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Reliability Assessment of Nanoscale System on Chip Depending on Neturon Irradiation
2023 Yang, Weitao; Li, Yang; Hu, Zhiliang; He, Chaohui; Cai, Jiale; Wu, Longsheng
Research on Reliability of Nanoscale System on Chips
2022 Yang, Weitao
Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis
2021 Yang, Weitao; Du, Boyang; He, Chaohui; Sterpone, Luca
A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit
2020 Azimi, Sarah; DE SIO, Corrado; Yang, Weitao; Sterpone, Luca
Electron inducing soft errors in 28 nm system-on-Chip
2020 Yang, W.; Li, Y.; Zhang, W.; Guo, Y.; Zhao, H.; Wei, J.; Li, Y.; He, C.; Chen, K.; Guo, G.; Du, B.; Sterpone, L.
Investigation of Single Event Effect in 28nm System-on-Chip with Multi Patterns
2020 Yang, Weitao; Li, Yong-hong; Guo, Ya-xin; Zhao, Hao-yu; Li, Yang; Li, Pei; He, Chao-hui; Guo, Gang; Liu, Jie; Yang, Sheng-Sheng; An, Heng
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Reliability Assessment of Nanoscale System on Chip Depending on Neturon Irradiation / Yang, Weitao; Li, Yang; Hu, Zhiliang; He, Chaohui; Cai, Jiale; Wu, Longsheng. - In: ELECTRONICS. - ISSN 2079-9292. - (2023). | 1-gen-2023 | Weitao,YangJiale,Cai + | AIP-Reliability Evaluation-20220207.pdf |
| Research on Reliability of Nanoscale System on Chips / Yang, Weitao. - (2022 Jan 21), pp. 1-127. | 21-gen-2022 | YANG, WEITAO | Weitao_Yang-Dissertation-Final.pdf; Weitao_Yang-Dissertation-Abstract-Eng.pdf |
| Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis / Yang, Weitao; Du, Boyang; He, Chaohui; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 120 (114122):(2021). [10.1016/j.microrel.2021.114122] | 1-gen-2021 | Yang, WeitaoDu, BoyangSterpone, Luca + | 1-s2.0-S0026271421000883-main.pdf |
| A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit / Azimi, Sarah; DE SIO, Corrado; Yang, Weitao; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 311-314. (Intervento presentato al convegno 18th IEEE International NEWCAS tenutosi a Montreal, Canada nel June 16-19, 2020) [10.1109/NEWCAS49341.2020.9159844]. | 1-gen-2020 | Sarah AzimiCorrado De SioWeitao YangLuca Sterpone | NEWCAS_2020.pdf; 09159844.pdf |
| Electron inducing soft errors in 28 nm system-on-Chip / Yang, W.; Li, Y.; Zhang, W.; Guo, Y.; Zhao, H.; Wei, J.; Li, Y.; He, C.; Chen, K.; Guo, G.; Du, B.; Sterpone, L.. - In: RADIATION EFFECTS AND DEFECTS IN SOLIDS. - ISSN 1042-0150. - 175:7-8(2020), pp. 745-754. [10.1080/10420150.2020.1759067] | 1-gen-2020 | Yang W.Du B.Sterpone L. + | Electron inducing soft errors in 28 nm system on Chip.pdf |
| Investigation of Single Event Effect in 28nm System-on-Chip with Multi Patterns / Yang, Weitao; Li, Yong-hong; Guo, Ya-xin; Zhao, Hao-yu; Li, Yang; Li, Pei; He, Chao-hui; Guo, Gang; Liu, Jie; Yang, Sheng-Sheng; An, Heng. - In: CHINESE PHYSICS B. - ISSN 1674-1056. - ELETTRONICO. - 29:10(2020). [10.1088/1674-1056/ab99b8] | 1-gen-2020 | Yang, Weitao + | Chinese Physics B.pdf; 200930-final proof.pdf |