PORTO @ Archivio Istituzionale della Ricerca

FERRERO, ANDREA PIERENRICO
 Distribuzione geografica
Salva come PNG Salva come JPEG
Continente #
NA - Nord America 17.117
EU - Europa 11.947
AS - Asia 6.718
SA - Sud America 556
AF - Africa 140
OC - Oceania 15
Continente sconosciuto - Info sul continente non disponibili 5
Totale 36.498
Salva come PNG Salva come JPEG
Nazione #
US - Stati Uniti d'America 16.971
GB - Regno Unito 2.597
SG - Singapore 2.005
DE - Germania 2.001
FR - Francia 1.968
IT - Italia 1.817
CN - Cina 1.515
VN - Vietnam 1.399
UA - Ucraina 927
RU - Federazione Russa 636
KR - Corea 424
BR - Brasile 414
NL - Olanda 368
IE - Irlanda 340
TR - Turchia 306
AT - Austria 262
CH - Svizzera 260
HK - Hong Kong 224
IN - India 218
FI - Finlandia 201
SE - Svezia 189
JP - Giappone 128
CA - Canada 88
MY - Malesia 79
BE - Belgio 77
ID - Indonesia 67
TW - Taiwan 54
BD - Bangladesh 52
ZA - Sudafrica 51
GR - Grecia 49
TH - Thailandia 42
PH - Filippine 41
AR - Argentina 40
JO - Giordania 39
SN - Senegal 39
CL - Cile 37
RO - Romania 36
ES - Italia 35
PL - Polonia 35
IQ - Iraq 34
AP - ???statistics.table.value.countryCode.AP??? 31
MX - Messico 26
IL - Israele 21
VE - Venezuela 21
EU - Europa 20
PK - Pakistan 20
EC - Ecuador 18
AE - Emirati Arabi Uniti 17
BG - Bulgaria 14
HN - Honduras 14
AU - Australia 13
IR - Iran 13
MA - Marocco 13
CO - Colombia 12
NO - Norvegia 10
SA - Arabia Saudita 9
CZ - Repubblica Ceca 8
EG - Egitto 8
PT - Portogallo 8
HU - Ungheria 6
KZ - Kazakistan 6
LV - Lettonia 6
TN - Tunisia 6
UZ - Uzbekistan 6
AL - Albania 5
AZ - Azerbaigian 5
LT - Lituania 5
PY - Paraguay 5
BO - Bolivia 4
DO - Repubblica Dominicana 4
KE - Kenya 4
OM - Oman 4
PE - Perù 4
CR - Costa Rica 3
DZ - Algeria 3
EE - Estonia 3
ET - Etiopia 3
GP - Guadalupe 3
MK - Macedonia 3
NP - Nepal 3
BH - Bahrain 2
BY - Bielorussia 2
DK - Danimarca 2
GA - Gabon 2
GT - Guatemala 2
HR - Croazia 2
JM - Giamaica 2
KW - Kuwait 2
LK - Sri Lanka 2
MM - Myanmar 2
NG - Nigeria 2
NZ - Nuova Zelanda 2
SC - Seychelles 2
A2 - ???statistics.table.value.countryCode.A2??? 1
AO - Angola 1
BM - Bermuda 1
BW - Botswana 1
CG - Congo 1
CI - Costa d'Avorio 1
GE - Georgia 1
Totale 36.485
Salva come PNG Salva come JPEG
Città #
Ashburn 3.887
Southend 2.159
Seattle 1.371
Fairfield 1.227
Singapore 1.039
San Jose 833
Woodbridge 554
Chandler 512
Santa Clara 502
Jacksonville 501
Cambridge 457
Houston 453
Wilmington 433
Ann Arbor 424
Princeton 420
Buffalo 375
Hanoi 351
Des Moines 348
Ho Chi Minh City 342
Dublin 324
San Ramon 312
Beijing 293
Turin 268
Berlin 258
Dallas 241
Izmir 229
Bern 226
Chicago 203
Boardman 201
Helsinki 186
San Francisco 173
Hong Kong 172
Zhengzhou 163
Bologna 153
Seoul 149
Lauterbourg 142
San Donato Milanese 142
North Bergen 132
Vienna 131
Baltimore 129
Pennsylvania Furnace 125
Overberg 123
Zaporozhye 103
Los Angeles 101
Council Bluffs 97
Hangzhou 95
Torino 91
Monopoli 88
Shanghai 83
Milan 80
Saint Petersburg 80
Phoenix 77
Rome 76
New York 74
Norwalk 74
Mountain View 66
Las Vegas 62
Munich 61
Brussels 59
Nuremberg 57
Redwood City 57
Haiphong 56
Padua 55
San Diego 55
Hefei 54
The Dalles 54
Jakarta 53
Amsterdam 51
Malatya 49
Da Nang 46
Groningen 46
London 45
Atlanta 44
Guangzhou 42
Tokyo 42
Athens 41
Indiana 38
Toronto 38
Strassbourg 36
São Paulo 36
Muizenberg 35
Clearwater 31
Costa Mesa 30
Moscow 29
Putian 29
Shenzhen 28
Melun 27
Paris 27
Frankfurt am Main 26
Frankfurt 25
Riva 24
University Park 23
Fremont 21
Verona 21
Dong Ket 20
Bangalore 19
Chennai 18
Kuala Lumpur 18
Rio de Janeiro 18
Topeka 18
Totale 23.512
Salva come PNG Salva come JPEG
Nome #
Two-port network analyzer calibration using an unknown 'thru' 713
A Novel Calibration Algorithm for a Special Class of Multiport Vector Network Analyzers 614
A Comprehensive Mixed-Mode Time-Domain Load- and Source-Pull Measurement System 609
A new class of nonuniform, broadband, nonsymmetrical rectangular coaxial-to-microstrip directional couplers for high power applications 505
