ORTOLANO, Massimo

ORTOLANO, Massimo  

Dipartimento di Elettronica e Telecomunicazioni  

003904  

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Risultati 1 - 20 di 46 (tempo di esecuzione: 0.039 secondi).
Citazione Data di pubblicazione Autori File
A study on the thermal hysteresis of travelling inductance standards / Callegaro, Luca; D'Elia, Vincenzo; Marzano, Martina; Ortolano, Massimo; Florian Beug, M.; Bothe, Harald. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - ELETTRONICO. - 74:(2025), pp. 1-6. [10.1109/tim.2025.3550623] 1-gen-2025 Ortolano, Massimo + Callegaro2025_IEEETransInstrumMeas_74_1503306.pdf
An international trilateral comparison among the newest generations of digital and Josephson impedance bridges / Ortolano, Massimo; Marzano, Martina; Overney, Frédéric; Eichenberger, Ali L.; Kucera, Jan; D'Elia, Vincenzo; Bartova, Lucie; Medved, Juan; Callegaro, Luca. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - ELETTRONICO. - 74:(2025), pp. 1-9. [10.1109/tim.2025.3541803] 1-gen-2025 Ortolano, MassimoMedved, Juan + Ortolano2025_IEEETransInstrumMeas_74_1501009.pdf
Conductivity space isotherm behavior in quantum anomalous Hall devices / Tran, N. T. M.; Ortiz Jimenez, V.; Musso, M.; Rodenbach, L. K.; Andersen, M. P.; Hill, H. M.; Zhang, P.; Tai, L.; Wang, K. L.; Marzano, M.; Ortolano, M.; Newell, D. B.; Richter, C. A.; Rigosi, A. F.. - In: AIP ADVANCES. - ISSN 2158-3226. - 15:7(2025). [10.1063/5.0278373] 1-gen-2025 Musso, M.Ortolano, M. + Tran2025_AIPAdvances_075023.pdf
Graphene-based quantum Hall array pseudofractal designs via Minkowski–Bouligand algorithms / Scaletta, Dominick S.; Tran, Ngoc Thanh Mai; Musso, Marta; Jarrett, Dean G.; Hill, Heather M.; Ortolano, Massimo; Newell, David B.; Rigosi, Albert F.. - In: AIP ADVANCES. - ISSN 2158-3226. - 15:10(2025), pp. 1-8. [10.1063/5.0296053] 1-gen-2025 Musso, MartaOrtolano, Massimo + 105119_1_5.0296053.pdfADV25-AR-03863.pdf
Graphene-based quantum Hall arrays in cross–square recursion configurations / Tran, N. T. M.; Musso, M.; Scaletta, D. S.; Lin, W. -C.; Ortiz Jimenez, V.; Jarrett, D. G.; Ortolano, M.; Richter, C. A.; Liang, C. -T.; Newell, D. B.; Rigosi, A. F.. - In: AIP ADVANCES. - ISSN 2158-3226. - ELETTRONICO. - 15:8(2025), pp. 1-8. [10.1063/5.0290385] 1-gen-2025 Musso, M.Ortolano, M. + Tran2025_AIPAdvances 15_085225.pdf
Implementation of a 1 GΩ Star-Mesh Graphene Quantized Hall Array Resistance Standard Network for High Resistance Calibration / Musso, Marta; Lin, Wei-Chen; Yang, Yanfei; Tran, Ngoc Thanh Mai; Panna, Alireza R.; Yang, Cheng-Hsueh; Elmquist, Randolph E.; Newell, David B.; Liang, Chi-Te; Ortolano, Massimo; Rigosi, Albert F.; Jarrett, Dean G.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - ELETTRONICO. - 74:(2025), pp. 1-12. [10.1109/tim.2025.3581627] 1-gen-2025 Musso, MartaOrtolano, Massimo + Musso2025_IEEETransInstrumMeas_74_1506512.pdf
Magnitude and phase calibration of lock-in amplifiers, and analysis of the noise response / Cultrera, Alessandro; Medved, Juan; Durandetto, Paolo; Ortolano, Massimo; Sosso, Andrea; Callegaro, Luca. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 74:(2025), pp. 1-15. [10.1109/tim.2025.3553954] 1-gen-2025 Medved, JuanOrtolano, Massimo + Cultrera2025_IEEETransInstrumMeas_74_1008515.pdf
Virtual Training Laboratory for Primary Impedance Metrology / Kaczmarek, Janusz; Ortolano, Massimo; Power, Oliver; Kucera, Jan; Callegaro, Luca; D'Elia, Vincenzo; Marzano, Martina; Walsh, Robert; Koziol, Miroslaw; Rybski, Ryszard. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 72:(2023), p. 1001312. [10.1109/TIM.2022.3223140] 1-gen-2023 Massimo Ortolano + Kaczmarek2023_IEEETransInstrumMeas_72_1001312.pdf
Metrological characterization of consumer-grade equipment for wearable brain-computer interfaces and extended reality / Arpaia, P; Callegaro, L; Cultrera, A; Esposito, A; Ortolano, M. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 71:(2022), p. 4002209. [10.1109/TIM.2021.3127650] 1-gen-2022 Esposito, AOrtolano, M + 2021_Arpaia_Metrological_characterization_of_consumer-grade_equipment_for_wearable_brain-computer_interfaces_and_extended_reality_early_access.pdfOrtolano-Metrological.pdf
Primary Realization of Inductance and Capacitance Scales With a Fully Digital Bridge / Marzano, Martina; D'Elia, Vincenzo; Ortolano, Massimo; Callegaro, Luca. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 71:(2022), p. 1503008. [10.1109/TIM.2022.3214498] 1-gen-2022 Massimo Ortolano + Marzano2022_IEEETransInstrumMeas_71_1503008.pdf
