The physical mechanism involved in resistive switching phenomena occurring in devices based on ZnO nanowire (NW) arrays may vary considerably, also depending on the structure of the switching layer. In particular, it is shown here that the formation of a ZnO base layer between the metallic catalyst substrate and the NW, which is typical of CVD-grown ZnO NW arrays, should not be neglected when explaining the switching physical mechanism. The structural and electrical properties of this layer are investigated after the mechanical removal of NWs. Electrical measurements were performed in the presence of NWs and, after their removal, showed that the base alone exhibits resistive switching properties. The proposed switching mechanism is based on the creation/rupture of an oxygen vacancies conductive path along grain boundaries of the polycrystalline base. The creation of the filament is facilitated by the high concentration of vacancies at the grain boundaries that are oriented perpendicularly to the electrodes, as a direct consequence of the ZnO growth along the c-axis of the wurtzite lattice.
|Titolo:||Unravelling Resistive Switching Mechanism in ZnO NW Arrays: The Role of the Polycrystalline Base Layer|
|Data di pubblicazione:||2018|
|Digital Object Identifier (DOI):||10.1021/acs.jpcc.7b09978|
|Appare nelle tipologie:||1.1 Articolo in rivista|