PORTO @ Archivio Istituzionale della Ricerca

FERRERO, ANDREA PIERENRICO
 Distribuzione geografica
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Continente #
NA - Nord America 15.522
EU - Europa 11.233
AS - Asia 3.481
SA - Sud America 399
AF - Africa 112
OC - Oceania 12
Continente sconosciuto - Info sul continente non disponibili 5
Totale 30.764
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Nazione #
US - Stati Uniti d'America 15.422
GB - Regno Unito 2.580
DE - Germania 1.948
FR - Francia 1.804
IT - Italia 1.759
CN - Cina 1.268
SG - Singapore 1.006
UA - Ucraina 922
RU - Federazione Russa 357
KR - Corea 339
IE - Irlanda 337
NL - Olanda 315
BR - Brasile 310
TR - Turchia 300
CH - Svizzera 257
AT - Austria 250
SE - Svezia 187
FI - Finlandia 165
VN - Vietnam 92
MY - Malesia 75
HK - Hong Kong 74
JP - Giappone 74
BE - Belgio 72
IN - India 72
CA - Canada 64
ID - Indonesia 57
GR - Grecia 47
ZA - Sudafrica 46
SN - Senegal 36
RO - Romania 35
PL - Polonia 32
AP - ???statistics.table.value.countryCode.AP??? 31
CL - Cile 29
JO - Giordania 29
ES - Italia 26
AR - Argentina 24
TW - Taiwan 22
EU - Europa 20
IL - Israele 18
MX - Messico 17
AE - Emirati Arabi Uniti 14
HN - Honduras 14
BG - Bulgaria 13
IQ - Iraq 13
IR - Iran 13
VE - Venezuela 12
EC - Ecuador 11
AU - Australia 10
NO - Norvegia 10
BD - Bangladesh 9
MA - Marocco 9
CZ - Repubblica Ceca 8
PK - Pakistan 8
PT - Portogallo 8
SA - Arabia Saudita 8
CO - Colombia 7
EG - Egitto 6
LV - Lettonia 6
HU - Ungheria 5
LT - Lituania 5
TN - Tunisia 5
UZ - Uzbekistan 4
EE - Estonia 3
AL - Albania 2
BO - Bolivia 2
BY - Bielorussia 2
DK - Danimarca 2
GP - Guadalupe 2
KE - Kenya 2
KZ - Kazakistan 2
LK - Sri Lanka 2
MK - Macedonia 2
NZ - Nuova Zelanda 2
OM - Oman 2
PY - Paraguay 2
SC - Seychelles 2
TH - Thailandia 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AO - Angola 1
AZ - Azerbaigian 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
ET - Etiopia 1
GH - Ghana 1
HT - Haiti 1
JM - Giamaica 1
MD - Moldavia 1
ML - Mali 1
NG - Nigeria 1
NP - Nepal 1
PE - Perù 1
PH - Filippine 1
RS - Serbia 1
UY - Uruguay 1
Totale 30.764
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Città #
Ashburn 3.769
Southend 2.159
Seattle 1.368
Fairfield 1.227
Woodbridge 554
Singapore 523
Chandler 512
Jacksonville 500
Santa Clara 475
Cambridge 457
Houston 450
Wilmington 433
Ann Arbor 424
Princeton 420
Buffalo 353
Des Moines 340
Dublin 321
San Ramon 312
Turin 266
Berlin 257
Beijing 250
Izmir 228
Bern 226
Dallas 223
San Jose 201
Chicago 199
Boardman 197
San Francisco 168
Zhengzhou 163
Bologna 153
Helsinki 150
San Donato Milanese 142
Vienna 130
Pennsylvania Furnace 125
Overberg 123
Baltimore 119
Zaporozhye 103
Hangzhou 94
Seoul 93
Torino 91
Monopoli 88
Saint Petersburg 80
Shanghai 80
Norwalk 74
Phoenix 74
Rome 71
Milan 66
Mountain View 66
Las Vegas 62
Hong Kong 61
Munich 59
Redwood City 57
Padua 55
Brussels 54
Hefei 52
Jakarta 52
San Diego 52
New York 51
Malatya 49
Amsterdam 47
Nuremberg 44
Atlanta 42
Athens 41
London 40
Los Angeles 39
Indiana 38
Guangzhou 36
Strassbourg 36
Muizenberg 35
Clearwater 31
Costa Mesa 30
Putian 29
Hanoi 28
Melun 27
Shenzhen 26
Toronto 26
Frankfurt 25
São Paulo 25
Paris 24
Riva 24
Council Bluffs 23
University Park 23
Fremont 21
Verona 21
Dong Ket 20
Tokyo 20
Bangalore 19
Moscow 19
Collegno 17
Renton 17
Yubileyny 17
Andover 16
Ho Chi Minh City 16
Yellow Springs 16
Austin 15
Carshalton 15
Easton 15
Frankfurt Am Main 15
Kemerovo 15
Kuala Lumpur 15
Totale 20.549
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Nome #
Two-port network analyzer calibration using an unknown 'thru' 617
A Comprehensive Mixed-Mode Time-Domain Load- and Source-Pull Measurement System 543
A Novel Calibration Algorithm for a Special Class of Multiport Vector Network Analyzers 466
A new class of nonuniform, broadband, nonsymmetrical rectangular coaxial-to-microstrip directional couplers for high power applications 454
