MICHIELETTI, FABIO
MICHIELETTI, FABIO
Dipartimento Scienza Applicata e Tecnologia
061295
Influence of active electrode impurity on memristive characteristics of ECM devices
2024 Michieletti, Fabio; Chen, Shaochuan; Weber, Carsten; Ricciardi, Carlo; Ohno, Takeo; Valov, Ilia
"Electrical and Thermal Conductivities of Single CuxO Nanowires"
2023 DE CARLO, Ivan; Baudino, Luisa; Klapetek, Petr; Serrapede, Mara; Michieletti, Fabio; De Leo, Natascia; Pirri, Fabrizio; Boarino, Luca; Lamberti, Andrea; Milano, Gianluca
Fault tolerant photovoltaic array: a repair circuit based on memristor sensing
2019 Gnoli, L.; Carnicelli, Giuseppe; Parisi, Alessio; Urbinati, L.; Kabashi, B.; Michieletti, F.; Ibarra, S. I. P.; Vacca, M.; Graziano, M.; Mathew, J.; Ottavi, M.
Citazione | Data di pubblicazione | Autori | File |
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Influence of active electrode impurity on memristive characteristics of ECM devices / Michieletti, Fabio; Chen, Shaochuan; Weber, Carsten; Ricciardi, Carlo; Ohno, Takeo; Valov, Ilia. - In: JOURNAL OF SOLID STATE ELECTROCHEMISTRY. - ISSN 1432-8488. - (2024). [10.1007/s10008-024-05821-w] | 1-gen-2024 | Michieletti, FabioRicciardi, CarloValov, Ilia + | s10008-024-05821-w.pdf |
"Electrical and Thermal Conductivities of Single CuxO Nanowires" / DE CARLO, Ivan; Baudino, Luisa; Klapetek, Petr; Serrapede, Mara; Michieletti, Fabio; De Leo, Natascia; Pirri, Fabrizio; Boarino, Luca; Lamberti, Andrea; Milano, Gianluca. - In: NANOMATERIALS. - ISSN 2079-4991. - ELETTRONICO. - 13:21(2023), pp. 1-13. [10.3390/nano13212822] | 1-gen-2023 | Ivan De CarloLuisa BaudinoMara SerrapedeFabio MichielettiFabrizio PirriLuca BoarinoAndrea LambertiGianluca Milano + | nanomaterials-13-02822.pdf |
Fault tolerant photovoltaic array: a repair circuit based on memristor sensing / Gnoli, L.; Carnicelli, Giuseppe; Parisi, Alessio; Urbinati, L.; Kabashi, B.; Michieletti, F.; Ibarra, S. I. P.; Vacca, M.; Graziano, M.; Mathew, J.; Ottavi, M.. - ELETTRONICO. - (2019). (Intervento presentato al convegno 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019 tenutosi a Noordwijk (NL) nel 2019) [10.1109/DFT.2019.8875467]. | 1-gen-2019 | Gnoli L.CARNICELLI, GIUSEPPEPARISI, ALESSIOUrbinati L.Michieletti F.Vacca M.Graziano M. + | Fault_Tollerant_Photovoltaic_Array.pdf |