Archivio Istituzionale della RicercaPORRO, SAMUELE
PORRO, SAMUELE
Dipartimento Scienza Applicata e Tecnologia
011631
50nm gate-length hydrogen terminated diamond field effect transistors characterization and inspection of operation
2011 Moran, D. A. J.; Maclaren, D. A.; Porro, S.; Hill, R.; Mclelland, H.; John, P.; Wilson, J.
A multi-level memristor based on atomic layer deposition of iron oxide
2018 Porro, Samuele; Bejtka, Katarzyna; Jasmin, Alladin; Fontana, Marco; Milano, Gianluca; Chiolerio, Alessandro; Pirri, Candido; Ricciardi, Carlo
A powerful tool for graphene functionalization: Benzophenone mediated UV-grafting
2014 Roppolo, Ignazio; Chiappone, Annalisa; Bejtka, KATARZYNA TERESA; Edvige, Celasco; Angelica, Chiodoni; Giorgis, Fabrizio; Sangermano, Marco; Porro, Samuele
APPARATO DI PROPULSIONE PER VEICOLI SPAZIALI E PROCEDIMENTO CORRISPONDENTE
2015 Chiolerio, A.; Porro, S.
Carbon fibre production during hydrogen plasma etching of diamond films
2016 Villalpando, I; John, P.; Porro, Samuele; Wilson, J. I. B.
Characterization of the surface acoustic wave devices based on ZnO/nanocrystalline diamond structures
2013 Hua Feng, Pang; Luis Garcia, Gancedo; Yong Qing, Fu; Porro, Samuele; Yan Wei, Gu; J. K., Luo; Xiao Tao, Zu; Frank, Placido; John I. B., Wilson; Andrew J., Flewitt; W. I., Milne
Comparison between ZnO nanowires grown by chemical vapor deposition and hydrothermal synthesis
2013 Podrezova, L. P.; Porro, Samuele; Cauda, VALENTINA ALICE; Fontana, M.; Cicero, Giancarlo
Correlation between Defects and Electrical Properties of 4H-SiC Based Schottky Diodes
2003 Scaltrito, Luciano; Porro, Samuele; Giorgis, Fabrizio; Mandracci, Pietro; Cocuzza, Matteo; Pirri, Candido; Ricciardi, Carlo; Ferrero, Sergio; Castaldini, A.
Defect characterization of 4H-SiC wafers for power electronic device applications
2002 Scaltrito, Luciano; Porro, Samuele; Giorgis, Fabrizio; Pirri, Candido; Mandracci, Pietro; Ricciardi, Carlo; Sgorlon, C.; Richieri, G.; Merlin, L.; Ferrero, Sergio
Defect influence on the electrical properties of 4H-SiC Schottky diodes
2004 Scaltrito, Luciano; Celasco, Edvige; Porro, Samuele; Ferrero, Sergio; Giorgis, Fabrizio; Pirri, Candido; Perrone, Denis; Meotto, U; Mandracci, Pietro; Richieri, G; Merlin, L; Cavallini, A; Castaldini, A; Rossi, M.
Defect influence on the electrical properties of 4H-SiC Schottky diodes
2003 Scaltrito, Luciano; Celasco, Edvige; Porro, Samuele; Ferrero, Sergio; Giorgis, F; Pirri, Candido; Perrone, D; Meotto, U; Mandracci, Pietro; Richieri, G; Merlin, L; Cavallini, A; Castaldini, A; Rossi, M.
Defects localization and nature in bulk and thin film ultrananocrystalline diamond
2007 A. I., Shames; A. M., Panich; Porro, Samuele; Rovere, Massimo; Musso, Simone; Tagliaferro, Alberto; M. V., Baidakova; Osipov, V. Y. U.; Vul, A. Y. A.; T., Enoki; M., Takahashi; E., Osawa; O. A., Williams; P., Bruno; D. M., Gruen
Deposition of polycrystalline and nanocrystalline diamond on graphite: effects of surface pre-treatments
