Archivio Istituzionale della RicercaThis report contains the outcome of this first study on the reliability of Wide Band Gap (WBG) components and WBG-based applications. By summarizing key findings, it leads to an outlook and discusses the next steps.
Reliability of WBG, results of a Pre-Scoping Study / Zhang, Kaichen; Iannuzzo, Francesco; Holm Christiansen, Christian. - ELETTRONICO. - (2023). (Intervento presentato al convegno 2023 25th European Conference on Power Electronics and Applications, EPE 2023 ECCE Europe tenutosi a Aalborg (Denmark) nel 04/09/2023 - 08/09/2023) [10.23919/EPE23ECCEEurope58414.2023.10264334].
Reliability of WBG, results of a Pre-Scoping Study
Francesco Iannuzzo;
2023
Abstract
This report contains the outcome of this first study on the reliability of Wide Band Gap (WBG) components and WBG-based applications. By summarizing key findings, it leads to an outlook and discusses the next steps.
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Utilizza questo identificativo per citare o creare un link a questo documento:
https://hdl.handle.net/11583/2999814