVacca, EleonoraSterpone, Luca + | RADECS2022_Final.pdf; Proton-induced_MBU_Effects_in_Real-time_Operating_System_on_Embedded_Soft_Processor.pdf |
| Soft Error Reliability Prediction of SRAM-based FPGA Designs / Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Sterpone, Luca; Merodio Codinachs, David; Poivey, Christian. - ELETTRONICO. - (2022), pp. 1-4. (Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022 tenutosi a Venice (ITA) nel 03-07 October 2022) [10.1109/RADECS55911.2022.10412546]. | 1-gen-2022 | Eleonora VaccaSarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriLuca Sterpone + | RADECS_prediction_v6 (2).pdf; Soft_Error_Reliability_Prediction_of_SRAM-based_FPGA_Designs.pdf |
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