PORTO @ Archivio Istituzionale della Ricerca

FERRERO, ANDREA PIERENRICO
 Distribuzione geografica
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Continente #
NA - Nord America 14.645
EU - Europa 10.905
AS - Asia 2.038
AF - Africa 93
SA - Sud America 54
OC - Oceania 11
Continente sconosciuto - Info sul continente non disponibili 5
Totale 27.751
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Nazione #
US - Stati Uniti d'America 14.575
GB - Regno Unito 2.562
DE - Germania 1.852
FR - Francia 1.798
IT - Italia 1.734
UA - Ucraina 918
CN - Cina 852
RU - Federazione Russa 347
IE - Irlanda 335
NL - Olanda 304
SG - Singapore 302
TR - Turchia 290
CH - Svizzera 257
KR - Corea 210
SE - Svezia 186
FI - Finlandia 152
AT - Austria 126
MY - Malesia 75
BE - Belgio 71
JP - Giappone 65
IN - India 60
ID - Indonesia 52
CA - Canada 48
GR - Grecia 47
ZA - Sudafrica 42
SN - Senegal 36
RO - Romania 35
VN - Vietnam 35
AP - ???statistics.table.value.countryCode.AP??? 31
CL - Cile 28
JO - Giordania 27
ES - Italia 23
PL - Polonia 22
TW - Taiwan 22
EU - Europa 20
IL - Israele 18
AE - Emirati Arabi Uniti 13
BG - Bulgaria 13
BR - Brasile 13
HK - Hong Kong 13
IR - Iran 13
HN - Honduras 12
NO - Norvegia 10
AU - Australia 9
PT - Portogallo 8
CZ - Repubblica Ceca 7
MX - Messico 7
EG - Egitto 5
HU - Ungheria 5
LT - Lituania 5
LV - Lettonia 5
VE - Venezuela 5
AR - Argentina 4
CO - Colombia 3
EE - Estonia 3
MA - Marocco 3
PK - Pakistan 3
SA - Arabia Saudita 3
BY - Bielorussia 2
DK - Danimarca 2
GP - Guadalupe 2
KZ - Kazakistan 2
LK - Sri Lanka 2
NZ - Nuova Zelanda 2
OM - Oman 2
SC - Seychelles 2
TH - Thailandia 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AL - Albania 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
EC - Ecuador 1
ET - Etiopia 1
GH - Ghana 1
IQ - Iraq 1
MD - Moldavia 1
MK - Macedonia 1
NG - Nigeria 1
PH - Filippine 1
RS - Serbia 1
TN - Tunisia 1
Totale 27.751
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Città #
Ashburn 3.726
Southend 2.159
Seattle 1.361
Fairfield 1.227
Woodbridge 554
Chandler 512
Jacksonville 500
Cambridge 457
Houston 450
Wilmington 433
Ann Arbor 424
Princeton 420
Des Moines 338
Buffalo 329
Dublin 319
San Ramon 312
Turin 258
Berlin 257
Izmir 227
Bern 226
Singapore 216
San Jose 201
Chicago 194
Boardman 176
Beijing 174
San Francisco 165
Zhengzhou 159
Santa Clara 158
Bologna 151
Helsinki 145
San Donato Milanese 142
Pennsylvania Furnace 125
Overberg 123
Vienna 122
Baltimore 119
Zaporozhye 103
Torino 91
Hangzhou 89
Monopoli 88
Saint Petersburg 80
Norwalk 74
Phoenix 70
Shanghai 69
Rome 68
Mountain View 66
Milan 64
Las Vegas 61
Redwood City 57
Padua 55
Brussels 54
Jakarta 52
San Diego 51
Malatya 49
Amsterdam 45
New York 45
Athens 41
Atlanta 39
Indiana 38
Seoul 37
Strassbourg 36
Muizenberg 35
London 32
Clearwater 31
Costa Mesa 30
Putian 29
Melun 27
Frankfurt 25
Shenzhen 25
Toronto 25
Guangzhou 24
Paris 24
Riva 24
University Park 23
Fremont 21
Los Angeles 21
Verona 21
Dong Ket 20
Bangalore 19
Moscow 18
Collegno 17
Renton 17
Yubileyny 17
Andover 16
Dallas 16
Munich 16
Yellow Springs 16
Austin 15
Carshalton 15
Easton 15
Frankfurt Am Main 15
Hanoi 15
Kemerovo 15
Kuala Lumpur 15
Seongnam 15
Naples 14
Nürnberg 14
Boulder 13
Henderson 13
Zurich 13
Delft 12
Totale 19.169
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Nome #
Two-port network analyzer calibration using an unknown 'thru' 579
A Comprehensive Mixed-Mode Time-Domain Load- and Source-Pull Measurement System 523
A Novel Calibration Algorithm for a Special Class of Multiport Vector Network Analyzers 433
A new class of nonuniform, broadband, nonsymmetrical rectangular coaxial-to-microstrip directional couplers for high power applications 424
Further Improvements in Real-Time Load-Pull Measurement Accuracy 396
Accuracy evaluation of on-wafer load-pull measurements 388
A Complete Noise- and Scattering-Parameters Test-Set 382