PTB-INRIM comparison of novel digital impedance bridges with graphene impedance quantum standards / Marzano, Martina; Pimsut, Yaowaret; Kruskopf, Mattias; Yin, Yefei; Kraus, Marco; D'Elia, Vincenzo; Callegaro, Luca; Ortolano, Massimo; Bauer, Stephan; Behr, Ralf. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 59:6(2022), p. 065001. [10.1088/1681-7575/ac9187] 1-gen-2022 Massimo Ortolano + Marzano2022_Metrologia_59_065001.pdf
A comprehensive analysis of error sources in electronic fully-digital impedance bridges / Ortolano, Massimo; Marzano, Martina; D'Elia, Vincenzo; Tran, Ngoc Thanh Mai; Rybski, Ryszard; Kaczmarek, Janusz; Koziol, Miroslaw; Musiol, Krzysztof; Christensen, Andreas Elmholdt; Callegaro, Luca; Kucera, Jan; Power, Oliver. - ELETTRONICO. - 70:(2021), pp. 1-14. [10.1109/TIM.2020.3034115] 1-gen-2021 Ortolano, MassimoTran, Ngoc Thanh Mai + Ortolano-Acomprehensive.pdf
A fully digital bridge towards the realization of the farad from the quantum Hall effect / Marzano, Martina; Ortolano, Massimo; D'Elia, Vincenzo; Mueller, Andre; Callegaro, Luca. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 58:1(2021). [10.1088/1681-7575/abba86] 1-gen-2021 Massimo Ortolano + MET-101749_R1.pdfOrtolano-Afully.pdf
A new calibration setup for lock-in amplifiers in the low frequency range and its validation in a bilateral comparison / Cultrera, Alessandro; Corminboeuf, David; D'Elia, Vincenzo; Thanh Mai Tran, Ngoc; Callegaro, Luca; Ortolano, Massimo. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 58:(2021), p. 025001. [10.1088/1681-7575/abdae0] 1-gen-2021 Massimo Ortolano + 20201117_LockinComparison_Metrologia.pdfOrtolano-Anewcalibration.pdf
Design and development of a coaxial cryogenic probe for precision measurements of the quantum hall effect in the ac regime / Marzano, M.; Tran, N. T. M.; D'Elia, V.; Serazio, D.; Enrico, E.; Ortolano, M.; Pierz, K.; Kucera, J.; Callegaro, L.. - In: ACTA IMEKO. - ISSN 0237-028X. - ELETTRONICO. - 10:2(2021), pp. 24-29. [10.21014/acta_imeko.v10i2.925] 1-gen-2021 Tran N. T. M.Ortolano M. + Marzano2021_ACTAIMEKO_10_24.pdf
Smart gasses for visually evoked potential applications: characterisation of the optical output for different display technologies / Cultrera, Alessandro; Arpaia, Pasquale; Callegaro, Luca; Esposito, Antonio; Ortolano, Massimo. - In: ENGINEERING PROCEEDINGS. - ISSN 2673-4591. - ELETTRONICO. - 10:1(2021), p. 33. [10.3390/ecsa-8-11263] 1-gen-2021 Antonio EspositoMassimo Ortolano + Cultrera2021_EngProc_10_33.pdf
A Capacitance Build-Up Method to Determine LCR Meter Errors and Capacitance Transfer / Tran, Ngoc Thanh Mai; D'Elia, Vincenzo; Callegaro, Luca; Ortolano, Massimo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 69:8(2020), pp. 5727-5735. [10.1109/TIM.2019.2960620] 1-gen-2020 Tran, Ngoc Thanh MaiOrtolano, Massimo + Tran2019_TIM_final.pdfOrtolano-Acapacitance.pdf
Implementation of a graphene quantum Hall Kelvin bridge-on-a-chip for resistance calibrations / Marzano, Martina; Kruskopf, Mattias; Panna, Alireza; Rigosi, Albert; Patel, Dinesh; Jin, Hanbyul; Cular, Stefan; Callegaro, Luca; Elmquist, R E; Ortolano, Massimo. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 57:(2020), p. 015007. [10.1088/1681-7575/ab581e] 1-gen-2020 Marzano, MartinaCallegaro, LucaOrtolano, Massimo + Marzano2019_Metrologia_postprint.pdfMarzano_2020_Metrologia_57_015007.pdf
A correlation noise spectrometer for flicker noise measurement in graphene samples / Marzano, Martina; Cultrera, Alessandro; Ortolano, Massimo; Callegaro, Luca. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - STAMPA. - 30:3(2019), p. 035102. [10.1088/1361-6501/aafcab] 1-gen-2019 Marzano, MartinaOrtolano, Massimo + Marzano2018_MST_postprint.pdf
Atypical quantized resistances in millimeter-scale epitaxial graphene p-n junctions / Rigosi, Albert F.; Patel, Dinesh; Marzano, Martina; Kruskopf, Mattias; Hill, Heather M.; Jin, Hanbyul; Hu, Jiuning; Hight Walker, Angela R.; Ortolano, Massimo; Callegaro, Luca; Liang, Chi-Te; Newell, David B.. - In: CARBON. - ISSN 0008-6223. - ELETTRONICO. - 154:(2019), pp. 230-237. [10.1016/j.carbon.2019.08.002] 1-gen-2019 Marzano, MartinaOrtolano, MassimoCALLEGARO, LUCA + Rigosi2019_Carbon_preprint.pdf