PORTO @ Archivio Istituzionale della Ricerca

FERRERO, ANDREA PIERENRICO
 Distribuzione geografica
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Continente #
NA - Nord America 14.201
EU - Europa 10.725
AS - Asia 1.466
AF - Africa 93
SA - Sud America 53
OC - Oceania 11
Continente sconosciuto - Info sul continente non disponibili 5
Totale 26.554
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Nazione #
US - Stati Uniti d'America 14.133
GB - Regno Unito 2.555
DE - Germania 1.826
FR - Francia 1.797
IT - Italia 1.710
UA - Ucraina 918
CN - Cina 691
IE - Irlanda 335
NL - Olanda 302
TR - Turchia 290
CH - Svizzera 257
RU - Federazione Russa 241
SE - Svezia 186
KR - Corea 159
FI - Finlandia 148
AT - Austria 126
MY - Malesia 75
BE - Belgio 65
JP - Giappone 63
IN - India 55
GR - Grecia 47
CA - Canada 46
ZA - Sudafrica 42
SN - Senegal 36
RO - Romania 35
VN - Vietnam 35
AP - ???statistics.table.value.countryCode.AP??? 31
CL - Cile 28
JO - Giordania 27
TW - Taiwan 22
ES - Italia 21
EU - Europa 20
PL - Polonia 20
IL - Israele 15
AE - Emirati Arabi Uniti 13
BG - Bulgaria 13
IR - Iran 13
BR - Brasile 12
HN - Honduras 12
NO - Norvegia 10
AU - Australia 9
SG - Singapore 9
PT - Portogallo 8
CZ - Repubblica Ceca 7
MX - Messico 7
EG - Egitto 5
HK - Hong Kong 5
HU - Ungheria 5
LT - Lituania 5
LV - Lettonia 5
VE - Venezuela 5
AR - Argentina 4
CO - Colombia 3
EE - Estonia 3
ID - Indonesia 3
MA - Marocco 3
PK - Pakistan 3
SA - Arabia Saudita 3
BY - Bielorussia 2
DK - Danimarca 2
GP - Guadalupe 2
KZ - Kazakistan 2
LK - Sri Lanka 2
NZ - Nuova Zelanda 2
OM - Oman 2
SC - Seychelles 2
TH - Thailandia 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AL - Albania 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
EC - Ecuador 1
ET - Etiopia 1
GH - Ghana 1
IQ - Iraq 1
MD - Moldavia 1
MK - Macedonia 1
NG - Nigeria 1
PH - Filippine 1
RS - Serbia 1
TN - Tunisia 1
Totale 26.554
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Città #
Ashburn 3.694
Southend 2.159
Seattle 1.361
Fairfield 1.227
Woodbridge 554
Chandler 512
Jacksonville 500
Cambridge 457
Houston 450
Wilmington 433
Ann Arbor 424
Princeton 420
Des Moines 338
Buffalo 329
Dublin 319
San Ramon 312
Berlin 257
Turin 247
Izmir 227
Bern 226
San Jose 201
Chicago 194
Beijing 171
San Francisco 165
Zhengzhou 159
Bologna 151
San Donato Milanese 142
Helsinki 141
Pennsylvania Furnace 125
Overberg 123
Vienna 122
Baltimore 119
Zaporozhye 103
Torino 91
Hangzhou 89
Monopoli 88
Saint Petersburg 80
Norwalk 74
Phoenix 70
Rome 67
Mountain View 66
Las Vegas 61
Milan 61
Shanghai 61
Redwood City 57
Padua 55
San Diego 51
Boardman 50
Malatya 49
Brussels 48
Amsterdam 44
Athens 41
Atlanta 39
Indiana 38
Seoul 36
Strassbourg 36
Muizenberg 35
New York 35
Clearwater 31
Costa Mesa 30
London 30
Putian 29
Melun 27
Frankfurt 25
Shenzhen 25
Guangzhou 24
Paris 24
Riva 24
Toronto 24
University Park 23
Fremont 21
Verona 21
Dong Ket 20
Los Angeles 20
Bangalore 19
Collegno 17
Renton 17
Andover 16
Dallas 16
Yellow Springs 16
Austin 15
Carshalton 15
Easton 15
Frankfurt Am Main 15
Hanoi 15
Kemerovo 15
Kuala Lumpur 15
Moscow 15
Seongnam 15
Munich 14
Naples 14
Nürnberg 14
Boulder 13
Henderson 13
Zurich 13
Delft 12
Taipei 12
Zhitomir 12
Galati 11
Miami 11
Totale 18.557
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Nome #
Two-port network analyzer calibration using an unknown 'thru' 556
A Comprehensive Mixed-Mode Time-Domain Load- and Source-Pull Measurement System 512
A Novel Calibration Algorithm for a Special Class of Multiport Vector Network Analyzers 419
A new class of nonuniform, broadband, nonsymmetrical rectangular coaxial-to-microstrip directional couplers for high power applications 413
Further Improvements in Real-Time Load-Pull Measurement Accuracy 383
Accuracy evaluation of on-wafer load-pull measurements 377
A Complete Noise- and Scattering-Parameters Test-Set 373
