VALLERO, ALESSANDRO

VALLERO, ALESSANDRO  

029207  

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Bayesian models for early cross-layer reliability analysis and design space exploration / Vallero, A., Savino, A., Carelli, A., Di Carlo, S.. - STAMPA. - (2019), pp. 143-146. (25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 Rhodes, Greece 1-3 July 2019) [10.1109/IOLTS.2019.8854452]. 1-gen-2019 Vallero A.Savino A.Carelli A.Di Carlo S. 08854452.pdfconference_041818.pdf
Combining cluster sampling and ACE analysis to improve fault-injection based reliability evaluation of GPU-based systems / Vallero, A., Di Carlo, S.. - STAMPA. - (2019), pp. 8138-8143. (32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019 Noordwijk, Netherlands 2-4 Oct. 2019) [10.1109/DFT.2019.8875392]. 1-gen-2019 Vallero A.Di Carlo S. conference_041818.pdf08875392.pdf
Multi-faceted microarchitecture level reliability characterization for NVIDIA and AMD GPUs / Vallero, A., Tselonis, S., Gizopoulos, D., Di Carlo, S.. - ELETTRONICO. - 2018:(2018), pp. 1-6. (36th IEEE VLSI Test Symposium, VTS 2018 San Francisca, CA (USA) 22-25 April 2018) [10.1109/VTS.2018.8368665]. 1-gen-2018 Vallero, AlessandroDi Carlo, Stefano + PID5222961.pdf
Securing bitstream integrity, confidentiality and authenticity in reconfigurable mobile heterogeneous systems / Carelli, A., Cristofanini, C.A., Vallero, A., Basile, C., Prinetto, P., Di Carlo, S.. - STAMPA. - (2018), pp. 1-6. (IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR 2018) Cluj-Napoca (Romania) 24-26 May 2018) [10.1109/AQTR.2018.8402795]. 1-gen-2018 Carelli, AlbertoVALLERO, ALESSANDROBasile, CataldoPrinetto, PaoloDi Carlo, Stefano + AQTR2018_SecureBitstream.pdf
Shielding Performance Monitor Counters: A double edged weapon for safety and security / Carelli, A., Vallero, A., Di Carlo, S.. - STAMPA. - (2018), pp. 269-274. (24th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2018 Platja d'Aro, Spain 2-4 July 2018) [10.1109/IOLTS.2018.8474191]. 1-gen-2018 Carelli, AlbertoVallero, AlessandroDi Carlo, Stefano bare_conf.pdf
Trading-off reliability and performance in FPGA-based reconfigurable heterogeneous systems / Vallero, A., Carelli, A., Di Carlo, S.. - ELETTRONICO. - (2018), pp. 1-6. (13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018 Taormina, Italy 9-12 April 2018) [10.1109/DTIS.2018.8368557]. 1-gen-2018 Vallero, AlessandroCarelli, AlbertoDi Carlo, Stefano TradingFPGA-DTIS-2018.pdf
Microarchitecture level reliability comparison of modern GPU designs: First findings / Vallero, A., DI CARLO, S., Tselonis, S., Gizopoulos, D.. - STAMPA. - (2017), pp. 129-130. (2017 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS 2017) USA 24-25 April 2017) [10.1109/ISPASS.2017.7975280]. 1-gen-2017 VALLERO, ALESSANDRODI CARLO, STEFANO + PID4694323.pdf
SIFI: AMD southern islands GPU microarchitectural level fault injector / Vallero, A., Gizopoulos, D., Di Carlo, S.. - STAMPA. - (2017), pp. 138-144. (23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017 Hotel Makedonia Palace, Thessaloniki (Greece) 21 September 2017) [10.1109/IOLTS.2017.8046209]. 1-gen-2017 Vallero, AlessandroDi Carlo, Stefano + IOLTS2017-SIFI-PostDraft.pdf
