PORTO @ Archivio Istituzionale della Ricerca

FERRERO, ANDREA PIERENRICO
 Distribuzione geografica
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Continente #
NA - Nord America 15.718
EU - Europa 11.301
AS - Asia 4.199
SA - Sud America 463
AF - Africa 114
OC - Oceania 15
Continente sconosciuto - Info sul continente non disponibili 5
Totale 31.815
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Nazione #
US - Stati Uniti d'America 15.612
GB - Regno Unito 2.583
DE - Germania 1.965
FR - Francia 1.818
IT - Italia 1.766
CN - Cina 1.438
SG - Singapore 1.433
UA - Ucraina 925
RU - Federazione Russa 359
BR - Brasile 357
KR - Corea 340
IE - Irlanda 338
NL - Olanda 320
TR - Turchia 301
CH - Svizzera 257
AT - Austria 252
SE - Svezia 187
FI - Finlandia 169
VN - Vietnam 145
HK - Hong Kong 112
JP - Giappone 81
MY - Malesia 78
IN - India 76
BE - Belgio 72
CA - Canada 67
ID - Indonesia 61
GR - Grecia 48
ZA - Sudafrica 46
RO - Romania 36
SN - Senegal 36
PL - Polonia 34
AR - Argentina 32
AP - ???statistics.table.value.countryCode.AP??? 31
JO - Giordania 30
CL - Cile 29
ES - Italia 28
TW - Taiwan 23
EU - Europa 20
IL - Israele 19
MX - Messico 18
VE - Venezuela 16
AE - Emirati Arabi Uniti 14
HN - Honduras 14
IQ - Iraq 14
AU - Australia 13
BG - Bulgaria 13
EC - Ecuador 13
IR - Iran 13
BD - Bangladesh 11
MA - Marocco 10
NO - Norvegia 10
CO - Colombia 9
PK - Pakistan 9
CZ - Repubblica Ceca 8
PT - Portogallo 8
SA - Arabia Saudita 8
EG - Egitto 6
HU - Ungheria 6
LV - Lettonia 6
LT - Lituania 5
TN - Tunisia 5
UZ - Uzbekistan 5
AL - Albania 3
EE - Estonia 3
GP - Guadalupe 3
KZ - Kazakistan 3
PY - Paraguay 3
BO - Bolivia 2
BY - Bielorussia 2
DK - Danimarca 2
HR - Croazia 2
KE - Kenya 2
LK - Sri Lanka 2
MK - Macedonia 2
NZ - Nuova Zelanda 2
OM - Oman 2
SC - Seychelles 2
TH - Thailandia 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AO - Angola 1
AZ - Azerbaigian 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
DO - Repubblica Dominicana 1
ET - Etiopia 1
GH - Ghana 1
HT - Haiti 1
JM - Giamaica 1
LY - Libia 1
MD - Moldavia 1
ML - Mali 1
MM - Myanmar 1
NG - Nigeria 1
NP - Nepal 1
PE - Perù 1
PH - Filippine 1
RS - Serbia 1
UY - Uruguay 1
Totale 31.815
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Città #
Ashburn 3.782
Southend 2.159
Seattle 1.368
Fairfield 1.227
Singapore 758
Woodbridge 554
Chandler 512
Jacksonville 500
Santa Clara 475
Cambridge 457
Houston 450
Wilmington 433
Ann Arbor 424
Princeton 420
Buffalo 374
Des Moines 346
Dublin 322
San Ramon 312
Beijing 286
Turin 266
Berlin 257
Izmir 228
Bern 226
Dallas 226
Chicago 201
San Jose 201
Boardman 197
San Francisco 168
Zhengzhou 163
Helsinki 154
Bologna 153
San Donato Milanese 142
Vienna 130
Pennsylvania Furnace 125
Overberg 123
Baltimore 119
Zaporozhye 103
Hong Kong 99
Hangzhou 94
Seoul 94
Torino 91
Monopoli 88
Shanghai 83
North Bergen 80
Saint Petersburg 80
Norwalk 74
Phoenix 74
Rome 71
Milan 70
Mountain View 66
Las Vegas 62
Munich 61
Los Angeles 60
New York 57
Redwood City 57
Padua 55
Brussels 54
Hefei 54
San Diego 54
Jakarta 52
Malatya 49
Amsterdam 48
Nuremberg 46
Atlanta 42
Athens 41
Guangzhou 41
Ho Chi Minh City 41
London 41
Hanoi 40
Indiana 38
Strassbourg 36
Muizenberg 35
São Paulo 32
Clearwater 31
Costa Mesa 30
Putian 29
Melun 27
Shenzhen 27
Tokyo 27
Toronto 26
Council Bluffs 25
Frankfurt 25
Paris 25
Riva 24
University Park 23
Fremont 21
Verona 21
Dong Ket 20
Bangalore 19
Moscow 19
Collegno 17
Kuala Lumpur 17
Renton 17
Rio de Janeiro 17
Warsaw 17
Yubileyny 17
Andover 16
Frankfurt am Main 16
Yellow Springs 16
Austin 15
Totale 21.085
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Nome #
Two-port network analyzer calibration using an unknown 'thru' 640
A Comprehensive Mixed-Mode Time-Domain Load- and Source-Pull Measurement System 562
A Novel Calibration Algorithm for a Special Class of Multiport Vector Network Analyzers 474
A new class of nonuniform, broadband, nonsymmetrical rectangular coaxial-to-microstrip directional couplers for high power applications 468
