Archivio Istituzionale della RicercaORTOLANO, Massimo
ORTOLANO, Massimo
Dipartimento di Elettronica e Telecomunicazioni
003904
An international trilateral comparison among the newest generations of digital and Josephson impedance bridges
2025 Ortolano, Massimo; Marzano, Martina; Overney, Frédéric; Eichenberger, Ali L.; Kucera, Jan; D'Elia, Vincenzo; Bartova, Lucie; Medved, Juan; Callegaro, Luca
Magnitude and phase calibration of lock-in amplifiers, and analysis of the noise response
2025 Cultrera, Alessandro; Medved, Juan; Durandetto, Paolo; Ortolano, Massimo; Sosso, Andrea; Callegaro, Luca
Virtual Training Laboratory for Primary Impedance Metrology
2023 Kaczmarek, Janusz; Ortolano, Massimo; Power, Oliver; Kucera, Jan; Callegaro, Luca; D'Elia, Vincenzo; Marzano, Martina; Walsh, Robert; Koziol, Miroslaw; Rybski, Ryszard
Metrological characterization of consumer-grade equipment for wearable brain-computer interfaces and extended reality
2022 Arpaia, P; Callegaro, L; Cultrera, A; Esposito, A; Ortolano, M
Primary Realization of Inductance and Capacitance Scales With a Fully Digital Bridge
2022 Marzano, Martina; D'Elia, Vincenzo; Ortolano, Massimo; Callegaro, Luca
PTB-INRIM comparison of novel digital impedance bridges with graphene impedance quantum standards
2022 Marzano, Martina; Pimsut, Yaowaret; Kruskopf, Mattias; Yin, Yefei; Kraus, Marco; D'Elia, Vincenzo; Callegaro, Luca; Ortolano, Massimo; Bauer, Stephan; Behr, Ralf
A comprehensive analysis of error sources in electronic fully-digital impedance bridges
2021 Ortolano, Massimo; Marzano, Martina; D'Elia, Vincenzo; Tran, Ngoc Thanh Mai; Rybski, Ryszard; Kaczmarek, Janusz; Koziol, Miroslaw; Musiol, Krzysztof; Christensen, Andreas Elmholdt; Callegaro, Luca; Kucera, Jan; Power, Oliver
A fully digital bridge towards the realization of the farad from the quantum Hall effect
2021 Marzano, Martina; Ortolano, Massimo; D'Elia, Vincenzo; Mueller, Andre; Callegaro, Luca
A new calibration setup for lock-in amplifiers in the low frequency range and its validation in a bilateral comparison
2021 Cultrera, Alessandro; Corminboeuf, David; D'Elia, Vincenzo; Thanh Mai Tran, Ngoc; Callegaro, Luca; Ortolano, Massimo
Design and development of a coaxial cryogenic probe for precision measurements of the quantum hall effect in the ac regime
2021 Marzano, M.; Tran, N. T. M.; D'Elia, V.; Serazio, D.; Enrico, E.; Ortolano, M.; Pierz, K.; Kucera, J.; Callegaro, L.
Smart gasses for visually evoked potential applications: characterisation of the optical output for different display technologies
2021 Cultrera, Alessandro; Arpaia, Pasquale; Callegaro, Luca; Esposito, Antonio; Ortolano, Massimo
A Capacitance Build-Up Method to Determine LCR Meter Errors and Capacitance Transfer
2020 Tran, Ngoc Thanh Mai; D'Elia, Vincenzo; Callegaro, Luca; Ortolano, Massimo
Implementation of a graphene quantum Hall Kelvin bridge-on-a-chip for resistance calibrations
2020 Marzano, Martina; Kruskopf, Mattias; Panna, Alireza; Rigosi, Albert; Patel, Dinesh; Jin, Hanbyul; Cular, Stefan; Callegaro, Luca; Elmquist, R E; Ortolano, Massimo
A correlation noise spectrometer for flicker noise measurement in graphene samples
2019 Marzano, Martina; Cultrera, Alessandro; Ortolano, Massimo; Callegaro, Luca
Atypical quantized resistances in millimeter-scale epitaxial graphene p-n junctions
2019 Rigosi, Albert F.; Patel, Dinesh; Marzano, Martina; Kruskopf, Mattias; Hill, Heather M.; Jin, Hanbyul; Hu, Jiuning; Hight Walker, Angela R.; Ortolano, Massimo; Callegaro, Luca; Liang, Chi-Te; Newell, David B.
