Archivio Istituzionale della RicercaIANNUZZO, FRANCESCO
IANNUZZO, FRANCESCO
Dipartimento Energia
068543
Reliability-Constrained Design of a High-Gain Power Optimizer based on a Real Mission Profile
2025 Cerutti, Stefano; Iannuzzo, Francesco; Sangwongwanich, Ariya; Kerekes, Tamas; Pavone, Mario Giuseppe; Gennaro, Francesco; Aiello, Natale; Musolino, Francesco; Crovetti, Paolo Stefano
A Distributed Turn-Off Delay Compensator Scheme for Voltage Balancing of Series-Connected IGBTs
2024 Zarghani, Mostafa; Iannuzzo, Francesco; Blaabjerg, Frede; Kaboli, Shahriyar
A Double-Sided Cooling Approach of Discrete SiC MOSFET Device Based on Press-Pack Package
2024 Yao, Ran; Zhu, Zheyan; Li, Hui; Lai, Wei; Chen, Xianping; Iannuzzo, Francesco; Liu, Renkuan; Luo, Xiaorong
A Novel Sensor-Reduction Condition Monitoring Approach for MMC Submodule IGBTs Based on Statistics of Inferred On-State Voltage
2024 Zhan, Cao; Wang, Weicheng; Tang, Yizheng; Li, Yixin; Iannuzzo, Francesco; Zhu, Lingyu; Yu, Kefan; Ji, Shengchang; Blaabjerg, Frede
Application-Oriented Flexible Power Cycling Test System for Power Electronic Components
2024 Zhang, Kaichen; Iannuzzo, Francesco; Blaabjerg, Frede
Comparative Analysis of Bond Wire Degradation in Power Modules during DC and AC Power Cycling
2024 Zhang, Kaichen; Iannuzzo, Francesco; Blaabjerg, Frede
Figures-of-Merit Study for Thermal Transient Measurement of SiC MOSFETs
2024 Zhang, Yi; Zhang, Yichi; Hon Wong, Voon; Kalker, Sven; Caruso, Antonio; Ruppert, Lukas; Iannuzzo, Francesco; de Doncker, Rik W.
In-Operation Junction Temperature Extraction for Cascode GaN Devices Based on Turn-Off Delay
2024 Lu, Zhebie; Iannuzzo, Francesco
Intelligent Condition Monitoring of Multiple Thermal Degradation of IGBT Modules Based on Case Temperature Matrix
2024 Zhan, Cao; Tang, Yizheng; Zhu, Lingyu; Wang, Weicheng; Gou, Yating; Ji, Shengchang; Iannuzzo, Francesco
Investigation on Saturation Voltage Increment of Multichip Press-Pack IGBTs Under Power Cycling Tests
2024 Zhan, Cao; Zhu, Lingyu; Zhang, Yaxin; Ji, Shengchang; Iannuzzo, Francesco; Blaabjerg, Frede
Large-Scale Adoption of Silicon Carbide in the Automotive Sector: What is Missing?
2024 Iannuzzo, Francesco
Model-Based Thermal Stress and Lifetime Estimation of DFIG Wind Power Converter
2024 Yu, Xinming; Iannuzzo, Francesco; Zhou, Dao
Online Junction Temperature Extraction for Cascode GaN Devices Based on Turn-On Delay
2024 Lu, Zhebie; Iannuzzo, Francesco
Proof-of-Concept for an On-Chip Kelvin-Emitter RTD Sensor for Junction Temperature Monitoring of IGBTs
2024 Baker, Nick; Dupont, Laurent; Michal Beczkowski, Szymon; Iannuzzo, Francesco
Accuracy estimation of low-current voltage drop method for junction temperature monitoring under DC power cycling
2023 Lu, Zhebie; Iannuzzo, Francesco
Analytical Modeling and Sensitivity Analysis on Plasma Extraction Transit Time (PETT) Oscillations in High-Voltage NPT p-i-n Diode
2023 Zhu, Ankang; Ye, Shuoyu; Kang, Jianlong; Xin, Zhen; Luo, Haoze; Iannuzzo, Francesco; Li, Wuhua; He, Xiangning
Comparison of Junction Temperature Measurement Using the TSEP Method and Optical Fiber Method in IGBT Power Modules without Silicone Gel Removal
2023 Zhang, Kaichen; Leduc, Charles; Iannuzzo, Francesco
