VALLERO, ALESSANDRO

VALLERO, ALESSANDRO  

029207  

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A Bayesian model for system level reliability estimation / Vallero, Alessandro; Savino, Alessandro; Tselonis, S.; Foutris, N.; Kaliorakis, M.; Politano, GIANFRANCO MICHELE MARIA; Gizopoulos, D.; DI CARLO, Stefano. - ELETTRONICO. - (2015), pp. 1-2. ((Intervento presentato al convegno 20th IEEE European Test Symposium (ETS) tenutosi a Cluj-Napoca, RO nel 25-29 May 2015 [10.1109/ETS.2015.7138745]. 1-gen-2015 VALLERO, ALESSANDROSAVINO, ALESSANDROPOLITANO, GIANFRANCO MICHELE MARIADI CARLO, STEFANO + ETS.2015.Bayesian.pdf
A novel methodology to increase fault tolerance in autonomous FPGA-based systems / DI CARLO, Stefano; Gambardella, Giulio; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal; Vallero, Alessandro. - STAMPA. - (2014), pp. 87-92. ((Intervento presentato al convegno IEEE 20th International On-Line Testing Symposium (IOLTS) tenutosi a Platja d'Aro, Girona (ES) nel 7-9 July 2014 [10.1109/IOLTS.2014.6873677]. 1-gen-2014 DI CARLO, STEFANOGAMBARDELLA, GIULIOPRINETTO, Paolo ErnestoROLFO, DANIELETROTTA, PASCALVALLERO, ALESSANDRO 06873677.pdfIOLTS.2014.DPR.pdf
Bayesian models for early cross-layer reliability analysis and design space exploration / Vallero, A.; Savino, A.; Carelli, A.; Di Carlo, S.. - STAMPA. - (2019), pp. 143-146. ((Intervento presentato al convegno 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 tenutosi a Rhodes, Greece nel 1-3 July 2019 [10.1109/IOLTS.2019.8854452]. 1-gen-2019 Vallero A.Savino A.Carelli A.Di Carlo S. 08854452.pdfconference_041818.pdf
Bayesian network early reliability evaluation analysis for both permanent and transient faults / Vallero, Alessandro; Savino, Alessandro; Tselonis, S.; Foutris, N.; Kaliorakis, M.; Politano, GIANFRANCO MICHELE MARIA; Gizopoulos, D.; DI CARLO, Stefano. - STAMPA. - (2015), pp. 7-12. ((Intervento presentato al convegno IEEE 21st International On-Line Testing Symposium (IOLTS) tenutosi a Halkidiki, GR nel 6-8 July 2015 [10.1109/IOLTS.2015.7229819]. 1-gen-2015 VALLERO, ALESSANDROSAVINO, ALESSANDROPOLITANO, GIANFRANCO MICHELE MARIADI CARLO, STEFANO + IOLTS.2015.BayesianNet.pdf
Combining cluster sampling and ACE analysis to improve fault-injection based reliability evaluation of GPU-based systems / Vallero, A.; Di Carlo, S.. - STAMPA. - (2019), pp. 8138-8143. ((Intervento presentato al convegno 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019 tenutosi a Noordwijk, Netherlands nel 2-4 Oct. 2019 [10.1109/DFT.2019.8875392]. 1-gen-2019 Vallero A.Di Carlo S. conference_041818.pdf08875392.pdf
Cross layer reliability estimation for digital systems / Vallero, Alessandro. - (2017). [10.6092/polito/porto/2673865] 1-gen-2017 VALLERO, ALESSANDRO Vallero PhD thesis.pdf
Cross-Layer Early Reliability Evaluation for the Computing cOntinuum / DI CARLO, Stefano; Vallero, Alessandro; Gizopoulos, D.; Di Natale, G.; Grasset, A.; Mariani, R.; Reichenbach, F.. - STAMPA. - (2014), pp. 199-205. ((Intervento presentato al convegno 17th Euromicro Conference on Digital System Design (DSD) tenutosi a Verona, IT nel 27-29 Aug. 2014 [10.1109/DSD.2014.65]. 1-gen-2014 DI CARLO, STEFANOVALLERO, ALESSANDRO + 06927245.pdfDSD_2014_Clereco.pdf
