Archivio Istituzionale della RicercaCARDONE, LORENZO
CARDONE, LORENZO
Dipartimento di Automatica e Informatica
093240
Smart Heuristics for Maximum Common Subgraph Sub-Estimation in Large Digital Circuits
In corso di stampa Bernardi, Paolo; Cardone, Lorenzo; Quer, Stefano
Fast Circuit Analysis via Neighborhood-Guided Maximum Common Subgraph
2026 Cardone, Lorenzo; Quer, Stefano; Bernardi, Paolo
Leveraging ATE to optimize System-Level-Test for Multicore Automotive SoCs
2025 Angione, Francesco; Bernardi, Paolo; Bertani, Claudia; Bertetto, Lorenzo; Cardone, Lorenzo; DI GRUTTOLA GIARDINO, Nicola; Quer, Stefano; Tancorre, Vincenzo
Efficiently Computing Maximum Clique of Sparse Graphs with Many-Core Graphical Processing Units
2024 Cardone, Lorenzo; Di Martino, Salvatore; Quer, Stefano
Exploiting the Connectivity metric in test programs generation
2024 Cardone, Lorenzo
Exploring trade-offs in multi-site wafer testing
2024 Bernardi, Paolo; Cardone, Lorenzo; Foscale, Tommaso
A Web Scraping Algorithm to Improve the Computation of the Maximum Common Subgraph
2023 Calabrese, Andrea; Cardone, Lorenzo; Licata, Salvatore; Porro, Marco; Quer, Stefano
About the correlation between logical identified faulty gates and their layout characteristics
2023 Bernardi, Paolo; Cardone, Lorenzo; Iaria, Giusy; Appello, Davide; Garozzo, Giuseppe; Tancorre, Vincenzo
Reporting test programs connectivity in a human-readable format
2023 Cardone, Lorenzo
An innovative Strategy to Quickly Grade Functional Test Programs
2022 Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, Alessandro; Piumatti, Davide; Quer, Stefano; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Smart Heuristics for Maximum Common Subgraph Sub-Estimation in Large Digital Circuits / Bernardi, Paolo; Cardone, Lorenzo; Quer, Stefano. - (In corso di stampa). ( IWLS 2025 Verona (IT) 20/05/2024 - 24/05/2024). | In corso di stampa | Bernardi,PaoloCardone,LorenzoQuer,Stefano | - |
| Fast Circuit Analysis via Neighborhood-Guided Maximum Common Subgraph / Cardone, L., Quer, S., Bernardi, P.. - (2026). (European Test Symposium 2026 Platanias (GR) 25/05/2026 - 29/05/2026). | 1-gen-2026 | Cardone,LorenzoQuer,StefanoBernardi,Paolo | - |
| Leveraging ATE to optimize System-Level-Test for Multicore Automotive SoCs / Angione, F., Bernardi, P., Bertani, C., Bertetto, L., Cardone, L., DI GRUTTOLA GIARDINO, N., Quer, S., Tancorre, V.. - (2025), pp. 1-6. (Latin American Test Symposium San Andres Islas, Colombia 11-14 March 2025) [10.1109/LATS65346.2025.10963947]. | 1-gen-2025 | Francesco AngionePaolo BernardiLorenzo BertettoLorenzo CardoneNicola Di Gruttola GiardinoStefano Quer + | Leveraging_ATE_to_Optimize_System-Level-Test_for_Multicore_Automotive_SoCs.pdf |
| Efficiently Computing Maximum Clique of Sparse Graphs with Many-Core Graphical Processing Units / Cardone, L., Di Martino, S., Quer, S.. - STAMPA. - 1:(2024), pp. 539-546. (ICSOFT 2024: 19th International Conference on Software Technologies Dijon (FRA) 8-10 July, 2024). | 1-gen-2024 | Cardone, LorenzoDi Martino, SalvatoreQuer, Stefano | final.pdf |
| Exploiting the Connectivity metric in test programs generation / Cardone, L.. - (2024). (IEEE 29th European Test Symposium 2024 The Hague (NLD) 20/05/2024 - 24/05/2024). | 1-gen-2024 | Cardone,Lorenzo | - |
| Exploring trade-offs in multi-site wafer testing / Bernardi, P., Cardone, L., Foscale, T.. - (2024). (25th IEEE Latin American Test Symposium 2024 Maceio (BRA) 09-12 April 2024) [10.1109/lats62223.2024.10534596]. | 1-gen-2024 | Bernardi, PaoloCardone, LorenzoFoscale, Tommaso | Exploring_trade-offs_in_multi-site_wafer_testing.pdf |
| A Web Scraping Algorithm to Improve the Computation of the Maximum Common Subgraph / Calabrese, A., Cardone, L., Licata, S., Porro, M., Quer, S.. - ELETTRONICO. - (2023), pp. 197-206. (18th International Conference on Software Technologies Rome, Italy July 10-12 2023) [10.5220/0000168200003538]. | 1-gen-2023 | Andrea, CalabreseLorenzo, CardoneSalvatore, LicataStefano Quer + | main.pdf |
| About the correlation between logical identified faulty gates and their layout characteristics / Bernardi, P., Cardone, L., Iaria, G., Appello, D., Garozzo, G., Tancorre, V.. - (2023). (IEEE International Symposium on On-Line Testing and Robust System Design 03-05 July 2023 Crete, Greece) [10.1109/IOLTS59296.2023.10224897]. | 1-gen-2023 | Bernardi, PaoloCardone, LorenzoIaria, Giusy + | IOLTS_2023_FaultsLayoutAnalysis (4).pdf; About_the_Correlation_between_Logical_Identified_Faulty_Gates_and_their_Layout_Characteristics.pdf |
| Reporting test programs connectivity in a human-readable format / Cardone, L.. - (2023). (IEEE 28th European Test Symposium 2023 Venezia (ITA) 22/05/2023 - 26/05/2023). | 1-gen-2023 | Lorenzo Cardone | ets23_poster_final.pdf; PhD_Forum_ETS.pdf |
| An innovative Strategy to Quickly Grade Functional Test Programs / Angione, F., Bernardi, P., Calabrese, A., Cardone, L., Niccoletti, A., Piumatti, D., Quer, S., Appello, D., Tancorre, V., Ugioli, R.. - (2022), pp. 355-364. (International Test Conference Anaheim, CA (USA) 23-30 September 2022) [10.1109/ITC50671.2022.00044]. | 1-gen-2022 | Francesco AngionePaolo BernardiAndrea CalabreseLorenzo CardoneDavide PiumattiStefano Quer + | An_innovative_Strategy_to_Quickly_Grade_Functional_Test_Programs.pdf |