RESTIFO, MARCO

RESTIFO, MARCO  

Dipartimento di Automatica e Informatica  

038167  

Mostra records
Risultati 1 - 10 di 10 (tempo di esecuzione: 0.02 secondi).
Citazione Data di pubblicazione Autori File
A hybrid in-field self-test technique for SoCs / Carbonara, S., Bernardi, P., Restifo, M.. - (2019), pp. 1-6. (14th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2019 grc 2019) [10.1109/DTIS.2019.8735075]. 1-gen-2019 Carbonara S.Bernardi P.Restifo M. 08735075.pdf
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test / COSTA DE ALMEIDA, A.F., Bernardi, P., Calabrese, D., Restifo, M., Reorda, M.S., Appello, D., Pollaccia, G., Tancorre, V., Ugioli, R., Zoppi, G.. - STAMPA. - (2019). (22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2019 rou 2019) [10.1109/DDECS.2019.8724644]. 1-gen-2019 COSTA DE ALMEIDA, ANTONIO FELIPEBernardi P.Restifo M.Reorda M. S. + -
About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications / Cantoro, R., Firrincieli, A., Piumatti, D., Restifo, M., Sanchez, E., Reorda, M.S.. - STAMPA. - 2018-:(2018), pp. 1-6. (19th IEEE Latin-American Test Symposium, LATS 2018 bra 2018) [10.1109/LATW.2018.8349679]. 1-gen-2018 Cantoro, R.FIRRINCIELI, ANDREAPiumatti, D.Restifo, M.Sanchez, E.Reorda, M. Sonza lats18 preprint.pdf
A Comprehensive Methodology for Stress Procedures Evaluation and Comparison for Burn-In of Automotive SoC / Bernardi, P., Appello, D., Giacopelli, G., Motta, A., Pagani, A., Pollaccia, G., Rabbi, C., Restifo, M., Ruberg, P., Sanchez, E., Villa, C.M., Venini, F.. - (2017). (Design, Automation and Test in Europe Conference and Exhibition (DATE2017) ). 1-gen-2017 BERNARDI, PAOLORESTIFO, MARCOSanchez, ErnestoVENINI, FEDERICO + -
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller / Bernardi, P., Cantoro, R., Gianotto, L., Restifo, M., SANCHEZ SANCHEZ, E.E., Venini, F., Appello, D.. - STAMPA. - (2017), pp. 1-6. (2017 18th IEEE Latin American Test Symposium (LATS) Bogota (CO) 13-15 March 2017) [10.1109/LATW.2017.7906767]. 1-gen-2017 BERNARDI, PAOLOCANTORO, RICCARDORESTIFO, MARCOSANCHEZ SANCHEZ, EDGAR ERNESTOVENINI, FEDERICO + -
An Evolutionary Approach to Hardware Encryption and Trojan-Horse Mitigation / Marcelli, A., Restifo, M., Sanchez, E., Squillero, G.. - ELETTRONICO. - (2017). (Design, Automation and Test in Europe, DATE 2017 Laussane, Switzerland 27-31 March 2017) [10.23919/DATE.2017.7927244]. 1-gen-2017 MARCELLI, ANDREARESTIFO, MARCOSanchez, ErnestoSQUILLERO, GIOVANNI -
Defeating Hardware Trojan through Software Obfuscation / Marcelli, Andrea; Restifo, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni. - ELETTRONICO. - (2017). ( RESCUE 2017 - Workshop on Reliability, Security and Quality Limassol, Cyprus May 25-26, 2017). 1-gen-2017 MARCELLI, ANDREARESTIFO, MARCOSANCHEZ SANCHEZ, EDGAR ERNESTOSQUILLERO, GIOVANNI -
On the in-field test of embedded memories / Bernardi, P., Restifo, M., SANCHEZ SANCHEZ, E.E., SONZA REORDA, M.. - (2017). (23rd IEEE International Symposium on On-Line Testing and Robust System Design ). 1-gen-2017 BERNARDI, PAOLORESTIFO, MARCOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MATTEO -
On-Line Software-based Self-Test for ECC of Embedded RAM Memories / Restifo, M., Bernardi, P., DE LUCA, S., Sansonetti, A.. - ELETTRONICO. - (2017), pp. 1-6. (Symposium on Defect and Fault TOlerance in VLSI and Nanotechnology Systems Cambridge (UK) 2017). 1-gen-2017 RESTIFO, MARCOBERNARDI, PAOLO + -
Scan chain encryption for the test, diagnosis and debug of secure circuits / Da Silva, M., Flottes, M.L., DI NATALE, G., Rouzeyre, B., Prinetto, P.E., Restifo, M.. - ELETTRONICO. - (2017), pp. 1-6. (22nd IEEE European Test Symposium, ETS 2017 cyp 2017) [10.1109/ETS.2017.7968248]. 1-gen-2017 DI NATALE, GIORGIOPRINETTO, Paolo ErnestoRESTIFO, MARCO + -