ORTOLANO, Massimo

ORTOLANO, Massimo  

Dipartimento di Elettronica e Telecomunicazioni  

003904  

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Risultati 1 - 20 di 34 (tempo di esecuzione: 0.035 secondi).
Citazione Data di pubblicazione Autori File
A dynamic analysis of the LO noise transfer mechanism in Rb-Cell frequency standards / Ortolano, Massimo; Nicolo', Beverini; ANDREA DE, Marchi. - In: IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL. - ISSN 0885-3010. - 47:(2000), pp. 471-474. 1-gen-2000 ORTOLANO, Massimo + -
A Three-Arm Current Comparator Bridge for Impedance Comparisons Over the Complex Plane / Luca, Callegaro; Vincenzo, D'Elia; Ortolano, Massimo; Pourdanesh, Faranak. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - (2015), pp. 1466-1471. [10.1109/TIM.2015.2398953] 1-gen-2015 ORTOLANO, MassimoPOURDANESH, FARANAK + callegaro2015_IEEETranInstrumMeas_64_1466.pdf
Atypical quantized resistances in millimeter-scale epitaxial graphene p-n junctions / Rigosi, Albert F.; Patel, Dinesh; Marzano, Martina; Kruskopf, Mattias; Hill, Heather M.; Jin, Hanbyul; Hu, Jiuning; Hight Walker, Angela R.; Ortolano, Massimo; Callegaro, Luca; Liang, Chi-Te; Newell, David B.. - In: CARBON. - ISSN 0008-6223. - ELETTRONICO. - 154:(2019), pp. 230-237. [10.1016/j.carbon.2019.08.002] 1-gen-2019 Marzano, MartinaOrtolano, MassimoCALLEGARO, LUCA + Rigosi2019_Carbon_preprint.pdfRigosi2019_Carbon_154_230.pdf
A Capacitance Build-Up Method to Determine LCR Meter Errors and Capacitance Transfer / Tran, Ngoc Thanh Mai; D'Elia, Vincenzo; Callegaro, Luca; Ortolano, Massimo. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 69:8(2020), pp. 5727-5735. [10.1109/TIM.2019.2960620] 1-gen-2020 Tran, Ngoc Thanh MaiOrtolano, Massimo + Tran2019_TIM_final.pdfOrtolano-Acapacitance.pdf
Circuit models and SPICE macro-models for quantum Hall effect devices / Ortolano, Massimo; Callegaro, Luca. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - STAMPA. - 26:8(2015), p. 085018. [10.1088/0957-0233/26/8/085018] 1-gen-2015 ORTOLANO, Massimo + Ortolano2015_MeasSciTechnol_26_085018.pdf
A comprehensive analysis of error sources in electronic fully-digital impedance bridges / Ortolano, Massimo; Marzano, Martina; D'Elia, Vincenzo; Tran, Ngoc Thanh Mai; Rybski, Ryszard; Kaczmarek, Janusz; Koziol, Miroslaw; Musiol, Krzysztof; Christensen, Andreas Elmholdt; Callegaro, Luca; Kucera, Jan; Power, Oliver. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - ELETTRONICO. - 70:(2021), pp. 1-14. [10.1109/TIM.2020.3034115] 1-gen-2021 Ortolano, MassimoTran, Ngoc Thanh Mai + Ortolano-Acomprehensive.pdf
A correlation noise spectrometer for flicker noise measurement in graphene samples / Marzano, Martina; Cultrera, Alessandro; Ortolano, Massimo; Callegaro, Luca. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - STAMPA. - 30:3(2019), p. 035102. [10.1088/1361-6501/aafcab] 1-gen-2019 Marzano, MartinaOrtolano, Massimo + Marzano2018_MST_postprint.pdf
Cs cell atomic clock optically pumped by a diode laser / Nicolo', Beverini; Ortolano, Massimo; Costanzo, Giovanni Antonio; DE MARCHI, Andrea; Enrico, Maccioni; P., Marsili; A., Ruffini; Felice, Periale; V., Barychev. - In: LASER PHYSICS. - ISSN 1054-660X. - 11:(2001), pp. 1110-1116. 1-gen-2001 ORTOLANO, MassimoCOSTANZO, Giovanni AntonioDE MARCHI, ANDREA + -
Design and development of a coaxial cryogenic probe for precision measurements of the quantum hall effect in the ac regime / Marzano, M.; Tran, N. T. M.; D'Elia, V.; Serazio, D.; Enrico, E.; Ortolano, M.; Pierz, K.; Kucera, J.; Callegaro, L.. - In: ACTA IMEKO. - ISSN 0237-028X. - ELETTRONICO. - 10:2(2021), pp. 24-29. [10.21014/acta_imeko.v10i2.925] 1-gen-2021 Tran N. T. M.Ortolano M. + Marzano2021_ACTAIMEKO_10_24.pdf
Development of an in-line calibration system for flow-through cells for low electrolytic conductivity values / Elena, Orrù; Francesca, Durbiano; Ortolano, Massimo. - In: ACCREDITATION AND QUALITY ASSURANCE. - ISSN 0949-1775. - 19:(2014), pp. 11-16. [10.1007/s00769-013-1023-6] 1-gen-2014 ORTOLANO, Massimo + Orru2014_AccredQualAssur_19_11.pdf