Accuracy Improvement of Real-Time Load-Pull Measurements 380
Broad Band Coaxial Directional Couplers for High Power Applications 373
A new implementation of a multiport automatic network analyzer 372
Generalized mixed-mode S-parameters 369
A Comparison of Uncertainty Evaluation Methods for On-Wafer S-Parameter Measurements 361
Conformal Mapping Design Tools for Coaxial Couplers with Complex Cross Section 358
Accuracy of a multiport network analyzer 350
Multiport vector network analyzer calibration: a general formulation 348
Accurate coaxial standard verification by multiport vector network analyzer 347
A Microwave System for Relative Humidity Measurement 346
Simple technique for measuring source reflection coefficient while characterizing active devices 344
A simple NWA calibration algorithm based on a transfer standard 343
Recent Advances in Real-Time Load-Pull Systems 342
Time domain reflectometry applied to MMIC passive component modeling 342
Microwave Multiport Measurements for the Digital World 338
A new, simple, test-set for on-wafer characterization of millimeter-wave electro-optic devices 337
On-Wafer Calibration Algorithm for Partially Leaky Multiport Vector Network Analyzers 332
Design of a broadband multiprobe reflectometer 331
Novel hardware and software solutions for a complete linear and non-linear microwave device characterization 328
A simplified algorithm for leaky network analyzer calibration 323
A new approach to the design of wide-band multiprobe reflectometers 322
Testing microwave devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 320
Harmonic load/source pull strategies for high efficiency PAs design 318
An automated N-port network analyzer for linear and non linear multi-port RF and digital circuits 300
Multiport network analyzer self-calibration: a new approach and some interesting results 299
Simple Technique for source reflection coefficient measurement while characterizing active devices 299
Design and realization of an on-wafer two port transfer standard 289
Modern RF and microwave measurement techniques 281
Accurate on-wafer power and harmonic measurements of mm-wave amplifiers and devices 276
A Unified Theory for S-Parameter Uncertainty Evaluation 275
In-fixture calibration of an S-parameter measuring system by means of time domain reflectometry 272
Novel software techniques for automatic microwave measurements 271
Large signal 2nd harmonic on wafer MESFET characterization 257
Comparison between a vector multiport network analyzer and the national S-parameter measurement system 257
Ottimizzazione della transizione tra linea coplanare e microstriscia per misure su wafer 242
Advanced load-pull techniques–From single-ended to multiport/differential measurement systems 233
Microwave Measurements – Part III. Advanced Non-Linear Measurements 230
Harmonic Load-Pull Techniques: An Overview of Modern Systems 229
Load- and source-pull techniques 228
A microwave interferometer system for humidity measurement 221
Multiport VNA Measurements 219
Fabrication and nonlinear characterization of GaN HEMTs on SiC and sapphire for high-power applications 216
Radio frequency and microwave linear and nonlinear characterization 216
Multiport and differential S-parameter measurements 215
Miglioramento dell'accuratezza delle misure di load-pull real-time 210
A NOVEL METHODOLOGY FOR FAST HARMONIC-LOAD CONTROL WITH A PASSIVE TUNER AND AN ACTIVE LOOP 210
A novel active differential/common-mode load for true mixed-mode load-pull systems 210
Testing devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 209
Fabrication and non-linear load-pull characterization of GaN HEMT on SiC for high power applications 205
Software Solutions for Linear and Non-Linear Microwave Measurements and Calibrations 202
Active, closed-loop, harmonic source- and load-pull systems 201
