Reporting test programs connectivity in a human-readable format

Because of the increasing complexity of systems on chips, our ability to test their proper functioning is decreasing. Since safety standards, such as ISO-26262, propose very time-consuming metrics to ensure the safety of the users, new techniques to achieve high fault coverage are making their way to speed up this process. In this article, we take a look at the connectivity metrics proposed last year by Francesco Angione et al. We will discuss software that we have developed in order to expose to the user in a more readable and intuitive way the data produced by the analysis carried out through the previously presented methodology. We will take functional tests on a chip developed by STMicroelectronics from the SP58 family as a case study and show what information can be exposed to the end-user and what value each of these can provide.