2017 Villalpando, I.; John, P.; Porro, Samuele; Wilson, J. I. B.
Design, Fabrication and Characterization of 1.5 mΩcm2, 800 V 4H-SiC n-Type Schottky Barrier Diodes
2005 Furno, Mauro Stefano; Bonani, Fabrizio; Ghione, Giovanni; Ferrero, Sergio; Porro, Samuele; Mandracci, Pietro; Scaltrito, Luciano; Perrone, Denis; Richieri, G.; Merlin, Luigi
Developing Quantitative Nondestructive Characterization of Nanomaterials: A Case Study on Sequential Infiltration Synthesis of Block Copolymers
2023 Cara, Eleonora; Hönicke, Philipp; Kayser, Yves; Lindner, Jörg K. N.; Castellino, Micaela; Murataj, Irdi; Porro, Samuele; Angelini, Angelo; De Leo, Natascia; Pirri, Candido; Beckhoff, Burkhard; Boarino, Luca; FERRARESE LUPI, Federico
Diamond coatings exposure to fusion-relevant plasma conditions
2011 Porro, Samuele; G., De Temmerman; S., Lisgo; D. L., Rudakov; A., Litnovsky; P., Petersson; P., John; J. I. B., Wilson
Effects in CVD diamond exposed to fusion plasmas
2009 Porro, Samuele; G., De Temmerman; P., John; S., Lisgo; I., Villalpando; J. I. B., Wilson
Effects in CVD diamond exposed to fusion plasmas Physica Status Solidi (A) Applications and Materials (2009) 206:9 (2028-2032))
2010 Porro, S.; De Temmerman, G.; John, P.; Lisgo, S.; Villalpando, I.; Wilson, J. I. B.
Effects of single-pulse Al2O3 insertion in TiO2 oxide memristors by low temperature ALD
2018 Giovinazzo, C.; Ricciardi, C.; Pirri, C. F.; Chiolerio, A.; Porro, S.
Effetto sigillante di film di TiO2 depositati attraverso atomic layer deposition su leghe di alluminio AA6xxx
2023 Fedrizzi, L.; Andreatta, F.; Porro, S.; Lanzutti, A.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| 50nm gate-length hydrogen terminated diamond field effect transistors characterization and inspection of operation / Moran, D. A. J.; Maclaren, D. A.; Porro, S.; Hill, R.; Mclelland, H.; John, P.; Wilson, J.. - In: MATERIALS RESEARCH SOCIETY SYMPOSIA PROCEEDINGS. - ISSN 0272-9172. - 1282:(2011), pp. 141-147. (Intervento presentato al convegno MATERIALS RESEARCH SOCIETY SYMPOSIA) [10.1557/opl.2011.455]. | 1-gen-2011 | Porro, S. + | - |
| A multi-level memristor based on atomic layer deposition of iron oxide / Porro, Samuele; Bejtka, Katarzyna; Jasmin, Alladin; Fontana, Marco; Milano, Gianluca; Chiolerio, Alessandro; Pirri, Candido; Ricciardi, Carlo. - In: NANOTECHNOLOGY. - ISSN 0957-4484. - 29:49(2018), p. 495201. [10.1088/1361-6528/aae2ff] | 1-gen-2018 | Samuele PorroAlladin JasminMarco FontanaGianluca MilanoAlessandro ChiolerioCandido Fabrizio PirriCarlo Ricciardi + | - |
| A powerful tool for graphene functionalization: Benzophenone mediated UV-grafting / Roppolo, Ignazio; Chiappone, Annalisa; Bejtka, KATARZYNA TERESA; Edvige, Celasco; Angelica, Chiodoni; Giorgis, Fabrizio; Sangermano, Marco; Porro, Samuele. - In: CARBON. - ISSN 0008-6223. - ELETTRONICO. - 77:(2014), pp. 226-235. [10.1016/j.carbon.2014.05.025] | 1-gen-2014 | ROPPOLO, IGNAZIOAnnalisa ChiapponeKatarzyna BejtkaGIORGIS, FABRIZIOSANGERMANO, MARCOPORRO, SAMUELE + | - |
| APPARATO DI PROPULSIONE PER VEICOLI SPAZIALI E PROCEDIMENTO CORRISPONDENTE / Chiolerio, A.; Porro, S.. - (2015). | 1-gen-2015 | A. ChiolerioS. Porro | ITUB20154918A1_Original_document_20201002165826.pdf |
| Carbon fibre production during hydrogen plasma etching of diamond films / Villalpando, I; John, P.; Porro, Samuele; Wilson, J. I. B.. - In: RSC ADVANCES. - ISSN 2046-2069. - 6:69(2016), pp. 64421-64427. [10.1039/c6ra04599e] | 1-gen-2016 | PORRO, SAMUELE + | - |