A dynamic analysis of the LO noise transfer mechanism in a Rb-cell frequency standard / Ortolano, M.; Beverini, N.; De Marchi, A.. - In: IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL. - ISSN 0885-3010. - STAMPA. - 47:2(2000), pp. 471-474. [10.1109/58.827438] 1-gen-2000 Ortolano M.De Marchi A. + Ortolano2000_IEEETransUltrasonFerroelectFreqContr_47_471.pdf
Equilibrium noise correlations in quantum Hall effect devices as a test of a formula by Büttiker / Callegaro, Luca; Ortolano, Massimo; J., Schurr. - In: EUROPHYSICS LETTERS. - ISSN 0295-5075. - STAMPA. - 101:(2013), pp. 50003-p1-50003-p3. [10.1209/0295-5075/101/50003] 1-gen-2013 ORTOLANO, Massimo + epl15282-offprints.pdf
Error modelling of quantum Hall array resistance standards / Marzano, Martina; Oe, Takehiko; Ortolano, Massimo; Callegaro, Luca; Kaneko, Nobu-Hisa. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 55:2(2018), pp. 167-174. [10.1088/1681-7575/aaa5c1] 1-gen-2018 Marzano, MartinaOrtolano, Massimo + -
Experiences With a Two-Terminal-Pair Digital Impedance Bridge / Luca, Callegaro; Vincenzo, D'Elia; Marian, Kampik; Dan Bee, Kim; Ortolano, Massimo; Pourdanesh, Faranak. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - 64:6(2015), pp. 1460-1465. [10.1109/TIM.2015.2401192] 1-gen-2015 ORTOLANO, MassimoPOURDANESH, FARANAK + callegaro2015_IEEETranInstrumMeas_64_1460.pdfOrtolano-Experiences_AAM.pdf
A fully digital bridge towards the realization of the farad from the quantum Hall effect / Marzano, Martina; Ortolano, Massimo; D'Elia, Vincenzo; Mueller, Andre; Callegaro, Luca. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 58:1(2020). [10.1088/1681-7575/abba86] 1-gen-2020 Massimo Ortolano + MET-101749_R1.pdfOrtolano-Afully.pdf
Implementation of a graphene quantum Hall Kelvin bridge-on-a-chip for resistance calibrations / Marzano, Martina; Kruskopf, Mattias; Panna, Alireza; Rigosi, Albert; Patel, Dinesh; Jin, Hanbyul; Cular, Stefan; Callegaro, Luca; Elmquist, R E; Ortolano, Massimo. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 57:(2020), p. 015007. [10.1088/1681-7575/ab581e] 1-gen-2020 Marzano, MartinaCallegaro, LucaOrtolano, Massimo + Marzano2019_Metrologia_postprint.pdfMarzano_2020_Metrologia_57_015007.pdf
An international comparison of phase angle standards between the novel impedance bridges of CMI, INRIM and METAS / Ortolano, Massimo; Palafox, Luis; Kučera, Jan; Callegaro, Luca; D’Elia, Vincenzo; Marzano, Martina; Overney, Frédéric; Gülmez, Gülay. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 55:4(2018), pp. 499-512. [10.1088/1681-7575/aabf24] 1-gen-2018 Ortolano, MassimoMarzano, Martina + Ortolano2018_Metrologia_55_499_preprint.pdfOrtolano.Aninternational.pdf
Low-noise and wide-bandwidth current readout at low temperatures using a superconducting-quantum-interference-device amplifier / Tran, Ngoc Thanh Mai; Okazaki, Yuma; Nakamura, Shuji; Ortolano, Massimo; Kaneko, Nobu Hisa. - In: JAPANESE JOURNAL OF APPLIED PHYSICS. PART 1, REGULAR PAPERS & SHORT NOTES. - ISSN 0021-4922. - STAMPA. - 56:4(2017), p. 04CK10. [10.7567/JJAP.56.04CK10] 1-gen-2017 ORTOLANO, Massimo + -
Mapping the conductivity of graphene with Electrical Resistance Tomography / Cultrera, A.; Serazio, D.; Zurutuza, A.; Centeno, A.; Txoperena, O.; Etayo, D.; Cordon, A.; Redo-Sanchez, A.; Arnedo, I.; Ortolano, M.; Callegaro, L.. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - ELETTRONICO. - 9:1(2019), p. 10655. [10.1038/s41598-019-46713-8] 1-gen-2019 Ortolano M.Callegaro L. + Cultrera2019_SciRep_9_10655.pdf
Matrix method analysis of quantum Hall effect device connections / Ortolano, Massimo; Callegaro, Luca. - In: METROLOGIA. - ISSN 0026-1394. - 49:1(2012), pp. 1-7. [10.1088/0026-1394/49/1/001] 1-gen-2012 ORTOLANO, Massimo + 0026-1394_49_1_001.pdf