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Risultati 401 - 410 di 470 (tempo di esecuzione: 0.031 secondi).
Recent Trends and Perspectives on Defect-Oriented Testing
2022 Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.
Recovery scheme for hardening system on programmable chips
2009 Meinhardt, C; Reis, R; Violante, Massimo; SONZA REORDA, Matteo
Reducing SEU Sensitivity in LIN Networks: Selective and Collaborative Hardening Techniques
2014 A., Vaskova; A., Fabregat; M., Portela García; M., García Valderas; C., López Ongil; SONZA REORDA, Matteo
Reducing Test Application Time through Interleaved Scan
2002 Corno, Fulvio; SONZA REORDA, Matteo; Squillero, Giovanni
REFU: Redundant Execution with Idle Functional Units, Fault Tolerant GPGPU architecture
2022 Raghunandana, K. K.; Varaprasad, B. K. S. V. L.; Sonza Reorda, M.; Singh, Virendra
Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG
2015 Palermo, N.; Tihhomirov, V.; Copetti, T. S.; Jenihhin, M.; Raik, J.; Kostin, S.; Gaudesi, M.; Squillero, Giovanni; SONZA REORDA, Matteo; Vargas, F.; Poehls, L. Bolzani
Rejuvenation of nbti-impacted processors using evolutionary generation of assembler programs
2016 Pellerey, Francesco; Jenihhin, Maksim; Squillero, Giovanni; Raik, Jaan; SONZA REORDA, Matteo; Tihhomirov, Valentin; Ubar, Raimund
Reliability Analysis Reloaded: How Will We Survive?
2013 Robert, Aitken; Görschwin, Fey; Zbigniew T., Kalbarczyk; Frank, Reichenbach; SONZA REORDA, Matteo
Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections
2022 Guerrero-Balaguera, Juan-David; Galasso, Luigi; Sierra, Robert Limas; Reorda, Matteo Sonza
Reliability Estimation of Split DNN Models for Distributed Computing in IoT Systems
2023 Guerrero-Balaguera, Juan-David; Harshbarger, Ian A.; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino (Italy) nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. | 1-gen-2022 | P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + | _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdf; Recent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf |
| Recovery scheme for hardening system on programmable chips / Meinhardt, C; Reis, R; Violante, Massimo; SONZA REORDA, Matteo. - (2009), pp. 1-6. (Intervento presentato al convegno 10th IEEE Latin American Test Workshop (LATW '09) tenutosi a Buzios (Brazil) nel 2-5 March 2009) [10.1109/LATW.2009.4813816]. | 1-gen-2009 | VIOLANTE, MASSIMOSONZA REORDA, Matteo + | - |
| Reducing SEU Sensitivity in LIN Networks: Selective and Collaborative Hardening Techniques / A., Vaskova; A., Fabregat; M., Portela García; M., García Valderas; C., López Ongil; SONZA REORDA, Matteo. - STAMPA. - (2014). (Intervento presentato al convegno 2014 15th Latin American Test Workshop - LATW) [10.1109/LATW.2014.6841924]. | 1-gen-2014 | SONZA REORDA, Matteo + | - |
| Reducing Test Application Time through Interleaved Scan / Corno, Fulvio; SONZA REORDA, Matteo; Squillero, Giovanni. - (2002), pp. 89-94. (Intervento presentato al convegno SBCCI2002: 15th IEEE Symposium on Integrated Circuits and Systems Design, Porto Alegre (Brasil)). | 1-gen-2002 | CORNO, FulvioSONZA REORDA, MatteoSQUILLERO, Giovanni | - |
| REFU: Redundant Execution with Idle Functional Units, Fault Tolerant GPGPU architecture / Raghunandana, K. K.; Varaprasad, B. K. S. V. L.; Sonza Reorda, M.; Singh, Virendra. - (2022), pp. 394-397. (Intervento presentato al convegno 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) tenutosi a Nicosia, Cyprus nel 04-06 July 2022) [10.1109/ISVLSI54635.2022.00088]. | 1-gen-2022 | Sonza Reorda, M. + | REFU_Redundant_Execution_with_Idle_Functional_Units_Fault_Tolerant_GPGPU_architecture.pdf; REFU_Redundant_Execution_with_Idle_Functional_Units_Fault_Tolerant_GPGPU_architecture.pdf |
| Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG / Palermo, N.; Tihhomirov, V.; Copetti, T. S.; Jenihhin, M.; Raik, J.; Kostin, S.; Gaudesi, M.; Squillero, Giovanni; SONZA REORDA, Matteo; Vargas, F.; Poehls, L. Bolzani. - STAMPA. - (2015). (Intervento presentato al convegno 16th IEEE Latin-American Test Symposium, LATS 2015 tenutosi a mex nel 2015) [10.1109/LATW.2015.7102405]. | 1-gen-2015 | SQUILLERO, GiovanniSONZA REORDA, Matteo + | - |
| Rejuvenation of nbti-impacted processors using evolutionary generation of assembler programs / Pellerey, Francesco; Jenihhin, Maksim; Squillero, Giovanni; Raik, Jaan; SONZA REORDA, Matteo; Tihhomirov, Valentin; Ubar, Raimund. - STAMPA. - (2016), pp. 304-309. (Intervento presentato al convegno 25th IEEE Asian Test Symposium, ATS 2016 tenutosi a jpn nel 2016) [10.1109/ATS.2016.57]. | 1-gen-2016 | SQUILLERO, GIOVANNISONZA REORDA, Matteo + | - |
| Reliability Analysis Reloaded: How Will We Survive? / Robert, Aitken; Görschwin, Fey; Zbigniew T., Kalbarczyk; Frank, Reichenbach; SONZA REORDA, Matteo. - STAMPA. - (2013), pp. 358-367. (Intervento presentato al convegno Design, Automation & Test in Europe tenutosi a Grenoble (France) nel March 2013). | 1-gen-2013 | SONZA REORDA, Matteo + | - |
| Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections / Guerrero-Balaguera, Juan-David; Galasso, Luigi; Sierra, Robert Limas; Reorda, Matteo Sonza. - ELETTRONICO. - (2022), pp. 959-962. (Intervento presentato al convegno 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)) [10.1109/ISIE51582.2022.9831549]. | 1-gen-2022 | Guerrero-Balaguera, Juan-DavidReorda, Matteo Sonza + | Reliability_Assessment_of_Neural_Networks_in_GPUs_A_Framework_For_Permanent_Faults_Injections.pdf |
| Reliability Estimation of Split DNN Models for Distributed Computing in IoT Systems / Guerrero-Balaguera, Juan-David; Harshbarger, Ian A.; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - (2023), pp. 1-4. (Intervento presentato al convegno 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE) tenutosi a Helsinki (FIN) nel 19-21 June 2023) [10.1109/ISIE51358.2023.10227928]. | 1-gen-2023 | Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo + | Reliability_Estimation_of_Split_DNN_Models_for_Distributed_Computing_in_IoT_Systems.pdf |
Risultati 401 - 410 di 470 (tempo di esecuzione: 0.031 secondi).
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