A novel test set which integrates an active load pull system with a VNA and a Time Domain receiver is presented. The system has both time and frequency domain measurement capability coupled with a complete configurable load/source control at fundamental and harmonic frequencies. The test set features along with its calibration and some measurement data in Time and Frequency Domain are presented.

A complete measurement test-set for non-linear device characterization / Ferrero, ANDREA PIERENRICO; Teppati, Valeria. - STAMPA. - 40:(2001), pp. 1-3. ((Intervento presentato al convegno IEEE ARFTG Conference tenutosi a San Diego, CA (USA) nel November 2001 [10.1109/ARFTG.2001.327494].

A complete measurement test-set for non-linear device characterization

FERRERO, ANDREA PIERENRICO;TEPPATI, VALERIA
2001

Abstract

A novel test set which integrates an active load pull system with a VNA and a Time Domain receiver is presented. The system has both time and frequency domain measurement capability coupled with a complete configurable load/source control at fundamental and harmonic frequencies. The test set features along with its calibration and some measurement data in Time and Frequency Domain are presented.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/1418478
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