Cross-layer system reliability assessment framework for hardware faults / Vallero, A., Savino, A., Politano, G.M.M., DI CARLO, S., Chatzidimitriou, A., Tselonis, S., Kaliorakis, M., Gizopoulos, D., Riera, M., Canal, R., Gonzalez, A., Kooli, M., Bosio, A., Di Natale, G.. - ELETTRONICO. - (2016), pp. 1-10. (47th IEEE International Test Conference (ITC) Forth Worth, TX, USA 2016) [10.1109/TEST.2016.7805863]. 1-gen-2016 VALLERO, ALESSANDROSAVINO, ALESSANDROPOLITANO, GIANFRANCO MICHELE MARIADI CARLO, STEFANO + TEST.2016.BayesianAuthor.pdf
Early Component-Based System Reliability Analysis for Approximate Computing Systems / Vallero, A., Savino, A., Politano, G.M.M., DI CARLO, S., Chatzidimitriou, A., Tselonis, S., Kaliorakis, M., Gizopoulos, D., Riera, M., Canal, R., Gonzalez, A., Kooli, M., Bosio, A., Di Natale, G.. - ELETTRONICO. - (2016), pp. 1-4. (2nd Workshop On Approximate Computing (WAPCO) Prague, CZ 20 Jan. 2016) [10.13140/RG.2.1.3883.5604]. 1-gen-2016 VALLERO, ALESSANDROSAVINO, ALESSANDROPOLITANO, GIANFRANCO MICHELE MARIADI CARLO, STEFANO + 2016.WAPCO.Bayesian.pdf
RIIF-2: Toward the next generation reliability information interchange format / Savino, A., DI CARLO, S., Vallero, A., Politano, G.M.M., Gizopoulos, D., Evans, A.. - ELETTRONICO. - (2016), pp. 173-178. (22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016 Sant Feliu de Guixols, Spain 4-6 July 2016) [10.1109/IOLTS.2016.7604693]. 1-gen-2016 SAVINO, ALESSANDRODI CARLO, STEFANOVALLERO, ALESSANDROPOLITANO, GIANFRANCO MICHELE MARIA + IOLTS_camera_ready_V3.pdf
A Bayesian model for system level reliability estimation / Vallero, A., Savino, A., Tselonis, S., Foutris, N., Kaliorakis, M., Politano, G.M.M., Gizopoulos, D., DI CARLO, S.. - ELETTRONICO. - (2015), pp. 1-2. (20th IEEE European Test Symposium (ETS) Cluj-Napoca, RO 25-29 May 2015) [10.1109/ETS.2015.7138745]. 1-gen-2015 VALLERO, ALESSANDROSAVINO, ALESSANDROPOLITANO, GIANFRANCO MICHELE MARIADI CARLO, STEFANO + ETS.2015.Bayesian.pdf
A novel methodology to increase fault tolerance in autonomous FPGA-based systems / DI CARLO, S., Gambardella, G., Prinetto, P.E., Rolfo, D., Trotta, P., Vallero, A.. - STAMPA. - (2014), pp. 87-92. (IEEE 20th International On-Line Testing Symposium (IOLTS) Platja d'Aro, Girona (ES) 7-9 July 2014) [10.1109/IOLTS.2014.6873677]. 1-gen-2014 DI CARLO, STEFANOGAMBARDELLA, GIULIOPRINETTO, Paolo ErnestoROLFO, DANIELETROTTA, PASCALVALLERO, ALESSANDRO IOLTS.2014.DPR.pdf
Cross-Layer Early Reliability Evaluation for the Computing cOntinuum / DI CARLO, S., Vallero, A., Gizopoulos, D., Di Natale, G., Grasset, A., Mariani, R., Reichenbach, F.. - STAMPA. - (2014), pp. 199-205. (17th Euromicro Conference on Digital System Design (DSD) Verona, IT 27-29 Aug. 2014) [10.1109/DSD.2014.65]. 1-gen-2014 DI CARLO, STEFANOVALLERO, ALESSANDRO + DSD_2014_Clereco.pdf
Cross-layer early reliability evaluation: Challenges and promises / DI CARLO, S., Vallero, A., Gizopoulos, D., Di Natale, G., Gonzalez, A., Canal, R., Mariani, R., Pipponzi, M., Grasset, A., Bonnot, F., Reichenbach, F., Rafiq, G., Loekstad, T.. - STAMPA. - (2014), pp. 228-233. (IEEE 20th International On-Line Testing Symposium (IOLTS) Platja d'Aro, Girona (ES) 7-9 July 2014) [10.1109/IOLTS.2014.6873704]. 1-gen-2014 DI CARLO, STEFANOVALLERO, ALESSANDRO + IOLTS_Clereco_2014.pdf