Archivio Istituzionale della RicercaSfoglia per Autore
A novel SBST generation technique for path-delay faults in microprocessors based on BDD analysis and evolutionary algorithm
2008 Christou, K; Michael, M. K.; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization
2009 Appello, D.; Bernardi, Paolo; Cagliesi, R.; Giancarlini, M.; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study
2009 Appello, D.; Bernardi, Paolo; Gerardin, S.; Grosso, Michelangelo; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo
Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core
2009 Rech, P; Paccagnella, A; Grosso, Michelangelo; SONZA REORDA, Matteo; Melchiori, F; Appello, D.
Exploiting Embedded FPGA in On-line Software-based Test Strategies for Microprocessor Cores
2009 Grosso, Michelangelo; SONZA REORDA, Matteo
Effective Diagnostic Pattern Generation Strategy forTransition-Delay Faults in Full-Scan SOCs
2009 Appello, D; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
Evaluating Alpha-induced Soft Errors in Embedded Microprocessors
2009 Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo; Appello, D.; Rech, P.; Gerardin, S.; Paccagnella, A.
A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores
2009 Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
Enhanced Observability in Microprocessor-based Systems for Permanent and Transient Fault Resiliency
2010 Entrena, L.; Gallardo Campos, M.; Garcia Valderas, M.; Grosso, Michelangelo; Lopez Ongil, C.; Portela Garcia, M.; SONZA REORDA, Matteo
A Novel Scalable and Reconfigurable Emulation Platform for Embedded Systems Verification
2010 DI MARZIO, M; Grosso, Michelangelo; SONZA REORDA, Matteo; Sterpone, Luca; Audisio, G; Sabatini, M.
Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts
2010 Rech, P.; Grosso, Michelangelo; Melchiori, F.; Loparco, D.; Appello, D.; Dilillo, L.; Paccagnella, A.; SONZA REORDA, Matteo
An adaptive tester architecture for volume diagnosis
2010 Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo
A fault grading methodology for software-based self-test programs in systems-on-chip
2010 Ballan, O.; Bernardi, Paolo; Fontana, G.; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO
Functional Test Generation for DMA Controllers
2010 Grosso, Michelangelo; W. J., PEREZ H; Ravotto, D; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; VELASCO MEDINA, J.
A Software-based self-test methodology for system peripherals
2010 Grosso, Michelangelo; W. J. Perez, H.; Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; J., Velasco Medina
An On-line Fault Detection Technique based on Embedded Debug Features
2010 Grosso, Michelangelo; SONZA REORDA, Matteo; M., Portela Garcia; M., Garcia Valderas; C., Lopez Ongil; L., Entrena
A Hybrid Approach for Detection and Correction of Transient Faults in SoCs
2010 Bernardi, Paolo; Grosso, Michelangelo; Bolzani Poehls, L.; SONZA REORDA, Matteo
Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug
2010 Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo
Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core
2010 Appello, D.; Grosso, Michelangelo; Loparco, D.; Melchiori, F.; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo
A Programmable BIST for DRAM Testing and Diagnosis
2010 Grosso, Michelangelo; Bernardi, Paolo; SONZA REORDA, Matteo; Y., Zhang
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A novel SBST generation technique for path-delay faults in microprocessors based on BDD analysis and evolutionary algorithm / Christou, K; Michael, M. K.; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - (2008), pp. 389-394. (Intervento presentato al convegno 26th IEEE VLSI Test Symposium tenutosi a San Diego, CA, USA nel apr 27 - may 1) [10.1109/VTS.2008.37]. | 1-gen-2008 | BERNARDI, PAOLOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | - |
| Automatic Functional Stress Pattern Generation for SoC Reliability Characterization / Appello, D.; Bernardi, Paolo; Cagliesi, R.; Giancarlini, M.; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - (2009). (Intervento presentato al convegno 14th IEEE European Test Symposium, 2009) [10.1109/ETS.2009.16]. | 1-gen-2009 | BERNARDI, PAOLOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | - |
| DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study / Appello, D.; Bernardi, Paolo; Gerardin, S.; Grosso, Michelangelo; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo. - (2009), pp. 276-281. (Intervento presentato al convegno 27th IEEE VLSI Test Symposium (VTS '09) tenutosi a Santa Cruz, USA nel May 2009) [10.1109/VTS.2009.26]. | 1-gen-2009 | BERNARDI, PAOLOGROSSO, MICHELANGELOP. RECHSONZA REORDA, Matteo + | - |
| Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core / Rech, P; Paccagnella, A; Grosso, Michelangelo; SONZA REORDA, Matteo; Melchiori, F; Appello, D.. - (2009), pp. 481-488. (Intervento presentato al convegno European Conference on Radiation and Its Effects on Components and Systems (RADECS) tenutosi a Bruges, Belgium nel Sept. 14-18, 2009) [10.1109/RADECS.2009.5994699]. | 1-gen-2009 | RECH PGROSSO, MICHELANGELOSONZA REORDA, Matteo + | - |
| Exploiting Embedded FPGA in On-line Software-based Test Strategies for Microprocessor Cores / Grosso, Michelangelo; SONZA REORDA, Matteo. - (2009), pp. 95-100. (Intervento presentato al convegno 15th IEEE International On-Line Testing Symposium tenutosi a Sesimbra-Lisbon, Portugal nel June 24-26, 2009) [10.1109/IOLTS.2009.5195989]. | 1-gen-2009 | GROSSO, MICHELANGELOSONZA REORDA, Matteo | - |
| Effective Diagnostic Pattern Generation Strategy forTransition-Delay Faults in Full-Scan SOCs / Appello, D; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - 17 (11):(2009), pp. 1654-1659. [10.1109/TVLSI.2008.2006177] | 1-gen-2009 | BERNARDI, PAOLOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | - |
| Evaluating Alpha-induced Soft Errors in Embedded Microprocessors / Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo; Appello, D.; Rech, P.; Gerardin, S.; Paccagnella, A.. - (2009). [10.1109/IOLTS.2009.5195985] | 1-gen-2009 | BERNARDI, PAOLOGROSSO, MICHELANGELOSONZA REORDA, MatteoP. RECH + | - |
| A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores / Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - (2009), pp. 103-108. (Intervento presentato al convegno 9th International Workshop on Microprocessor Test and Verification (MTV'08) tenutosi a Austin, TX (U.S.A.) nel 8-10 Dic., 2008) [10.1109/MTV.2008.9]. | 1-gen-2009 | BERNARDI, PAOLOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo | - |
| Enhanced Observability in Microprocessor-based Systems for Permanent and Transient Fault Resiliency / Entrena, L.; Gallardo Campos, M.; Garcia Valderas, M.; Grosso, Michelangelo; Lopez Ongil, C.; Portela Garcia, M.; SONZA REORDA, Matteo. - (2010), pp. 240-245. (Intervento presentato al convegno Conference on Design of Circuits and Integrated Systems tenutosi a Lanzarote (E) nel November 17-19, 2010). | 1-gen-2010 | GROSSO, MICHELANGELOSONZA REORDA, Matteo + | - |
| A Novel Scalable and Reconfigurable Emulation Platform for Embedded Systems Verification / DI MARZIO, M; Grosso, Michelangelo; SONZA REORDA, Matteo; Sterpone, Luca; Audisio, G; Sabatini, M.. - (2010), pp. 865-868. (Intervento presentato al convegno IEEE International Symposium on Circuits and Systems, ISCAS tenutosi a Paris, France nel May 30th - June 2nd) [10.1109/ISCAS.2010.5537422]. | 1-gen-2010 | GROSSO, MICHELANGELOSONZA REORDA, MatteoSTERPONE, Luca + | - |
| Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts / Rech, P.; Grosso, Michelangelo; Melchiori, F.; Loparco, D.; Appello, D.; Dilillo, L.; Paccagnella, A.; SONZA REORDA, Matteo. - STAMPA. - (2010), pp. 29-34. (Intervento presentato al convegno IEEE 16th International On-Line Testing Symposium tenutosi a corfu (greece) nel july 2010). | 1-gen-2010 | P. RechGROSSO, MICHELANGELOSONZA REORDA, Matteo + | - |
| An adaptive tester architecture for volume diagnosis / Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo. - STAMPA. - (2010), pp. 227-232. (Intervento presentato al convegno 15th IEEE European Test Symposium (ETS) tenutosi a Prague (Czech Republic) nel May 2010). | 1-gen-2010 | BERNARDI, PAOLOGROSSO, MICHELANGELOSONZA REORDA, Matteo | - |
| A fault grading methodology for software-based self-test programs in systems-on-chip / Ballan, O.; Bernardi, Paolo; Fontana, G.; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO. - (2010), pp. 43-46. (Intervento presentato al convegno International Workshop on Microprocessor Test and Verification tenutosi a Austin (TX), USA nel Dec. 13-15, 2010) [10.1109/MTV.2010.16]. | 1-gen-2010 | BERNARDI, PAOLOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTO + | - |
| Functional Test Generation for DMA Controllers / Grosso, Michelangelo; W. J., PEREZ H; Ravotto, D; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; VELASCO MEDINA, J.. - (2010). (Intervento presentato al convegno 11th IEEE Latin-American Test Workshop 2010 tenutosi a Punta del Este, Uruguay nel March 28-31). | 1-gen-2010 | GROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | - |
| A Software-based self-test methodology for system peripherals / Grosso, Michelangelo; W. J. Perez, H.; Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; J., Velasco Medina. - STAMPA. - (2010), pp. 195-200. (Intervento presentato al convegno 15th IEEE European Test Symposium (ETS) tenutosi a Prague (Czech Republic) nel May 2010). | 1-gen-2010 | GROSSO, MICHELANGELORAVOTTO, DANILOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | - |
| An On-line Fault Detection Technique based on Embedded Debug Features / Grosso, Michelangelo; SONZA REORDA, Matteo; M., Portela Garcia; M., Garcia Valderas; C., Lopez Ongil; L., Entrena. - STAMPA. - (2010), pp. 167-172. (Intervento presentato al convegno IEEE 16th International On-Line Testing Symposium tenutosi a corfu (greece) nel july 2010). | 1-gen-2010 | GROSSO, MICHELANGELOSONZA REORDA, Matteo + | - |
| A Hybrid Approach for Detection and Correction of Transient Faults in SoCs / Bernardi, Paolo; Grosso, Michelangelo; Bolzani Poehls, L.; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING. - ISSN 1545-5971. - STAMPA. - Volume: 7 , Issue: 4:(2010), pp. 439-445. [10.1109/TDSC.2010.33] | 1-gen-2010 | BERNARDI, PAOLOGROSSO, MICHELANGELOSONZA REORDA, Matteo + | - |
| Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug / Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo. - In: IET COMPUTERS & DIGITAL TECHNIQUES. - ISSN 1751-8601. - 4(2):(2010), pp. 104-113. [10.1049/iet-cdt.2008.0122] | 1-gen-2010 | BERNARDI, PAOLOGROSSO, MICHELANGELOREBAUDENGO, MaurizioSONZA REORDA, Matteo | - |
| Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core / Appello, D.; Grosso, Michelangelo; Loparco, D.; Melchiori, F.; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - STAMPA. - 57:4(2010), pp. 2098-2105. [10.1109/TNS.2010.2049119] | 1-gen-2010 | GROSSO, MICHELANGELORECH P.SONZA REORDA, Matteo + | - |
| A Programmable BIST for DRAM Testing and Diagnosis / Grosso, Michelangelo; Bernardi, Paolo; SONZA REORDA, Matteo; Y., Zhang. - (2010). (Intervento presentato al convegno IEEE International Test Conference tenutosi a Austin, USA nel November 2010). | 1-gen-2010 | GROSSO, MICHELANGELOBERNARDI, PAOLOSONZA REORDA, Matteo + | - |
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