PORTO @ Archivio Istituzionale della Ricerca

FERRERO, ANDREA PIERENRICO
 Distribuzione geografica
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Continente #
NA - Nord America 15.208
EU - Europa 11.202
AS - Asia 2.766
SA - Sud America 306
AF - Africa 108
OC - Oceania 11
Continente sconosciuto - Info sul continente non disponibili 5
Totale 29.606
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Nazione #
US - Stati Uniti d'America 15.119
GB - Regno Unito 2.576
DE - Germania 1.944
FR - Francia 1.799
IT - Italia 1.753
CN - Cina 939
UA - Ucraina 921
SG - Singapore 820
RU - Federazione Russa 353
IE - Irlanda 337
NL - Olanda 315
TR - Turchia 295
CH - Svizzera 257
AT - Austria 249
KR - Corea 247
BR - Brasile 243
SE - Svezia 187
FI - Finlandia 165
MY - Malesia 75
BE - Belgio 71
IN - India 69
JP - Giappone 66
CA - Canada 59
ID - Indonesia 52
GR - Grecia 47
HK - Hong Kong 47
VN - Vietnam 46
ZA - Sudafrica 44
SN - Senegal 36
RO - Romania 35
AP - ???statistics.table.value.countryCode.AP??? 31
PL - Polonia 29
CL - Cile 28
JO - Giordania 28
ES - Italia 25
TW - Taiwan 22
EU - Europa 20
IL - Israele 18
MX - Messico 15
AE - Emirati Arabi Uniti 14
BG - Bulgaria 13
IR - Iran 13
AR - Argentina 12
HN - Honduras 12
NO - Norvegia 10
VE - Venezuela 10
AU - Australia 9
MA - Marocco 9
CZ - Repubblica Ceca 8
IQ - Iraq 8
PT - Portogallo 8
SA - Arabia Saudita 7
BD - Bangladesh 6
CO - Colombia 6
EG - Egitto 5
HU - Ungheria 5
LT - Lituania 5
LV - Lettonia 5
PK - Pakistan 5
TN - Tunisia 5
EC - Ecuador 4
EE - Estonia 3
UZ - Uzbekistan 3
AL - Albania 2
BY - Bielorussia 2
DK - Danimarca 2
GP - Guadalupe 2
KE - Kenya 2
KZ - Kazakistan 2
LK - Sri Lanka 2
MK - Macedonia 2
NZ - Nuova Zelanda 2
OM - Oman 2
SC - Seychelles 2
TH - Thailandia 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AZ - Azerbaigian 1
BO - Bolivia 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
ET - Etiopia 1
GH - Ghana 1
MD - Moldavia 1
ML - Mali 1
NG - Nigeria 1
NP - Nepal 1
PH - Filippine 1
PY - Paraguay 1
RS - Serbia 1
UY - Uruguay 1
Totale 29.606
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Città #
Ashburn 3.755
Southend 2.159
Seattle 1.368
Fairfield 1.227
Woodbridge 554
Chandler 512
Jacksonville 500
Santa Clara 474
Cambridge 457
Houston 450
Wilmington 433
Ann Arbor 424
Princeton 420
Singapore 414
Des Moines 338
Buffalo 329
Dublin 321
San Ramon 312
Turin 266
Berlin 257
Izmir 228
Bern 226
San Jose 201
Boardman 197
Chicago 197
Beijing 177
San Francisco 167
Zhengzhou 160
Bologna 153
Helsinki 150
San Donato Milanese 142
Vienna 130
Pennsylvania Furnace 125
Overberg 123
Baltimore 119
Zaporozhye 103
Hangzhou 91
Torino 91
Monopoli 88
Saint Petersburg 80
Norwalk 74
Phoenix 74
Shanghai 74
Rome 70
Mountain View 66
Milan 64
Las Vegas 62
Munich 59
Redwood City 57
Padua 55
Brussels 54
Jakarta 52
New York 51
San Diego 51
Malatya 49
Amsterdam 47
Nuremberg 43
Athens 41
Atlanta 41
Indiana 38
London 38
Seoul 38
Hong Kong 36
Strassbourg 36
Muizenberg 35
Clearwater 31
Costa Mesa 30
Putian 29
Melun 27
Frankfurt 25
Guangzhou 25
Shenzhen 25
Toronto 25
Los Angeles 24
Paris 24
Riva 24
University Park 23
Fremont 21
São Paulo 21
Verona 21
Dong Ket 20
Bangalore 19
Moscow 19
Dallas 18
Collegno 17
Hanoi 17
Renton 17
Yubileyny 17
Andover 16
Yellow Springs 16
Austin 15
Carshalton 15
Easton 15
Frankfurt Am Main 15
Kemerovo 15
Kuala Lumpur 15
Seongnam 15
Council Bluffs 14
Naples 14
Nürnberg 14
Totale 19.921
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Nome #
Two-port network analyzer calibration using an unknown 'thru' 610
A Comprehensive Mixed-Mode Time-Domain Load- and Source-Pull Measurement System 534
A Novel Calibration Algorithm for a Special Class of Multiport Vector Network Analyzers 454
A new class of nonuniform, broadband, nonsymmetrical rectangular coaxial-to-microstrip directional couplers for high power applications 441
Further Improvements in Real-Time Load-Pull Measurement Accuracy 412
