FERRERO, ANDREA PIERENRICO
 Distribuzione geografica
Continente #
NA - Nord America 16.849
EU - Europa 11.917
AS - Asia 6.669
SA - Sud America 556
AF - Africa 140
OC - Oceania 15
Continente sconosciuto - Info sul continente non disponibili 5
Totale 36.151
Nazione #
US - Stati Uniti d'America 16.713
GB - Regno Unito 2.597
DE - Germania 2.001
SG - Singapore 1.986
FR - Francia 1.966
IT - Italia 1.792
CN - Cina 1.515
VN - Vietnam 1.399
UA - Ucraina 927
RU - Federazione Russa 636
KR - Corea 424
BR - Brasile 414
NL - Olanda 367
IE - Irlanda 340
TR - Turchia 305
AT - Austria 262
CH - Svizzera 258
HK - Hong Kong 223
IN - India 218
FI - Finlandia 201
SE - Svezia 189
JP - Giappone 126
CA - Canada 81
MY - Malesia 78
BE - Belgio 77
ID - Indonesia 67
TW - Taiwan 54
ZA - Sudafrica 51
GR - Grecia 49
TH - Thailandia 42
PH - Filippine 41
AR - Argentina 40
JO - Giordania 39
SN - Senegal 39
CL - Cile 37
RO - Romania 36
ES - Italia 35
PL - Polonia 35
IQ - Iraq 34
AP - ???statistics.table.value.countryCode.AP??? 31
BD - Bangladesh 27
MX - Messico 26
IL - Israele 21
VE - Venezuela 21
EU - Europa 20
PK - Pakistan 20
EC - Ecuador 18
AE - Emirati Arabi Uniti 17
BG - Bulgaria 14
HN - Honduras 14
AU - Australia 13
IR - Iran 13
MA - Marocco 13
CO - Colombia 12
NO - Norvegia 10
SA - Arabia Saudita 9
CZ - Repubblica Ceca 8
EG - Egitto 8
PT - Portogallo 8
HU - Ungheria 6
KZ - Kazakistan 6
LV - Lettonia 6
TN - Tunisia 6
UZ - Uzbekistan 6
AL - Albania 5
AZ - Azerbaigian 5
LT - Lituania 5
PY - Paraguay 5
BO - Bolivia 4
DO - Repubblica Dominicana 4
KE - Kenya 4
OM - Oman 4
PE - Perù 4
DZ - Algeria 3
EE - Estonia 3
ET - Etiopia 3
GP - Guadalupe 3
MK - Macedonia 3
NP - Nepal 3
BH - Bahrain 2
BY - Bielorussia 2
CR - Costa Rica 2
DK - Danimarca 2
GA - Gabon 2
HR - Croazia 2
JM - Giamaica 2
KW - Kuwait 2
LK - Sri Lanka 2
MM - Myanmar 2
NG - Nigeria 2
NZ - Nuova Zelanda 2
SC - Seychelles 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AO - Angola 1
BM - Bermuda 1
BW - Botswana 1
CG - Congo 1
CI - Costa d'Avorio 1
GE - Georgia 1
GH - Ghana 1
Totale 36.139
Città #
Ashburn 3.863
Southend 2.159
Seattle 1.371
Fairfield 1.227
Singapore 1.035
San Jose 743
Woodbridge 554
Chandler 512
Jacksonville 501
Santa Clara 488
Cambridge 457
Houston 453
Wilmington 433
Ann Arbor 424
Princeton 420
Buffalo 375
Hanoi 351
Des Moines 348
Ho Chi Minh City 342
Dublin 324
San Ramon 312
Beijing 293
Turin 268
Berlin 258
Dallas 239
Izmir 229
Bern 226
Chicago 202
Boardman 197
Helsinki 186
San Francisco 173
Hong Kong 171
Zhengzhou 163
Bologna 153
Seoul 149
Lauterbourg 142
San Donato Milanese 142
North Bergen 132
Vienna 131
Pennsylvania Furnace 125
Overberg 123
Baltimore 119
Zaporozhye 103
Los Angeles 99
Hangzhou 95
Torino 91
Monopoli 88
Shanghai 83
Saint Petersburg 80
Milan 77
Phoenix 77
New York 74
Norwalk 74
Rome 74
Mountain View 66
Council Bluffs 64
Las Vegas 62
Munich 61
Brussels 59
Nuremberg 57
Redwood City 57
Haiphong 56
Padua 55
San Diego 55
Hefei 54
The Dalles 54
Jakarta 53
Amsterdam 51
Malatya 49
Da Nang 46
Groningen 46
London 45
Atlanta 44
Guangzhou 42
Athens 41
Tokyo 41
Indiana 38
Strassbourg 36
São Paulo 36
Muizenberg 35
Toronto 33
Clearwater 31
Costa Mesa 30
Moscow 29
Putian 29
Shenzhen 28
Melun 27
Paris 27
Frankfurt am Main 26
Frankfurt 25
Riva 24
University Park 23
Fremont 21
Verona 21
Dong Ket 20
Bangalore 19
Chennai 18
Rio de Janeiro 18
Warsaw 18
Collegno 17
Totale 23.315
Nome #
Two-port network analyzer calibration using an unknown 'thru' 700
A Comprehensive Mixed-Mode Time-Domain Load- and Source-Pull Measurement System 606
A Novel Calibration Algorithm for a Special Class of Multiport Vector Network Analyzers 582
A new class of nonuniform, broadband, nonsymmetrical rectangular coaxial-to-microstrip directional couplers for high power applications 503
Further Improvements in Real-Time Load-Pull Measurement Accuracy 472
Generalized mixed-mode S-parameters 468