Mapping the conductivity of graphene with Electrical Resistance Tomography
2019 Cultrera, A.; Serazio, D.; Zurutuza, A.; Centeno, A.; Txoperena, O.; Etayo, D.; Cordon, A.; Redo-Sanchez, A.; Arnedo, I.; Ortolano, M.; Callegaro, L.
Update: On the synthesis of quantum Hall array resistance standards (2015 Metrologia 52 31)
2019 Ortolano, Massimo; Callegaro, Luca
An international comparison of phase angle standards between the novel impedance bridges of CMI, INRIM and METAS
2018 Ortolano, Massimo; Palafox, Luis; Kučera, Jan; Callegaro, Luca; D’Elia, Vincenzo; Marzano, Martina; Overney, Frédéric; Gülmez, Gülay
Error modelling of quantum Hall array resistance standards
2018 Marzano, Martina; Oe, Takehiko; Ortolano, Massimo; Callegaro, Luca; Kaneko, Nobu-Hisa
Role of plasma-induced defects in the generation of 1/f noise in graphene
2018 Cultrera, Alessandro; Callegaro, Luca; Marzano, Martina; Ortolano, Massimo; Amato, Giampiero
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| An international trilateral comparison among the newest generations of digital and Josephson impedance bridges / Ortolano, Massimo; Marzano, Martina; Overney, Frédéric; Eichenberger, Ali L.; Kucera, Jan; D'Elia, Vincenzo; Bartova, Lucie; Medved, Juan; Callegaro, Luca. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - ELETTRONICO. - 74:(2025), pp. 1-9. [10.1109/tim.2025.3541803] | 1-gen-2025 | Ortolano, MassimoMedved, Juan + | Ortolano2025_IEEETransInstrumMeas_74_1501009.pdf |
| Magnitude and phase calibration of lock-in amplifiers, and analysis of the noise response / Cultrera, Alessandro; Medved, Juan; Durandetto, Paolo; Ortolano, Massimo; Sosso, Andrea; Callegaro, Luca. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 74:(2025), pp. 1-15. [10.1109/tim.2025.3553954] | 1-gen-2025 | Medved, JuanOrtolano, Massimo + | Cultrera2025_IEEETransInstrumMeas_74_1008515.pdf |
| Virtual Training Laboratory for Primary Impedance Metrology / Kaczmarek, Janusz; Ortolano, Massimo; Power, Oliver; Kucera, Jan; Callegaro, Luca; D'Elia, Vincenzo; Marzano, Martina; Walsh, Robert; Koziol, Miroslaw; Rybski, Ryszard. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 72:(2023), p. 1001312. [10.1109/TIM.2022.3223140] | 1-gen-2023 | Massimo Ortolano + | Kaczmarek2023_IEEETransInstrumMeas_72_1001312.pdf |
| Metrological characterization of consumer-grade equipment for wearable brain-computer interfaces and extended reality / Arpaia, P; Callegaro, L; Cultrera, A; Esposito, A; Ortolano, M. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 71:(2022), p. 4002209. [10.1109/TIM.2021.3127650] | 1-gen-2022 | Esposito, AOrtolano, M + | 2021_Arpaia_Metrological_characterization_of_consumer-grade_equipment_for_wearable_brain-computer_interfaces_and_extended_reality_early_access.pdf; Ortolano-Metrological.pdf |
| Primary Realization of Inductance and Capacitance Scales With a Fully Digital Bridge / Marzano, Martina; D'Elia, Vincenzo; Ortolano, Massimo; Callegaro, Luca. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 71:(2022), p. 1503008. [10.1109/TIM.2022.3214498] | 1-gen-2022 | Massimo Ortolano + | Marzano2022_IEEETransInstrumMeas_71_1503008.pdf |