Further Improvements in Real-Time Load-Pull Measurement Accuracy 433
Accuracy evaluation of on-wafer load-pull measurements 433
Broad Band Coaxial Directional Couplers for High Power Applications 426
Accuracy Improvement of Real-Time Load-Pull Measurements 424
A new implementation of a multiport automatic network analyzer 423
Generalized mixed-mode S-parameters 420
A Complete Noise- and Scattering-Parameters Test-Set 411
Conformal Mapping Design Tools for Coaxial Couplers with Complex Cross Section 404
A Comparison of Uncertainty Evaluation Methods for On-Wafer S-Parameter Measurements 399
Accurate coaxial standard verification by multiport vector network analyzer 396
Accuracy of a multiport network analyzer 388
Design of a broadband multiprobe reflectometer 388
Multiport vector network analyzer calibration: a general formulation 383
Simple technique for measuring source reflection coefficient while characterizing active devices 380
A Microwave System for Relative Humidity Measurement 379
A simple NWA calibration algorithm based on a transfer standard 378
Recent Advances in Real-Time Load-Pull Systems 376
Microwave Multiport Measurements for the Digital World 367
On-Wafer Calibration Algorithm for Partially Leaky Multiport Vector Network Analyzers 367
A new, simple, test-set for on-wafer characterization of millimeter-wave electro-optic devices 365
Time domain reflectometry applied to MMIC passive component modeling 364
Novel hardware and software solutions for a complete linear and non-linear microwave device characterization 361
Harmonic load/source pull strategies for high efficiency PAs design 358
Testing microwave devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 351
A simplified algorithm for leaky network analyzer calibration 351
A new approach to the design of wide-band multiprobe reflectometers 349
Multiport network analyzer self-calibration: a new approach and some interesting results 334
Design and realization of an on-wafer two port transfer standard 329
Simple Technique for source reflection coefficient measurement while characterizing active devices 328
An automated N-port network analyzer for linear and non linear multi-port RF and digital circuits 325
Accurate on-wafer power and harmonic measurements of mm-wave amplifiers and devices 323
Modern RF and microwave measurement techniques 319
Novel software techniques for automatic microwave measurements 316
A Unified Theory for S-Parameter Uncertainty Evaluation 307
In-fixture calibration of an S-parameter measuring system by means of time domain reflectometry 299
Comparison between a vector multiport network analyzer and the national S-parameter measurement system 291
Large signal 2nd harmonic on wafer MESFET characterization 288
Microwave Measurements – Part III. Advanced Non-Linear Measurements 271
Harmonic Load-Pull Techniques: An Overview of Modern Systems 269
Advanced load-pull techniques–From single-ended to multiport/differential measurement systems 264
Testing devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 264
Multiport VNA Measurements 263
Ottimizzazione della transizione tra linea coplanare e microstriscia per misure su wafer 261
Load- and source-pull techniques 259
Fabrication and nonlinear characterization of GaN HEMTs on SiC and sapphire for high-power applications 250
Radio frequency and microwave linear and nonlinear characterization 249
A microwave interferometer system for humidity measurement 248
Multiport and differential S-parameter measurements 248
Save the "THRU" in the A.N.A. calibration 248
An improved calibration technique for on-wafer large signal characterization 245
A NOVEL METHODOLOGY FOR FAST HARMONIC-LOAD CONTROL WITH A PASSIVE TUNER AND AN ACTIVE LOOP 237
QSOLT: a new fast calibration algorithm for two port S-parameter measurements 234
Fabrication and non-linear load-pull characterization of GaN HEMT on SiC for high power applications 233