Accuracy Improvement of Real-Time Load-Pull Measurements 465
Accuracy evaluation of on-wafer load-pull measurements 463
A new implementation of a multiport automatic network analyzer 462
Broad Band Coaxial Directional Couplers for High Power Applications 457
A Complete Noise- and Scattering-Parameters Test-Set 450
Conformal Mapping Design Tools for Coaxial Couplers with Complex Cross Section 445
Design of a broadband multiprobe reflectometer 442
A Comparison of Uncertainty Evaluation Methods for On-Wafer S-Parameter Measurements 436
Accuracy of a multiport network analyzer 426
Accurate coaxial standard verification by multiport vector network analyzer 426
Recent Advances in Real-Time Load-Pull Systems 425
Multiport vector network analyzer calibration: a general formulation 416
A Microwave System for Relative Humidity Measurement 413
Simple technique for measuring source reflection coefficient while characterizing active devices 409
On-Wafer Calibration Algorithm for Partially Leaky Multiport Vector Network Analyzers 405
A simple NWA calibration algorithm based on a transfer standard 402
Microwave Multiport Measurements for the Digital World 398
Novel hardware and software solutions for a complete linear and non-linear microwave device characterization 397
Harmonic load/source pull strategies for high efficiency PAs design 394
A new, simple, test-set for on-wafer characterization of millimeter-wave electro-optic devices 392
Time domain reflectometry applied to MMIC passive component modeling 383
Testing microwave devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 377
A new approach to the design of wide-band multiprobe reflectometers 376
A simplified algorithm for leaky network analyzer calibration 372
Multiport network analyzer self-calibration: a new approach and some interesting results 371
Accurate on-wafer power and harmonic measurements of mm-wave amplifiers and devices 366
Simple Technique for source reflection coefficient measurement while characterizing active devices 364
Design and realization of an on-wafer two port transfer standard 360
Modern RF and microwave measurement techniques 347
Novel software techniques for automatic microwave measurements 344
An automated N-port network analyzer for linear and non linear multi-port RF and digital circuits 342
A Unified Theory for S-Parameter Uncertainty Evaluation 337
Testing devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 336
In-fixture calibration of an S-parameter measuring system by means of time domain reflectometry 331
Comparison between a vector multiport network analyzer and the national S-parameter measurement system 328
Large signal 2nd harmonic on wafer MESFET characterization 320
Microwave Measurements – Part III. Advanced Non-Linear Measurements 318
Save the "THRU" in the A.N.A. calibration 308
Harmonic Load-Pull Techniques: An Overview of Modern Systems 307
A NOVEL METHODOLOGY FOR FAST HARMONIC-LOAD CONTROL WITH A PASSIVE TUNER AND AN ACTIVE LOOP 306
Advanced load-pull techniques–From single-ended to multiport/differential measurement systems 302
Multiport VNA Measurements 299
Load- and source-pull techniques 295
A microwave interferometer system for humidity measurement 293
Radio frequency and microwave linear and nonlinear characterization 289
Ottimizzazione della transizione tra linea coplanare e microstriscia per misure su wafer 288
An improved calibration technique for on-wafer large signal characterization 288
Fabrication and nonlinear characterization of GaN HEMTs on SiC and sapphire for high-power applications 286
Multiport and differential S-parameter measurements 283
Miglioramento dell'accuratezza delle misure di load-pull real-time 280
Recent technological advances for modular active harmonic load-pull measurement systems 265
Active, closed-loop, harmonic source- and load-pull systems 263
Recent Improvements in Real-Time Load-Pull Systems 263
