RIBOTTA, LUIGI

RIBOTTA, LUIGI  

Dipartimento di Elettronica e Telecomunicazioni  

049987  

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Citazione Data di pubblicazione Autori File
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires / Ribotta, Luigi; Delvallée, Alexandra; Cara, Eleonora; Bellotti, Roberto; Giura, Andrea; Carlo, Ivan De; Fretto, Matteo; Knulst, Walter; Koops, Richard; Torre, Bruno; Saghi, Zineb; Boarino, Luca. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 35:10(2024), pp. 1-18. [10.1088/1361-6501/ad5e9f] 1-gen-2024 Ribotta, LuigiCara, EleonoraCarlo, Ivan DeFretto, MatteoTorre, BrunoBoarino, Luca + Ribotta_2024_Meas._Sci._Technol._35_105014.pdf
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes / Bellotti, Roberto; Bartolo Picotto, Gian; Ribotta, Luigi. - In: NANOMANUFACTURING AND METROLOGY. - ISSN 2520-8128. - ELETTRONICO. - (2022). [10.1007/s41871-022-00125-x] 1-gen-2022 Luigi Ribotta + Bellotti2022.pdf
Dimensional metrology at the nanoscale: quantitative characterization of nanoparticles by means of metrological atomic force microscopy / Ribotta, Luigi. - (2022 Nov 04), pp. 1-240. 4-nov-2022 RIBOTTA, LUIGI PhD_thesis_Ribotta.pdfPhD_abstract_Ribotta.pdf
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy / Maurino, Valter; Pellegrino, Francesco; bartolo picotto, Gian; Ribotta, Luigi. - In: ULTRAMICROSCOPY. - ISSN 0304-3991. - ELETTRONICO. - (2022). [10.1016/j.ultramic.2022.113480] 1-gen-2022 luigi ribotta + Quantitative 3D Characterization of Critical Sizes by AFM.pdfMaurino2022.pdfULTRAM-D-21-00168_R1.pdf
Atomic force microscopy metrology of non-spherical nanoparticles / Maurino, Valter; Pellegrino, Francesco; Bartolo PICOTTO, Gian; Ribotta, Luigi. - (2020). (Intervento presentato al convegno 106° Congresso Nazionale Società Italiana di Fisica nel 14-18 Settembre 2020). 1-gen-2020 Luigi RIBOTTA + Abstract SIF 2020.docx
INRiM Technical Report 26/2020 - Indoor and outdoor measurements of particulate matter concentration in air during wintertime performed in INRiM Campus and in the CNR Research Area of Turin by using particle counters / Ribotta, Luigi. - ELETTRONICO. - (2020). 1-gen-2020 luigi ribotta I.N.RI.M. TECHNICAL REPORT 26-2020.pdf
Quarantena / Ribotta, Luigi - In: Virus ex machina - Scritti meta-scientifici al tempo del Coronavirus / Vittorio Marchis, Marco Pozzi. - [s.l] : Mimesis, 2020. - ISBN 9788857571966. 1-gen-2020 luigi ribotta Virus-ex-Machina_Quarantena_Ribotta.docx
Tip-sample characterization in the AFM study of a rod-shaped nanostructure / Picotto, Gian Bartolo; Vallino, Marta; Ribotta, Luigi. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - (2020). [10.1088/1361-6501/ab7bc2] 1-gen-2020 Ribotta, Luigi + Picotto+et+al_2020_Meas._Sci._Technol._10.1088_1361-6501_ab7bc2.pdfRibotta-Tip-sample.pdf
Metrologia di superfici funzionali per la caratterizzazione di celle fotovoltaiche / Valentina, Furin; Gian Bartolo, Picotto; Ribotta, Luigi. - (2019). (Intervento presentato al convegno A&T - Automation & Testing - LA FIERA DEDICATA A INDUSTRIA 4.0, MISURE E PROVE, ROBOTICA, TECNOLOGIE INNOVATIVE). 1-gen-2019 RIBOTTA, LUIGI + 1218_Ribotta_INRIM_abstract esteso.pdf
Metrological characterization of nanoparticles by mAFM / Maurino, Valter; Pellegrino, Francesco; Bartolo Picotto, Gian; Ribotta, Luigi. - (2019). (Intervento presentato al convegno 6th Nano Today Conference nel 16-20 Giugno 2019). 1-gen-2019 Luigi Ribotta + -
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells / Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Bartolo Picotto, Gian; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - (2019). [10.1088/2051-672X/ab370e] 1-gen-2019 Luigi Ribotta + Bellotti+et+al_2019_Surf._Topogr.__Metrol._Prop._10.1088_2051-672X_ab370e.pdf
Tip-sample interaction in the AFM characterization of bio-plant nanostructures / Carofiglio, Marco; Damiani, Manuel; Giordano, Marco; Nguyen, Linh; Bartolo Picotto, Gian; Ribotta, Luigi; Vallino, Marta. - (2019). (Intervento presentato al convegno 6th Nano Today Conference nel 16-20 Giugno 2019). 1-gen-2019 Marco CarofiglioLuigi Ribotta + -
Tip-sample interactions in the AFM study of rod-shaped nanostructures / bartolo picotto, Gian; Ribotta, Luigi; Vallino, Marta. - (2019). (Intervento presentato al convegno NanoScale 2019). 1-gen-2019 luigi ribotta + -
3D characterization of printed structures by stylus- and optical- based measurements / Bellotti, Roberto; Maras, Claire; Bartolo Picotto, Gian; Pometto, Marco; Ribotta, Luigi. - STAMPA. - (2018), pp. 493-494. (Intervento presentato al convegno euspen - european society for precision engineering and nanotechnology tenutosi a Venezia nel 2018). 1-gen-2018 Luigi Ribotta + -
A function-driven characterization of printed conductors on PV cells / Bellotti, Roberto; Furin, Valentina; Maras, Claire; Bartolo Picotto, Gian; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - 6:(2018). [10.1088/2051-672X/aabe20] 1-gen-2018 Luigi Ribotta + A function-driven characterization of printed conductors on PV cells.pdf
AFM metrology of shape controlled TiO2 nanoparticles / Maurino, Valter; Pellegrino, Francesco; Bartolo Picotto, Gian; Ribotta, Luigi. - (2018). (Intervento presentato al convegno NanoInnovation 2018 Conference&Exhibition). 1-gen-2018 Luigi Ribotta + -
Morphology-driven parameters of engineered functional surfaces / Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Bartolo Picotto, Gian; Ribotta, Luigi. - (2017). (Intervento presentato al convegno Macroscale - Recent Development in Traceable Dimensional Measurements nel 17-19 October 2017). 1-gen-2017 Luigi Ribotta + -