| Characterization of the surface acoustic wave devices based on ZnO/nanocrystalline diamond structures / Hua Feng, Pang; Luis Garcia, Gancedo; Yong Qing, Fu; Porro, Samuele; Yan Wei, Gu; J. K., Luo; Xiao Tao, Zu; Frank, Placido; John I. B., Wilson; Andrew J., Flewitt; W. I., Milne. - In: PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE. - ISSN 1862-6300. - 210:(2013), pp. 1575-1583. [10.1002/pssa.201228631] | 1-gen-2013 | PORRO, SAMUELE + | - |
| Comparison between ZnO nanowires grown by chemical vapor deposition and hydrothermal synthesis / Podrezova, L. P.; Porro, Samuele; Cauda, VALENTINA ALICE; Fontana, M.; Cicero, Giancarlo. - In: APPLIED PHYSICS. A, MATERIALS SCIENCE & PROCESSING. - ISSN 1432-0630. - STAMPA. - 113:3(2013), pp. 623-632. [10.1007/s00339-013-7838-5] | 1-gen-2013 | PORRO, SAMUELECAUDA, VALENTINA ALICEFontana M.CICERO, Giancarlo + | - |
| Correlation between Defects and Electrical Properties of 4H-SiC Based Schottky Diodes / Scaltrito, Luciano; Porro, Samuele; Giorgis, Fabrizio; Mandracci, Pietro; Cocuzza, Matteo; Pirri, Candido; Ricciardi, Carlo; Ferrero, Sergio; Castaldini, A.. - 433-436:(2003), pp. 455-458. | 1-gen-2003 | SCALTRITO, LUCIANOPORRO, SAMUELEGIORGIS, FABRIZIOMANDRACCI, PietroCOCUZZA, MATTEOPIRRI, CandidoRICCIARDI, CarloFERRERO, SERGIO + | - |
| Defect characterization of 4H-SiC wafers for power electronic device applications / Scaltrito, Luciano; Porro, Samuele; Giorgis, Fabrizio; Pirri, Candido; Mandracci, Pietro; Ricciardi, Carlo; Sgorlon, C.; Richieri, G.; Merlin, L.; Ferrero, Sergio. - In: JOURNAL OF PHYSICS. CONDENSED MATTER. - ISSN 0953-8984. - 14:48(2002), pp. 13397-13402. [10.1088/0953-8984/14/48/394] | 1-gen-2002 | SCALTRITO, LUCIANOPORRO, SAMUELEGIORGIS, FABRIZIOPIRRI, CandidoMANDRACCI, PietroRICCIARDI, CarloFERRERO, SERGIO + | - |
| Defect influence on the electrical properties of 4H-SiC Schottky diodes / Scaltrito, Luciano; Celasco, Edvige; Porro, Samuele; Ferrero, Sergio; Giorgis, Fabrizio; Pirri, Candido; Perrone, Denis; Meotto, U; Mandracci, Pietro; Richieri, G; Merlin, L; Cavallini, A; Castaldini, A; Rossi, M.. - 457-460:2(2004), pp. 1081-1084. | 1-gen-2004 | SCALTRITO, LUCIANOCELASCO, EDVIGEPORRO, SAMUELEFERRERO, SERGIOGIORGIS, FABRIZIOPIRRI, CandidoPERRONE, DENISMANDRACCI, Pietro + | - |
| Defect influence on the electrical properties of 4H-SiC Schottky diodes / Scaltrito, Luciano; Celasco, Edvige; Porro, Samuele; Ferrero, Sergio; Giorgis, F; Pirri, Candido; Perrone, D; Meotto, U; Mandracci, Pietro; Richieri, G; Merlin, L; Cavallini, A; Castaldini, A; Rossi, M.. - (2003). (Intervento presentato al convegno International Conference on Silicon Carbide and Related Materials ICSCRM tenutosi a Lyon nel 5-10 October 2003). | 1-gen-2003 | SCALTRITO, LUCIANOCELASCO, EDVIGEPORRO, SAMUELEFERRERO, SERGIOPIRRI, CandidoMANDRACCI, Pietro + | - |
| Defects localization and nature in bulk and thin film ultrananocrystalline diamond / A. I., Shames; A. M., Panich; Porro, Samuele; Rovere, Massimo; Musso, Simone; Tagliaferro, Alberto; M. V., Baidakova; Osipov, V. Y. U.; Vul, A. Y. A.; T., Enoki; M., Takahashi; E., Osawa; O. A., Williams; P., Bruno; D. M., Gruen. - In: DIAMOND AND RELATED MATERIALS. - ISSN 0925-9635. - 16:(2007), pp. 1806-1812. [10.1016/j.diamond.2007.08.026] | 1-gen-2007 | PORRO, SAMUELEROVERE, MASSIMOMUSSO, SIMONETAGLIAFERRO, Alberto + | - |