Cross-layer early reliability evaluation: Challenges and promises / DI CARLO, Stefano; Vallero, Alessandro; Gizopoulos, D.; Di Natale, G.; Gonzalez, A.; Canal, R.; Mariani, R.; Pipponzi, M.; Grasset, A.; Bonnot, F.; Reichenbach, F.; Rafiq, G.; Loekstad, T.. - STAMPA. - (2014), pp. 228-233. ((Intervento presentato al convegno IEEE 20th International On-Line Testing Symposium (IOLTS) tenutosi a Platja d'Aro, Girona (ES) nel 7-9 July 2014 [10.1109/IOLTS.2014.6873704]. 1-gen-2014 DI CARLO, STEFANOVALLERO, ALESSANDRO + 06873704.pdfIOLTS_Clereco_2014.pdf
Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview / Vallero, Alessandro; Tselonis, S.; Foutris, N.; Kaliorakis, M.; Kooli, M.; Savino, Alessandro; Politano, GIANFRANCO MICHELE MARIA; Bosio, A.; Di Natale, G.; Gizopoulos, D.; DI CARLO, Stefano. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - STAMPA. - 39:8(2015), pp. 1204-1214. [10.1016/j.micpro.2015.06.003] 1-gen-2015 VALLERO, ALESSANDROSAVINO, ALESSANDROPOLITANO, GIANFRANCO MICHELE MARIADI CARLO, STEFANO + MICROPRO.2015-CLERECO.pdf
Cross-layer system reliability assessment framework for hardware faults / Vallero, Alessandro; Savino, Alessandro; Politano, GIANFRANCO MICHELE MARIA; DI CARLO, Stefano; Chatzidimitriou, A.; Tselonis, S.; Kaliorakis, M.; Gizopoulos, D.; Riera, M.; Canal, R.; Gonzalez, A.; Kooli, M.; Bosio, A.; Di Natale, G.. - ELETTRONICO. - (2016), pp. 1-10. ((Intervento presentato al convegno 47th IEEE International Test Conference (ITC) tenutosi a Forth Worth, TX, USA nel 2016 [10.1109/TEST.2016.7805863]. 1-gen-2016 VALLERO, ALESSANDROSAVINO, ALESSANDROPOLITANO, GIANFRANCO MICHELE MARIADI CARLO, STEFANO + TEST.2016.Bayesian.pdfTEST.2016.BayesianAuthor.pdf
Early Component-Based System Reliability Analysis for Approximate Computing Systems / Vallero, Alessandro; Savino, Alessandro; Politano, GIANFRANCO MICHELE MARIA; DI CARLO, Stefano; Chatzidimitriou, A.; Tselonis, S.; Kaliorakis, M.; Gizopoulos, D.; Riera, M.; Canal, R.; Gonzalez, A.; Kooli, M.; Bosio, A.; Di Natale, G.. - ELETTRONICO. - (2016), pp. 1-4. ((Intervento presentato al convegno 2nd Workshop On Approximate Computing (WAPCO) tenutosi a Prague, CZ nel 20 Jan. 2016 [10.13140/RG.2.1.3883.5604]. 1-gen-2016 VALLERO, ALESSANDROSAVINO, ALESSANDROPOLITANO, GIANFRANCO MICHELE MARIADI CARLO, STEFANO + 2016.WAPCO.Bayesian.pdf
Microarchitecture level reliability comparison of modern GPU designs: First findings / Vallero, Alessandro; DI CARLO, Stefano; Tselonis, Sotiris; Gizopoulos, Dimitris. - STAMPA. - (2017), pp. 129-130. ((Intervento presentato al convegno 2017 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS 2017) tenutosi a USA nel 24-25 April 2017 [10.1109/ISPASS.2017.7975280]. 1-gen-2017 VALLERO, ALESSANDRODI CARLO, STEFANO + PID4694323.pdf07975280-2.pdf
Multi-faceted microarchitecture level reliability characterization for NVIDIA and AMD GPUs / Vallero, Alessandro; Tselonis, Sotiris; Gizopoulos, Dimitris; Di Carlo, Stefano. - ELETTRONICO. - 2018:(2018), pp. 1-6. ((Intervento presentato al convegno 36th IEEE VLSI Test Symposium, VTS 2018 tenutosi a San Francisca, CA (USA) nel 22-25 April 2018 [10.1109/VTS.2018.8368665]. 1-gen-2018 Vallero, AlessandroDi Carlo, Stefano + PID5222961.pdf08368665.pdf