Accuracy evaluation of on-wafer load-pull measurements 412
Broad Band Coaxial Directional Couplers for High Power Applications 406
Accuracy Improvement of Real-Time Load-Pull Measurements 400
A new implementation of a multiport automatic network analyzer 398
Generalized mixed-mode S-parameters 395
A Complete Noise- and Scattering-Parameters Test-Set 394
Conformal Mapping Design Tools for Coaxial Couplers with Complex Cross Section 382
Accuracy of a multiport network analyzer 374
A Comparison of Uncertainty Evaluation Methods for On-Wafer S-Parameter Measurements 373
Multiport vector network analyzer calibration: a general formulation 367
Accurate coaxial standard verification by multiport vector network analyzer 363
A simple NWA calibration algorithm based on a transfer standard 363
Simple technique for measuring source reflection coefficient while characterizing active devices 362
A Microwave System for Relative Humidity Measurement 358
Recent Advances in Real-Time Load-Pull Systems 358
A new, simple, test-set for on-wafer characterization of millimeter-wave electro-optic devices 358
Time domain reflectometry applied to MMIC passive component modeling 354
On-Wafer Calibration Algorithm for Partially Leaky Multiport Vector Network Analyzers 353
Microwave Multiport Measurements for the Digital World 352
Design of a broadband multiprobe reflectometer 351
Novel hardware and software solutions for a complete linear and non-linear microwave device characterization 347
A simplified algorithm for leaky network analyzer calibration 343
Testing microwave devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 338
Harmonic load/source pull strategies for high efficiency PAs design 338
A new approach to the design of wide-band multiprobe reflectometers 335
Multiport network analyzer self-calibration: a new approach and some interesting results 320
Simple Technique for source reflection coefficient measurement while characterizing active devices 316
Design and realization of an on-wafer two port transfer standard 315
An automated N-port network analyzer for linear and non linear multi-port RF and digital circuits 315
Accurate on-wafer power and harmonic measurements of mm-wave amplifiers and devices 302
Modern RF and microwave measurement techniques 297
Novel software techniques for automatic microwave measurements 296
A Unified Theory for S-Parameter Uncertainty Evaluation 294
In-fixture calibration of an S-parameter measuring system by means of time domain reflectometry 287
Comparison between a vector multiport network analyzer and the national S-parameter measurement system 273
Large signal 2nd harmonic on wafer MESFET characterization 266
Ottimizzazione della transizione tra linea coplanare e microstriscia per misure su wafer 251
Microwave Measurements – Part III. Advanced Non-Linear Measurements 249
Harmonic Load-Pull Techniques: An Overview of Modern Systems 249
Advanced load-pull techniques–From single-ended to multiport/differential measurement systems 246
Load- and source-pull techniques 245
Multiport VNA Measurements 240
A microwave interferometer system for humidity measurement 236
Fabrication and nonlinear characterization of GaN HEMTs on SiC and sapphire for high-power applications 236
Testing devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 233
Radio frequency and microwave linear and nonlinear characterization 233
Multiport and differential S-parameter measurements 230
Miglioramento dell'accuratezza delle misure di load-pull real-time 221
A NOVEL METHODOLOGY FOR FAST HARMONIC-LOAD CONTROL WITH A PASSIVE TUNER AND AN ACTIVE LOOP 221
A novel active differential/common-mode load for true mixed-mode load-pull systems 217
Fabrication and non-linear load-pull characterization of GaN HEMT on SiC for high power applications 217
Active, closed-loop, harmonic source- and load-pull systems 214
