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CAI, JIALE
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Risultati 1 - 4 di 4 (tempo di esecuzione: 0.004 secondi).
Design of the Readout Chip with Multi-Energy Bins for Spectroscopic X-ray Imaging
2024 Cai, Jiale
Reliability Assessment of Nanoscale System on Chip Depending on Neturon Irradiation
2023 Yang, Weitao; Li, Yang; Hu, Zhiliang; He, Chaohui; Cai, Jiale; Wu, Longsheng
A 64-channel high-time resolution digital waveform sampling electronic system based on DRS4 for positron burst annihilation lifetime measurement
2022 Wang, M.; Bian, Z.; Wang, Y.; Li, D.; Li, X.; Cai, J.; Wang, P.; Wang, B.; Cao, X.; Zhang, Z.; Kuang, P.; Liu, F.; Zhang, H.; Yu, X.; Chen, T.; Yun, X.; Wei, L.
A readout chip for spectroscopic X-ray imaging in photon-counting pixel detector
2022 Cai, Jiale
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Design of the Readout Chip with Multi-Energy Bins for Spectroscopic X-ray Imaging / Cai, Jiale. - (2024 May 21), pp. 1-114. | 21-mag-2024 | CAI, JIALE | conv_phd_thesis_jialecai_final.pdf; conv_abstract.pdf |
| Reliability Assessment of Nanoscale System on Chip Depending on Neturon Irradiation / Yang, Weitao; Li, Yang; Hu, Zhiliang; He, Chaohui; Cai, Jiale; Wu, Longsheng. - In: ELECTRONICS. - ISSN 2079-9292. - (2023). | 1-gen-2023 | Weitao,YangJiale,Cai + | AIP-Reliability Evaluation-20220207.pdf |
| A 64-channel high-time resolution digital waveform sampling electronic system based on DRS4 for positron burst annihilation lifetime measurement / Wang, M.; Bian, Z.; Wang, Y.; Li, D.; Li, X.; Cai, J.; Wang, P.; Wang, B.; Cao, X.; Zhang, Z.; Kuang, P.; Liu, F.; Zhang, H.; Yu, X.; Chen, T.; Yun, X.; Wei, L.. - In: JOURNAL OF INSTRUMENTATION. - ISSN 1748-0221. - 17:10(2022), p. T10001. [10.1088/1748-0221/17/10/T10001] | 1-gen-2022 | Cai J.Wang P.Cao X.Chen T. + | Wang_2022_J._Inst._17_T10001.pdf |
| A readout chip for spectroscopic X-ray imaging in photon-counting pixel detector / Cai, Jiale. - ELETTRONICO. - (2022). (Intervento presentato al convegno 2022 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector (RTSD) Conference tenutosi a Italy nel 05-12 November 2022) [10.1109/NSS/MIC44845.2022.10399218]. | 1-gen-2022 | Jiale Cai | 2022259912 .pdf; Cai-AReadout.pdf |