Archivio Istituzionale della RicercaIANNUZZO, FRANCESCO
IANNUZZO, FRANCESCO
Dipartimento Energia
068543
A Distributed Turn-Off Delay Compensator Scheme for Voltage Balancing of Series-Connected IGBTs
2024 Zarghani, Mostafa; Iannuzzo, Francesco; Blaabjerg, Frede; Kaboli, Shahriyar
A Double-Sided Cooling Approach of Discrete SiC MOSFET Device Based on Press-Pack Package
2024 Yao, Ran; Zhu, Zheyan; Li, Hui; Lai, Wei; Chen, Xianping; Iannuzzo, Francesco; Liu, Renkuan; Luo, Xiaorong
A Novel Sensor-Reduction Condition Monitoring Approach for MMC Submodule IGBTs Based on Statistics of Inferred On-State Voltage
2024 Zhan, Cao; Wang, Weicheng; Tang, Yizheng; Li, Yixin; Iannuzzo, Francesco; Zhu, Lingyu; Yu, Kefan; Ji, Shengchang; Blaabjerg, Frede
Application-Oriented Flexible Power Cycling Test System for Power Electronic Components
2024 Zhang, Kaichen; Iannuzzo, Francesco; Blaabjerg, Frede
Figures-of-Merit Study for Thermal Transient Measurement of SiC MOSFETs
2024 Zhang, Yi; Zhang, Yichi; Hon Wong, Voon; Kalker, Sven; Caruso, Antonio; Ruppert, Lukas; Iannuzzo, Francesco; de Doncker, Rik W.
In-Operation Junction Temperature Extraction for Cascode GaN Devices Based on Turn-Off Delay
2024 Lu, Zhebie; Iannuzzo, Francesco
Intelligent Condition Monitoring of Multiple Thermal Degradation of IGBT Modules Based on Case Temperature Matrix
2024 Zhan, Cao; Tang, Yizheng; Zhu, Lingyu; Wang, Weicheng; Gou, Yating; Ji, Shengchang; Iannuzzo, Francesco
Investigation on Saturation Voltage Increment of Multichip Press-Pack IGBTs Under Power Cycling Tests
2024 Zhan, Cao; Zhu, Lingyu; Zhang, Yaxin; Ji, Shengchang; Iannuzzo, Francesco; Blaabjerg, Frede
Model-Based Thermal Stress and Lifetime Estimation of DFIG Wind Power Converter
2024 Yu, Xinming; Iannuzzo, Francesco; Zhou, Dao
Online Junction Temperature Extraction for Cascode GaN Devices Based on Turn-On Delay
2024 Lu, Zhebie; Iannuzzo, Francesco
Proof-of-Concept for an On-Chip Kelvin-Emitter RTD Sensor for Junction Temperature Monitoring of IGBTs
2024 Baker, Nick; Dupont, Laurent; Michal Beczkowski, Szymon; Iannuzzo, Francesco
Accuracy estimation of low-current voltage drop method for junction temperature monitoring under DC power cycling
2023 Lu, Zhebie; Iannuzzo, Francesco
Analytical Modeling and Sensitivity Analysis on Plasma Extraction Transit Time (PETT) Oscillations in High-Voltage NPT p-i-n Diode
2023 Zhu, Ankang; Ye, Shuoyu; Kang, Jianlong; Xin, Zhen; Luo, Haoze; Iannuzzo, Francesco; Li, Wuhua; He, Xiangning
Evaluation of the Thermal Resistance in GaN HEMTs Using Thermo-Sensitive Electrical Parameters
2023 Valeriu Pirosca, Adrian; Vecchio, Marcello; Agatino Rizzo, Santi; Iannuzzo, Francesco
Failure degradation similarities on power SiC MOSFET devices submitted to short-circuit stress and accelerated switching conditions
