Archivio Istituzionale della RicercaRESTIFO, MARCO
Reliability and Testing of Complex Safety-Critical Automotive SoC
2020 Restifo, Marco
A hybrid in-field self-test technique for SoCs
2019 Carbonara, S.; Bernardi, P.; Restifo, M.
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test
2019 COSTA DE ALMEIDA, ANTONIO FELIPE; Bernardi, P.; Calabrese, D.; Restifo, M.; Reorda, M. S.; Appello, D.; Pollaccia, G.; Tancorre, V.; Ugioli, R.; Zoppi, G.
Self-testing of multicore processors
2019 Skitsas, Michael A.; Restifo, Marco; Michael, Maria K.; Nicopoulos, Chrysostomos; Bernardi, Paolo; Ernesto, Sanchez
About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications
2018 Cantoro, R.; Firrincieli, Andrea; Piumatti, D.; Restifo, M.; Sanchez, E.; Reorda, M. Sonza
Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC
2018 Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Venini, Federico
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In
2018 Appello, Davide; Bernardi, Paolo; Cantoro, Riccardo; Colazzo, Andrea; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico
An Optimized Test During Burn-In for Automotive SoC
2018 Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico
A Comprehensive Methodology for Stress Procedures Evaluation and Comparison for Burn-In of Automotive SoC
2017 Bernardi, Paolo; Appello, Davide; Giacopelli, Giampaolo; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Rabbi, Christian; Restifo, Marco; Ruberg, Priit; Sanchez, Ernesto; Villa, Claudio Maria; Venini, Federico
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller
2017 Bernardi, Paolo; Cantoro, Riccardo; Gianotto, L.; Restifo, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; Venini, Federico; Appello, D.
An Evolutionary Approach to Hardware Encryption and Trojan-Horse Mitigation
2017 Marcelli, Andrea; Restifo, Marco; Sanchez, Ernesto; Squillero, Giovanni
Defeating Hardware Trojan through Software Obfuscation
2017 Marcelli, Andrea; Restifo, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni
On the in-field test of embedded memories
2017 Bernardi, Paolo; Restifo, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
On-Line Software-based Self-Test for ECC of Embedded RAM Memories
2017 Restifo, Marco; Bernardi, Paolo; DE LUCA, Sergio; Sansonetti, Alessandro
Scan chain encryption for the test, diagnosis and debug of secure circuits
2017 Da Silva, Mathieu; Flottes, Marie Lise; DI NATALE, Giorgio; Rouzeyre, Bruno; Prinetto, Paolo Ernesto; Restifo, Marco
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Reliability and Testing of Complex Safety-Critical Automotive SoC / Restifo, M.. - (2020 Feb 20), pp. 1-140. | 20-feb-2020 | RESTIFO, MARCO | - |
| A hybrid in-field self-test technique for SoCs / Carbonara, S., Bernardi, P., Restifo, M.. - (2019), pp. 1-6. (14th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2019 grc 2019) [10.1109/DTIS.2019.8735075]. | 1-gen-2019 | Carbonara S.Bernardi P.Restifo M. | 08735075.pdf |
| Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test / COSTA DE ALMEIDA, A.F., Bernardi, P., Calabrese, D., Restifo, M., Reorda, M.S., Appello, D., Pollaccia, G., Tancorre, V., Ugioli, R., Zoppi, G.. - STAMPA. - (2019). (22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2019 rou 2019) [10.1109/DDECS.2019.8724644]. | 1-gen-2019 | COSTA DE ALMEIDA, ANTONIO FELIPEBernardi P.Restifo M.Reorda M. S. + | - |
| Self-testing of multicore processors / Skitsas, M.A., Restifo, M., Michael, M.K., Nicopoulos, C., Bernardi, P., Ernesto, S. - In: Many-Core Computing: Hardware and Software / Al-Hashimi B.M., Merrett G.V.. - STAMPA. - [s.l] : IET, 2019. - ISBN 9781785615825. - pp. 367-394 [10.1049/PBPC022E_ch15] | 1-gen-2019 | Marco RestifoPaolo BernardiErnesto Sanchez + | - |
