Archivio Istituzionale della RicercaTURCO, VITTORIO
TURCO, VITTORIO
Dipartimento di Automatica e Informatica
067530
Advances in Testing and Reliability Benchmarks
2026 Angione, Francesco; Bernardi, Paolo; Giardino, Nicola Di Gruttola; Filipponi, Gabriele; Iaria, Giusy; Perlo, Giacomo; Pomeranz, Irith; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Turco, Vittorio
APSS Metrics for Fault Detection: Area, Position, Symmetry, and Shape in Image Segmentation
2025 Turco, Vittorio; Fezza, Lorenzo; Ruospo, Annachiara; Sanchez, Ernesto; Sonza Reorda, Matteo
DOC: Detection of On-Line Failures in CNNs
2025 Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto
Special Session: Trustworthy Hardware-AI at the Cloud
2025 Angione, Francesco; Bernardi, Paolo; Bosio, Alberto; Dattatraya Dixit, Harish; Pappalardo, Salvatore; Ruospo, Annachiara; Sanchez, Ernesto; Sinha, Arani; Turco, Vittorio
Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics
2024 Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.
Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries
2023 Turco, V.; Ruospo, A.; Gavarini, G.; Sanchez, E.; Sonza Reorda, M.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Advances in Testing and Reliability Benchmarks / Angione, F., Bernardi, P., Giardino, N.D.G., Filipponi, G., Iaria, G., Perlo, G., Pomeranz, I., Porsia, A., Ruospo, A., Sanchez, E., Turco, V.. - (2026), pp. 1-10. (31st IEEE European Test Symposium, ETS 2026 Chania (GRC) 25-29 May 2026) [10.1109/ets69887.2026.11591740]. | 1-gen-2026 | Angione, FrancescoBernardi, PaoloGiardino, Nicola Di GruttolaFilipponi, GabrieleIaria, GiusyPerlo, GiacomoPorsia, AntonioRuospo, AnnachiaraSanchez, ErnestoTurco, Vittorio + | Advances_in_Testing_and_Reliability_Benchmarks.pdf |
| APSS Metrics for Fault Detection: Area, Position, Symmetry, and Shape in Image Segmentation / Turco, V., Fezza, L., Ruospo, A., Sanchez, E., Sonza Reorda, M.. - ELETTRONICO. - (2025). (DFT 2025 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Barcellona (ESP) 21-23 October 2025) [10.1109/DFT66274.2025.11257474]. | 1-gen-2025 | Turco, VittorioFezza, LorenzoRuospo, AnnachiaraSanchez, ErnestoSonza Reorda, Matteo | DFT25___Segmentation_metrics.pdf; APSS_Metrics_for_Fault_Detection_Area_Position_Symmetry_and_Shape_in_Image_Segmentation.pdf |
| DOC: Detection of On-Line Failures in CNNs / Turco, V., Bellarmino, N., Ruospo, A., Cantoro, R., Sanchez, E.. - ELETTRONICO. - (2025). (Latin American Test Workshop, LATW San Andrés (COL) 11-14 March 2025) [10.1109/LATS65346.2025.10963935]. | 1-gen-2025 | Turco VittorioNicolò BellarminoAnnachiara RuospoCantoro RiccardoErnesto Sanchez | LATS2025_On_line_detection (3).pdf; DOC_Detection_of_On-Line_Failures_in_CNNs.pdf |
| Special Session: Trustworthy Hardware-AI at the Cloud / Angione, F., Bernardi, P., Bosio, A., Dattatraya Dixit, H., Pappalardo, S., Ruospo, A., Sanchez, E., Sinha, A., Turco, V.. - ELETTRONICO. - (2025). (IEEE VLSI Test Symposium 2025 Tempe, Arizona (USA) 28-30 April 2025) [10.1109/VTS65138.2025.11022869]. | 1-gen-2025 | Francesco AngionePaolo BernardiAnnachiara RuospoErnesto SanchezVittorio Turco + | VTS25___Special_Session.pdf; Special_Session_Trustworthy_Hardware-AI_at_the_Cloud.pdf |
| Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics / Turco, V., Ruospo, A., Sanchez, E., Sonza Reorda, M.. - ELETTRONICO. - (2024), pp. 13-18. (2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) Kielce (POL) 03-05 April 2024) [10.1109/DDECS60919.2024.10508918]. | 1-gen-2024 | Turco V.Ruospo A.Sanchez E.Sonza Reorda M. | Early_Detection_of_Permanent_Faults_in_DNNs_Through_the_Application_of_Tensor-Related_Metrics.pdf |
| Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries / Turco, V., Ruospo, A., Gavarini, G., Sanchez, E., Sonza Reorda, M.. - (2023). (International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Juan-Les-Pins (FR) 03-05 October 2023) [10.1109/DFT59622.2023.10313530]. | 1-gen-2023 | V. TurcoA. RuospoG. GavariniE. SanchezM. Sonza Reorda | Uncovering_hidden_vulnerabilities_in_CNNs_through_evolutionary-based_Image_Test_Libraries.pdf |