This paper describes the joint effort of the two FP7 EU projects CLERECO and MoRV toward the definition of an extended reliability information exchange format able to manage reliability information for the full system stack, from technology up to the software level. The paper starts from the RIIF language initiative, proposing a set of new features to improve the expression power of the language and to extend it to the software layer of a system. The proposed extended reliability information exchange format named RIIF-2 has the potential to support the development of next generation reliability analysis tools that will help to fully include reliability evaluation into an automated design flow, pushing cross-layer reliability considerations at the same level of importance as area, timing and power consumption when performing design exploration for new products.
RIIF-2: Toward the next generation reliability information interchange format / Savino, Alessandro; DI CARLO, Stefano; Vallero, Alessandro; Politano, GIANFRANCO MICHELE MARIA; Gizopoulos, D.; Evans, A.. - ELETTRONICO. - (2016), pp. 173-178. (Intervento presentato al convegno 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016 tenutosi a Sant Feliu de Guixols, Spain nel 4-6 July 2016) [10.1109/IOLTS.2016.7604693].
RIIF-2: Toward the next generation reliability information interchange format
SAVINO, ALESSANDRO;DI CARLO, STEFANO;VALLERO, ALESSANDRO;POLITANO, GIANFRANCO MICHELE MARIA;
2016
Abstract
This paper describes the joint effort of the two FP7 EU projects CLERECO and MoRV toward the definition of an extended reliability information exchange format able to manage reliability information for the full system stack, from technology up to the software level. The paper starts from the RIIF language initiative, proposing a set of new features to improve the expression power of the language and to extend it to the software layer of a system. The proposed extended reliability information exchange format named RIIF-2 has the potential to support the development of next generation reliability analysis tools that will help to fully include reliability evaluation into an automated design flow, pushing cross-layer reliability considerations at the same level of importance as area, timing and power consumption when performing design exploration for new products.File | Dimensione | Formato | |
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https://hdl.handle.net/11583/2670016
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