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LIMAS SIERRA, ROBERT ALEXANDER

LIMAS SIERRA, ROBERT ALEXANDER  

Dipartimento di Automatica e Informatica  

098709  

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Analyzing hardware accelerators’ reliability: from design exploration to fast evaluation with hyperscalers / Guerrero-Balaguera, J., Limas Sierra, R., Vilar De Farias, G., Abed, S., Bagbaba, A.C., Rodriguez Condia, J.E.. - ELETTRONICO. - (2026). (2026 17th IEEE Latin American Symposium on Circuits and Systems Arequipa (PE) 24-27 February 2026) [10.1109/LASCAS67804.2026.11457105]. 1-gen-2026 Guerrero-Balaguera, Juan-DavidLimas Sierra, RobertVilar de Farias, GustavoAbed, Sergiu-MohamedRodriguez Condia, Josie E. + lascas_final.pdf; Analyzing_Hardware_Accelerators_Reliability_From_Design_Exploration_to_Fast_Evaluation_with_Hyperscalers.pdf
About the Functional In-Field Self-Testing of AI Accelerators / Guerrero-Balaguera, J., Rodriguez condia, J.E., Sierra, R.L., Reorda, M.S.. - ELETTRONICO. - (2025), pp. 1-6. (2025 IEEE 26th Latin American Test Symposium (LATS) San Andres Island (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963960]. 1-gen-2025 Guerrero-Balaguera, Juan-DavidRodriguez condia, Josie EstebanSierra, Robert LimasReorda, Matteo Sonza About_the_Functional_In-Field_Self-Testing_of_AI_Accelerators.pdf
Improving CNN Runtime Robustness Against Soft Errors by Dropout Layer Optimization / Sierra, R.L., Esposito, G., Guerrero-Balaguera, J., Rodriguez Condia, J.E., Reorda, M.S.. - (2025), pp. 1-6. (2025 IEEE 26th Latin American Test Symposium (LATS) San Andres Islas (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963963]. 1-gen-2025 Sierra, Robert LimasEsposito, GiuseppeGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza Improving_CNN_Runtime_Robustness_Against_Soft_Errors_by_Dropout_Layer_Optimization.pdf
IoT and Edge Computing: Applications and Reliability Implications / Caro-Anzola, Edward-W., Esposito, G., Guerrero-Balaguera, J., Jiménez-López, Andrés-F., Jiménez-López, Fabián-R., Limas-Sierra, R., Ramirez-Espinosa, G., Giusto, E., Montrucchio, B., Vera-Cely, Oscar-F., Rodriguez Condia, J.E.. - ELETTRONICO. - (2025), pp. 1-10. (2025 IEEE 26th Latin American Test Symposium (LATS) San Andres Island (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963944]. 1-gen-2025 Esposito, GiuseppeGuerrero-Balaguera, Juan-DavidLimas-Sierra, RobertRamirez-Espinosa, GustavoGiusto, EdoardoMontrucchio, BartolomeoRodriguez Condia, Josie Esteban + _LATS_25__Special_Session__IoT_and_Edge_Computing__Applications_and_Reliability_Implications.pdf; IoT_and_Edge_Computing_Applications_and_Reliability_Implications.pdf
Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations / Limas Sierra, R., Guerrero-Balaguera, J., Pessia, F., Rodriguez Condia, J.E., Reorda, M.S.. - (2024). (2024 IEEE 42nd VLSI Test Symposium (VTS) Tempe, AZ (USA) 22-24 April 2024) [10.1109/vts60656.2024.10538940]. 1-gen-2024 Limas Sierra, RobertGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza + Analyzing_the_Impact_of_Scheduling_Policies_on_the_Reliability_of_GPUs_Running_CNN_Operations.pdf
Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats / Limas Sierra, R.A., Guerrero-Balaguera, J., Rodriguez Condia, J.E., Sonza Reorda, M.. - 680:(2024), pp. 149-176. (31st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2023 Sharjah, United Arab Emirates October 16–18, 2023) [10.1007/978-3-031-70947-0_8]. 1-gen-2024 Robert Limas SierraJuan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo Sonza Reorda VLSI_Soc2023_Book_Chapter.pdf; 978-3-031-70947-0_8.pdf
Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN Operations / Rodriguez Condia, J.E., Guerrero-Balaguera, J., Sierra, R.L., Reorda, M.S.. - (2024), pp. 1-4. (29th IEEE European Test Symposium 2024 The Hague (NL) 20-24 May 2024) [10.1109/ets61313.2024.10567884]. 1-gen-2024 Rodriguez Condia, Josie EGuerrero-Balaguera, Juan-DavidSierra, Robert LimasReorda, Matteo Sonza Analyzing_the_Structural_and_Operational_Impact_of_Faults_in_Floating-Point_and_Posit_Arithmetic_Cores_for_CNN_Operations.pdf
Effective Application-level Error Modeling of Permanent Faults on AI Accelerators / Pessia, F., Guerrero-Balaguera, J., Limas Sierra, R., Rodriguez Condia, J.E., Levorato, M., Sonza Reorda, M.. - ELETTRONICO. - (2024), pp. 1-7. (International Symposium on On-Line Testing and Robust System Design (IOLTS) Rennes (FRA) 03-05 July 2024) [10.1109/iolts60994.2024.10616087]. 1-gen-2024 Guerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo + Effective_Application-level_Error_Modeling_of_Permanent_Faults_on_AI_Accelerators.pdf
