A key enabler of real applications on approximate computing systems is the availability of instruments to analyze system reliability, early in the design cycle. Accurately measuring the impact on system reliability of any change in the technology, circuits, microarchitecture and software is most of the time a multi-team multi-objective problem and reliability must be traded off against other crucial design attributes (or objectives) such as power, performance and cost. Unfortunately, tools and models for cross-layer reliability analysis are still at their early stages compared to other very mature design tools and this represents a major issue for mainstream applications. This paper presents preliminary information on a cross-layer framework built on top of a Bayesian model designed to perform component-based reliability analysis of complex systems.

Early Component-Based System Reliability Analysis for Approximate Computing Systems / Vallero, Alessandro; Savino, Alessandro; Politano, GIANFRANCO MICHELE MARIA; DI CARLO, Stefano; Chatzidimitriou, A.; Tselonis, S.; Kaliorakis, M.; Gizopoulos, D.; Riera, M.; Canal, R.; Gonzalez, A.; Kooli, M.; Bosio, A.; Di Natale, G.. - ELETTRONICO. - (2016), pp. 1-4. (Intervento presentato al convegno 2nd Workshop On Approximate Computing (WAPCO) tenutosi a Prague, CZ nel 20 Jan. 2016) [10.13140/RG.2.1.3883.5604].

Early Component-Based System Reliability Analysis for Approximate Computing Systems

VALLERO, ALESSANDRO;SAVINO, ALESSANDRO;POLITANO, GIANFRANCO MICHELE MARIA;DI CARLO, STEFANO;
2016

Abstract

A key enabler of real applications on approximate computing systems is the availability of instruments to analyze system reliability, early in the design cycle. Accurately measuring the impact on system reliability of any change in the technology, circuits, microarchitecture and software is most of the time a multi-team multi-objective problem and reliability must be traded off against other crucial design attributes (or objectives) such as power, performance and cost. Unfortunately, tools and models for cross-layer reliability analysis are still at their early stages compared to other very mature design tools and this represents a major issue for mainstream applications. This paper presents preliminary information on a cross-layer framework built on top of a Bayesian model designed to perform component-based reliability analysis of complex systems.
File in questo prodotto:
File Dimensione Formato  
2016.WAPCO.Bayesian.pdf

accesso aperto

Tipologia: 2. Post-print / Author's Accepted Manuscript
Licenza: PUBBLICO - Tutti i diritti riservati
Dimensione 451.69 kB
Formato Adobe PDF
451.69 kB Adobe PDF Visualizza/Apri
Pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2641082
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo