YANG, WEITAO

YANG, WEITAO  

Dipartimento di Automatica e Informatica  

060603  

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Citazione Data di pubblicazione Autori File
Reliability Assessment of Nanoscale System on Chip Depending on Neturon Irradiation / Yang, W., Li, Y., Hu, Z., He, C., Cai, J., Wu, L.. - In: ELECTRONICS. - ISSN 2079-9292. - (2023). 1-gen-2023 Weitao,YangJiale,Cai + AIP-Reliability Evaluation-20220207.pdf
Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis / Yang, W., Du, B., He, C., Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 120 (114122):(2021). [10.1016/j.microrel.2021.114122] 1-gen-2021 Yang, WeitaoDu, BoyangSterpone, Luca + 1-s2.0-S0026271421000883-main.pdf
Electron inducing soft errors in 28 nm system-on-Chip / Yang, W., Li, Y., Zhang, W., Guo, Y., Zhao, H., Wei, J., Li, Y., He, C., Chen, K., Guo, G., Du, B., Sterpone, L.. - In: RADIATION EFFECTS AND DEFECTS IN SOLIDS. - ISSN 1042-0150. - 175:7-8(2020), pp. 745-754. [10.1080/10420150.2020.1759067] 1-gen-2020 Yang W.Du B.Sterpone L. + Electron inducing soft errors in 28 nm system on Chip.pdf
Investigation of Single Event Effect in 28nm System-on-Chip with Multi Patterns / Yang, W., Li, Y., Guo, Y., Zhao, H., Li, Y., Li, P., He, C., Guo, G., Liu, J., Yang, S., An, H.. - In: CHINESE PHYSICS B. - ISSN 1674-1056. - ELETTRONICO. - 29:10(2020). [10.1088/1674-1056/ab99b8] 1-gen-2020 Yang, Weitao + Chinese Physics B.pdf200930-final proof.pdf