Archivio Istituzionale della RicercaKOLAHIMAHMOUDI, NIMA
KOLAHIMAHMOUDI, NIMA
Dipartimento di Automatica e Informatica
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A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements
In corso di stampa Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test
2023 Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries
2022 Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements / Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio. - (In corso di stampa). (Intervento presentato al convegno IEEE International conference on Design, Test & Technology of Integrated Systems (DTTIS) tenutosi a Aix-en-Provence (FR) nel 2024). | In corso di stampa | Bernardi,PaoloKolahimahmoudi,NimaInsinga,Giorgio | DTTIS24_6_pages.pdf |
| A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test / Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio. - (2023), pp. 1-6. (Intervento presentato al convegno Conference on Very Large Scale Integration (VLSI-SoC 2023) tenutosi a Dubai (United Arab Emirates) nel October 16 - 18, 2023) [10.1109/VLSI-SoC57769.2023.10321848]. | 1-gen-2023 | Bernardi, PaoloKolahimahmoudi, NimaInsinga, Giorgio | A_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdf; A_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdf |
| Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries / Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud. - (2022), pp. 1-2. (Intervento presentato al convegno 2022 IEEE European Test Symposium tenutosi a Barcelona (SP) nel 23-27 Maggio 2022) [10.1109/ETS54262.2022.9810392]. | 1-gen-2022 | Cantoro, RiccardoGarau, FrancescoKolahimahmoudi, NimaSartoni, SandroReorda, Matteo Sonza + | ETS22___Effective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self_Test_Libraries.pdf; Effective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self-Test_Libraries.pdf |