IANNUZZO, FRANCESCO

IANNUZZO, FRANCESCO  

Dipartimento Energia  

068543  

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Citazione Data di pubblicazione Autori File
Reliability-Constrained Design of a High-Gain Power Optimizer based on a Real Mission Profile / Cerutti, S., Iannuzzo, F., Sangwongwanich, A., Kerekes, T., Pavone, M.G., Gennaro, F., Aiello, N., Musolino, F., Crovetti, P.S.. - ELETTRONICO. - (2025), pp. 738-745. (2025 IEEE Applied Power Electronics Conference and Exposition (APEC) Atlanta (USA) 16-20 marzo 2025) [10.1109/apec48143.2025.10977512]. 1-gen-2025 Cerutti, StefanoIannuzzo, FrancescoMusolino, FrancescoCrovetti, Paolo Stefano + Reliability-Constrained_Design_of_a_High-Gain_Power_Optimizer_based_on_a_Real_Mission_Profile.pdfReliability-Constrained Design of a High-Gain Power Optimizer based on a Real Mission Profile.pdf
Comparative Analysis of Bond Wire Degradation in Power Modules during DC and AC Power Cycling / Zhang, K., Iannuzzo, F., Blaabjerg, F.. - ELETTRONICO. - (2024). (2024 IEEE 15th International Symposium on Power Electronics for Distributed Generation Systems, PEDG 2024 23/06/2024 - 26/06/2024) [10.1109/PEDG61800.2024.10667438]. 1-gen-2024 Francesco Iannuzzo + Comparative_Analysis_of_Bond_Wire_Degradation_in_Power_Modules_During_DC_and_AC_Power_Cycling_compressed.pdf
Large-Scale Adoption of Silicon Carbide in the Automotive Sector: What is Missing? / Iannuzzo, F.. - ELETTRONICO. - (2024), pp. 678-683. (CIPS 2024 - 13th International Conference on Integrated Power Electronics Systems Dusseldorf (Germany) 12/03/2024 - 14/03/2024). 1-gen-2024 Francesco Iannuzzo -
Comparison of Junction Temperature Measurement Using the TSEP Method and Optical Fiber Method in IGBT Power Modules without Silicone Gel Removal / Zhang, K., Leduc, C., Iannuzzo, F.. - ELETTRONICO. - (2023). (PCIM Europe 2023 : International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management Nuremberg (Germany) 09/05/2023 - 11/05/2023) [10.30420/566091347]. 1-gen-2023 Francesco Iannuzzo + File018.pdf
Design of a Non-destructive Device Test Platform Capable of Double-pulse Tests and Short-circuit Tests with Fast Overcurrent Protection for Wide Band-gap Devices / Lu, Z., Iannuzzo, F.. - ELETTRONICO. - (2023). (2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe Aalborg (Denmark) 04/09/2023 - 08/09/2023) [10.23919/EPE23ECCEEurope58414.2023.10264648]. 1-gen-2023 Francesco Iannuzzo + Design_of_a_Non-destructive_Device_Test_Platform_Capable_of_Double-pulse_Tests_and_Short-circuit_Tests_with_Fast_Overcurrent_Protection_for_Wide_Band-gap_Devices.pdf
Factors Affecting Self-Sustained Switching Oscillations of Cascode GaN Devices and Mitigation Strategy during Parameter Design / Lu, Z., Iannuzzo, F.. - ELETTRONICO. - (2023), pp. 632-636. (APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition Orlando (United States) 19/03/2023 - 23/03/2023) [10.1109/APEC43580.2023.10131546]. 1-gen-2023 Francesco Iannuzzo + Factors_Affecting_Self-Sustained_Switching_Oscillations_of_Cascode_GaN_Devices_and_Mitigation_Strategy_During_Parameter_Design.pdf