Performance monitor counters: Interplay between safety and security in complex cyber-physical systems / Carelli, Alberto; Vallero, Alessandro; Di Carlo, Stefano. - In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. - ISSN 1530-4388. - STAMPA. - 19:1(2019), pp. 73-82. [10.1109/TDMR.2019.2898882] 1-gen-2019 Carelli, AlbertoVallero, AlessandroDi Carlo, Stefano bare_jrnl_postprint.pdf08640260-2.pdf
ReDO: Cross-Layer Multi-Objective Design-Exploration Framework for Efficient Soft Error Resilient Systems / Savino, Alessandro; Vallero, Alessandro; Di Carlo, Stefano. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - STAMPA. - 67:10(2018), pp. 1462-1477. [10.1109/TC.2018.2818735] 1-gen-2018 Savino, AlessandroVallero, AlessandroDi Carlo, Stefano TC.2018.2818735_REDO.pdf08323226.pdf
RIIF-2: Toward the next generation reliability information interchange format / Savino, Alessandro; DI CARLO, Stefano; Vallero, Alessandro; Politano, GIANFRANCO MICHELE MARIA; Gizopoulos, D.; Evans, A.. - ELETTRONICO. - (2016), pp. 173-178. ((Intervento presentato al convegno 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016 tenutosi a Sant Feliu de Guixols, Spain nel 4-6 July 2016 [10.1109/IOLTS.2016.7604693]. 1-gen-2016 SAVINO, ALESSANDRODI CARLO, STEFANOVALLERO, ALESSANDROPOLITANO, GIANFRANCO MICHELE MARIA + IOLTS_camera_ready_V3.pdf07604693.pdf
Securing bitstream integrity, confidentiality and authenticity in reconfigurable mobile heterogeneous systems / Carelli, Alberto; Cristofanini, Carlo Alberto; Vallero, Alessandro; Basile, Cataldo; Prinetto, Paolo; Di Carlo, Stefano. - STAMPA. - (2018), pp. 1-6. ((Intervento presentato al convegno IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR 2018) tenutosi a Cluj-Napoca (Romania) nel 24-26 May 2018 [10.1109/AQTR.2018.8402795]. 1-gen-2018 Carelli, AlbertoVALLERO, ALESSANDROBasile, CataldoPrinetto, PaoloDi Carlo, Stefano + 08402795.pdfAQTR2018_SecureBitstream.pdf
Shielding Performance Monitor Counters: A double edged weapon for safety and security / Carelli, Alberto; Vallero, Alessandro; Di Carlo, Stefano. - STAMPA. - (2018), pp. 269-274. ((Intervento presentato al convegno 24th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2018 tenutosi a Platja d'Aro, Spain nel 2-4 July 2018 [10.1109/IOLTS.2018.8474191]. 1-gen-2018 Carelli, AlbertoVallero, AlessandroDi Carlo, Stefano bare_conf.pdf08474191.pdf
SIFI: AMD southern islands GPU microarchitectural level fault injector / Vallero, Alessandro; Gizopoulos, Dimitris; Di Carlo, Stefano. - STAMPA. - (2017), pp. 138-144. ((Intervento presentato al convegno 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017 tenutosi a Hotel Makedonia Palace, Thessaloniki (Greece) nel 21 September 2017 [10.1109/IOLTS.2017.8046209]. 1-gen-2017 Vallero, AlessandroDi Carlo, Stefano + IOLTS2017-SIFI.pdfIOLTS2017-SIFI-PostDraft.pdf
Stochastic methods / Savino, Alessandro; Vallero, Alessandro; DI CARLO, Stefano - In: Cross-Layer Reliability of Computing Systems / Di Natale G, Gizopoulos D., Di Carlo S., Bosio A. Canal R.. - ELETTRONICO. - [s.l] : IET - the institution of engineering and technology, 2020. - ISBN 9781785617973. - pp. 281-304 [10.1049/PBCS057E_ch11] 1-gen-2020 Alessandro SavinoAlessandro ValleroStefano Di Carlo Reliability analyssis - Stochastic Methods.pdfPBCS0570_DiNatale_Chapter11_Proof.pdf