TURCO, VITTORIO

TURCO, VITTORIO  

Dipartimento di Automatica e Informatica  

067530  

Mostra records
Risultati 1 - 5 di 5 (tempo di esecuzione: 0.008 secondi).
Citazione Data di pubblicazione Autori File
APSS Metrics for Fault Detection: Area, Position, Symmetry, and Shape in Image Segmentation / Turco, Vittorio; Fezza, Lorenzo; Ruospo, Annachiara; Sanchez, Ernesto; Sonza Reorda, Matteo. - ELETTRONICO. - (2025). ( DFT 2025 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Barcellona (ESP) 21-23 October 2025) [10.1109/DFT66274.2025.11257474]. 1-gen-2025 Turco, VittorioFezza, LorenzoRuospo, AnnachiaraSanchez, ErnestoSonza Reorda, Matteo DFT25___Segmentation_metrics.pdfAPSS_Metrics_for_Fault_Detection_Area_Position_Symmetry_and_Shape_in_Image_Segmentation.pdf
DOC: Detection of On-Line Failures in CNNs / Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto. - ELETTRONICO. - (2025). ( Latin American Test Workshop, LATW San Andrés (COL) 11-14 March 2025) [10.1109/LATS65346.2025.10963935]. 1-gen-2025 Turco VittorioNicolò BellarminoAnnachiara RuospoCantoro RiccardoErnesto Sanchez LATS2025_On_line_detection (3).pdfDOC_Detection_of_On-Line_Failures_in_CNNs.pdf
Special Session: Trustworthy Hardware-AI at the Cloud / Angione, Francesco; Bernardi, Paolo; Bosio, Alberto; Dattatraya Dixit, Harish; Pappalardo, Salvatore; Ruospo, Annachiara; Sanchez, Ernesto; Sinha, Arani; Turco, Vittorio. - ELETTRONICO. - (2025). ( IEEE VLSI Test Symposium 2025 Tempe, Arizona (USA) 28-30 April 2025) [10.1109/VTS65138.2025.11022869]. 1-gen-2025 Francesco AngionePaolo BernardiAnnachiara RuospoErnesto SanchezVittorio Turco + VTS25___Special_Session.pdfSpecial_Session_Trustworthy_Hardware-AI_at_the_Cloud.pdf
Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics / Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.. - ELETTRONICO. - (2024), pp. 13-18. ( 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) Kielce (POL) 03-05 April 2024) [10.1109/DDECS60919.2024.10508918]. 1-gen-2024 Turco V.Ruospo A.Sanchez E.Sonza Reorda M. Early_Detection_of_Permanent_Faults_in_DNNs_Through_the_Application_of_Tensor-Related_Metrics.pdf
Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries / Turco, V.; Ruospo, A.; Gavarini, G.; Sanchez, E.; Sonza Reorda, M.. - (2023). ( International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Juan-Les-Pins (FR) 03-05 October 2023) [10.1109/DFT59622.2023.10313530]. 1-gen-2023 V. TurcoA. RuospoG. GavariniE. SanchezM. Sonza Reorda Uncovering_hidden_vulnerabilities_in_CNNs_through_evolutionary-based_Image_Test_Libraries.pdf