Archivio Istituzionale della RicercaThis paper aims to quantify the linewidth of two-mode correlations in Traveling Wave Parametric Amplifiers (TWPAs). Artifacts induced by data acquisition and processing, such as windowing effects and acquisition time, are examined to understand their influence on the linewidth estimation of these correlations. The findings underscore the significance of acquisition parameters in optimizing two-mode correlation measurements, enhancing device characterization for quantum applications.
Towards Quantifying Two-Mode Correlation Linewidths in Quantum Circuits / Alocco, Alessandro; Celotto, Andrea; Fasolo, Luca; Galvano, Bernardo; Palumbo, Emanuele; Oberto, Luca; Callegaro, Luca; Tafuri, Felice Francesco; Livreri, Patrizia; Enrico, Emanuele. - ELETTRONICO. - (2025), pp. 1-4. (Intervento presentato al convegno 2025 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2025 tenutosi a ita nel 2025) [10.1109/inmmic64198.2025.10975393].
Towards Quantifying Two-Mode Correlation Linewidths in Quantum Circuits
Alocco, Alessandro;Celotto, Andrea;Fasolo, Luca;Palumbo, Emanuele;Oberto, Luca;Callegaro, Luca;Livreri, Patrizia;Enrico, Emanuele
2025
Abstract
This paper aims to quantify the linewidth of two-mode correlations in Traveling Wave Parametric Amplifiers (TWPAs). Artifacts induced by data acquisition and processing, such as windowing effects and acquisition time, are examined to understand their influence on the linewidth estimation of these correlations. The findings underscore the significance of acquisition parameters in optimizing two-mode correlation measurements, enhancing device characterization for quantum applications.
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https://hdl.handle.net/11583/3004341
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