An experimental analysis of on-wafer S-parameter uncertainties is presented. Recently, two different approaches, based either on differential numerical programming or on a fully analytical solution have been introduced. In order estabilish their suitability, a careful comparison is here given for on-wafer meaurements. Through this comparison, possible limitations and causes of errors are also highlighted. Finally, the uncertainty evaluation of the 16-term error model is here presented for the first time.

A Comparison of Uncertainty Evaluation Methods for On-Wafer S-Parameter Measurements / Teppati, Valeria; Ferrero, ANDREA PIERENRICO. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 63:4(2014), pp. 935-942. [10.1109/TIM.2013.2287796]

A Comparison of Uncertainty Evaluation Methods for On-Wafer S-Parameter Measurements

TEPPATI, VALERIA;FERRERO, ANDREA PIERENRICO
2014

Abstract

An experimental analysis of on-wafer S-parameter uncertainties is presented. Recently, two different approaches, based either on differential numerical programming or on a fully analytical solution have been introduced. In order estabilish their suitability, a careful comparison is here given for on-wafer meaurements. Through this comparison, possible limitations and causes of errors are also highlighted. Finally, the uncertainty evaluation of the 16-term error model is here presented for the first time.
File in questo prodotto:
File Dimensione Formato  
06656861.pdf

accesso aperto

Tipologia: 2. Post-print / Author's Accepted Manuscript
Licenza: PUBBLICO - Tutti i diritti riservati
Dimensione 1.09 MB
Formato Adobe PDF
1.09 MB Adobe PDF Visualizza/Apri
Pubblicazioni consigliate

Caricamento pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2517720
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo