Archivio Istituzionale della RicercaKOLAHIMAHMOUDI, NIMA
KOLAHIMAHMOUDI, NIMA
Dipartimento di Automatica e Informatica
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A Data-Driven ANN-Based Model for FeCAP & FeFET: Orienting to SPICE and Circuit Design
2026 Wang, Changhao; Yuan, Sicong; Bellarmino, Nicolò; Chen, Danyang; Kolahimahmoudi, Nima; Wang, Honghao; Xun, Hanzhi; Li, Xiuyan; Wang, Lin; Yin, Chujun; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Hamdioui, Said; Squillero, Giovanni; Cantoro, Riccardo
Automated Generation of Software-Based Self-Test from ATPG Patterns targeting Transition Delay Faults in the decode stage of the RISC-V based microcontrollers
2026 Kolahimahmoudi, Nima; Angione, Francesco; Bernardi, Paolo
Extended design and linearity analysis of a 6-bit low-area hybrid ADC design for local system-on-chip measurements
2025 Kolahimahmoudi, Nima; Insinga, Giorgio; Bernardi, Paolo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A Data-Driven ANN-Based Model for FeCAP & FeFET: Orienting to SPICE and Circuit Design / Wang, C., Yuan, S., Bellarmino, N., Chen, D., Kolahimahmoudi, N., Wang, H., Xun, H., Li, X., Wang, L., Yin, C., Li, C., Taouil, M., Fieback, M., Hamdioui, S., Squillero, G., Cantoro, R.. - In: IEEE ELECTRON DEVICE LETTERS. - ISSN 0741-3106. - 47:6(2026), pp. 1233-1236. [10.1109/led.2026.3680006] | 1-gen-2026 | Wang, ChanghaoBellarmino, NicolòKolahimahmoudi, NimaHamdioui, SaidSquillero, GiovanniCantoro, Riccardo + | A_Data-Driven_ANN-Based_Model_for_FeCAP_amp_FeFET_Orienting_to_SPICE_and_Circuit_Design.pdf; A_Data-Driven_ANN-Based_Model_for_FeCAP_and_FeFET_Orienting_to_SPICE_and_Circuit_Design.pdf |
| Automated Generation of Software-Based Self-Test from ATPG Patterns targeting Transition Delay Faults in the decode stage of the RISC-V based microcontrollers / Kolahimahmoudi, N., Angione, F., Bernardi, P.. - In: IEEE ACCESS. - ISSN 2169-3536. - 14:(2026), pp. 127239-127253. [10.1109/access.2026.3723024] | 1-gen-2026 | Kolahimahmoudi, NimaAngione, FrancescoBernardi, Paolo | Automated_Generation_of_Software-Based_Self-Test_From_ATPG_Patterns_Targeting_Transition_Delay_Faults_in_the_Decode_Stage_of_the_RISC-V-Based_Microcontrollers.pdf |
| Extended design and linearity analysis of a 6-bit low-area hybrid ADC design for local system-on-chip measurements / Kolahimahmoudi, N., Insinga, G., Bernardi, P.. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - 118:(2025). [10.1016/j.micpro.2025.105191] | 1-gen-2025 | Nima KolahimahmoudiGiorgio InsingaPaolo Bernardi | 1-s2.0-S0141933125000584-main.pdf |