2023 Oliveira, J.; Frey, P.; Morel, H.; Reynes, J. M.; Burky, J.; Coccetti, F.; Iannuzzo, F.; Piton, M.
Ferrite Beads Design to Improve Turn-off Characteristics of Cascode GaN HEMTs: An Optimum Design Method
2023 Xue, Peng; Iannuzzo, Francesco
Investigating the solder mask defects impact on leakage current on PCB under condensing humidity conditions
2023 Zhang, Kaichen; Sajjad Bahman, Amir; Iannuzzo, Francesco; Ramesh Chopade, Amol; Holst, Jørgen; Murli Rao, Jyothsna; Bahrebar, Sajjad; Ambat, Rajan
Junction temperature monitoring for cascode GaN devices using the Si MOSFET's body diode voltage drop
2023 Lu, Zhebie; Iannuzzo, Francesco
Lifetime prediction for press pack IGBT device by considering fretting wear failure
2023 Yao, Ran; Duan, Zeyu; Li, Hui; Iannuzzo, Francesco; Lai, Wei; Chen, Xianping
Low Inductive Characterization of Fast-Switching SiC MOSFETs and Active Gate Driver Units
2023 Philipps, Daniel A.; Xue, Peng; Ubostad, Tobias N.; Iannuzzo, Francesco; Peftitsis, Dimosthenis
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A Distributed Turn-Off Delay Compensator Scheme for Voltage Balancing of Series-Connected IGBTs / Zarghani, Mostafa; Iannuzzo, Francesco; Blaabjerg, Frede; Kaboli, Shahriyar. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - 12:(2024), pp. 2545-2557. [10.1109/JESTPE.2024.3390845] | 1-gen-2024 | Francesco Iannuzzo + | A_Distributed_Turn-Off_Delay_Compensator_Scheme_for_Voltage_Balancing_of_Series-Connected_IGBTs.pdf |
| A Double-Sided Cooling Approach of Discrete SiC MOSFET Device Based on Press-Pack Package / Yao, Ran; Zhu, Zheyan; Li, Hui; Lai, Wei; Chen, Xianping; Iannuzzo, Francesco; Liu, Renkuan; Luo, Xiaorong. - In: IEEE OPEN JOURNAL OF POWER ELECTRONICS. - ISSN 2644-1314. - ELETTRONICO. - 5:(2024), pp. 1629-1640. [10.1109/OJPEL.2024.3479293] | 1-gen-2024 | Francesco Iannuzzo + | File002.pdf |
| A Novel Sensor-Reduction Condition Monitoring Approach for MMC Submodule IGBTs Based on Statistics of Inferred On-State Voltage / Zhan, Cao; Wang, Weicheng; Tang, Yizheng; Li, Yixin; Iannuzzo, Francesco; Zhu, Lingyu; Yu, Kefan; Ji, Shengchang; Blaabjerg, Frede. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - 12:(2024), pp. 1068-1077. [10.1109/JESTPE.2023.3334643] | 1-gen-2024 | Francesco Iannuzzo + | A_Novel_Sensor-Reduction_Condition_Monitoring_Approach_for_MMC_Submodule_IGBTs_Based_on_Statistics_of_Inferred_On-State_Voltage.pdf |
| Application-Oriented Flexible Power Cycling Test System for Power Electronic Components / Zhang, Kaichen; Iannuzzo, Francesco; Blaabjerg, Frede. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - 12:(2024), pp. 5805-5816. [10.1109/JESTPE.2024.3446968] | 1-gen-2024 | Francesco Iannuzzo + | Application-Oriented_Flexible_Power_Cycling_Test_System_for_Power_Electronic_Components.pdf |
| Figures-of-Merit Study for Thermal Transient Measurement of SiC MOSFETs / Zhang, Yi; Zhang, Yichi; Hon Wong, Voon; Kalker, Sven; Caruso, Antonio; Ruppert, Lukas; Iannuzzo, Francesco; de Doncker, Rik W.. - In: IEEE TRANSACTIONS ON POWER ELECTRONICS. - ISSN 0885-8993. - ELETTRONICO. - 39:(2024), pp. 11583-11595. [10.1109/TPEL.2024.3382891] | 1-gen-2024 | Francesco Iannuzzo + | File006_compressed.pdf; Figures-of-Merit_Study_for_Thermal_Transient_Measurement_of_SiC_MOSFETs.pdf |