Accuracy Improvement of Real-Time Load-Pull Measurements 366
A new implementation of a multiport automatic network analyzer 362
Broad Band Coaxial Directional Couplers for High Power Applications 360
Generalized mixed-mode S-parameters 355
A Comparison of Uncertainty Evaluation Methods for On-Wafer S-Parameter Measurements 350
Accuracy of a multiport network analyzer 341
Multiport vector network analyzer calibration: a general formulation 340
Conformal Mapping Design Tools for Coaxial Couplers with Complex Cross Section 340
A Microwave System for Relative Humidity Measurement 339
Accurate coaxial standard verification by multiport vector network analyzer 337
Simple technique for measuring source reflection coefficient while characterizing active devices 334
A simple NWA calibration algorithm based on a transfer standard 332
Time domain reflectometry applied to MMIC passive component modeling 332
Microwave Multiport Measurements for the Digital World 330
A new, simple, test-set for on-wafer characterization of millimeter-wave electro-optic devices 329
Recent Advances in Real-Time Load-Pull Systems 324
Design of a broadband multiprobe reflectometer 322
On-Wafer Calibration Algorithm for Partially Leaky Multiport Vector Network Analyzers 316
A new approach to the design of wide-band multiprobe reflectometers 315
Novel hardware and software solutions for a complete linear and non-linear microwave device characterization 313
Testing microwave devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 310
A simplified algorithm for leaky network analyzer calibration 310
Harmonic load/source pull strategies for high efficiency PAs design 309
Simple Technique for source reflection coefficient measurement while characterizing active devices 292
An automated N-port network analyzer for linear and non linear multi-port RF and digital circuits 292
Multiport network analyzer self-calibration: a new approach and some interesting results 283
Design and realization of an on-wafer two port transfer standard 275
Modern RF and microwave measurement techniques 272
A Unified Theory for S-Parameter Uncertainty Evaluation 267
Accurate on-wafer power and harmonic measurements of mm-wave amplifiers and devices 266
In-fixture calibration of an S-parameter measuring system by means of time domain reflectometry 259
Novel software techniques for automatic microwave measurements 258
Large signal 2nd harmonic on wafer MESFET characterization 250
Comparison between a vector multiport network analyzer and the national S-parameter measurement system 249
Ottimizzazione della transizione tra linea coplanare e microstriscia per misure su wafer 234
Advanced load-pull techniques–From single-ended to multiport/differential measurement systems 223
Harmonic Load-Pull Techniques: An Overview of Modern Systems 222
Microwave Measurements – Part III. Advanced Non-Linear Measurements 219
Load- and source-pull techniques 217
A microwave interferometer system for humidity measurement 212
Multiport VNA Measurements 210
Multiport and differential S-parameter measurements 208
Fabrication and nonlinear characterization of GaN HEMTs on SiC and sapphire for high-power applications 208
Radio frequency and microwave linear and nonlinear characterization 205
A novel active differential/common-mode load for true mixed-mode load-pull systems 204
Miglioramento dell'accuratezza delle misure di load-pull real-time 202
A NOVEL METHODOLOGY FOR FAST HARMONIC-LOAD CONTROL WITH A PASSIVE TUNER AND AN ACTIVE LOOP 200
Active, closed-loop, harmonic source- and load-pull systems 194
Fabrication and non-linear load-pull characterization of GaN HEMT on SiC for high power applications 194
Software Solutions for Linear and Non-Linear Microwave Measurements and Calibrations 192
Testing devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 191