Further Improvements in Real-Time Load-Pull Measurement Accuracy 477
Generalized mixed-mode S-parameters 473
Accuracy Improvement of Real-Time Load-Pull Measurements 470
Accuracy evaluation of on-wafer load-pull measurements 466
A new implementation of a multiport automatic network analyzer 466
Broad Band Coaxial Directional Couplers for High Power Applications 460
A Complete Noise- and Scattering-Parameters Test-Set 452
Conformal Mapping Design Tools for Coaxial Couplers with Complex Cross Section 451
A Comparison of Uncertainty Evaluation Methods for On-Wafer S-Parameter Measurements 443
Design of a broadband multiprobe reflectometer 443
Accuracy of a multiport network analyzer 428
Recent Advances in Real-Time Load-Pull Systems 428
Accurate coaxial standard verification by multiport vector network analyzer 428
Simple technique for measuring source reflection coefficient while characterizing active devices 417
Multiport vector network analyzer calibration: a general formulation 417
A Microwave System for Relative Humidity Measurement 415
On-Wafer Calibration Algorithm for Partially Leaky Multiport Vector Network Analyzers 408
A simple NWA calibration algorithm based on a transfer standard 407
Microwave Multiport Measurements for the Digital World 403
Novel hardware and software solutions for a complete linear and non-linear microwave device characterization 399
Harmonic load/source pull strategies for high efficiency PAs design 395
A new, simple, test-set for on-wafer characterization of millimeter-wave electro-optic devices 393
Time domain reflectometry applied to MMIC passive component modeling 386
Testing microwave devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 379
Multiport network analyzer self-calibration: a new approach and some interesting results 377
A new approach to the design of wide-band multiprobe reflectometers 376
A simplified algorithm for leaky network analyzer calibration 373
Accurate on-wafer power and harmonic measurements of mm-wave amplifiers and devices 371
Simple Technique for source reflection coefficient measurement while characterizing active devices 365
Design and realization of an on-wafer two port transfer standard 362
Modern RF and microwave measurement techniques 348
An automated N-port network analyzer for linear and non linear multi-port RF and digital circuits 346
Novel software techniques for automatic microwave measurements 344
A Unified Theory for S-Parameter Uncertainty Evaluation 340
Testing devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients 338
In-fixture calibration of an S-parameter measuring system by means of time domain reflectometry 332
Comparison between a vector multiport network analyzer and the national S-parameter measurement system 331
Microwave Measurements – Part III. Advanced Non-Linear Measurements 326
Large signal 2nd harmonic on wafer MESFET characterization 321
Harmonic Load-Pull Techniques: An Overview of Modern Systems 312
Save the "THRU" in the A.N.A. calibration 310
A NOVEL METHODOLOGY FOR FAST HARMONIC-LOAD CONTROL WITH A PASSIVE TUNER AND AN ACTIVE LOOP 309
Advanced load-pull techniques–From single-ended to multiport/differential measurement systems 304
Multiport VNA Measurements 303
A microwave interferometer system for humidity measurement 296
Ottimizzazione della transizione tra linea coplanare e microstriscia per misure su wafer 296
Load- and source-pull techniques 296
An improved calibration technique for on-wafer large signal characterization 291
Radio frequency and microwave linear and nonlinear characterization 290
Fabrication and nonlinear characterization of GaN HEMTs on SiC and sapphire for high-power applications 288
Multiport and differential S-parameter measurements 285
Miglioramento dell'accuratezza delle misure di load-pull real-time 284
Recent technological advances for modular active harmonic load-pull measurement systems 269
Active, closed-loop, harmonic source- and load-pull systems 268
