Archivio Istituzionale della RicercaObtaining the characteristics of the device is a key procedure before practical applications. Here in this paper, the design of a device test platform for wide-bandgap devices is introduced. The platform has a high noise immunity, low loop inductance, and fast overcurrent protection, realizing a non-destructive operation.
Design of a Non-destructive Device Test Platform Capable of Double-pulse Tests and Short-circuit Tests with Fast Overcurrent Protection for Wide Band-gap Devices / Lu, Zhebie; Iannuzzo, Francesco. - ELETTRONICO. - (2023). (Intervento presentato al convegno 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe tenutosi a Aalborg (Denmark) nel 04/09/2023 - 08/09/2023) [10.23919/EPE23ECCEEurope58414.2023.10264648].
Design of a Non-destructive Device Test Platform Capable of Double-pulse Tests and Short-circuit Tests with Fast Overcurrent Protection for Wide Band-gap Devices
Francesco Iannuzzo
2023
Abstract
Obtaining the characteristics of the device is a key procedure before practical applications. Here in this paper, the design of a device test platform for wide-bandgap devices is introduced. The platform has a high noise immunity, low loop inductance, and fast overcurrent protection, realizing a non-destructive operation.
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https://hdl.handle.net/11583/2999734