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An efficient strategy for the development of software test libraries for an automotive microcontroller family
2020 Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A.
Assessing the effectiveness of different test approaches for power devices in a PCB
2020 Piumatti, Davide; Borlo, Stefano; Reorda, Matteo Sonza; Bojoi, Radu
Test Solution for Heatsinks in Power Electronics Applications
2020 Piumatti, Davide; Borlo, Stefano; Quitadamo, Matteo Vincenzo; Sonza Reorda, Matteo; Giacomo Armando, Eric; Fiori, Franco
Faults Detection in the Heatsinks Mounted on Power Electronic Transistors
2020 Quitadamo, Matteo V.; Piumatti, Davide; SONZA REORDA, Matteo; Fiori, Franco
A Suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices
2021 Ruospo, A.; Piumatti, D.; Floridia, A.; Sanchez, E.
Reliability in Power Electronics and Power Systems
2021 Piumatti, Davide
A New Technique to Check the Correct Mounting of the Power Module Heatsinks
2022 Quitadamo, Matteo Vincenzo; Piumatti, Davide; Raviola, Erica; Fiori, Franco; Sonza Reorda, Matteo
An innovative Strategy to Quickly Grade Functional Test Programs
2022 Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, Alessandro; Piumatti, Davide; Quer, Stefano; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems
2023 Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo
High-reliability uninterruptible power supply manager for critical virtualization cluster
2024 Piumatti, Davide; Galletto, Andrea; Castagno, Flavio
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| An efficient strategy for the development of software test libraries for an automotive microcontroller family / Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 115:(2020), p. 113962. [10.1016/j.microrel.2020.113962] | 1-gen-2020 | Piumatti, D.Sanchez, E.Bernardi, P. + | 1-s2.0-S0026271420307939-main-post print.pdf; Versione editoriale pre print.pdf |
| Assessing the effectiveness of different test approaches for power devices in a PCB / Piumatti, Davide; Borlo, Stefano; Reorda, Matteo Sonza; Bojoi, Radu. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - (2020), pp. 1-14. [10.1109/JESTPE.2020.3013229] | 1-gen-2020 | Piumatti, DavideBorlo, StefanoReorda, Matteo SonzaBojoi, Radu | FINAL VERSION.pdf; 09153558.pdf |
| Test Solution for Heatsinks in Power Electronics Applications / Piumatti, Davide; Borlo, Stefano; Quitadamo, Matteo Vincenzo; Sonza Reorda, Matteo; Giacomo Armando, Eric; Fiori, Franco. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 9:6(2020), pp. 1-15. [10.3390/electronics9061020] | 1-gen-2020 | Piumatti, DavideBorlo, StefanoQuitadamo, Matteo VincenzoSonza Reorda, MatteoGiacomo Armando, EricFiori, Franco | electronics-09-01020.pdf |
| Faults Detection in the Heatsinks Mounted on Power Electronic Transistors / Quitadamo, Matteo V.; Piumatti, Davide; SONZA REORDA, Matteo; Fiori, Franco. - In: INTERNATIONAL JOURNAL OF ELECTRICAL AND ELECTRONIC ENGINEERING AND TELECOMMUNICATIONS. - ISSN 2319-2518. - STAMPA. - 9:4(2020), pp. 206-212. [10.18178/ijeetc.9.4.206-212] | 1-gen-2020 | Matteo V. QuitadamoDavide PiumattiMatteo Sonza ReordaFranco Fiori | 5fad2e2165a91658384c85f25b0f4f87d3ef.pdf |
| A Suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices / Ruospo, A.; Piumatti, D.; Floridia, A.; Sanchez, E.. - ELETTRONICO. - (2021), pp. 1-6. (Intervento presentato al convegno 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021 tenutosi a Torino, Italy nel 2021) [10.1109/IOLTS52814.2021.9486704]. | 1-gen-2021 | Ruospo A.Piumatti D.Floridia A.Sanchez E. | FINAL_PUBLISHED.pdf |
| Reliability in Power Electronics and Power Systems / Piumatti, Davide. - (2021 Jul 08), pp. 1-165. | 8-lug-2021 | PIUMATTI, DAVIDE | conv_versione_finale_tesi.pdf; conv_abstract_finale.pdf |
| A New Technique to Check the Correct Mounting of the Power Module Heatsinks / Quitadamo, Matteo Vincenzo; Piumatti, Davide; Raviola, Erica; Fiori, Franco; Sonza Reorda, Matteo. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 128:(2022). [10.1016/j.microrel.2021.114416] | 1-gen-2022 | Quitadamo, Matteo VincenzoPiumatti, DavideRaviola, EricaFiori, FrancoSonza Reorda, Matteo | Termico_FINALpoof.pdf; 1-s2.0-S0026271421003826-main.pdf |
| An innovative Strategy to Quickly Grade Functional Test Programs / Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, Alessandro; Piumatti, Davide; Quer, Stefano; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto. - (2022), pp. 355-364. (Intervento presentato al convegno International Test Conference tenutosi a Anaheim, CA (USA) nel 23-30 September 2022) [10.1109/ITC50671.2022.00044]. | 1-gen-2022 | Francesco AngionePaolo BernardiAndrea CalabreseLorenzo CardoneDavide PiumattiStefano Quer + | An_innovative_Strategy_to_Quickly_Grade_Functional_Test_Programs.pdf |
| On the integration and hardening of Software Test Libraries in Real-Time Operating Systems / Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo. - (2023), pp. 1-6. (Intervento presentato al convegno Latin American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154492]. | 1-gen-2023 | Angione, FrancescoBernardi, PaoloCantoro, RiccardoDi Gruttola Giardino, NicolaPiumatti, DavideReorda, Matteo Sonza + | On_the_integration_and_hardening_of_Software_Test_Libraries_in_Real-Time_Operating_Systems.pdf |
| High-reliability uninterruptible power supply manager for critical virtualization cluster / Piumatti, Davide; Galletto, Andrea; Castagno, Flavio. - In: INTERNATIONAL JOURNAL OF POWER ELECTRONICS AND DRIVE SYSTEMS. - ISSN 2088-8694. - ELETTRONICO. - 15:2(2024), pp. 1117-1127. [10.11591/ijpeds.v15.i2.pp1117-1127] | 1-gen-2024 | Piumatti, DavideGalletto, AndreaCastagno, Flavio | - |
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