| In-Operation Junction Temperature Extraction for Cascode GaN Devices Based on Turn-Off Delay / Lu, Zhebie; Iannuzzo, Francesco. - In: IEEE TRANSACTIONS ON POWER ELECTRONICS. - ISSN 0885-8993. - ELETTRONICO. - 39:(2024), pp. 4735-4745. [10.1109/TPEL.2024.3354166] | 1-gen-2024 | Francesco Iannuzzo + | In-Operation_Junction_Temperature_Extraction_for_Cascode_GaN_Devices_Based_on_Turn-Off_Delay.pdf |
| Intelligent Condition Monitoring of Multiple Thermal Degradation of IGBT Modules Based on Case Temperature Matrix / Zhan, Cao; Tang, Yizheng; Zhu, Lingyu; Wang, Weicheng; Gou, Yating; Ji, Shengchang; Iannuzzo, Francesco. - In: IEEE TRANSACTIONS ON POWER ELECTRONICS. - ISSN 0885-8993. - ELETTRONICO. - 39:(2024), pp. 12490-12501. [10.1109/TPEL.2024.3415439] | 1-gen-2024 | Francesco Iannuzzo + | Intelligent_Condition_Monitoring_of_Multiple_Thermal_Degradation_of_IGBT_Modules_Based_on_Case_Temperature_Matrix.pdf |
| Investigation on Saturation Voltage Increment of Multichip Press-Pack IGBTs Under Power Cycling Tests / Zhan, Cao; Zhu, Lingyu; Zhang, Yaxin; Ji, Shengchang; Iannuzzo, Francesco; Blaabjerg, Frede. - In: IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS. - ISSN 0278-0046. - ELETTRONICO. - 71:(2024), pp. 15012-15023. [10.1109/TIE.2024.3368103] | 1-gen-2024 | Francesco Iannuzzo + | Investigation_on_Saturation_Voltage_Increment_of_Multichip_Press-Pack_IGBTs_Under_Power_Cycling_Tests.pdf |
| Model-Based Thermal Stress and Lifetime Estimation of DFIG Wind Power Converter / Yu, Xinming; Iannuzzo, Francesco; Zhou, Dao. - In: ENERGIES. - ISSN 1996-1073. - ELETTRONICO. - 17:(2024). [10.3390/en17143451] | 1-gen-2024 | Francesco Iannuzzo + | File011.pdf |
| Online Junction Temperature Extraction for Cascode GaN Devices Based on Turn-On Delay / Lu, Zhebie; Iannuzzo, Francesco. - In: IEEE TRANSACTIONS ON POWER ELECTRONICS. - ISSN 0885-8993. - ELETTRONICO. - 39:(2024), pp. 10250-10260. [10.1109/TPEL.2024.3392534] | 1-gen-2024 | Francesco Iannuzzo + | Online_Junction_Temperature_Extraction_for_Cascode_GaN_Devices_Based_on_Turn-On_Delay.pdf |
| Proof-of-Concept for an On-Chip Kelvin-Emitter RTD Sensor for Junction Temperature Monitoring of IGBTs / Baker, Nick; Dupont, Laurent; Michal Beczkowski, Szymon; Iannuzzo, Francesco. - In: IEEE TRANSACTIONS ON COMPONENTS, PACKAGING AND MANUFACTURING TECHNOLOGY. PART C. MANUFACTURING. - ISSN 1083-4400. - ELETTRONICO. - 14:(2024). [10.1109/TCPMT.2024.3370951] | 1-gen-2024 | Francesco Iannuzzo + | Proof-of-Concept_for_an_On-Chip_Kelvin-Emitter_RTD_Sensor_for_Junction_Temperature_Monitoring_of_IGBTs_compressed.pdf |
| Accuracy estimation of low-current voltage drop method for junction temperature monitoring under DC power cycling / Lu, Zhebie; Iannuzzo, Francesco. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 150:(2023). [10.1016/j.microrel.2023.115138] | 1-gen-2023 | Francesco Iannuzzo + | File016.pdf |
