Archivio Istituzionale della RicercaSfoglia per Autore
SETA-RAY: A New IDE tool for Predicting, Analyzing and Mitigating Radiation-induced Soft Errors on FPGAs
2019 Sterpone, Luca; Du, Boyang; Azimi, Sarah
Rad-Ray: A new Simulation Tool for the Analysis of Heavy Ions-induced SETs on ICs
2019 Sterpone, Luca; Azimi, Sarah; Du, Boyang; Luoni, Francesca
Analysis of Radiation-induced SETs in 3D VLSI Face-to-Back LUTs
2019 Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah
Ultra High Energy Heavy Ion Test Beam on Xilinx Kintex-7 SRAM-based FPGA
2019 Du, Boyang; Sterpone, Luca; Azimi, Sarah; Merodio Codinachs, David; Ferlet-Cavrois, Véronique; Boatella Polo, Cesar; García Alía, Rubén; Kastriotou, Maria; Fernández-Martínez, Pablo
On the Evaluation of the PIPB Effect within SRAM-based FPGAs
2019 DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca
Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs
2019 De Sio, C.; Azimi, S.; Bozzoli, L.; Du, B.; Sterpone, L.
Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect
2019 DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Du, Boyang
A new CAD tool for Single Event Transient Analysis and Mitigation on Flash-based FPGAs
2019 Azimi, Sarah; Du, Boyang; Sterpone, Luca; Merodio Codinachs, David; Grimoldi, Raoul; Cattaneo, Luca
A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs
2019 Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah
On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGA
2019 Du, Boyang; Azimi, Sarah; DE SIO, Corrado; Bozzoli, Ludovica; Sterpone, Luca
Digital design techniques for dependable High-Performance Computing
2019 Azimi, Sarah
On the Mitigation of Single Event Transient in 3D LUT by In-Cell Layout Resizing
2020 Azimi, Sarah; Du, Boyang; DE SIO, Corrado; Sterpone, Luca
In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops
2020 Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
On the evaluation of SEU effects on AXI interconnect within AP-SoCs
2020 De Sio, C.; Azimi, S.; Sterpone, L.
A 3D Simulation-based Approach to Analyze Heavy Ions-induced SET on Digital Circuits
2020 Sterpone, L.; Luoni, F.; Azimi, S.; Du, B.
Digital Design Techniques for Dependable High Performance Computing
2020 Azimi, Sarah; Sterpone, Luca
A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit
2020 Azimi, Sarah; DE SIO, Corrado; Yang, Weitao; Sterpone, Luca
An Emulation Platform for Evaluating the Reliability of Deep Neural Networks
2020 DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca
On the Analysis of Radiation-induced Failures in the AXI Interconnect Module
2020 De Sio, C.; Azimi, S.; Sterpone, L.
A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication
2021 Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| SETA-RAY: A New IDE tool for Predicting, Analyzing and Mitigating Radiation-induced Soft Errors on FPGAs / Sterpone, Luca; Du, Boyang; Azimi, Sarah. - ELETTRONICO. - (2019). (Intervento presentato al convegno IEEE design, automation and test in Europe - DATE 2019). | 1-gen-2019 | luca sterponeboyang duSarah azimi | date_CameraReady.pdf |
| Rad-Ray: A new Simulation Tool for the Analysis of Heavy Ions-induced SETs on ICs / Sterpone, Luca; Azimi, Sarah; Du, Boyang; Luoni, Francesca. - ELETTRONICO. - (2019). (Intervento presentato al convegno 30th IEEE Radiation and its Effects on Components and Systems (RADECS 2019)). | 1-gen-2019 | Luca SterponeSarah AzimiBoyang Du + | - |
| Analysis of Radiation-induced SETs in 3D VLSI Face-to-Back LUTs / Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah. - (2019). (Intervento presentato al convegno 30th IEEE Radiation and its Effects on Components and Systems (RADECS 2019)). | 1-gen-2019 | Luca SterponeLudovica BozzoliCorrado De SioBoyang DuSarah Azimi | - |
| Ultra High Energy Heavy Ion Test Beam on Xilinx Kintex-7 SRAM-based FPGA / Du, Boyang; Sterpone, Luca; Azimi, Sarah; Merodio Codinachs, David; Ferlet-Cavrois, Véronique; Boatella Polo, Cesar; García Alía, Rubén; Kastriotou, Maria; Fernández-Martínez, Pablo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - ELETTRONICO. - 66:7(2019), pp. 1813-1819. [10.1109/TNS.2019.2915207] | 1-gen-2019 | Boyang DuLuca SterponeSarah Azimi + | 08708253.pdf |
| On the Evaluation of the PIPB Effect within SRAM-based FPGAs / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca. - (2019). (Intervento presentato al convegno 2019 IEEE European Test Symposium (ETS2019)) [10.1109/ETS.2019.8791527]. | 1-gen-2019 | Corrado de sioSarah AzimiLuca sterpone | ETS_CAMERAREADY.pdf; On_the_Evaluation_of_the_PIPB_Effect_within_SRAM-based_FPGAs.pdf |
| Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs / De Sio, C.; Azimi, S.; Bozzoli, L.; Du, B.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - (2019). [10.1016/j.microrel.2019.06.034] | 1-gen-2019 | De Sio, C.Azimi, S.Bozzoli, L.Du, B.Sterpone, L. | - |
| Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Du, Boyang. - In: IEEE ACCESS. - ISSN 2169-3536. - 7:(2019), pp. 140182-140189. [10.1109/ACCESS.2019.2915136] | 1-gen-2019 | Corrado De SioSarah AzimiLuca SterponeBoyang Du | 08708270.pdf |
