MICHIELETTI, FABIO

MICHIELETTI, FABIO  

Dipartimento Scienza Applicata e Tecnologia  

061295  

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Citazione Data di pubblicazione Autori File
Self-organized Criticality in Neuromorphic Nanowire Networks With Tunable and Local Dynamics / Michieletti, F; Pilati, D; Milano, G; Ricciardi, C. - In: ADVANCED FUNCTIONAL MATERIALS. - ISSN 1616-301X. - (2025). [10.1002/adfm.202423903] 1-gen-2025 Michieletti, FPilati, DMilano, GRicciardi, C Adv Funct Materials - 2025 - Michieletti - Self‐organized Criticality in Neuromorphic Nanowire.pdf
Emerging Spatiotemporal Dynamics in Multiterminal Neuromorphic Nanowire Networks Through Conductance Matrices and Voltage Maps / Pilati, Davide; Michieletti, Fabio; Cultrera, Alessandro; Ricciardi, Carlo; Milano, Gianluca. - In: ADVANCED ELECTRONIC MATERIALS. - ISSN 2199-160X. - ELETTRONICO. - (2024). [10.1002/aelm.202400750] 1-gen-2024 Davide PilatiFabio MichielettiCarlo RicciardiGianluca Milano + Adv Elect Materials - 2024 - Pilati - Emerging Spatiotemporal Dynamics in Multiterminal Neuromorphic Nanowire Networks.pdf
Influence of active electrode impurity on memristive characteristics of ECM devices / Michieletti, Fabio; Chen, Shaochuan; Weber, Carsten; Ricciardi, Carlo; Ohno, Takeo; Valov, Ilia. - In: JOURNAL OF SOLID STATE ELECTROCHEMISTRY. - ISSN 1432-8488. - 28:5(2024), pp. 1735-1741. [10.1007/s10008-024-05821-w] 1-gen-2024 Michieletti, FabioRicciardi, CarloValov, Ilia + s10008-024-05821-w.pdf
"Electrical and Thermal Conductivities of Single CuxO Nanowires" / DE CARLO, Ivan; Baudino, Luisa; Klapetek, Petr; Serrapede, Mara; Michieletti, Fabio; De Leo, Natascia; Pirri, Fabrizio; Boarino, Luca; Lamberti, Andrea; Milano, Gianluca. - In: NANOMATERIALS. - ISSN 2079-4991. - ELETTRONICO. - 13:21(2023), pp. 1-13. [10.3390/nano13212822] 1-gen-2023 Ivan De CarloLuisa BaudinoMara SerrapedeFabio MichielettiFabrizio PirriLuca BoarinoAndrea LambertiGianluca Milano + nanomaterials-13-02822.pdf
Fault tolerant photovoltaic array: a repair circuit based on memristor sensing / Gnoli, L.; Carnicelli, Giuseppe; Parisi, Alessio; Urbinati, L.; Kabashi, B.; Michieletti, F.; Ibarra, S. I. P.; Vacca, M.; Graziano, M.; Mathew, J.; Ottavi, M.. - ELETTRONICO. - (2019). (Intervento presentato al convegno 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019 tenutosi a Noordwijk (NL) nel 2019) [10.1109/DFT.2019.8875467]. 1-gen-2019 Gnoli L.CARNICELLI, GIUSEPPEPARISI, ALESSIOUrbinati L.Michieletti F.Vacca M.Graziano M. + Fault_Tollerant_Photovoltaic_Array.pdf