Reliability Assessment of Large DNN Models:Trading Off Performance and Accuracy / Chen, J., Esposito, G., Fernandes dos Santos, F., Guerrero-Balaguera, J., Kritikakou, A., Krstic, M., Limas-Sierra, R., Rodriguez-Condia, J., Sonza-Reorda, M., Traiola, M., Veronesi, A.. - ELETTRONICO. - (2024), pp. 1-10. (2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC) Tanger (MAR) 06-09 October 2024) [10.1109/VLSI-SoC62099.2024.10767814]. 1-gen-2024 Esposito,GiuseppeGuerrero-Balaguera,Juan-DavidLimas-Sierra,Robert-AlexanderRodriguez-Condia,Josie-EstebanSonza-Reorda,Matteo + Reliability_Assessment_of_Large_DNN_Models_Trading_Off_Performance_and_Accuracy.pdf
Special Session: Reliability Assessment Recipes for DNN Accelerators / Ahmadilivani, M.H., Bosio, A., Deveautour, B., Santos, F.F.D., Guerrero-Balaguera, J., Jenihhin, M., Kritikakou, A., Limas Sierra, R., Pappalardo, S., Raik, J., Rodriguez Condia, J.E., Sonza Reorda, M., Taheri, M., Traiola, M.. - ELETTRONICO. - (2024). (2024 IEEE 42nd VLSI Test Symposium (VTS) Tempe (USA) 22-24 April 2024) [10.1109/vts60656.2024.10538707]. 1-gen-2024 Bosio, AlbertoGuerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Sonza Reorda, Matteo + Special_Session_Reliability_Assessment_Recipes_for_DNN_Accelerators.pdf
A Reliability-aware Environment for Design Exploration for GPU Devices / Limas Sierra, R., Guerrero Balaguera, J.D., Rodriguez Condia, J.E., Sonza Reorda, M.. - (2023), pp. 169-174. (2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Tallinn (Estonia) 03-05 May 2023) [10.1109/DDECS57882.2023.10139643]. 1-gen-2023 Limas Sierra, RobertGuerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo A_Reliability-aware_Environment_for_Design_Exploration_for_GPU_Devices.pdf
Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs / Rodriguez Condia, J.E., Guerrero-Balaguera, J., Patiño Núñez, E.J., Limas, R., Reorda, M.S.. - (2023), pp. 1-6. (2023 IEEE 24th Latin American Test Symposium (LATS) Veracruz (Mexico) 21-24 March 2023) [10.1109/LATS58125.2023.10154504]. 1-gen-2023 Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidLimas, RobertReorda, Matteo Sonza + Analyzing_the_Architectural_Impact_of_Transient_Fault_Effects_in_SFUs_of_GPUs.pdf
Analyzing the Impact of Different Real Number Formats on the Structural Reliability of TCUs in GPUs / Sierra, R.L., Guerrero-Balaguera, J., Rodriguez Condia, J.E., Sonza Reorda, M.. - (2023), pp. 1-6. (IFIP/IEEE Conference on Very Large Scale Integration (VLSI-SoC 2023) Dubai (United Arab Emirates) 16-18 October 2023) [10.1109/VLSI-SoC57769.2023.10321881]. 1-gen-2023 Sierra, Robert LimasGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo Analyzing_the_Impact_of_Different_Real_Number_Formats_on_the_Structural_Reliability_of_TCUs_in_GPUs.pdf
Evaluating the Prevalence of SFUs in the Reliability of GPUs / Rodriguez Condia, J.E., Guerrero-Balaguera, J., Patiño Núñez, E.J., Limas, R., Reorda, M.S.. - (2023), pp. 1-6. (2023 IEEE European Test Symposium (ETS) Venice (IT) 22-26 May 2023) [10.1109/ETS56758.2023.10174110]. 1-gen-2023 Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidLimas, RobertReorda, Matteo Sonza + Evaluating_the_Prevalence_of_SFUs_in_the_Reliability_of_GPUs.pdf
Effective fault simulation of GPU’s permanent faults for reliability estimation of CNNs / Guerrero-Balaguera, J., Sierra, R.L., Reorda, M.S.. - (2022), pp. 1-6. (2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) Torino 12-14 September 2022) [10.1109/IOLTS56730.2022.9897823]. 1-gen-2022 Guerrero-Balaguera, Juan-DavidSierra, Robert LimasReorda, Matteo Sonza Effective_fault_simulation_of_GPUs_permanent_faults_for_reliability_estimation_of_CNNs.pdf
Evaluating the impact of Permanent Faults in a GPU running a Deep Neural Network / Juan-David, G., Galasso, L., LIMAS SIERRA, R.A., Ernesto, S., SONZA REORDA, M.. - (2022), pp. 96-101. (2022 {IEEE} International Test Conference in Asia ({ITC}-Asia) Taipei (Taiwan) 24-26 August 2022) [10.1109/itcasia55616.2022.00027]. 1-gen-2022 Juan-David Guerrero-BalagueraRobert Limas SierraErnesto SanchezMatteo Sonza Reorda + 2022_ITC_ASIA_CNNs_Reliability_Registers_cameraready.pdf; Evaluating_the_impact_of_Permanent_Faults_in_a_GPU_running_a_Deep_Neural_Network.pdf