Archivio Istituzionale della RicercaIANNUZZO, FRANCESCO
IANNUZZO, FRANCESCO
Dipartimento Energia
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Risultati 1 - 20 di 20 (tempo di esecuzione: 0.017 secondi).
Reliability-Constrained Design of a High-Gain Power Optimizer based on a Real Mission Profile
2025 Cerutti, Stefano; Iannuzzo, Francesco; Sangwongwanich, Ariya; Kerekes, Tamas; Pavone, Mario Giuseppe; Gennaro, Francesco; Aiello, Natale; Musolino, Francesco; Crovetti, Paolo Stefano
Comparative Analysis of Bond Wire Degradation in Power Modules during DC and AC Power Cycling
2024 Zhang, Kaichen; Iannuzzo, Francesco; Blaabjerg, Frede
Large-Scale Adoption of Silicon Carbide in the Automotive Sector: What is Missing?
2024 Iannuzzo, Francesco
Comparison of Junction Temperature Measurement Using the TSEP Method and Optical Fiber Method in IGBT Power Modules without Silicone Gel Removal
2023 Zhang, Kaichen; Leduc, Charles; Iannuzzo, Francesco
Design of a Non-destructive Device Test Platform Capable of Double-pulse Tests and Short-circuit Tests with Fast Overcurrent Protection for Wide Band-gap Devices
2023 Lu, Zhebie; Iannuzzo, Francesco
Factors Affecting Self-Sustained Switching Oscillations of Cascode GaN Devices and Mitigation Strategy during Parameter Design
2023 Lu, Zhebie; Iannuzzo, Francesco
Influence of Temperature on Bond Wire Fatigue of Gate Loops in IGBT Modules under Sinusoidal Vibration Stress
2023 Zhan, Cao; Zhang, Yaxin; Tang, Yizheng; Iannuzzo, Francesco; Zhu, Lingyu; Ji, Shengchang; Blaabjerg, Frede
Investigation on the Short-circuit Withstand Capability of Press-pack IGBT modules with Optimized Package Structures
2023 Liu, Renkuan; Li, Hui; Yao, Ran; Lai, Wei; Duan, Zeyu; Iannuzzo, Francesco
Optimization of a Bidirectional Boost Converter for Nanogrid Applications
2023 Mdanat, Rand A. L.; Saeed, Sarah; Georgious, Ramy; Garcia, Jorge; Iannuzzo, Francesco
Reliability of WBG, results of a Pre-Scoping Study
2023 Zhang, Kaichen; Iannuzzo, Francesco; Holm Christiansen, Christian
Temperature Monitoring of Multi-Chip SiC MOSFET Modules: On-Chip RTDs vs. VSD(T)
2023 Baker, Nick; Lemmon, Andy; Iannuzzo, Francesco; Michal Beczkowski, Szymon; Austin, John; Ostrander, Lauren
Thermal Characteristics of Liquid Metal Interconnects for Power Semiconductors
2023 Sun, Zhongchao; Bjorn Jorgensen, Asger; Baker, Nick; Beczkowski, Szymon; Guo, Wendi; Munk-Nielsen, Stig; Iannuzzo, Francesco
Thermal Mapping of Power Modules Using Optical Fibers during AC Power Cycling Tests
2023 Zhang, Kaichen; Iannuzzo, Francesco
Thermal Stress Emulation of Power Devices Subject to DFIG Wind Power Converter
2023 Yu, Xinming; Iannuzzo, Francesco; Zhou, Dao
Comparative Analysis of Power Semiconductor Thermal Stress in DC and AC Power Cycling
2022 Yu, Xinming; Zhou, Dao; Iannuzzo, Francesco
Effects of On-State Snap-back Characteristics on the Current Sharing of Parallel RC-IGBTs
2022 Rahimo, Munaf; Diaz Reigosa, Paula; Iannuzzo, Francesco
Improved Drain-source Voltage Detection Method for Short-circuit Protection of SiC MOSFET
2022 Wang, Qiang; Iannuzzo, Francesco; Zhang, Jingwei; Jiang, Yizhan; He, Fengyou
Measuring Temperature Swing with Optical Fibers during Power Cycling of Power Components
2022 Zhang, Kaichen; Iannuzzo, Francesco
Role of parasitic capacitances in power MOSFET turn-on switching speed limits: a SiC case study
2017 Cittanti, Davide; Iannuzzo, Francesco; Hoene, Eckart; Klein, Kirill
High voltage, high performance switch using series connected IGBTs
