An experimental analysis of on-wafer S-parameter uncertainties is presented. Recently, two different approaches, based either on differential numerical programming or on a fully analytical solution have been introduced. In order estabilish their suitability, a careful comparison is here given for on-wafer meaurements. Through this comparison, possible limitations and causes of errors are also highlighted. Finally, the uncertainty evaluation of the 16-term error model is here presented for the first time.

A Comparison of Uncertainty Evaluation Methods for On-Wafer S-Parameter Measurements / Teppati, Valeria; Ferrero, ANDREA PIERENRICO. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 63:4(2014), pp. 935-942. [10.1109/TIM.2013.2287796]

A Comparison of Uncertainty Evaluation Methods for On-Wafer S-Parameter Measurements

TEPPATI, VALERIA;FERRERO, ANDREA PIERENRICO
2014

Abstract

An experimental analysis of on-wafer S-parameter uncertainties is presented. Recently, two different approaches, based either on differential numerical programming or on a fully analytical solution have been introduced. In order estabilish their suitability, a careful comparison is here given for on-wafer meaurements. Through this comparison, possible limitations and causes of errors are also highlighted. Finally, the uncertainty evaluation of the 16-term error model is here presented for the first time.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2517720
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