A Comprehensive GaN HEMT Characterization for Power Amplifier Design 214
Save the "THRU" in the A.N.A. calibration 214
Software Solutions for Linear and Non-Linear Microwave Measurements and Calibrations 211
Accuracy evaluation of on-wafer load-pull measurements 209
An improved calibration technique for on-wafer large signal characterization 208
Active and Passive Load Pull systems: from the basic to the future of variable impedance device characterization 207
A unified calibration algorithm for scattering and load pull measurement 205
QSOLT: a new fast calibration algorithm for two port S-parameter measurements 201
A complete measurement test-set for non-linear device characterization 201
Recent Improvements in Real-Time Load-Pull Systems 201
A novel pulsed load-pull and S-parameter integrated measurement system 200
Caratterizzazione, progetto e misura di accoppiatori direzionali a larga banda per misure di potenza a microonde 199
A Generalized Time-Domain Waveform Test-Set 199
A Simple Calibration Alghorithm for Partially Leaky Model Multiport Vector Network Analyzers 194
Three port network analyzer: an original implementation with a simplified calibration procedure 193
Uncertainty in multiport S-parameters measurements 189
From the foundry to the model - A fully automated system for on-wafer MESFET characterization 188
Recent technological advances for modular active harmonic load-pull measurement systems 188
Overview of Modern Load-Pull and Other Non-Linear Measurement Systems 181
Active, closed-loop, harmonic load- and source-pull systems 181
Accuracy Improvement of on-wafer load-pull measurements 180
Modello di taratura per una nuova classe di analizzatori di reti multiporta 180
Load pull techniques for millimetre-wave device characterization 179
Approccio multimediale sulla didattica sperimentale nelle Misure Elettroniche 177
The S-matrix Method for High Frequency Capacitance Calibration 176
Un nuovo metodo per un controllo rapido del carico armonico in presenza di un tuner passivo 173
Three port device S-parameter characterization by means of an original three port test set 172
Large-Signal Characterization of an 870MHz Inverse Class-F CrossCoupled Push-Pull PA using Active Mixed-Mode Load-Pull 171
A generalized harmonic load pull system 169
Development and implementation of a new multiport calibration alghoritm 169
Experimental comparison of active and passive load-pull measurement technologies 167
An improved calibration technique for on-wafer large signal device chracterization suitable up to millimeter waves 167
A microwave environmental humidity sensor 165
Load-Pull Techniques 163
Microwave Measurements 163
Un nuovo sistema di load-pull attivo mixed-mode 162
Active harmonic differential / common-mode load-pull with time-domain waveform capabilities 161
A new microwave multiport NWA dynamic calibration 161
Caratterizzazione sperimentale di dispositivi attivi alle microonde in regime non lineare 160
Incertezza di parametri scattering multiporta 160
An unconventional VNA-based time-domain waveform load-pull test bench 160
Un Sistema Completo per Misure di Dispositivi a Microonde nel Dominio del Tempo 159
New perspectives in non linear device and amplifier characterization 158
Totale 26.479
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Categoria #
all - tutte 84.249
article - articoli 26.518
book - libri 812
conference - conferenze 52.894
curatela - curatele 0
other - altro 0
patent - brevetti 502
selected - selezionate 0
volume - volumi 3.523
Totale 168.498
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20212.490 334 367 184 262 121 234 82 214 178 215 163 136
2021/20221.536 74 136 3 26 49 230 143 50 77 145 281 322
2022/20232.554 225 368 43 187 227 283 424 135 205 18 181 258
2023/2024402 39 24 15 15 59 25 21 17 8 19 64 96
2024/20252.761 55 467 102 255 275 272 73 132 343 211 240 336
2025/2026134 134 0 0 0 0 0 0 0 0 0 0 0
Totale 29.894