Recent Improvements in Real-Time Load-Pull Systems 265
QSOLT: a new fast calibration algorithm for two port S-parameter measurements 264
Load pull techniques for millimetre-wave device characterization 264
Three port network analyzer: an original implementation with a simplified calibration procedure 260
The S-matrix Method for High Frequency Capacitance Calibration 260
Fabrication and non-linear load-pull characterization of GaN HEMT on SiC for high power applications 260
A novel pulsed load-pull and S-parameter integrated measurement system 259
Software Solutions for Linear and Non-Linear Microwave Measurements and Calibrations 258
Approccio multimediale sulla didattica sperimentale nelle Misure Elettroniche 257
A Comprehensive GaN HEMT Characterization for Power Amplifier Design 256
A novel active differential/common-mode load for true mixed-mode load-pull systems 250
Caratterizzazione, progetto e misura di accoppiatori direzionali a larga banda per misure di potenza a microonde 248
An improved calibration technique for on-wafer large signal device chracterization suitable up to millimeter waves 245
A Generalized Time-Domain Waveform Test-Set 244
Uncertainty in multiport S-parameters measurements 242
A unified calibration algorithm for scattering and load pull measurement 241
A Simple Calibration Alghorithm for Partially Leaky Model Multiport Vector Network Analyzers 241
Modello di taratura per una nuova classe di analizzatori di reti multiporta 240
From the foundry to the model - A fully automated system for on-wafer MESFET characterization 239
Active and Passive Load Pull systems: from the basic to the future of variable impedance device characterization 238
A complete measurement test-set for non-linear device characterization 238
Overview of Modern Load-Pull and Other Non-Linear Measurement Systems 235
Large-Signal Characterization of an 870MHz Inverse Class-F CrossCoupled Push-Pull PA using Active Mixed-Mode Load-Pull 235
Three port device S-parameter characterization by means of an original three port test set 235
Active, closed-loop, harmonic load- and source-pull systems 234
Accuracy evaluation of on-wafer load-pull measurements 231
Accuracy Improvement of on-wafer load-pull measurements 227
Active harmonic differential / common-mode load-pull with time-domain waveform capabilities 225
Un nuovo metodo per un controllo rapido del carico armonico in presenza di un tuner passivo 225
An unconventional VNA-based time-domain waveform load-pull test bench 222
Microwave Measurements 219
Load-Pull Techniques 217
Incertezza di parametri scattering multiporta 216
An integrated high speed microwave test set for linear and non-linear device characterization 216
Un Sistema Completo per Misure di Dispositivi a Microonde nel Dominio del Tempo 211
Development and implementation of a new multiport calibration alghoritm 210
A generalized harmonic load pull system 208
Sviluppo di una nuova tecnica di calibrazione nel campo delle microonde per componenti multiporte 208
Experimental comparison of active and passive load-pull measurement technologies 207
A new microwave multiport NWA dynamic calibration 206
New perspectives in non linear device and amplifier characterization 205
Un nuovo sistema di load-pull attivo mixed-mode 205
Totale 32.262
Salva come PNG Salva come JPEG
Categoria #
all - tutte 100.909
article - articoli 31.122
book - libri 942
conference - conferenze 63.946
curatela - curatele 0
other - altro 0
patent - brevetti 619
selected - selezionate 0
volume - volumi 4.280
Totale 201.818
Salva come PNG Salva come JPEG


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021136 0 0 0 0 0 0 0 0 0 0 0 136
2021/20221.536 74 136 3 26 49 230 143 50 77 145 281 322
2022/20232.554 225 368 43 187 227 283 424 135 205 18 181 258
2023/2024402 39 24 15 15 59 25 21 17 8 19 64 96
2024/20252.761 55 467 102 255 275 272 73 132 343 211 240 336
2025/20267.026 352 319 531 585 569 586 888 476 1.559 721 142 298
Totale 36.786