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Short-Circuit Fault Adaptive Analysis and Protection for SiC MOSFETs
2023 Wang, Qiang; Zhang, Jingwei; Iannuzzo, Francesco; Jiang, Yizhan; Zhang, Weifeng; He, Fengyou
Improved Drain-source Voltage Detection Method for Short-circuit Protection of SiC MOSFET
2022 Wang, Qiang; Iannuzzo, Francesco; Zhang, Jingwei; Jiang, Yizhan; He, Fengyou
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Short-Circuit Fault Adaptive Analysis and Protection for SiC MOSFETs / Wang, Q., Zhang, J., Iannuzzo, F., Jiang, Y., Zhang, W., He, F.. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - 11:(2023), pp. 4867-4881. [10.1109/JESTPE.2023.3293096] | 1-gen-2023 | Qiang WangFrancesco Iannuzzo + | Short-Circuit_Fault_Adaptive_Analysis_and_Protection_for_SiC_MOSFETs.pdf |
| Improved Drain-source Voltage Detection Method for Short-circuit Protection of SiC MOSFET / Wang, Q., Iannuzzo, F., Zhang, J., Jiang, Y., He, F.. - ELETTRONICO. - (2022). (2022 IEEE International Workshop on Integrated Power Packaging, IWIPP 2022 Grenoble (France) 24/08/2022 - 26/08/2022) [10.1109/IWIPP50752.2022.9894118]. | 1-gen-2022 | Qiang WangFrancesco Iannuzzo + | Improved_Drain-source_Voltage_Detection_Method_for_Short-circuit_Protection_of_SiC_MOSFET.pdf |