Design of a Non-destructive Device Test Platform Capable of Double-pulse Tests and Short-circuit Tests with Fast Overcurrent Protection for Wide Band-gap Devices
2023 Lu, Zhebie; Iannuzzo, Francesco
Evaluation of the Thermal Resistance in GaN HEMTs Using Thermo-Sensitive Electrical Parameters
2023 Valeriu Pirosca, Adrian; Vecchio, Marcello; Agatino Rizzo, Santi; Iannuzzo, Francesco
Factors Affecting Self-Sustained Switching Oscillations of Cascode GaN Devices and Mitigation Strategy during Parameter Design
2023 Lu, Zhebie; Iannuzzo, Francesco
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Reliability-Constrained Design of a High-Gain Power Optimizer based on a Real Mission Profile / Cerutti, Stefano; Iannuzzo, Francesco; Sangwongwanich, Ariya; Kerekes, Tamas; Pavone, Mario Giuseppe; Gennaro, Francesco; Aiello, Natale; Musolino, Francesco; Crovetti, Paolo Stefano. - ELETTRONICO. - (2025), pp. 738-745. (Intervento presentato al convegno 2025 IEEE Applied Power Electronics Conference and Exposition (APEC) tenutosi a Atlanta (USA) nel 16-20 marzo 2025) [10.1109/apec48143.2025.10977512]. | 1-gen-2025 | Cerutti, StefanoIannuzzo, FrancescoMusolino, FrancescoCrovetti, Paolo Stefano + | Reliability-Constrained_Design_of_a_High-Gain_Power_Optimizer_based_on_a_Real_Mission_Profile.pdf; Reliability-Constrained Design of a High-Gain Power Optimizer based on a Real Mission Profile.pdf |
| A Distributed Turn-Off Delay Compensator Scheme for Voltage Balancing of Series-Connected IGBTs / Zarghani, Mostafa; Iannuzzo, Francesco; Blaabjerg, Frede; Kaboli, Shahriyar. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - 12:(2024), pp. 2545-2557. [10.1109/JESTPE.2024.3390845] | 1-gen-2024 | Francesco Iannuzzo + | A_Distributed_Turn-Off_Delay_Compensator_Scheme_for_Voltage_Balancing_of_Series-Connected_IGBTs.pdf |
| A Double-Sided Cooling Approach of Discrete SiC MOSFET Device Based on Press-Pack Package / Yao, Ran; Zhu, Zheyan; Li, Hui; Lai, Wei; Chen, Xianping; Iannuzzo, Francesco; Liu, Renkuan; Luo, Xiaorong. - In: IEEE OPEN JOURNAL OF POWER ELECTRONICS. - ISSN 2644-1314. - ELETTRONICO. - 5:(2024), pp. 1629-1640. [10.1109/OJPEL.2024.3479293] | 1-gen-2024 | Francesco Iannuzzo + | File002.pdf |
| A Novel Sensor-Reduction Condition Monitoring Approach for MMC Submodule IGBTs Based on Statistics of Inferred On-State Voltage / Zhan, Cao; Wang, Weicheng; Tang, Yizheng; Li, Yixin; Iannuzzo, Francesco; Zhu, Lingyu; Yu, Kefan; Ji, Shengchang; Blaabjerg, Frede. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - 12:(2024), pp. 1068-1077. [10.1109/JESTPE.2023.3334643] | 1-gen-2024 | Francesco Iannuzzo + | A_Novel_Sensor-Reduction_Condition_Monitoring_Approach_for_MMC_Submodule_IGBTs_Based_on_Statistics_of_Inferred_On-State_Voltage.pdf |
| Application-Oriented Flexible Power Cycling Test System for Power Electronic Components / Zhang, Kaichen; Iannuzzo, Francesco; Blaabjerg, Frede. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - 12:(2024), pp. 5805-5816. [10.1109/JESTPE.2024.3446968] | 1-gen-2024 | Francesco Iannuzzo + | Application-Oriented_Flexible_Power_Cycling_Test_System_for_Power_Electronic_Components.pdf |