| Deposition of polycrystalline and nanocrystalline diamond on graphite: effects of surface pre-treatments / Villalpando, I.; John, P.; Porro, Samuele; Wilson, J. I. B.. - In: APPLIED PHYSICS. A, MATERIALS SCIENCE & PROCESSING. - ISSN 0947-8396. - ELETTRONICO. - 123:3(2017), pp. 1-8. [10.1007/s00339-017-0819-3] | 1-gen-2017 | PORRO, SAMUELE + | - |
| Design, Fabrication and Characterization of 1.5 mΩcm2, 800 V 4H-SiC n-Type Schottky Barrier Diodes / Furno, Mauro Stefano; Bonani, Fabrizio; Ghione, Giovanni; Ferrero, Sergio; Porro, Samuele; Mandracci, Pietro; Scaltrito, Luciano; Perrone, Denis; Richieri, G.; Merlin, Luigi. - ELETTRONICO. - 483-485:(2005), pp. 941-944. (Intervento presentato al convegno 5th European Conference on Silicon Carbide and Related Materials, ECRSCRM2004 tenutosi a Bologna, Italy nel 31 August - 4 September 2004) [10.4028/www.scientific.net/MSF.483-485.941]. | 1-gen-2005 | FURNO, Mauro StefanoBONANI, FABRIZIOGHIONE, GIOVANNIFERRERO, SERGIOPORRO, SAMUELEMANDRACCI, PietroSCALTRITO, LUCIANOPERRONE, DENIS + | Design, Fabrication, and Characterization of.pdf |
| Developing Quantitative Nondestructive Characterization of Nanomaterials: A Case Study on Sequential Infiltration Synthesis of Block Copolymers / Cara, Eleonora; Hönicke, Philipp; Kayser, Yves; Lindner, Jörg K. N.; Castellino, Micaela; Murataj, Irdi; Porro, Samuele; Angelini, Angelo; De Leo, Natascia; Pirri, Candido; Beckhoff, Burkhard; Boarino, Luca; FERRARESE LUPI, Federico. - In: ACS APPLIED POLYMER MATERIALS. - ISSN 2637-6105. - ELETTRONICO. - 5:3(2023), pp. 2079-2087. [10.1021/acsapm.2c02094] | 1-gen-2023 | Eleonora CaraMicaela CastellinoIrdi MuratajSamuele PorroAngelo AngeliniCandido Fabrizio PirriLuca BoarinoFederico Ferrarese Lupi + | 2023 ACS Appl Polym Mater BCP SIS ALD inrim.pdf |
| Diamond coatings exposure to fusion-relevant plasma conditions / Porro, Samuele; G., De Temmerman; S., Lisgo; D. L., Rudakov; A., Litnovsky; P., Petersson; P., John; J. I. B., Wilson. - In: JOURNAL OF NUCLEAR MATERIALS. - ISSN 0022-3115. - 415:(2011), pp. S161-S164. [10.1016/j.jnucmat.2010.10.005] | 1-gen-2011 | PORRO, SAMUELE + | - |
| Effects in CVD diamond exposed to fusion plasmas / Porro, Samuele; G., De Temmerman; P., John; S., Lisgo; I., Villalpando; J. I. B., Wilson. - In: PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE. - ISSN 1862-6300. - 206:(2009), pp. 2028-2032. [10.1002/pssa.200982201] | 1-gen-2009 | PORRO, SAMUELE + | - |
| Effects in CVD diamond exposed to fusion plasmas Physica Status Solidi (A) Applications and Materials (2009) 206:9 (2028-2032)) / Porro, S.; De Temmerman, G.; John, P.; Lisgo, S.; Villalpando, I.; Wilson, J. I. B.. - In: PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE. - ISSN 1862-6300. - 207:8(2010), pp. 2004-2004. [10.1002/pssa.201083670] | 1-gen-2010 | Porro S. + | - |
| Effects of single-pulse Al2O3 insertion in TiO2 oxide memristors by low temperature ALD / Giovinazzo, C.; Ricciardi, C.; Pirri, C. F.; Chiolerio, A.; Porro, S.. - In: APPLIED PHYSICS. A, MATERIALS SCIENCE & PROCESSING. - ISSN 0947-8396. - 124:10(2018). [10.1007/s00339-018-2112-5] | 1-gen-2018 | Giovinazzo, C.Ricciardi, C.Pirri, C. F.Chiolerio, A.Porro, S. | - |
| Effetto sigillante di film di TiO2 depositati attraverso atomic layer deposition su leghe di alluminio AA6xxx / Fedrizzi, L.; Andreatta, F.; Porro, S.; Lanzutti, A.. - ELETTRONICO. - (2023). (Intervento presentato al convegno GNCP 2023 - Giornate Nazionali Corrosione e Protezione tenutosi a Torino nel 5-7 Luglio 2023). | 1-gen-2023 | L. FedrizziS. Porro + | GNCP 2023 Fedrizzi.pdf; GNCP 2023 Torino_programma.pdf |