| Analytical Modeling and Sensitivity Analysis on Plasma Extraction Transit Time (PETT) Oscillations in High-Voltage NPT p-i-n Diode / Zhu, Ankang; Ye, Shuoyu; Kang, Jianlong; Xin, Zhen; Luo, Haoze; Iannuzzo, Francesco; Li, Wuhua; He, Xiangning. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - 11:(2023), pp. 1754-1766. [10.1109/JESTPE.2022.3223376] | 1-gen-2023 | Francesco Iannuzzo + | Analytical_Modeling_and_Sensitivity_Analysis_on_Plasma_Extraction_Transit_Time_PETT_Oscillations_in_High-Voltage_NPT_p-i-n_Diode.pdf |
| Evaluation of the Thermal Resistance in GaN HEMTs Using Thermo-Sensitive Electrical Parameters / Valeriu Pirosca, Adrian; Vecchio, Marcello; Agatino Rizzo, Santi; Iannuzzo, Francesco. - In: ENERGIES. - ISSN 1996-1073. - ELETTRONICO. - 16:(2023). [10.3390/en16062779] | 1-gen-2023 | Francesco Iannuzzo + | File020.pdf |
| Failure degradation similarities on power SiC MOSFET devices submitted to short-circuit stress and accelerated switching conditions / Oliveira, J.; Frey, P.; Morel, H.; Reynes, J. M.; Burky, J.; Coccetti, F.; Iannuzzo, F.; Piton, M.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 148:(2023). [10.1016/j.microrel.2023.115166] | 1-gen-2023 | F. Iannuzzo + | 1-s2.0-S0026271423002664-main.pdf |
| Ferrite Beads Design to Improve Turn-off Characteristics of Cascode GaN HEMTs: An Optimum Design Method / Xue, Peng; Iannuzzo, Francesco. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - 11:(2023), pp. 3184-3194. [10.1109/JESTPE.2023.3265903] | 1-gen-2023 | Francesco Iannuzzo + | File023.pdf; Ferrite_Beads_Design_to_Improve_Turn-Off_Characteristics_of_Cascode_GaN_HEMTs_An_Optimum_Design_Method.pdf |
| Investigating the solder mask defects impact on leakage current on PCB under condensing humidity conditions / Zhang, Kaichen; Sajjad Bahman, Amir; Iannuzzo, Francesco; Ramesh Chopade, Amol; Holst, Jørgen; Murli Rao, Jyothsna; Bahrebar, Sajjad; Ambat, Rajan. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 150:(2023). [10.1016/j.microrel.2023.115210] | 1-gen-2023 | Francesco Iannuzzo + | 1-s2.0-S0026271423003104-main_compressed.pdf |
| Junction temperature monitoring for cascode GaN devices using the Si MOSFET's body diode voltage drop / Lu, Zhebie; Iannuzzo, Francesco. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 150:(2023). [10.1016/j.microrel.2023.115158] | 1-gen-2023 | Francesco Iannuzzo + | File027.pdf |
| Lifetime prediction for press pack IGBT device by considering fretting wear failure / Yao, Ran; Duan, Zeyu; Li, Hui; Iannuzzo, Francesco; Lai, Wei; Chen, Xianping. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 145:(2023). [10.1016/j.microrel.2023.114984] | 1-gen-2023 | Francesco Iannuzzo + | 1-s2.0-S0026271423000847-main.pdf |
| Low Inductive Characterization of Fast-Switching SiC MOSFETs and Active Gate Driver Units / Philipps, Daniel A.; Xue, Peng; Ubostad, Tobias N.; Iannuzzo, Francesco; Peftitsis, Dimosthenis. - In: IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS. - ISSN 0093-9994. - ELETTRONICO. - 59:(2023), pp. 6384-6398. [10.1109/TIA.2023.3282930] | 1-gen-2023 | Francesco Iannuzzo + | Low_Inductive_Characterization_of_Fast-Switching_SiC_MOSFETs_and_Active_Gate_Driver_Units.pdf |