Accuracy evaluation of on-wafer load-pull measurements

Ferrero, Andrea Pierenrico; Teppati, Valeria; Carullo, Alessio

doi:10.1109/22.899960

This paper investigates the residual calibration uncertainty effects in on-wafer load-pull measurements. After the systematic error correction (based on a traditional error-box model) has been applied, the residual uncertainty on absolute-power-level measurements can dramatically affect the accuracy of typical nonlinear parameters such as gain and power-added efficiency under different load conditions. The main residual uncertainty contributions are highlighted both by a theoretical analysis and experiments. Finally, one of the possible causes for intermodulation-distortion measurement errors is shown.

Accuracy evaluation of on-wafer load-pull measurements / FERRERO A.; TEPPATI V.; CARULLO A.. - In: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. - ISSN 0018-9480. - 49:1(2001), pp. 39-43. [10.1109/22.899960]

Titolo:	Accuracy evaluation of on-wafer load-pull measurements
Autori:	FERRERO, ANDREA PIERENRICO TEPPATI, VALERIA CARULLO, ALESSIO
Data di pubblicazione:	2001
Rivista:	IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
Digital Object Identifier (DOI):	http://dx.doi.org/10.1109/22.899960
Appare nelle tipologie:	1.1 Articolo in rivista

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