| About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications / Cantoro, R., Firrincieli, A., Piumatti, D., Restifo, M., Sanchez, E., Reorda, M.S.. - STAMPA. - 2018-:(2018), pp. 1-6. (19th IEEE Latin-American Test Symposium, LATS 2018 bra 2018) [10.1109/LATW.2018.8349679]. | 1-gen-2018 | Cantoro, R.FIRRINCIELI, ANDREAPiumatti, D.Restifo, M.Sanchez, E.Reorda, M. Sonza | lats18 preprint.pdf |
| Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC / Appello, D., Bernardi, P., Bugeja, C., Cantoro, R., Pollaccia, G., Restifo, M., Venini, F.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 34:(2018), pp. 43-52. [10.1007/s10836-018-5705-1] | 1-gen-2018 | Paolo BernardiRiccardo CantoroMarco RestifoFederico Venini + | - |
| An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In / Appello, D., Bernardi, P., Cantoro, R., Colazzo, A., Motta, A., Pagani, A., Pollaccia, G., Restifo, M., Ernesto, S., Venini, F.. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - STAMPA. - (2018), pp. 86-98. [10.1166/jolpe.2018.1542] | 1-gen-2018 | Paolo BernardiRiccardo CantoroMarco RestifoErnesto Sanchezand Federico Venini + | - |
| An Optimized Test During Burn-In for Automotive SoC / Appello, D., Bernardi, P., Bugeja, C., Cantoro, R., Pollaccia, G., Restifo, M., Ernesto, S., Venini, F.. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - STAMPA. - (2018), pp. 46-53. [10.1109/MDAT.2018.2799807] | 1-gen-2018 | Paolo BernardiRiccardo CantoroMarco RestifoErnesto SanchezFederico Venini + | PREPRINT_DT_DTSI-2017-04-0096.R2.pdf; 08272388.pdf |
| A Comprehensive Methodology for Stress Procedures Evaluation and Comparison for Burn-In of Automotive SoC / Bernardi, P., Appello, D., Giacopelli, G., Motta, A., Pagani, A., Pollaccia, G., Rabbi, C., Restifo, M., Ruberg, P., Sanchez, E., Villa, C.M., Venini, F.. - (2017). (Design, Automation and Test in Europe Conference and Exhibition (DATE2017) ). | 1-gen-2017 | BERNARDI, PAOLORESTIFO, MARCOSanchez, ErnestoVENINI, FEDERICO + | - |
| A DMA and CACHE-based stress schema for burn-in of automotive microcontroller / Bernardi, P., Cantoro, R., Gianotto, L., Restifo, M., SANCHEZ SANCHEZ, E.E., Venini, F., Appello, D.. - STAMPA. - (2017), pp. 1-6. (2017 18th IEEE Latin American Test Symposium (LATS) Bogota (CO) 13-15 March 2017) [10.1109/LATW.2017.7906767]. | 1-gen-2017 | BERNARDI, PAOLOCANTORO, RICCARDORESTIFO, MARCOSANCHEZ SANCHEZ, EDGAR ERNESTOVENINI, FEDERICO + | - |
| An Evolutionary Approach to Hardware Encryption and Trojan-Horse Mitigation / Marcelli, A., Restifo, M., Sanchez, E., Squillero, G.. - ELETTRONICO. - (2017). (Design, Automation and Test in Europe, DATE 2017 Laussane, Switzerland 27-31 March 2017) [10.23919/DATE.2017.7927244]. | 1-gen-2017 | MARCELLI, ANDREARESTIFO, MARCOSanchez, ErnestoSQUILLERO, GIOVANNI | - |
| Defeating Hardware Trojan through Software Obfuscation / Marcelli, Andrea; Restifo, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni. - ELETTRONICO. - (2017). ( RESCUE 2017 - Workshop on Reliability, Security and Quality Limassol, Cyprus May 25-26, 2017). | 1-gen-2017 | MARCELLI, ANDREARESTIFO, MARCOSANCHEZ SANCHEZ, EDGAR ERNESTOSQUILLERO, GIOVANNI | - |
| On the in-field test of embedded memories / Bernardi, P., Restifo, M., SANCHEZ SANCHEZ, E.E., SONZA REORDA, M.. - (2017). (23rd IEEE International Symposium on On-Line Testing and Robust System Design ). | 1-gen-2017 | BERNARDI, PAOLORESTIFO, MARCOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MATTEO | - |
| On-Line Software-based Self-Test for ECC of Embedded RAM Memories / Restifo, M., Bernardi, P., DE LUCA, S., Sansonetti, A.. - ELETTRONICO. - (2017), pp. 1-6. (Symposium on Defect and Fault TOlerance in VLSI and Nanotechnology Systems Cambridge (UK) 2017). | 1-gen-2017 | RESTIFO, MARCOBERNARDI, PAOLO + | - |
| Scan chain encryption for the test, diagnosis and debug of secure circuits / Da Silva, M., Flottes, M.L., DI NATALE, G., Rouzeyre, B., Prinetto, P.E., Restifo, M.. - ELETTRONICO. - (2017), pp. 1-6. (22nd IEEE European Test Symposium, ETS 2017 cyp 2017) [10.1109/ETS.2017.7968248]. | 1-gen-2017 | DI NATALE, GIORGIOPRINETTO, Paolo ErnestoRESTIFO, MARCO + | - |