| PTB-INRIM comparison of novel digital impedance bridges with graphene impedance quantum standards / Marzano, Martina; Pimsut, Yaowaret; Kruskopf, Mattias; Yin, Yefei; Kraus, Marco; D'Elia, Vincenzo; Callegaro, Luca; Ortolano, Massimo; Bauer, Stephan; Behr, Ralf. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 59:6(2022), p. 065001. [10.1088/1681-7575/ac9187] | 1-gen-2022 | Massimo Ortolano + | Marzano2022_Metrologia_59_065001.pdf |
| A comprehensive analysis of error sources in electronic fully-digital impedance bridges / Ortolano, Massimo; Marzano, Martina; D'Elia, Vincenzo; Tran, Ngoc Thanh Mai; Rybski, Ryszard; Kaczmarek, Janusz; Koziol, Miroslaw; Musiol, Krzysztof; Christensen, Andreas Elmholdt; Callegaro, Luca; Kucera, Jan; Power, Oliver. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - ELETTRONICO. - 70:(2021), pp. 1-14. [10.1109/TIM.2020.3034115] | 1-gen-2021 | Ortolano, MassimoTran, Ngoc Thanh Mai + | Ortolano-Acomprehensive.pdf |
| A fully digital bridge towards the realization of the farad from the quantum Hall effect / Marzano, Martina; Ortolano, Massimo; D'Elia, Vincenzo; Mueller, Andre; Callegaro, Luca. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 58:1(2021). [10.1088/1681-7575/abba86] | 1-gen-2021 | Massimo Ortolano + | MET-101749_R1.pdf; Ortolano-Afully.pdf |
| A new calibration setup for lock-in amplifiers in the low frequency range and its validation in a bilateral comparison / Cultrera, Alessandro; Corminboeuf, David; D'Elia, Vincenzo; Thanh Mai Tran, Ngoc; Callegaro, Luca; Ortolano, Massimo. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 58:(2021), p. 025001. [10.1088/1681-7575/abdae0] | 1-gen-2021 | Massimo Ortolano + | 20201117_LockinComparison_Metrologia.pdf; Ortolano-Anewcalibration.pdf |
| Design and development of a coaxial cryogenic probe for precision measurements of the quantum hall effect in the ac regime / Marzano, M.; Tran, N. T. M.; D'Elia, V.; Serazio, D.; Enrico, E.; Ortolano, M.; Pierz, K.; Kucera, J.; Callegaro, L.. - In: ACTA IMEKO. - ISSN 0237-028X. - ELETTRONICO. - 10:2(2021), pp. 24-29. [10.21014/acta_imeko.v10i2.925] | 1-gen-2021 | Tran N. T. M.Ortolano M. + | Marzano2021_ACTAIMEKO_10_24.pdf |
| Smart gasses for visually evoked potential applications: characterisation of the optical output for different display technologies / Cultrera, Alessandro; Arpaia, Pasquale; Callegaro, Luca; Esposito, Antonio; Ortolano, Massimo. - In: ENGINEERING PROCEEDINGS. - ISSN 2673-4591. - ELETTRONICO. - 10:1(2021), p. 33. [10.3390/ecsa-8-11263] | 1-gen-2021 | Antonio EspositoMassimo Ortolano + | Cultrera2021_EngProc_10_33.pdf |
| A Capacitance Build-Up Method to Determine LCR Meter Errors and Capacitance Transfer / Tran, Ngoc Thanh Mai; D'Elia, Vincenzo; Callegaro, Luca; Ortolano, Massimo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 69:8(2020), pp. 5727-5735. [10.1109/TIM.2019.2960620] | 1-gen-2020 | Tran, Ngoc Thanh MaiOrtolano, Massimo + | Tran2019_TIM_final.pdf; Ortolano-Acapacitance.pdf |