2008 Busatto, G.; Abbate, C.; Iannuzzo, F.; Abbate, B.; Fratelli, L.; Cascone, B.; Manzo, R.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Reliability-Constrained Design of a High-Gain Power Optimizer based on a Real Mission Profile / Cerutti, Stefano; Iannuzzo, Francesco; Sangwongwanich, Ariya; Kerekes, Tamas; Pavone, Mario Giuseppe; Gennaro, Francesco; Aiello, Natale; Musolino, Francesco; Crovetti, Paolo Stefano. - ELETTRONICO. - (2025), pp. 738-745. (Intervento presentato al convegno 2025 IEEE Applied Power Electronics Conference and Exposition (APEC) tenutosi a Atlanta (USA) nel 16-20 marzo 2025) [10.1109/apec48143.2025.10977512]. | 1-gen-2025 | Cerutti, StefanoIannuzzo, FrancescoMusolino, FrancescoCrovetti, Paolo Stefano + | Reliability-Constrained_Design_of_a_High-Gain_Power_Optimizer_based_on_a_Real_Mission_Profile.pdf; Reliability-Constrained Design of a High-Gain Power Optimizer based on a Real Mission Profile.pdf |
| Comparative Analysis of Bond Wire Degradation in Power Modules during DC and AC Power Cycling / Zhang, Kaichen; Iannuzzo, Francesco; Blaabjerg, Frede. - ELETTRONICO. - (2024). (Intervento presentato al convegno 2024 IEEE 15th International Symposium on Power Electronics for Distributed Generation Systems, PEDG 2024 nel 23/06/2024 - 26/06/2024) [10.1109/PEDG61800.2024.10667438]. | 1-gen-2024 | Francesco Iannuzzo + | Comparative_Analysis_of_Bond_Wire_Degradation_in_Power_Modules_During_DC_and_AC_Power_Cycling_compressed.pdf |
| Large-Scale Adoption of Silicon Carbide in the Automotive Sector: What is Missing? / Iannuzzo, Francesco. - ELETTRONICO. - (2024), pp. 678-683. (Intervento presentato al convegno CIPS 2024 - 13th International Conference on Integrated Power Electronics Systems tenutosi a Dusseldorf (Germany) nel 12/03/2024 - 14/03/2024). | 1-gen-2024 | Francesco Iannuzzo | - |
| Comparison of Junction Temperature Measurement Using the TSEP Method and Optical Fiber Method in IGBT Power Modules without Silicone Gel Removal / Zhang, Kaichen; Leduc, Charles; Iannuzzo, Francesco. - ELETTRONICO. - (2023). (Intervento presentato al convegno PCIM Europe 2023 : International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management tenutosi a Nuremberg (Germany) nel 09/05/2023 - 11/05/2023) [10.30420/566091347]. | 1-gen-2023 | Francesco Iannuzzo + | File018.pdf |
| Design of a Non-destructive Device Test Platform Capable of Double-pulse Tests and Short-circuit Tests with Fast Overcurrent Protection for Wide Band-gap Devices / Lu, Zhebie; Iannuzzo, Francesco. - ELETTRONICO. - (2023). (Intervento presentato al convegno 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe tenutosi a Aalborg (Denmark) nel 04/09/2023 - 08/09/2023) [10.23919/EPE23ECCEEurope58414.2023.10264648]. | 1-gen-2023 | Francesco Iannuzzo + | Design_of_a_Non-destructive_Device_Test_Platform_Capable_of_Double-pulse_Tests_and_Short-circuit_Tests_with_Fast_Overcurrent_Protection_for_Wide_Band-gap_Devices.pdf |
| Factors Affecting Self-Sustained Switching Oscillations of Cascode GaN Devices and Mitigation Strategy during Parameter Design / Lu, Zhebie; Iannuzzo, Francesco. - ELETTRONICO. - (2023), pp. 632-636. (Intervento presentato al convegno APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition tenutosi a Orlando (United States) nel 19/03/2023 - 23/03/2023) [10.1109/APEC43580.2023.10131546]. | 1-gen-2023 | Francesco Iannuzzo + | Factors_Affecting_Self-Sustained_Switching_Oscillations_of_Cascode_GaN_Devices_and_Mitigation_Strategy_During_Parameter_Design.pdf |
