SRAM-based FPGAs are widely used in mission critical applications. Due to the increasing working frequency and technology scaling of ultra-nanometer technology, Single Event Transients (SETs) are becoming a major source of errors for these devices. In this paper, we propose an approach for evaluating the Propagation-induced Pulse Broadening (PIPB) effect introduced by the logic resources traversed by transient pulses. The proposed methodology is applicable to any recent technology to provide SET analysis, necessary for an efficient mitigation technology. Experimental results achieved from a set of benchmarks are compared with fault injection experiments executed on a 28 nm SRAM-based FPGA to demonstrate the effectiveness of our technique.

On the Evaluation of the PIPB Effect within SRAM-based FPGAs / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca. - (2019). (Intervento presentato al convegno 2019 IEEE European Test Symposium (ETS2019)) [10.1109/ETS.2019.8791527].

On the Evaluation of the PIPB Effect within SRAM-based FPGAs

Corrado de sio;Sarah Azimi;Luca sterpone
2019

Abstract

SRAM-based FPGAs are widely used in mission critical applications. Due to the increasing working frequency and technology scaling of ultra-nanometer technology, Single Event Transients (SETs) are becoming a major source of errors for these devices. In this paper, we propose an approach for evaluating the Propagation-induced Pulse Broadening (PIPB) effect introduced by the logic resources traversed by transient pulses. The proposed methodology is applicable to any recent technology to provide SET analysis, necessary for an efficient mitigation technology. Experimental results achieved from a set of benchmarks are compared with fault injection experiments executed on a 28 nm SRAM-based FPGA to demonstrate the effectiveness of our technique.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2734652