Miglioramento dell'accuratezza delle misure di load-pull real-time 231
Software Solutions for Linear and Non-Linear Microwave Measurements and Calibrations 231
A Comprehensive GaN HEMT Characterization for Power Amplifier Design 230
Active, closed-loop, harmonic source- and load-pull systems 226
A novel active differential/common-mode load for true mixed-mode load-pull systems 226
Recent technological advances for modular active harmonic load-pull measurement systems 221
Active and Passive Load Pull systems: from the basic to the future of variable impedance device characterization 219
A novel pulsed load-pull and S-parameter integrated measurement system 219
Three port network analyzer: an original implementation with a simplified calibration procedure 217
A unified calibration algorithm for scattering and load pull measurement 216
Accuracy evaluation of on-wafer load-pull measurements 215
Caratterizzazione, progetto e misura di accoppiatori direzionali a larga banda per misure di potenza a microonde 214
A complete measurement test-set for non-linear device characterization 214
Recent Improvements in Real-Time Load-Pull Systems 212
A Generalized Time-Domain Waveform Test-Set 207
Uncertainty in multiport S-parameters measurements 207
A Simple Calibration Alghorithm for Partially Leaky Model Multiport Vector Network Analyzers 207
Large-Signal Characterization of an 870MHz Inverse Class-F CrossCoupled Push-Pull PA using Active Mixed-Mode Load-Pull 207
Approccio multimediale sulla didattica sperimentale nelle Misure Elettroniche 203
From the foundry to the model - A fully automated system for on-wafer MESFET characterization 202
Load pull techniques for millimetre-wave device characterization 202
Overview of Modern Load-Pull and Other Non-Linear Measurement Systems 201
Active, closed-loop, harmonic load- and source-pull systems 199
Modello di taratura per una nuova classe di analizzatori di reti multiporta 198
Three port device S-parameter characterization by means of an original three port test set 198
The S-matrix Method for High Frequency Capacitance Calibration 195
Accuracy Improvement of on-wafer load-pull measurements 193
Un nuovo metodo per un controllo rapido del carico armonico in presenza di un tuner passivo 189
An improved calibration technique for on-wafer large signal device chracterization suitable up to millimeter waves 186
Active harmonic differential / common-mode load-pull with time-domain waveform capabilities 185
An unconventional VNA-based time-domain waveform load-pull test bench 185
Experimental comparison of active and passive load-pull measurement technologies 184
A generalized harmonic load pull system 182
Development and implementation of a new multiport calibration alghoritm 182
A new microwave multiport NWA dynamic calibration 181
Load-Pull Techniques 180
Microwave Measurements 178
Caratterizzazione sperimentale di dispositivi attivi alle microonde in regime non lineare 178
Incertezza di parametri scattering multiporta 175
Un nuovo sistema di load-pull attivo mixed-mode 175
Un Sistema Completo per Misure di Dispositivi a Microonde nel Dominio del Tempo 175
Small and large signal device characterization made easier and faster with an integrated test system 173
New perspectives in non linear device and amplifier characterization 172
Totale 28.310
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Categoria #
all - tutte 91.098
article - articoli 28.416
book - libri 859
conference - conferenze 57.458
curatela - curatele 0
other - altro 0
patent - brevetti 546
selected - selezionate 0
volume - volumi 3.819
Totale 182.196
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20211.343 0 0 0 0 121 234 82 214 178 215 163 136
2021/20221.536 74 136 3 26 49 230 143 50 77 145 281 322
2022/20232.554 225 368 43 187 227 283 424 135 205 18 181 258
2023/2024402 39 24 15 15 59 25 21 17 8 19 64 96
2024/20252.761 55 467 102 255 275 272 73 132 343 211 240 336
2025/20262.343 352 319 531 585 556 0 0 0 0 0 0 0
Totale 32.103