| Comparative Analysis of Bond Wire Degradation in Power Modules during DC and AC Power Cycling / Zhang, Kaichen; Iannuzzo, Francesco; Blaabjerg, Frede. - ELETTRONICO. - (2024). (Intervento presentato al convegno 2024 IEEE 15th International Symposium on Power Electronics for Distributed Generation Systems, PEDG 2024 nel 23/06/2024 - 26/06/2024) [10.1109/PEDG61800.2024.10667438]. | 1-gen-2024 | Francesco Iannuzzo + | Comparative_Analysis_of_Bond_Wire_Degradation_in_Power_Modules_During_DC_and_AC_Power_Cycling_compressed.pdf |
| Figures-of-Merit Study for Thermal Transient Measurement of SiC MOSFETs / Zhang, Yi; Zhang, Yichi; Hon Wong, Voon; Kalker, Sven; Caruso, Antonio; Ruppert, Lukas; Iannuzzo, Francesco; de Doncker, Rik W.. - In: IEEE TRANSACTIONS ON POWER ELECTRONICS. - ISSN 0885-8993. - ELETTRONICO. - 39:(2024), pp. 11583-11595. [10.1109/TPEL.2024.3382891] | 1-gen-2024 | Francesco Iannuzzo + | File006_compressed.pdf; Figures-of-Merit_Study_for_Thermal_Transient_Measurement_of_SiC_MOSFETs.pdf |
| In-Operation Junction Temperature Extraction for Cascode GaN Devices Based on Turn-Off Delay / Lu, Zhebie; Iannuzzo, Francesco. - In: IEEE TRANSACTIONS ON POWER ELECTRONICS. - ISSN 0885-8993. - ELETTRONICO. - 39:(2024), pp. 4735-4745. [10.1109/TPEL.2024.3354166] | 1-gen-2024 | Francesco Iannuzzo + | In-Operation_Junction_Temperature_Extraction_for_Cascode_GaN_Devices_Based_on_Turn-Off_Delay.pdf |
| Intelligent Condition Monitoring of Multiple Thermal Degradation of IGBT Modules Based on Case Temperature Matrix / Zhan, Cao; Tang, Yizheng; Zhu, Lingyu; Wang, Weicheng; Gou, Yating; Ji, Shengchang; Iannuzzo, Francesco. - In: IEEE TRANSACTIONS ON POWER ELECTRONICS. - ISSN 0885-8993. - ELETTRONICO. - 39:(2024), pp. 12490-12501. [10.1109/TPEL.2024.3415439] | 1-gen-2024 | Francesco Iannuzzo + | Intelligent_Condition_Monitoring_of_Multiple_Thermal_Degradation_of_IGBT_Modules_Based_on_Case_Temperature_Matrix.pdf |
| Investigation on Saturation Voltage Increment of Multichip Press-Pack IGBTs Under Power Cycling Tests / Zhan, Cao; Zhu, Lingyu; Zhang, Yaxin; Ji, Shengchang; Iannuzzo, Francesco; Blaabjerg, Frede. - In: IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS. - ISSN 0278-0046. - ELETTRONICO. - 71:(2024), pp. 15012-15023. [10.1109/TIE.2024.3368103] | 1-gen-2024 | Francesco Iannuzzo + | Investigation_on_Saturation_Voltage_Increment_of_Multichip_Press-Pack_IGBTs_Under_Power_Cycling_Tests.pdf |
| Large-Scale Adoption of Silicon Carbide in the Automotive Sector: What is Missing? / Iannuzzo, Francesco. - ELETTRONICO. - (2024), pp. 678-683. (Intervento presentato al convegno CIPS 2024 - 13th International Conference on Integrated Power Electronics Systems tenutosi a Dusseldorf (Germany) nel 12/03/2024 - 14/03/2024). | 1-gen-2024 | Francesco Iannuzzo | - |
| Model-Based Thermal Stress and Lifetime Estimation of DFIG Wind Power Converter / Yu, Xinming; Iannuzzo, Francesco; Zhou, Dao. - In: ENERGIES. - ISSN 1996-1073. - ELETTRONICO. - 17:(2024). [10.3390/en17143451] | 1-gen-2024 | Francesco Iannuzzo + | File011.pdf |
| Online Junction Temperature Extraction for Cascode GaN Devices Based on Turn-On Delay / Lu, Zhebie; Iannuzzo, Francesco. - In: IEEE TRANSACTIONS ON POWER ELECTRONICS. - ISSN 0885-8993. - ELETTRONICO. - 39:(2024), pp. 10250-10260. [10.1109/TPEL.2024.3392534] | 1-gen-2024 | Francesco Iannuzzo + | Online_Junction_Temperature_Extraction_for_Cascode_GaN_Devices_Based_on_Turn-On_Delay.pdf |