Active and Passive Load Pull systems: from the basic to the future of variable impedance device characterization 190
Accuracy evaluation of on-wafer load-pull measurements 189
A complete measurement test-set for non-linear device characterization 187
An improved calibration technique for on-wafer large signal characterization 186
A Comprehensive GaN HEMT Characterization for Power Amplifier Design 185
A unified calibration algorithm for scattering and load pull measurement 181
Save the "THRU" in the A.N.A. calibration 181
A Generalized Time-Domain Waveform Test-Set 180
QSOLT: a new fast calibration algorithm for two port S-parameter measurements 179
Recent Improvements in Real-Time Load-Pull Systems 177
A novel pulsed load-pull and S-parameter integrated measurement system 175
From the foundry to the model - A fully automated system for on-wafer MESFET characterization 171
Uncertainty in multiport S-parameters measurements 171
Three port network analyzer: an original implementation with a simplified calibration procedure 169
A Simple Calibration Alghorithm for Partially Leaky Model Multiport Vector Network Analyzers 169
Caratterizzazione, progetto e misura di accoppiatori direzionali a larga banda per misure di potenza a microonde 168
Recent technological advances for modular active harmonic load-pull measurement systems 166
Active, closed-loop, harmonic load- and source-pull systems 161
Overview of Modern Load-Pull and Other Non-Linear Measurement Systems 158
Modello di taratura per una nuova classe di analizzatori di reti multiporta 157
Accuracy Improvement of on-wafer load-pull measurements 156
Large-Signal Characterization of an 870MHz Inverse Class-F CrossCoupled Push-Pull PA using Active Mixed-Mode Load-Pull 156
A microwave environmental humidity sensor 153
Load pull techniques for millimetre-wave device characterization 153
The S-matrix Method for High Frequency Capacitance Calibration 151
Three port device S-parameter characterization by means of an original three port test set 148
A generalized harmonic load pull system 147
Un nuovo metodo per un controllo rapido del carico armonico in presenza di un tuner passivo 147
Experimental comparison of active and passive load-pull measurement technologies 145
Development and implementation of a new multiport calibration alghoritm 145
An improved calibration technique for on-wafer large signal device chracterization suitable up to millimeter waves 144
Active harmonic differential / common-mode load-pull with time-domain waveform capabilities 143
A new microwave multiport NWA dynamic calibration 142
Un nuovo sistema di load-pull attivo mixed-mode 142
Caratterizzazione sperimentale di dispositivi attivi alle microonde in regime non lineare 141
Approccio multimediale sulla didattica sperimentale nelle Misure Elettroniche 141
Incertezza di parametri scattering multiporta 140
An unconventional VNA-based time-domain waveform load-pull test bench 138
Un Sistema Completo per Misure di Dispositivi a Microonde nel Dominio del Tempo 137
New perspectives in non linear device and amplifier characterization 136
Microwave Measurements 135
Flip chip technology for discrete GaN HEMTs devices: thermal management issues and devices performances 134
Totale 23.871
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Categoria #
all - tutte 69.808
article - articoli 22.389
book - libri 686
conference - conferenze 43.516
curatela - curatele 0
other - altro 0
patent - brevetti 410
selected - selezionate 0
volume - volumi 2.807
Totale 139.616
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/20191.413 0 0 0 0 0 0 0 0 0 0 755 658
2019/20203.906 438 254 156 419 478 467 412 487 417 189 125 64
2020/20212.490 334 367 184 262 121 234 82 214 178 215 163 136
2021/20221.536 74 136 3 26 49 230 143 50 77 145 281 322
2022/20232.554 225 368 43 187 227 283 424 135 205 18 181 258
2023/2024245 39 24 15 15 59 25 21 17 8 19 3 0
Totale 26.842