Influence of Temperature on Bond Wire Fatigue of Gate Loops in IGBT Modules under Sinusoidal Vibration Stress / Zhan, C., Zhang, Y., Tang, Y., Iannuzzo, F., Zhu, L., Ji, S., Blaabjerg, F.. - ELETTRONICO. - (2023), pp. 1349-1354. (ICPE 2023-ECCE Asia - 11th International Conference on Power Electronics - ECCE Asia : Green World with Power Electronics Jeju (Korea, Republic of) 22/05/2023 - 25/05/2023) [10.23919/ICPE2023-ECCEAsia54778.2023.10213967]. 1-gen-2023 Francesco Iannuzzo + Influence_of_Temperature_on_Bond_Wire_Fatigue_of_Gate_Loops_in_IGBT_Modules_under_Sinusoidal_Vibration_Stress.pdf
Investigation on the Short-circuit Withstand Capability of Press-pack IGBT modules with Optimized Package Structures / Liu, R., Li, H., Yao, R., Lai, W., Duan, Z., Iannuzzo, F.. - ELETTRONICO. - (2023). (2023 24th International Vacuum Electronics Conference, IVEC 2023 Chengdu (China) 25/04/2023 - 28/04/2023) [10.1109/IVEC56627.2023.10157563]. 1-gen-2023 Francesco Iannuzzo + Investigation_on_the_Short-circuit_Withstand_Capability_of_Press-pack_IGBT_modules_with_Optimized_Package_Structures.pdf
Optimization of a Bidirectional Boost Converter for Nanogrid Applications / Mdanat, R.A.L., Saeed, S., Georgious, R., Garcia, J., Iannuzzo, F.. - ELETTRONICO. - (2023). (2023 IEEE Industry Applications Society Annual Meeting, IAS 2023 Nashville (United States) 29/10/2023 - 02/11/2023) [10.1109/IAS54024.2023.10406583]. 1-gen-2023 Francesco Iannuzzo + Optimization_of_a_Bidirectional_Boost_Converter_for_Nanogrid_Applications.pdf
Reliability of WBG, results of a Pre-Scoping Study / Zhang, K., Iannuzzo, F., Holm Christiansen, C.. - ELETTRONICO. - (2023). (2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe Aalborg (Denmark) 04/09/2023 - 08/09/2023) [10.23919/EPE23ECCEEurope58414.2023.10264334]. 1-gen-2023 Francesco Iannuzzo + Reliability_of_WBG_results_of_a_Pre-Scoping_Study.pdf
Temperature Monitoring of Multi-Chip SiC MOSFET Modules: On-Chip RTDs vs. VSD(T) / Baker, N., Lemmon, A., Iannuzzo, F., Michal Beczkowski, S., Austin, J., Ostrander, L.. - ELETTRONICO. - (2023). (2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe Aalborg (Denmark) 04/09/2023 - 08/09/2023) [10.23919/EPE23ECCEEurope58414.2023.10264420]. 1-gen-2023 Francesco Iannuzzo + Temperature_Monitoring_of_Multi-Chip_SiC_MOSFET_Modules_On-Chip_RTDs_vs._VSDT.pdf
Thermal Characteristics of Liquid Metal Interconnects for Power Semiconductors / Sun, Z., Bjorn Jorgensen, A., Baker, N., Beczkowski, S., Guo, W., Munk-Nielsen, S., Iannuzzo, F.. - ELETTRONICO. - (2023), pp. 1135-1140. (APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition Orlando (United States) 19/03/2023 - 23/03/2023) [10.1109/APEC43580.2023.10131435]. 1-gen-2023 Francesco Iannuzzo + File037.pdfThermal_Characteristics_of_Liquid_Metal_Interconnects_for_Power_Semiconductors.pdf