| A new CAD tool for Single Event Transient Analysis and Mitigation on Flash-based FPGAs / Azimi, Sarah; Du, Boyang; Sterpone, Luca; Merodio Codinachs, David; Grimoldi, Raoul; Cattaneo, Luca. - In: INTEGRATION. - ISSN 0167-9260. - 67:(2019), pp. 73-81. [10.1016/j.vlsi.2019.02.001] | 1-gen-2019 | Sarah AzimiBoyang DuLuca Sterpone + | 1-s2.0-S0167926018305753-main.pdf |
| A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs / Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah. - ELETTRONICO. - (2019), pp. 205-208. (Intervento presentato al convegno IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design (SMACD)) [10.1109/SMACD.2019.8795296]. | 1-gen-2019 | Luca SterponeLudovica BozzoliCorrado De SioBoyang DuSarah Azimi | SMACD2019.pdf; A_new_Method_for_the_Analysis_of_Radiation-induced_Effects_in_3D_VLSI_Face-to-Back_LUTs.pdf |
| On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGA / Du, Boyang; Azimi, Sarah; DE SIO, Corrado; Bozzoli, Ludovica; Sterpone, Luca. - ELETTRONICO. - (2019). (Intervento presentato al convegno The 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology tenutosi a ESA-ESTEC & TU Delft, Netherlands nel 02/10/2019 - 04/10/2019) [10.1109/DFT.2019.8875362]. | 1-gen-2019 | Boyang DuSarah AzimiCorrado De SioLudovica BozzoliLuca Sterpone | 08875362.pdf |
| Digital design techniques for dependable High-Performance Computing / Azimi, Sarah. - (2019 May 16), pp. 1-196. | 16-mag-2019 | AZIMI, SARAH | PhD_Thesis_SarahAzimi_V2.pdf; Thesis_Abstract_SarahAzimi.pdf |
| On the Mitigation of Single Event Transient in 3D LUT by In-Cell Layout Resizing / Azimi, Sarah; Du, Boyang; DE SIO, Corrado; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 1-4. (Intervento presentato al convegno European Conference on Radiation and its Effects on Components and Systems (RADECS) tenutosi a Online event) [10.1109/RADECS50773.2020.9857719]. | 1-gen-2020 | Sarah AzimiBoyang DuCorrado De SioLuca Sterpone | RADECS2020_CameraReady.pdf; On_the_Mitigation_of_Single_Event_Transient_in_3D_LUT_by_In-Cell_Layout_Resizing.pdf |
| In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 1-6. (Intervento presentato al convegno 26th IEEE International Symposium on On-Line Testing and robust System Design (IOLT 2020) nel 13-15 July 2020) [10.1109/IOLTS50870.2020.9159738]. | 1-gen-2020 | Azimi, SarahDe Sio, CorradoSterpone, Luca | IOLTS2020_CameraReady.pdf; In-Circuit_Mitigation_Approach_of_Single_Event_Transients_for_45nm_Flip-Flops.pdf |
| On the evaluation of SEU effects on AXI interconnect within AP-SoCs / De Sio, C.; Azimi, S.; Sterpone, L.. - 12155:(2020), pp. 215-227. (Intervento presentato al convegno 33rd International Conference on Architecture of Computing Systems, ARCS 2020 tenutosi a deu nel 2020) [10.1007/978-3-030-52794-5_16]. | 1-gen-2020 | De Sio C.Azimi S.Sterpone L. | ARCS2020_CameraReady.pdf; Sio2020_Chapter_OnTheEvaluationOfSEUEffectsOnA.pdf |
| A 3D Simulation-based Approach to Analyze Heavy Ions-induced SET on Digital Circuits / Sterpone, L.; Luoni, F.; Azimi, S.; Du, B.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - (2020). [10.1109/TNS.2020.3006997] | 1-gen-2020 | L. SterponeS. AzimiB. Du + | FINAL_VERSION.pdf; 09133159.pdf |
| Digital Design Techniques for Dependable High Performance Computing / Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 1-10. (Intervento presentato al convegno IEEE International Test Conference (ITC 2020) nel 2020) [10.1109/ITC44778.2020.9325281]. | 1-gen-2020 | Azimi, SarahSterpone, Luca | ITC 2020- Camera Ready.pdf; 09325281.pdf |
| A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit / Azimi, Sarah; DE SIO, Corrado; Yang, Weitao; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 311-314. (Intervento presentato al convegno 18th IEEE International NEWCAS tenutosi a Montreal, Canada nel June 16-19, 2020) [10.1109/NEWCAS49341.2020.9159844]. | 1-gen-2020 | Sarah AzimiCorrado De SioWeitao YangLuca Sterpone | NEWCAS_2020.pdf; 09159844.pdf |
| An Emulation Platform for Evaluating the Reliability of Deep Neural Networks / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 1-4. (Intervento presentato al convegno 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2020) tenutosi a ita nel 19-21 Oct. 2020) [10.1109/DFT50435.2020.9250872]. | 1-gen-2020 | Corrado De SioSarah AzimiLuca Sterpone | DFT_CameaReady_FinalVersion.pdf; 09250872.pdf |
| On the Analysis of Radiation-induced Failures in the AXI Interconnect Module / De Sio, C.; Azimi, S.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 114:(2020), p. 113733. [10.1016/j.microrel.2020.113733] | 1-gen-2020 | De Sio C.Azimi S.Sterpone L. | MicRel2020_CameraReady.pdf; 1-s2.0-S0026271420305400-main.pdf |
| A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - ELETTRONICO. - 29:8(2021), pp. 1596-1600. [10.1109/TVLSI.2021.3086897] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca | ToVLSI-Final Version.pdf; A_Radiation-Hardened_CMOS_Full-Adder_Based_on_Layout_Selective_Transistor_Duplication.pdf |
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