ANGIONE, FRANCESCO
 Distribuzione geografica
Continente #
EU - Europa 495
NA - Nord America 253
AS - Asia 105
SA - Sud America 3
AF - Africa 2
OC - Oceania 1
Totale 859
Nazione #
IT - Italia 351
US - Stati Uniti d'America 253
CN - Cina 45
DE - Germania 30
IE - Irlanda 26
SG - Singapore 26
FR - Francia 21
BE - Belgio 18
GB - Regno Unito 13
HK - Hong Kong 12
CH - Svizzera 7
FI - Finlandia 7
JO - Giordania 7
NL - Olanda 7
ID - Indonesia 6
JP - Giappone 4
RU - Federazione Russa 4
BG - Bulgaria 3
ES - Italia 2
GR - Grecia 2
IR - Iran 2
AT - Austria 1
AU - Australia 1
BR - Brasile 1
CO - Colombia 1
CZ - Repubblica Ceca 1
DK - Danimarca 1
EG - Egitto 1
NO - Norvegia 1
PE - Perù 1
SN - Senegal 1
TH - Thailandia 1
TR - Turchia 1
TW - Taiwan 1
Totale 859
Città #
Turin 149
Council Bluffs 54
Chandler 38
Milan 30
Boardman 29
Torino 28
Ashburn 27
Dublin 26
Brussels 18
Collegno 16
Rome 16
Singapore 16
Munich 14
Varese 13
Beijing 12
Southend 9
Princeton 8
Bern 7
Piscataway 7
Seattle 7
Tappahannock 7
Helsinki 6
Shanghai 6
Houston 5
Paris 5
Agugliano 4
Berlin 4
Cadoneghe 4
Plano 4
Redmond 4
Central 3
Duncan 3
Martinsicuro 3
Palermo 3
Perugia 3
San Cipriano Picentino 3
Shenzhen 3
Sofia 3
St Petersburg 3
Wilmington 3
Aosta 2
Athens 2
Aversa 2
Baotou 2
Barcelona 2
Faenza 2
Frankfurt am Main 2
Fuzhou 2
Grugliasco 2
Guiyang 2
Minoh 2
Moncalieri 2
Mongrando 2
Rennes 2
Stuttgart 2
Tsing Yi Town 2
Valdagno 2
Ōita 2
Amsterdam 1
Ariano Irpino 1
Bangkok 1
Boydton 1
Bremen 1
Brindisi 1
Brisbane 1
Civitanova Marche 1
Clifton 1
Dronero 1
Fairfield 1
Fasano 1
Fürth 1
Genoa 1
Giza 1
Grosseto 1
Hong Kong 1
Italy 1
Izmir 1
Lappeenranta 1
Libertyville 1
London 1
Maarssen 1
Minneapolis 1
Novara 1
Puente Piedra 1
Saluzzo 1
Stio 1
Strambino 1
Sunnyvale 1
São Paulo 1
Taastrup 1
Taipei 1
Tunja 1
Vienna 1
Vigevano 1
Volpiano 1
Washington 1
Totale 677
Nome #
Test, Reliability and Functional Safety trends for Automotive System-on-Chip 247
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip 117
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip 101
An innovative Strategy to Quickly Grade Functional Test Programs 85
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level 73
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip 60
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems 57
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress 53
A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips 52
A guided debugger-based fault injection methodology for assessing functional test programs 26
Optimizing System-Level Test Program Generation via Genetic Programming 16
Totale 887
Categoria #
all - tutte 3.233
article - articoli 473
book - libri 0
conference - conferenze 2.760
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 6.466


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022145 0 0 0 0 0 0 0 28 24 13 47 33
2022/2023388 5 17 87 23 37 56 28 15 45 4 32 39
2023/2024309 22 47 36 11 30 55 21 17 14 16 22 18
2024/202545 16 29 0 0 0 0 0 0 0 0 0 0
Totale 887