HAMDIOUI, SAID
 Distribuzione geografica
Continente #
EU - Europa 420
NA - Nord America 402
AS - Asia 132
AF - Africa 1
Totale 955
Nazione #
US - Stati Uniti d'America 398
IT - Italia 136
DE - Germania 77
GB - Regno Unito 77
CN - Cina 37
NL - Olanda 30
SG - Singapore 30
FR - Francia 20
BE - Belgio 18
IE - Irlanda 18
FI - Finlandia 11
RU - Federazione Russa 11
HK - Hong Kong 10
TR - Turchia 9
ID - Indonesia 8
JP - Giappone 8
KR - Corea 7
PK - Pakistan 6
UA - Ucraina 6
IR - Iran 5
JO - Giordania 5
CA - Canada 4
CH - Svizzera 4
IN - India 3
TW - Taiwan 3
AT - Austria 2
EE - Estonia 2
RO - Romania 2
IL - Israele 1
LU - Lussemburgo 1
NO - Norvegia 1
PH - Filippine 1
PL - Polonia 1
RS - Serbia 1
SE - Svezia 1
SN - Senegal 1
Totale 955
Città #
Southend 72
Ashburn 63
Chandler 62
Turin 40
Santa Clara 36
Singapore 19
Brussels 18
Dublin 17
Princeton 17
Seattle 17
Berlin 14
Boardman 13
Houston 12
Council Bluffs 11
The Hague 11
Fairfield 10
Torino 10
Woodbridge 10
Helsinki 9
Milan 9
Bremen 8
Delft 8
Jakarta 8
Istanbul 7
Rome 7
Fremont 6
Mornago 5
Zhengzhou 5
Beijing 4
Hangzhou 4
Jacksonville 4
Karlsruhe 4
Rawalpindi 4
Zoetermeer 4
Bern 3
Bologna 3
Cambridge 3
Collegno 3
Dallas 3
Des Moines 3
Futahigashi 3
Kish 3
Mountain View 3
Nakano 3
None 3
San Donato Milanese 3
Wilmington 3
Zhongli District 3
Ann Arbor 2
Arlington 2
Buffalo 2
Casoria 2
Chicago 2
Delfgauw 2
East Los Angeles 2
Falls Church 2
Frankfurt am Main 2
Hausleiten 2
Islamabad 2
Lappeenranta 2
Leiden 2
Madison 2
Menlo Park 2
Neubiberg 2
Ningbo 2
Nuremberg 2
Nürnberg 2
Padova 2
Palermo 2
Pohang 2
Saint Petersburg 2
San Ramon 2
Shanghai 2
Tallinn 2
Toronto 2
Washington 2
Amsterdam 1
Andover 1
Asti 1
Baltimore 1
Basking Ridge 1
Belgrade 1
Busto Arsizio 1
Casal Velino 1
Cologno Monzese 1
Dearborn 1
Delhi 1
Empoli 1
Galati 1
Guiyang 1
Hillsboro 1
Hong Kong 1
Hunedoara 1
Izmir 1
Kashan 1
Kunming 1
Lissone 1
Los Angeles 1
Luxembourg 1
Malatya 1
Totale 670
Nome #
An efficient method for the test of embedded memory cores during the operational phase 321
Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks 107
Device-Aware Test for Anomalous Charge Trapping in FeFETs 97
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs 88
Automated Identification of Application-Dependent Safe Faults in Automotive Systems-on-a-Chips 84
Recent Trends and Perspectives on Defect-Oriented Testing 71
Untestable faults identification in GPGPUs for safety-critical applications 67
Using STLs for Effective In-field Test of GPUs 59
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers 53
Defects, Fault Modeling, and Test Development Framework for FeFETs 36
Totale 983
Categoria #
all - tutte 3.185
article - articoli 911
book - libri 0
conference - conferenze 2.274
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 6.370


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202028 0 0 0 0 0 4 4 11 6 1 2 0
2020/202179 18 6 9 6 0 3 6 5 9 10 5 2
2021/202294 3 4 2 4 4 4 1 5 1 35 7 24
2022/2023229 17 31 19 25 31 27 17 13 27 5 7 10
2023/202468 6 9 3 7 8 5 6 6 3 6 4 5
2024/2025259 4 31 35 95 56 38 0 0 0 0 0 0
Totale 983