Broad Band Coaxial Directional Couplers for High Power Applications 421
Further Improvements in Real-Time Load-Pull Measurement Accuracy 421
Accuracy evaluation of on-wafer load-pull measurements 420
A new implementation of a multiport automatic network analyzer 413
Accuracy Improvement of Real-Time Load-Pull Measurements 411
Generalized mixed-mode S-parameters 404
A Complete Noise- and Scattering-Parameters Test-Set 403
Conformal Mapping Design Tools for Coaxial Couplers with Complex Cross Section 391
A Comparison of Uncertainty Evaluation Methods for On-Wafer S-Parameter Measurements 384
Accurate coaxial standard verification by multiport vector network analyzer 383
Accuracy of a multiport network analyzer 382
Multiport vector network analyzer calibration: a general formulation 375
A simple NWA calibration algorithm based on a transfer standard 374
Simple technique for measuring source reflection coefficient while characterizing active devices 372
A Microwave System for Relative Humidity Measurement 371
Recent Advances in Real-Time Load-Pull Systems 369
Design of a broadband multiprobe reflectometer 369
A new, simple, test-set for on-wafer characterization of millimeter-wave electro-optic devices 363
Microwave Multiport Measurements for the Digital World 361
Time domain reflectometry applied to MMIC passive component modeling 360
On-Wafer Calibration Algorithm for Partially Leaky Multiport Vector Network Analyzers 357
Novel hardware and software solutions for a complete linear and non-linear microwave device characterization 352
Harmonic load/source pull strategies for high efficiency PAs design 348
A simplified algorithm for leaky network analyzer calibration 347
Testing microwave devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 344
A new approach to the design of wide-band multiprobe reflectometers 341
Multiport network analyzer self-calibration: a new approach and some interesting results 326
Design and realization of an on-wafer two port transfer standard 322
Simple Technique for source reflection coefficient measurement while characterizing active devices 321
An automated N-port network analyzer for linear and non linear multi-port RF and digital circuits 319
Accurate on-wafer power and harmonic measurements of mm-wave amplifiers and devices 313
Modern RF and microwave measurement techniques 310
Novel software techniques for automatic microwave measurements 307
A Unified Theory for S-Parameter Uncertainty Evaluation 302
In-fixture calibration of an S-parameter measuring system by means of time domain reflectometry 290
Comparison between a vector multiport network analyzer and the national S-parameter measurement system 284
Large signal 2nd harmonic on wafer MESFET characterization 277
Microwave Measurements – Part III. Advanced Non-Linear Measurements 259
Ottimizzazione della transizione tra linea coplanare e microstriscia per misure su wafer 256
Harmonic Load-Pull Techniques: An Overview of Modern Systems 255
Testing devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 255
Advanced load-pull techniques–From single-ended to multiport/differential measurement systems 254
Load- and source-pull techniques 252
Multiport VNA Measurements 250
Fabrication and nonlinear characterization of GaN HEMTs on SiC and sapphire for high-power applications 243
A microwave interferometer system for humidity measurement 240
Multiport and differential S-parameter measurements 239
Radio frequency and microwave linear and nonlinear characterization 238
Save the "THRU" in the A.N.A. calibration 235
A NOVEL METHODOLOGY FOR FAST HARMONIC-LOAD CONTROL WITH A PASSIVE TUNER AND AN ACTIVE LOOP 230
An improved calibration technique for on-wafer large signal characterization 229
Miglioramento dell'accuratezza delle misure di load-pull real-time 225
Fabrication and non-linear load-pull characterization of GaN HEMT on SiC for high power applications 223