| Influence of Temperature on Bond Wire Fatigue of Gate Loops in IGBT Modules under Sinusoidal Vibration Stress / Zhan, Cao; Zhang, Yaxin; Tang, Yizheng; Iannuzzo, Francesco; Zhu, Lingyu; Ji, Shengchang; Blaabjerg, Frede. - ELETTRONICO. - (2023), pp. 1349-1354. (Intervento presentato al convegno ICPE 2023-ECCE Asia - 11th International Conference on Power Electronics - ECCE Asia : Green World with Power Electronics tenutosi a Jeju (Korea, Republic of) nel 22/05/2023 - 25/05/2023) [10.23919/ICPE2023-ECCEAsia54778.2023.10213967]. | 1-gen-2023 | Francesco Iannuzzo + | Influence_of_Temperature_on_Bond_Wire_Fatigue_of_Gate_Loops_in_IGBT_Modules_under_Sinusoidal_Vibration_Stress.pdf |
| Investigation on the Short-circuit Withstand Capability of Press-pack IGBT modules with Optimized Package Structures / Liu, Renkuan; Li, Hui; Yao, Ran; Lai, Wei; Duan, Zeyu; Iannuzzo, Francesco. - ELETTRONICO. - (2023). (Intervento presentato al convegno 2023 24th International Vacuum Electronics Conference, IVEC 2023 tenutosi a Chengdu (China) nel 25/04/2023 - 28/04/2023) [10.1109/IVEC56627.2023.10157563]. | 1-gen-2023 | Francesco Iannuzzo + | Investigation_on_the_Short-circuit_Withstand_Capability_of_Press-pack_IGBT_modules_with_Optimized_Package_Structures.pdf |
| Optimization of a Bidirectional Boost Converter for Nanogrid Applications / Mdanat, Rand A. L.; Saeed, Sarah; Georgious, Ramy; Garcia, Jorge; Iannuzzo, Francesco. - ELETTRONICO. - (2023). (Intervento presentato al convegno 2023 IEEE Industry Applications Society Annual Meeting, IAS 2023 tenutosi a Nashville (United States) nel 29/10/2023 - 02/11/2023) [10.1109/IAS54024.2023.10406583]. | 1-gen-2023 | Francesco Iannuzzo + | Optimization_of_a_Bidirectional_Boost_Converter_for_Nanogrid_Applications.pdf |
| Reliability of WBG, results of a Pre-Scoping Study / Zhang, Kaichen; Iannuzzo, Francesco; Holm Christiansen, Christian. - ELETTRONICO. - (2023). (Intervento presentato al convegno 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe tenutosi a Aalborg (Denmark) nel 04/09/2023 - 08/09/2023) [10.23919/EPE23ECCEEurope58414.2023.10264334]. | 1-gen-2023 | Francesco Iannuzzo + | Reliability_of_WBG_results_of_a_Pre-Scoping_Study.pdf |
| Temperature Monitoring of Multi-Chip SiC MOSFET Modules: On-Chip RTDs vs. VSD(T) / Baker, Nick; Lemmon, Andy; Iannuzzo, Francesco; Michal Beczkowski, Szymon; Austin, John; Ostrander, Lauren. - ELETTRONICO. - (2023). (Intervento presentato al convegno 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe tenutosi a Aalborg (Denmark) nel 04/09/2023 - 08/09/2023) [10.23919/EPE23ECCEEurope58414.2023.10264420]. | 1-gen-2023 | Francesco Iannuzzo + | Temperature_Monitoring_of_Multi-Chip_SiC_MOSFET_Modules_On-Chip_RTDs_vs._VSDT.pdf |
| Thermal Characteristics of Liquid Metal Interconnects for Power Semiconductors / Sun, Zhongchao; Bjorn Jorgensen, Asger; Baker, Nick; Beczkowski, Szymon; Guo, Wendi; Munk-Nielsen, Stig; Iannuzzo, Francesco. - ELETTRONICO. - (2023), pp. 1135-1140. (Intervento presentato al convegno APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition tenutosi a Orlando (United States) nel 19/03/2023 - 23/03/2023) [10.1109/APEC43580.2023.10131435]. | 1-gen-2023 | Francesco Iannuzzo + | File037.pdf; Thermal_Characteristics_of_Liquid_Metal_Interconnects_for_Power_Semiconductors.pdf |
| Thermal Mapping of Power Modules Using Optical Fibers during AC Power Cycling Tests / Zhang, Kaichen; Iannuzzo, Francesco. - ELETTRONICO. - (2023), pp. 2630-2633. (Intervento presentato al convegno APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition tenutosi a Orlando (United States) nel 19/03/2023 - 23/03/2023) [10.1109/APEC43580.2023.10131209]. | 1-gen-2023 | Francesco Iannuzzo + | Thermal_Mapping_of_Power_Modules_Using_Optical_Fibers_during_AC_Power_Cycling_Tests.pdf |
