ANGIONE, FRANCESCO
 Distribuzione geografica
Continente #
EU - Europa 462
NA - Nord America 238
AS - Asia 63
SA - Sud America 3
AF - Africa 2
OC - Oceania 1
Totale 769
Nazione #
IT - Italia 333
US - Stati Uniti d'America 238
DE - Germania 30
CN - Cina 26
IE - Irlanda 24
FR - Francia 20
GB - Regno Unito 13
BE - Belgio 12
HK - Hong Kong 12
CH - Svizzera 7
JO - Giordania 7
FI - Finlandia 6
ID - Indonesia 6
NL - Olanda 5
JP - Giappone 4
RU - Federazione Russa 4
SG - Singapore 4
BG - Bulgaria 3
GR - Grecia 2
IR - Iran 2
AU - Australia 1
BR - Brasile 1
CO - Colombia 1
CZ - Repubblica Ceca 1
DK - Danimarca 1
EG - Egitto 1
NO - Norvegia 1
PE - Perù 1
SN - Senegal 1
TH - Thailandia 1
TW - Taiwan 1
Totale 769
Città #
Turin 141
Council Bluffs 51
Chandler 38
Torino 28
Ashburn 27
Milan 26
Boardman 24
Dublin 24
Collegno 16
Rome 15
Munich 14
Varese 13
Beijing 12
Brussels 12
Southend 9
Princeton 8
Bern 7
Seattle 7
Tappahannock 7
Helsinki 6
Houston 5
Shanghai 5
Agugliano 4
Berlin 4
Cadoneghe 4
Paris 4
Plano 4
Redmond 4
Central 3
Duncan 3
Martinsicuro 3
Palermo 3
Perugia 3
San Cipriano Picentino 3
Shenzhen 3
Sofia 3
St Petersburg 3
Wilmington 3
Aosta 2
Athens 2
Aversa 2
Baotou 2
Faenza 2
Frankfurt am Main 2
Grugliasco 2
Guiyang 2
Minoh 2
Moncalieri 2
Mongrando 2
Rennes 2
Stuttgart 2
Tsing Yi Town 2
Valdagno 2
Ōita 2
Ariano Irpino 1
Bangkok 1
Boydton 1
Bremen 1
Brindisi 1
Brisbane 1
Clifton 1
Dronero 1
Fairfield 1
Fasano 1
Fürth 1
Genoa 1
Giza 1
Grosseto 1
Hong Kong 1
Italy 1
Libertyville 1
London 1
Minneapolis 1
Novara 1
Piscataway 1
Puente Piedra 1
Saluzzo 1
Stio 1
Strambino 1
Sunnyvale 1
São Paulo 1
Taastrup 1
Taipei 1
Tunja 1
Vigevano 1
Volpiano 1
Totale 613
Nome #
Test, Reliability and Functional Safety trends for Automotive System-on-Chip 239
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip 105
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip 97
An innovative Strategy to Quickly Grade Functional Test Programs 78
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level 69
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip 56
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems 47
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress 47
A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips 35
A guided debugger-based fault injection methodology for assessing functional test programs 21
Totale 794
Categoria #
all - tutte 2.555
article - articoli 346
book - libri 0
conference - conferenze 2.209
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 5.110


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022145 0 0 0 0 0 0 0 28 24 13 47 33
2022/2023388 5 17 87 23 37 56 28 15 45 4 32 39
2023/2024261 22 47 36 11 30 55 21 17 14 8 0 0
Totale 794