Accuracy evaluation of on-wafer load-pull measurements 197
A Comprehensive GaN HEMT Characterization for Power Amplifier Design 195
Active and Passive Load Pull systems: from the basic to the future of variable impedance device characterization 194
An improved calibration technique for on-wafer large signal characterization 194
A complete measurement test-set for non-linear device characterization 193
Save the "THRU" in the A.N.A. calibration 192
A unified calibration algorithm for scattering and load pull measurement 190
QSOLT: a new fast calibration algorithm for two port S-parameter measurements 190
A novel pulsed load-pull and S-parameter integrated measurement system 188
A Generalized Time-Domain Waveform Test-Set 185
A Simple Calibration Alghorithm for Partially Leaky Model Multiport Vector Network Analyzers 184
Recent Improvements in Real-Time Load-Pull Systems 184
Caratterizzazione, progetto e misura di accoppiatori direzionali a larga banda per misure di potenza a microonde 180
Three port network analyzer: an original implementation with a simplified calibration procedure 180
From the foundry to the model - A fully automated system for on-wafer MESFET characterization 178
Uncertainty in multiport S-parameters measurements 178
Recent technological advances for modular active harmonic load-pull measurement systems 174
Modello di taratura per una nuova classe di analizzatori di reti multiporta 171
Active, closed-loop, harmonic load- and source-pull systems 170
Accuracy Improvement of on-wafer load-pull measurements 166
Load pull techniques for millimetre-wave device characterization 166
Overview of Modern Load-Pull and Other Non-Linear Measurement Systems 164
Large-Signal Characterization of an 870MHz Inverse Class-F CrossCoupled Push-Pull PA using Active Mixed-Mode Load-Pull 163
The S-matrix Method for High Frequency Capacitance Calibration 160
A microwave environmental humidity sensor 158
A generalized harmonic load pull system 156
Un nuovo metodo per un controllo rapido del carico armonico in presenza di un tuner passivo 156
Experimental comparison of active and passive load-pull measurement technologies 156
An improved calibration technique for on-wafer large signal device chracterization suitable up to millimeter waves 156
Three port device S-parameter characterization by means of an original three port test set 156
Development and implementation of a new multiport calibration alghoritm 153
Un nuovo sistema di load-pull attivo mixed-mode 152
Approccio multimediale sulla didattica sperimentale nelle Misure Elettroniche 151
A new microwave multiport NWA dynamic calibration 151
Active harmonic differential / common-mode load-pull with time-domain waveform capabilities 150
Incertezza di parametri scattering multiporta 150
Caratterizzazione sperimentale di dispositivi attivi alle microonde in regime non lineare 148
Un Sistema Completo per Misure di Dispositivi a Microonde nel Dominio del Tempo 147
Load-Pull Techniques 146
Microwave Measurements 145
An unconventional VNA-based time-domain waveform load-pull test bench 145
New perspectives in non linear device and amplifier characterization 144
Totale 24.877
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Categoria #
all - tutte 76.391
article - articoli 24.222
book - libri 743
conference - conferenze 47.820
curatela - curatele 0
other - altro 0
patent - brevetti 454
selected - selezionate 0
volume - volumi 3.152
Totale 152.782
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20202.639 0 0 0 0 478 467 412 487 417 189 125 64
2020/20212.490 334 367 184 262 121 234 82 214 178 215 163 136
2021/20221.536 74 136 3 26 49 230 143 50 77 145 281 322
2022/20232.554 225 368 43 187 227 283 424 135 205 18 181 258
2023/2024402 39 24 15 15 59 25 21 17 8 19 64 96
2024/20251.040 55 467 102 255 161 0 0 0 0 0 0 0
Totale 28.039