Archivio Istituzionale della RicercaCALLEGARO, LUCA
Tomography of memory engrams in self-organizing nanowire connectomes
2023 Milano, Gianluca; Cultrera, Alessandro; Boarino, Luca; Callegaro, Luca; Ricciardi, Carlo
Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation
2021 Cultrera, A.; Milano, G.; De Leo, N.; Ricciardi, C.; Boarino, L.; Callegaro, L.
Implementation of a graphene quantum Hall Kelvin bridge-on-a-chip for resistance calibrations
2020 Marzano, Martina; Kruskopf, Mattias; Panna, Alireza; Rigosi, Albert; Patel, Dinesh; Jin, Hanbyul; Cular, Stefan; Callegaro, Luca; Elmquist, R E; Ortolano, Massimo
Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials
2020 Milano, G.; Cultrera, A.; Bejtka, K.; De Leo, N.; Callegaro, L.; Ricciardi, C.; Boarino, L.
Atypical quantized resistances in millimeter-scale epitaxial graphene p-n junctions
2019 Rigosi, Albert F.; Patel, Dinesh; Marzano, Martina; Kruskopf, Mattias; Hill, Heather M.; Jin, Hanbyul; Hu, Jiuning; Hight Walker, Angela R.; Ortolano, Massimo; Callegaro, Luca; Liang, Chi-Te; Newell, David B.
Calibration of lock-in amplifiers in the low-frequency range
2019 Cultrera, Alessandro; Tran, NGOC THANH MAI; D’Elia, Vincenzo; Ortolano, Massimo; Callegaro, Luca
Mapping the conductivity of graphene with Electrical Resistance Tomography
2019 Cultrera, A.; Serazio, D.; Zurutuza, A.; Centeno, A.; Txoperena, O.; Etayo, D.; Cordon, A.; Redo-Sanchez, A.; Arnedo, I.; Ortolano, M.; Callegaro, L.
Practical Precision Electrical Impedance Measurement for the 21st Century – EMPIR Project 17RPT04 VersICal
2019 Power, Oliver; Ziolek, Adam; Elmholdt Christensen, Andreas; Pokatilov, Andrei; Nestor, Anca; Gumez, Gulay; Kučera, Jan; Kaczmarek, Janusz; Jursza, Jolanta; Callegaro, Luca; Ribero, Luis Filipe; Koszarny, Maciej; Marzano, Martina; Ortolano, Massimo; Kozioł, Mirosław; Tran, Ngoc Thanh Mai; Rybski, Ryszard; D’Elia, Vincenzo; Rzodkiewicz, Witold
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Tomography of memory engrams in self-organizing nanowire connectomes / Milano, Gianluca; Cultrera, Alessandro; Boarino, Luca; Callegaro, Luca; Ricciardi, Carlo. - In: NATURE COMMUNICATIONS. - ISSN 2041-1723. - 14:1(2023). [10.1038/s41467-023-40939-x] | 1-gen-2023 | Milano, GianlucaBoarino, LucaCallegaro, LucaRicciardi, Carlo + | 2023 Nat Comm engram.pdf |
| Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation / Cultrera, A.; Milano, G.; De Leo, N.; Ricciardi, C.; Boarino, L.; Callegaro, L.. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - ELETTRONICO. - 11:1(2021), p. 13167. [10.1038/s41598-021-92208-w] | 1-gen-2021 | Milano G.Ricciardi C.Boarino L.Callegaro L. + | 2021_scirep_tomo_Callegaro.pdf |
| Implementation of a graphene quantum Hall Kelvin bridge-on-a-chip for resistance calibrations / Marzano, Martina; Kruskopf, Mattias; Panna, Alireza; Rigosi, Albert; Patel, Dinesh; Jin, Hanbyul; Cular, Stefan; Callegaro, Luca; Elmquist, R E; Ortolano, Massimo. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 57:(2020), p. 015007. [10.1088/1681-7575/ab581e] | 1-gen-2020 | Marzano, MartinaCallegaro, LucaOrtolano, Massimo + | Marzano2019_Metrologia_postprint.pdf; Marzano_2020_Metrologia_57_015007.pdf |
| Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials / Milano, G.; Cultrera, A.; Bejtka, K.; De Leo, N.; Callegaro, L.; Ricciardi, C.; Boarino, L.. - In: ACS APPLIED NANO MATERIALS. - ISSN 2574-0970. - 3:12(2020), pp. 11987-11997. [10.1021/acsanm.0c02204] | 1-gen-2020 | Milano G.Bejtka K.Callegaro L.Ricciardi C.Boarino L. + | 2020_NW-tomo_acsanm.pdf; acsanm.0c02204.pdf |
| Atypical quantized resistances in millimeter-scale epitaxial graphene p-n junctions / Rigosi, Albert F.; Patel, Dinesh; Marzano, Martina; Kruskopf, Mattias; Hill, Heather M.; Jin, Hanbyul; Hu, Jiuning; Hight Walker, Angela R.; Ortolano, Massimo; Callegaro, Luca; Liang, Chi-Te; Newell, David B.. - In: CARBON. - ISSN 0008-6223. - ELETTRONICO. - 154:(2019), pp. 230-237. [10.1016/j.carbon.2019.08.002] | 1-gen-2019 | Marzano, MartinaOrtolano, MassimoCALLEGARO, LUCA + | Rigosi2019_Carbon_preprint.pdf |
| Calibration of lock-in amplifiers in the low-frequency range / Cultrera, Alessandro; Tran, NGOC THANH MAI; D’Elia, Vincenzo; Ortolano, Massimo; Callegaro, Luca. - ELETTRONICO. - (2019), pp. 122-125. (Intervento presentato al convegno 23rd IMEKO TC4 International Symposium tenutosi a Xi’an, China nel September 17-20). | 1-gen-2019 | Ngoc Thanh Mai TranMassimo OrtolanoLuca Callegaro + | - |
| Mapping the conductivity of graphene with Electrical Resistance Tomography / Cultrera, A.; Serazio, D.; Zurutuza, A.; Centeno, A.; Txoperena, O.; Etayo, D.; Cordon, A.; Redo-Sanchez, A.; Arnedo, I.; Ortolano, M.; Callegaro, L.. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - ELETTRONICO. - 9:1(2019), p. 10655. [10.1038/s41598-019-46713-8] | 1-gen-2019 | Ortolano M.Callegaro L. + | Cultrera2019_SciRep_9_10655.pdf |
| Practical Precision Electrical Impedance Measurement for the 21st Century – EMPIR Project 17RPT04 VersICal / Power, Oliver; Ziolek, Adam; Elmholdt Christensen, Andreas; Pokatilov, Andrei; Nestor, Anca; Gumez, Gulay; Kučera, Jan; Kaczmarek, Janusz; Jursza, Jolanta; Callegaro, Luca; Ribero, Luis Filipe; Koszarny, Maciej; Marzano, Martina; Ortolano, Massimo; Kozioł, Mirosław; Tran, Ngoc Thanh Mai; Rybski, Ryszard; D’Elia, Vincenzo; Rzodkiewicz, Witold. - ELETTRONICO. - (2019), p. 02001. (Intervento presentato al convegno International Congress of Metrology 2019) [10.1051/metrology/201902001]. | 1-gen-2019 | Callegaro, LucaMarzano, MartinaOrtolano, MassimoTran, Ngoc Thanh Mai + | Power2019_CIM_02001.pdf |