CALLEGARO, LUCA
Mapping and Tracking Conductivity in Memristive Nanowire Networks with Electrical Resistance Tomography
2026 Cultrera, Alessandro; Milano, Gianluca; Ricciardi, Carlo; Callegaro, Luca
A quantum resistance memristor for an intrinsically traceable International System of Units standard
2025 Milano, G; Zheng, X; Michieletti, F; Leonetti, G; Caballero, G; Oztoprak, I; Boarino, L; Bozat, Ö; Callegaro, L; De Leo, N; Godinho, I; Granados, D; Koymen, I; Menghini, M; Miranda, E; Ribeiro, L; Ricciardi, C; Suñe, J; Cabral, V; Valov, I
Tomography of memory engrams in self-organizing nanowire connectomes
2023 Milano, Gianluca; Cultrera, Alessandro; Boarino, Luca; Callegaro, Luca; Ricciardi, Carlo
Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation
2021 Cultrera, A.; Milano, G.; De Leo, N.; Ricciardi, C.; Boarino, L.; Callegaro, L.
Implementation of a graphene quantum Hall Kelvin bridge-on-a-chip for resistance calibrations
2020 Marzano, Martina; Kruskopf, Mattias; Panna, Alireza; Rigosi, Albert; Patel, Dinesh; Jin, Hanbyul; Cular, Stefan; Callegaro, Luca; Elmquist, R E; Ortolano, Massimo
Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials
2020 Milano, G.; Cultrera, A.; Bejtka, K.; De Leo, N.; Callegaro, L.; Ricciardi, C.; Boarino, L.
Atypical quantized resistances in millimeter-scale epitaxial graphene p-n junctions
2019 Rigosi, Albert F.; Patel, Dinesh; Marzano, Martina; Kruskopf, Mattias; Hill, Heather M.; Jin, Hanbyul; Hu, Jiuning; Hight Walker, Angela R.; Ortolano, Massimo; Callegaro, Luca; Liang, Chi-Te; Newell, David B.
Mapping the conductivity of graphene with Electrical Resistance Tomography
2019 Cultrera, A.; Serazio, D.; Zurutuza, A.; Centeno, A.; Txoperena, O.; Etayo, D.; Cordon, A.; Redo-Sanchez, A.; Arnedo, I.; Ortolano, M.; Callegaro, L.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Mapping and Tracking Conductivity in Memristive Nanowire Networks with Electrical Resistance Tomography / Cultrera, Alessandro; Milano, Gianluca; Ricciardi, Carlo; Callegaro, Luca. - In: IEEE OPEN JOURNAL OF INSTRUMENTATION AND MEASUREMENT. - ISSN 2768-7236. - ELETTRONICO. - 5:(2026), pp. 1-9. [10.1109/ojim.2026.3690870] | 1-gen-2026 | Milano, GianlucaRicciardi, CarloCallegaro, Luca + | IEEE Xplore Full-Text PDF_.pdf |
| A quantum resistance memristor for an intrinsically traceable International System of Units standard / Milano, G., Zheng, X., Michieletti, F., Leonetti, G., Caballero, G., Oztoprak, I., Boarino, L., Bozat, Ö., Callegaro, L., De Leo, N., Godinho, I., Granados, D., Koymen, I., Menghini, M., Miranda, E., Ribeiro, L., Ricciardi, C., Suñe, J., Cabral, V., Valov, I.. - In: NATURE NANOTECHNOLOGY. - ISSN 1748-3387. - (2025). [10.1038/s41565-025-02037-5] | 1-gen-2025 | Milano, GMichieletti, FLeonetti, GBoarino, LCallegaro, LRicciardi, CValov, I + | 2025 Nat Nano quantum.pdf |
| Tomography of memory engrams in self-organizing nanowire connectomes / Milano, G., Cultrera, A., Boarino, L., Callegaro, L., Ricciardi, C.. - In: NATURE COMMUNICATIONS. - ISSN 2041-1723. - 14:1(2023). [10.1038/s41467-023-40939-x] | 1-gen-2023 | Milano, GianlucaBoarino, LucaCallegaro, LucaRicciardi, Carlo + | 2023 Nat Comm engram.pdf |
| Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks using voltage excitation / Cultrera, A., Milano, G., De Leo, N., Ricciardi, C., Boarino, L., Callegaro, L.. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - ELETTRONICO. - 11:1(2021), p. 13167. [10.1038/s41598-021-92208-w] | 1-gen-2021 | Milano G.Ricciardi C.Boarino L.Callegaro L. + | 2021_scirep_tomo_Callegaro.pdf |
| Implementation of a graphene quantum Hall Kelvin bridge-on-a-chip for resistance calibrations / Marzano, M., Kruskopf, M., Panna, A., Rigosi, A., Patel, D., Jin, H., Cular, S., Callegaro, L., Elmquist, R.E., Ortolano, M.. - In: METROLOGIA. - ISSN 0026-1394. - STAMPA. - 57:(2020), p. 015007. [10.1088/1681-7575/ab581e] | 1-gen-2020 | Marzano, MartinaCallegaro, LucaOrtolano, Massimo + | Marzano2019_Metrologia_postprint.pdf; Marzano_2020_Metrologia_57_015007.pdf |
| Mapping Time-Dependent Conductivity of Metallic Nanowire Networks by Electrical Resistance Tomography toward Transparent Conductive Materials / Milano, G., Cultrera, A., Bejtka, K., De Leo, N., Callegaro, L., Ricciardi, C., Boarino, L.. - In: ACS APPLIED NANO MATERIALS. - ISSN 2574-0970. - 3:12(2020), pp. 11987-11997. [10.1021/acsanm.0c02204] | 1-gen-2020 | Milano G.Bejtka K.Callegaro L.Ricciardi C.Boarino L. + | 2020_NW-tomo_acsanm.pdf; acsanm.0c02204.pdf |
| Atypical quantized resistances in millimeter-scale epitaxial graphene p-n junctions / Rigosi, A.F., Patel, D., Marzano, M., Kruskopf, M., Hill, H.M., Jin, H., Hu, J., Hight Walker, A.R., Ortolano, M., Callegaro, L., Liang, C., Newell, D.B.. - In: CARBON. - ISSN 0008-6223. - ELETTRONICO. - 154:(2019), pp. 230-237. [10.1016/j.carbon.2019.08.002] | 1-gen-2019 | Marzano, MartinaOrtolano, MassimoCALLEGARO, LUCA + | Rigosi2019_Carbon_preprint.pdf |
| Mapping the conductivity of graphene with Electrical Resistance Tomography / Cultrera, A., Serazio, D., Zurutuza, A., Centeno, A., Txoperena, O., Etayo, D., Cordon, A., Redo-Sanchez, A., Arnedo, I., Ortolano, M., Callegaro, L.. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - ELETTRONICO. - 9:1(2019), p. 10655. [10.1038/s41598-019-46713-8] | 1-gen-2019 | Ortolano M.Callegaro L. + | Cultrera2019_SciRep_9_10655.pdf |