Archivio Istituzionale della RicercaRIBOTTA, LUIGI
RIBOTTA, LUIGI
Dipartimento di Elettronica e Telecomunicazioni
049987
AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires
2024 Ribotta, Luigi; Delvallée, Alexandra; Cara, Eleonora; Bellotti, Roberto; Giura, Andrea; Carlo, Ivan De; Fretto, Matteo; Knulst, Walter; Koops, Richard; Torre, Bruno; Saghi, Zineb; Boarino, Luca
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes
2022 Bellotti, Roberto; Bartolo Picotto, Gian; Ribotta, Luigi
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy
2022 Maurino, Valter; Pellegrino, Francesco; bartolo picotto, Gian; Ribotta, Luigi
Tip-sample characterization in the AFM study of a rod-shaped nanostructure
2020 Picotto, Gian Bartolo; Vallino, Marta; Ribotta, Luigi
Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells
2019 Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Bartolo Picotto, Gian; Ribotta, Luigi
A function-driven characterization of printed conductors on PV cells
2018 Bellotti, Roberto; Furin, Valentina; Maras, Claire; Bartolo Picotto, Gian; Ribotta, Luigi
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires / Ribotta, Luigi; Delvallée, Alexandra; Cara, Eleonora; Bellotti, Roberto; Giura, Andrea; Carlo, Ivan De; Fretto, Matteo; Knulst, Walter; Koops, Richard; Torre, Bruno; Saghi, Zineb; Boarino, Luca. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - 35:10(2024), pp. 1-18. [10.1088/1361-6501/ad5e9f] | 1-gen-2024 | Ribotta, LuigiCara, EleonoraCarlo, Ivan DeFretto, MatteoTorre, BrunoBoarino, Luca + | Ribotta_2024_Meas._Sci._Technol._35_105014.pdf |
| AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes / Bellotti, Roberto; Bartolo Picotto, Gian; Ribotta, Luigi. - In: NANOMANUFACTURING AND METROLOGY. - ISSN 2520-8128. - ELETTRONICO. - (2022). [10.1007/s41871-022-00125-x] | 1-gen-2022 | Luigi Ribotta + | Bellotti2022.pdf |
| Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy / Maurino, Valter; Pellegrino, Francesco; bartolo picotto, Gian; Ribotta, Luigi. - In: ULTRAMICROSCOPY. - ISSN 0304-3991. - ELETTRONICO. - (2022). [10.1016/j.ultramic.2022.113480] | 1-gen-2022 | luigi ribotta + | Quantitative 3D Characterization of Critical Sizes by AFM.pdf; Maurino2022.pdf; ULTRAM-D-21-00168_R1.pdf |
| Tip-sample characterization in the AFM study of a rod-shaped nanostructure / Picotto, Gian Bartolo; Vallino, Marta; Ribotta, Luigi. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - (2020). [10.1088/1361-6501/ab7bc2] | 1-gen-2020 | Ribotta, Luigi + | Picotto+et+al_2020_Meas._Sci._Technol._10.1088_1361-6501_ab7bc2.pdf; Ribotta-Tip-sample.pdf |
| Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells / Bellotti, Roberto; Furin, Valentina; Marsura, Alessandro; Bartolo Picotto, Gian; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - (2019). [10.1088/2051-672X/ab370e] | 1-gen-2019 | Luigi Ribotta + | Bellotti+et+al_2019_Surf._Topogr.__Metrol._Prop._10.1088_2051-672X_ab370e.pdf |
| A function-driven characterization of printed conductors on PV cells / Bellotti, Roberto; Furin, Valentina; Maras, Claire; Bartolo Picotto, Gian; Ribotta, Luigi. - In: SURFACE TOPOGRAPHY. - ISSN 2051-672X. - 6:(2018). [10.1088/2051-672X/aabe20] | 1-gen-2018 | Luigi Ribotta + | A function-driven characterization of printed conductors on PV cells.pdf |