Software Solutions for Linear and Non-Linear Microwave Measurements and Calibrations 223
A Comprehensive GaN HEMT Characterization for Power Amplifier Design 222
A novel active differential/common-mode load for true mixed-mode load-pull systems 221
QSOLT: a new fast calibration algorithm for two port S-parameter measurements 221
Active, closed-loop, harmonic source- and load-pull systems 218
Accuracy evaluation of on-wafer load-pull measurements 212
A unified calibration algorithm for scattering and load pull measurement 211
Active and Passive Load Pull systems: from the basic to the future of variable impedance device characterization 211
A novel pulsed load-pull and S-parameter integrated measurement system 211
A complete measurement test-set for non-linear device characterization 209
Three port network analyzer: an original implementation with a simplified calibration procedure 208
Recent technological advances for modular active harmonic load-pull measurement systems 208
Recent Improvements in Real-Time Load-Pull Systems 207
Caratterizzazione, progetto e misura di accoppiatori direzionali a larga banda per misure di potenza a microonde 205
A Generalized Time-Domain Waveform Test-Set 203
A Simple Calibration Alghorithm for Partially Leaky Model Multiport Vector Network Analyzers 201
Uncertainty in multiport S-parameters measurements 197
From the foundry to the model - A fully automated system for on-wafer MESFET characterization 196
Overview of Modern Load-Pull and Other Non-Linear Measurement Systems 192
Approccio multimediale sulla didattica sperimentale nelle Misure Elettroniche 192
Modello di taratura per una nuova classe di analizzatori di reti multiporta 191
Three port device S-parameter characterization by means of an original three port test set 191
Load pull techniques for millimetre-wave device characterization 191
Large-Signal Characterization of an 870MHz Inverse Class-F CrossCoupled Push-Pull PA using Active Mixed-Mode Load-Pull 190
Accuracy Improvement of on-wafer load-pull measurements 188
The S-matrix Method for High Frequency Capacitance Calibration 187
Active, closed-loop, harmonic load- and source-pull systems 186
Un nuovo metodo per un controllo rapido del carico armonico in presenza di un tuner passivo 181
An improved calibration technique for on-wafer large signal device chracterization suitable up to millimeter waves 180
A generalized harmonic load pull system 177
Development and implementation of a new multiport calibration alghoritm 176
Caratterizzazione sperimentale di dispositivi attivi alle microonde in regime non lineare 174
A new microwave multiport NWA dynamic calibration 174
Experimental comparison of active and passive load-pull measurement technologies 174
Load-Pull Techniques 173
An unconventional VNA-based time-domain waveform load-pull test bench 173
Microwave Measurements 171
Active harmonic differential / common-mode load-pull with time-domain waveform capabilities 169
A microwave environmental humidity sensor 167
Incertezza di parametri scattering multiporta 167
Un nuovo sistema di load-pull attivo mixed-mode 167
Un Sistema Completo per Misure di Dispositivi a Microonde nel Dominio del Tempo 167
New perspectives in non linear device and amplifier characterization 165
Totale 27.417
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Categoria #
all - tutte 88.163
article - articoli 27.598
book - libri 838
conference - conferenze 55.517
curatela - curatele 0
other - altro 0
patent - brevetti 528
selected - selezionate 0
volume - volumi 3.682
Totale 176.326
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20211.605 0 0 0 262 121 234 82 214 178 215 163 136
2021/20221.536 74 136 3 26 49 230 143 50 77 145 281 322
2022/20232.554 225 368 43 187 227 283 424 135 205 18 181 258
2023/2024402 39 24 15 15 59 25 21 17 8 19 64 96
2024/20252.761 55 467 102 255 275 272 73 132 343 211 240 336
2025/20261.292 352 319 531 90 0 0 0 0 0 0 0 0
Totale 31.052