| Thermal Stress Emulation of Power Devices Subject to DFIG Wind Power Converter / Yu, Xinming; Iannuzzo, Francesco; Zhou, Dao. - ELETTRONICO. - (2023), pp. 141-147. (Intervento presentato al convegno PEDG 2023 - 2023 IEEE 14th International Symposium on Power Electronics for Distributed Generation Systems tenutosi a Shanghai (China) nel 09/06/2023 - 12/06/2023) [10.1109/PEDG56097.2023.10215162]. | 1-gen-2023 | Francesco Iannuzzo + | File039.pdf; Design_of_a_Non-destructive_Device_Test_Platform_Capable_of_Double-pulse_Tests_and_Short-circuit_Tests_with_Fast_Overcurrent_Protection_for_Wide_Band-gap_Devices.pdf |
| Comparative Analysis of Power Semiconductor Thermal Stress in DC and AC Power Cycling / Yu, Xinming; Zhou, Dao; Iannuzzo, Francesco. - ELETTRONICO. - (2022). (Intervento presentato al convegno 2022 IEEE 13th International Symposium on Power Electronics for Distributed Generation Systems (PEDG)) [10.1109/PEDG54999.2022.9923148]. | 1-gen-2022 | Francesco Iannuzzo + | File043.pdf; Comparative_Analysis_of_Power_Semiconductor_Thermal_Stress_in_DC_and_AC_Power_Cycling.pdf |
| Effects of On-State Snap-back Characteristics on the Current Sharing of Parallel RC-IGBTs / Rahimo, Munaf; Diaz Reigosa, Paula; Iannuzzo, Francesco. - ELETTRONICO. - (2022), pp. 157-164. (Intervento presentato al convegno PCIM Europe 2022 tenutosi a Nuremberg (Germany) nel 10/05/2022 - 12/05/2022) [10.30420/565822025]. | 1-gen-2022 | Francesco Iannuzzo + | - |
| Improved Drain-source Voltage Detection Method for Short-circuit Protection of SiC MOSFET / Wang, Qiang; Iannuzzo, Francesco; Zhang, Jingwei; Jiang, Yizhan; He, Fengyou. - ELETTRONICO. - (2022). (Intervento presentato al convegno 2022 IEEE International Workshop on Integrated Power Packaging, IWIPP 2022 tenutosi a Grenoble (France) nel 24/08/2022 - 26/08/2022) [10.1109/IWIPP50752.2022.9894118]. | 1-gen-2022 | Qiang WangFrancesco Iannuzzo + | Improved_Drain-source_Voltage_Detection_Method_for_Short-circuit_Protection_of_SiC_MOSFET.pdf |
| Measuring Temperature Swing with Optical Fibers during Power Cycling of Power Components / Zhang, Kaichen; Iannuzzo, Francesco. - ELETTRONICO. - (2022). (Intervento presentato al convegno 2022 IEEE 13th International Symposium on Power Electronics for Distributed Generation Systems, PEDG 2022 tenutosi a Kiel (Germany) nel 26/06/2022 - 29/06/2022) [10.1109/PEDG54999.2022.9923077]. | 1-gen-2022 | Francesco Iannuzzo + | File051.pdf; Measuring_Temperature_Swing_with_Optical_Fibers_during_Power_Cycling_of_Power_Components.pdf |
| Role of parasitic capacitances in power MOSFET turn-on switching speed limits: a SiC case study / Cittanti, Davide; Iannuzzo, Francesco; Hoene, Eckart; Klein, Kirill. - ELETTRONICO. - (2017), pp. 1387-1394. (Intervento presentato al convegno 9th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2017 tenutosi a USA nel 2017) [10.1109/ECCE.2017.8095952]. | 1-gen-2017 | Cittanti, DavideIannuzzo, Francesco + | Cittanti et al. - 2017 - Role of parasitic capacitances in power MOSFET turn on.pdf |
| High voltage, high performance switch using series connected IGBTs / Busatto, G.; Abbate, C.; Iannuzzo, F.; Abbate, B.; Fratelli, L.; Cascone, B.; Manzo, R.. - (2008), pp. 1606-1611. (Intervento presentato al convegno ESREF). | 1-gen-2008 | Iannuzzo F. + | - |