| Proof-of-Concept for an On-Chip Kelvin-Emitter RTD Sensor for Junction Temperature Monitoring of IGBTs / Baker, Nick; Dupont, Laurent; Michal Beczkowski, Szymon; Iannuzzo, Francesco. - In: IEEE TRANSACTIONS ON COMPONENTS, PACKAGING AND MANUFACTURING TECHNOLOGY. PART C. MANUFACTURING. - ISSN 1083-4400. - ELETTRONICO. - 14:(2024). [10.1109/TCPMT.2024.3370951] | 1-gen-2024 | Francesco Iannuzzo + | Proof-of-Concept_for_an_On-Chip_Kelvin-Emitter_RTD_Sensor_for_Junction_Temperature_Monitoring_of_IGBTs_compressed.pdf |
| Accuracy estimation of low-current voltage drop method for junction temperature monitoring under DC power cycling / Lu, Zhebie; Iannuzzo, Francesco. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 150:(2023). [10.1016/j.microrel.2023.115138] | 1-gen-2023 | Francesco Iannuzzo + | File016.pdf |
| Analytical Modeling and Sensitivity Analysis on Plasma Extraction Transit Time (PETT) Oscillations in High-Voltage NPT p-i-n Diode / Zhu, Ankang; Ye, Shuoyu; Kang, Jianlong; Xin, Zhen; Luo, Haoze; Iannuzzo, Francesco; Li, Wuhua; He, Xiangning. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - 11:(2023), pp. 1754-1766. [10.1109/JESTPE.2022.3223376] | 1-gen-2023 | Francesco Iannuzzo + | Analytical_Modeling_and_Sensitivity_Analysis_on_Plasma_Extraction_Transit_Time_PETT_Oscillations_in_High-Voltage_NPT_p-i-n_Diode.pdf |
| Comparison of Junction Temperature Measurement Using the TSEP Method and Optical Fiber Method in IGBT Power Modules without Silicone Gel Removal / Zhang, Kaichen; Leduc, Charles; Iannuzzo, Francesco. - ELETTRONICO. - (2023). (Intervento presentato al convegno PCIM Europe 2023 : International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management tenutosi a Nuremberg (Germany) nel 09/05/2023 - 11/05/2023) [10.30420/566091347]. | 1-gen-2023 | Francesco Iannuzzo + | File018.pdf |
| Design of a Non-destructive Device Test Platform Capable of Double-pulse Tests and Short-circuit Tests with Fast Overcurrent Protection for Wide Band-gap Devices / Lu, Zhebie; Iannuzzo, Francesco. - ELETTRONICO. - (2023). (Intervento presentato al convegno 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe tenutosi a Aalborg (Denmark) nel 04/09/2023 - 08/09/2023) [10.23919/EPE23ECCEEurope58414.2023.10264648]. | 1-gen-2023 | Francesco Iannuzzo + | Design_of_a_Non-destructive_Device_Test_Platform_Capable_of_Double-pulse_Tests_and_Short-circuit_Tests_with_Fast_Overcurrent_Protection_for_Wide_Band-gap_Devices.pdf |
| Evaluation of the Thermal Resistance in GaN HEMTs Using Thermo-Sensitive Electrical Parameters / Valeriu Pirosca, Adrian; Vecchio, Marcello; Agatino Rizzo, Santi; Iannuzzo, Francesco. - In: ENERGIES. - ISSN 1996-1073. - ELETTRONICO. - 16:(2023). [10.3390/en16062779] | 1-gen-2023 | Francesco Iannuzzo + | File020.pdf |
| Factors Affecting Self-Sustained Switching Oscillations of Cascode GaN Devices and Mitigation Strategy during Parameter Design / Lu, Zhebie; Iannuzzo, Francesco. - ELETTRONICO. - (2023), pp. 632-636. (Intervento presentato al convegno APEC 2023 - 38th Annual IEEE Applied Power Electronics Conference and Exposition tenutosi a Orlando (United States) nel 19/03/2023 - 23/03/2023) [10.1109/APEC43580.2023.10131546]. | 1-gen-2023 | Francesco Iannuzzo + | Factors_Affecting_Self-Sustained_Switching_Oscillations_of_Cascode_GaN_Devices_and_Mitigation_Strategy_During_Parameter_Design.pdf |