ANGIONE, FRANCESCO
 Distribuzione geografica
Continente #
EU - Europa 616
NA - Nord America 348
AS - Asia 158
AF - Africa 3
SA - Sud America 3
OC - Oceania 1
Totale 1.129
Nazione #
IT - Italia 426
US - Stati Uniti d'America 346
CN - Cina 55
SG - Singapore 49
FR - Francia 35
DE - Germania 31
IE - Irlanda 28
BE - Belgio 20
GB - Regno Unito 17
RU - Federazione Russa 16
HK - Hong Kong 12
TR - Turchia 12
FI - Finlandia 9
ID - Indonesia 9
NL - Olanda 9
CH - Svizzera 7
JO - Giordania 7
JP - Giappone 4
KR - Corea 4
AT - Austria 3
BG - Bulgaria 3
CZ - Repubblica Ceca 3
CA - Canada 2
EG - Egitto 2
ES - Italia 2
GR - Grecia 2
IR - Iran 2
LT - Lituania 2
NO - Norvegia 2
TW - Taiwan 2
AU - Australia 1
BR - Brasile 1
CO - Colombia 1
DK - Danimarca 1
IN - India 1
PE - Perù 1
SN - Senegal 1
TH - Thailandia 1
Totale 1.129
Città #
Turin 180
Council Bluffs 54
Boardman 41
Milan 41
Chandler 38
Singapore 37
Ashburn 28
Dublin 28
Torino 28
Brussels 20
Santa Clara 19
Collegno 16
Rome 16
Paris 15
Munich 14
Varese 13
Beijing 12
Istanbul 11
Southend 9
Princeton 8
Bern 7
Helsinki 7
Ivrea 7
Piscataway 7
Seattle 7
Tappahannock 7
Shanghai 6
Cinisello Balsamo 5
Houston 5
Agugliano 4
Berlin 4
Cadoneghe 4
Plano 4
Redmond 4
Amsterdam 3
Borgosesia 3
Central 3
Duncan 3
Frankfurt am Main 3
Jakarta 3
London 3
Martinsicuro 3
Palermo 3
Perugia 3
San Cipriano Picentino 3
Shenzhen 3
Sofia 3
St Petersburg 3
Vienna 3
Wilmington 3
Aosta 2
Athens 2
Aversa 2
Baotou 2
Barcelona 2
Faenza 2
Fuzhou 2
Grenoble 2
Grugliasco 2
Guiyang 2
Lappeenranta 2
Minoh 2
Moncalieri 2
Mongrando 2
Rennes 2
Stuttgart 2
Tsing Yi Town 2
Valdagno 2
Yubileyny 2
Ōita 2
Alexandria 1
Ariano Irpino 1
Bangkok 1
Boydton 1
Bremen 1
Brindisi 1
Brisbane 1
Capaccio 1
Civitanova Marche 1
Clifton 1
Dronero 1
Fairfield 1
Fasano 1
Felitto 1
Fisciano 1
Florence 1
Fürth 1
Genoa 1
Giza 1
Grosseto 1
Hong Kong 1
Hsinchu 1
Italy 1
Izmir 1
Libertyville 1
Maarssen 1
Minneapolis 1
Novara 1
Oslo 1
Ottawa 1
Totale 824
Nome #
Test, Reliability and Functional Safety trends for Automotive System-on-Chip 267
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip 139
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip 113
An innovative Strategy to Quickly Grade Functional Test Programs 104
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level 84
A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems 74
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems 72
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip 72
A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips 70
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress 65
A guided debugger-based fault injection methodology for assessing functional test programs 45
Optimizing System-Level Test Program Generation via Genetic Programming 42
A System-Level Test Methodology for Communication Peripherals in System-on-Chips 20
Totale 1.167
Categoria #
all - tutte 4.174
article - articoli 654
book - libri 0
conference - conferenze 3.520
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 8.348


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022145 0 0 0 0 0 0 0 28 24 13 47 33
2022/2023388 5 17 87 23 37 56 28 15 45 4 32 39
2023/2024309 22 47 36 11 30 55 21 17 14 16 22 18
2024/2025325 16 86 41 105 77 0 0 0 0 0 0 0
Totale 1.167