| Implementation of a graphene quantum Hall Kelvin bridge-on-a-chip for resistance calibrations / Marzano, Martina; Kruskopf, Mattias; Panna, Alireza; Rigosi, Albert; Patel, Dinesh; Jin, Hanbyul; Cular, Stefan; Callegaro, Luca; Elmquist, R E; Ortolano, Massimo. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 57:(2020), p. 015007. [10.1088/1681-7575/ab581e] | 1-gen-2020 | Marzano, MartinaCallegaro, LucaOrtolano, Massimo + | Marzano2019_Metrologia_postprint.pdf; Marzano_2020_Metrologia_57_015007.pdf |
| A correlation noise spectrometer for flicker noise measurement in graphene samples / Marzano, Martina; Cultrera, Alessandro; Ortolano, Massimo; Callegaro, Luca. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - STAMPA. - 30:3(2019), p. 035102. [10.1088/1361-6501/aafcab] | 1-gen-2019 | Marzano, MartinaOrtolano, Massimo + | Marzano2018_MST_postprint.pdf |
| Atypical quantized resistances in millimeter-scale epitaxial graphene p-n junctions / Rigosi, Albert F.; Patel, Dinesh; Marzano, Martina; Kruskopf, Mattias; Hill, Heather M.; Jin, Hanbyul; Hu, Jiuning; Hight Walker, Angela R.; Ortolano, Massimo; Callegaro, Luca; Liang, Chi-Te; Newell, David B.. - In: CARBON. - ISSN 0008-6223. - ELETTRONICO. - 154:(2019), pp. 230-237. [10.1016/j.carbon.2019.08.002] | 1-gen-2019 | Marzano, MartinaOrtolano, MassimoCALLEGARO, LUCA + | Rigosi2019_Carbon_preprint.pdf |
| Mapping the conductivity of graphene with Electrical Resistance Tomography / Cultrera, A.; Serazio, D.; Zurutuza, A.; Centeno, A.; Txoperena, O.; Etayo, D.; Cordon, A.; Redo-Sanchez, A.; Arnedo, I.; Ortolano, M.; Callegaro, L.. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - ELETTRONICO. - 9:1(2019), p. 10655. [10.1038/s41598-019-46713-8] | 1-gen-2019 | Ortolano M.Callegaro L. + | Cultrera2019_SciRep_9_10655.pdf |
| Update: On the synthesis of quantum Hall array resistance standards (2015 Metrologia 52 31) / Ortolano, Massimo; Callegaro, Luca. - In: METROLOGIA. - ISSN 0026-1394. - 56:2(2019), p. 022101. [10.1088/1681-7575/ab065f] | 1-gen-2019 | Ortolano, Massimo + | Ortolano2019_Metrologia_56_022101_postprint.pdf |
| An international comparison of phase angle standards between the novel impedance bridges of CMI, INRIM and METAS / Ortolano, Massimo; Palafox, Luis; Kučera, Jan; Callegaro, Luca; D’Elia, Vincenzo; Marzano, Martina; Overney, Frédéric; Gülmez, Gülay. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 55:4(2018), pp. 499-512. [10.1088/1681-7575/aabf24] | 1-gen-2018 | Ortolano, MassimoMarzano, Martina + | Ortolano2018_Metrologia_55_499_preprint.pdf; Ortolano.Aninternational.pdf |
| Error modelling of quantum Hall array resistance standards / Marzano, Martina; Oe, Takehiko; Ortolano, Massimo; Callegaro, Luca; Kaneko, Nobu-Hisa. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 55:2(2018), pp. 167-174. [10.1088/1681-7575/aaa5c1] | 1-gen-2018 | Marzano, MartinaOrtolano, Massimo + | - |
| Role of plasma-induced defects in the generation of 1/f noise in graphene / Cultrera, Alessandro; Callegaro, Luca; Marzano, Martina; Ortolano, Massimo; Amato, Giampiero. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 112:9(2018). [10.1063/1.5024218] | 1-gen-2018 | Marzano, MartinaOrtolano, MassimoAmato, Giampiero + | 20180212_GrapheneNoisePlasma.pdf |