QSOLT: a new fast calibration algorithm for two port S-parameter measurements 262
Load pull techniques for millimetre-wave device characterization 261
Fabrication and non-linear load-pull characterization of GaN HEMT on SiC for high power applications 259
Three port network analyzer: an original implementation with a simplified calibration procedure 258
The S-matrix Method for High Frequency Capacitance Calibration 258
A novel pulsed load-pull and S-parameter integrated measurement system 257
A Comprehensive GaN HEMT Characterization for Power Amplifier Design 255
Software Solutions for Linear and Non-Linear Microwave Measurements and Calibrations 255
Approccio multimediale sulla didattica sperimentale nelle Misure Elettroniche 248
A novel active differential/common-mode load for true mixed-mode load-pull systems 248
Caratterizzazione, progetto e misura di accoppiatori direzionali a larga banda per misure di potenza a microonde 247
An improved calibration technique for on-wafer large signal device chracterization suitable up to millimeter waves 244
A Generalized Time-Domain Waveform Test-Set 241
A Simple Calibration Alghorithm for Partially Leaky Model Multiport Vector Network Analyzers 240
Uncertainty in multiport S-parameters measurements 239
Modello di taratura per una nuova classe di analizzatori di reti multiporta 238
A unified calibration algorithm for scattering and load pull measurement 237
From the foundry to the model - A fully automated system for on-wafer MESFET characterization 237
Active and Passive Load Pull systems: from the basic to the future of variable impedance device characterization 236
Three port device S-parameter characterization by means of an original three port test set 235
Overview of Modern Load-Pull and Other Non-Linear Measurement Systems 233
A complete measurement test-set for non-linear device characterization 233
Large-Signal Characterization of an 870MHz Inverse Class-F CrossCoupled Push-Pull PA using Active Mixed-Mode Load-Pull 233
Active, closed-loop, harmonic load- and source-pull systems 232
Accuracy evaluation of on-wafer load-pull measurements 230
Accuracy Improvement of on-wafer load-pull measurements 224
Un nuovo metodo per un controllo rapido del carico armonico in presenza di un tuner passivo 223
Active harmonic differential / common-mode load-pull with time-domain waveform capabilities 222
Microwave Measurements 218
An unconventional VNA-based time-domain waveform load-pull test bench 218
An integrated high speed microwave test set for linear and non-linear device characterization 216
Incertezza di parametri scattering multiporta 215
Load-Pull Techniques 212
Un Sistema Completo per Misure di Dispositivi a Microonde nel Dominio del Tempo 209
A generalized harmonic load pull system 208
Development and implementation of a new multiport calibration alghoritm 208
Experimental comparison of active and passive load-pull measurement technologies 206
Sviluppo di una nuova tecnica di calibrazione nel campo delle microonde per componenti multiporte 205
Un nuovo sistema di load-pull attivo mixed-mode 204
New perspectives in non linear device and amplifier characterization 203
A new microwave multiport NWA dynamic calibration 202
Totale 31.950
Categoria #
all - tutte 98.675
article - articoli 30.494
book - libri 913
conference - conferenze 62.485
curatela - curatele 0
other - altro 0
patent - brevetti 602
selected - selezionate 0
volume - volumi 4.181
Totale 197.350


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021299 0 0 0 0 0 0 0 0 0 0 163 136
2021/20221.536 74 136 3 26 49 230 143 50 77 145 281 322
2022/20232.554 225 368 43 187 227 283 424 135 205 18 181 258
2023/2024402 39 24 15 15 59 25 21 17 8 19 64 96
2024/20252.761 55 467 102 255 275 272 73 132 343 211 240 336
2025/20266.679 352 319 531 585 569 586 888 476 1.559 721 93 0
Totale 36.439