Thermal Mapping of Power Modules Using Optical Fibers during AC Power Cycling Tests / Zhang, K., Iannuzzo, F.. - ELETTRONICO. - (2023), pp. 2630-2633. (APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition Orlando (United States) 19/03/2023 - 23/03/2023) [10.1109/APEC43580.2023.10131209]. 1-gen-2023 Francesco Iannuzzo + Thermal_Mapping_of_Power_Modules_Using_Optical_Fibers_during_AC_Power_Cycling_Tests.pdf
Thermal Stress Emulation of Power Devices Subject to DFIG Wind Power Converter / Yu, X., Iannuzzo, F., Zhou, D.. - ELETTRONICO. - (2023), pp. 141-147. (PEDG 2023 - 2023 IEEE 14th International Symposium on Power Electronics for Distributed Generation Systems Shanghai (China) 09/06/2023 - 12/06/2023) [10.1109/PEDG56097.2023.10215162]. 1-gen-2023 Francesco Iannuzzo + File039.pdfDesign_of_a_Non-destructive_Device_Test_Platform_Capable_of_Double-pulse_Tests_and_Short-circuit_Tests_with_Fast_Overcurrent_Protection_for_Wide_Band-gap_Devices.pdf
Comparative Analysis of Power Semiconductor Thermal Stress in DC and AC Power Cycling / Yu, X., Zhou, D., Iannuzzo, F.. - ELETTRONICO. - (2022). (2022 IEEE 13th International Symposium on Power Electronics for Distributed Generation Systems (PEDG) ) [10.1109/PEDG54999.2022.9923148]. 1-gen-2022 Francesco Iannuzzo + File043.pdfComparative_Analysis_of_Power_Semiconductor_Thermal_Stress_in_DC_and_AC_Power_Cycling.pdf
Effects of On-State Snap-back Characteristics on the Current Sharing of Parallel RC-IGBTs / Rahimo, M., Diaz Reigosa, P., Iannuzzo, F.. - ELETTRONICO. - (2022), pp. 157-164. (PCIM Europe 2022 Nuremberg (Germany) 10/05/2022 - 12/05/2022) [10.30420/565822025]. 1-gen-2022 Francesco Iannuzzo + -
Improved Drain-source Voltage Detection Method for Short-circuit Protection of SiC MOSFET / Wang, Q., Iannuzzo, F., Zhang, J., Jiang, Y., He, F.. - ELETTRONICO. - (2022). (2022 IEEE International Workshop on Integrated Power Packaging, IWIPP 2022 Grenoble (France) 24/08/2022 - 26/08/2022) [10.1109/IWIPP50752.2022.9894118]. 1-gen-2022 Qiang WangFrancesco Iannuzzo + Improved_Drain-source_Voltage_Detection_Method_for_Short-circuit_Protection_of_SiC_MOSFET.pdf
Measuring Temperature Swing with Optical Fibers during Power Cycling of Power Components / Zhang, K., Iannuzzo, F.. - ELETTRONICO. - (2022). (2022 IEEE 13th International Symposium on Power Electronics for Distributed Generation Systems, PEDG 2022 Kiel (Germany) 26/06/2022 - 29/06/2022) [10.1109/PEDG54999.2022.9923077]. 1-gen-2022 Francesco Iannuzzo + File051.pdfMeasuring_Temperature_Swing_with_Optical_Fibers_during_Power_Cycling_of_Power_Components.pdf
Role of parasitic capacitances in power MOSFET turn-on switching speed limits: a SiC case study / Cittanti, D., Iannuzzo, F., Hoene, E., Klein, K.. - ELETTRONICO. - (2017), pp. 1387-1394. (9th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2017 USA 2017) [10.1109/ECCE.2017.8095952]. 1-gen-2017 Cittanti, DavideIannuzzo, Francesco + Cittanti et al. - 2017 - Role of parasitic capacitances in power MOSFET turn on.pdf
High voltage, high performance switch using series connected IGBTs / Busatto, G., Abbate, C., Iannuzzo, F., Abbate, B., Fratelli, L., Cascone, B., Manzo, R.. - (2008), pp. 1606-1611. (ESREF ). 1-gen-2008 Iannuzzo F. + -