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Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections
2022 Guerrero-Balaguera, Juan-David; Galasso, Luigi; Sierra, Robert Limas; Reorda, Matteo Sonza
Reliability Estimation of Split DNN Models for Distributed Computing in IoT Systems
2023 Guerrero-Balaguera, Juan-David; Harshbarger, Ian A.; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo
RESCUE: Cross-Sectoral PhD Training Concept for Interdependent Reliability, Security and Quality
2018 Vierhaus, Heinrich Theodor; Jenihhin, Maksim; Reorda, Matteo Sonza
Revealing GPUs Vulnerabilities by Combining Register-Transfer and Software-Level Fault Injection
2021 Fernandes dos Santos, Fernando; Rodriguez Condia, Josie Esteban.; Carro, Luigi; Sonza Reorda, Matteo; Rech, Paolo
RoRA: a reliability-oriented place and route algorithm for SRAM-based FPGAs
2005 Sterpone, Luca; SONZA REORDA, Matteo; Violante, Massimo
RT-level Fault Simulation Techniques based on Simulation Command Scripts
2000 Corno, Fulvio; G., Cumani; SONZA REORDA, Matteo; Squillero, Giovanni
SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
1997 Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
Safety Evaluation of NanoFabrics
2007 Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo
Scan insertion criteria for low design impact
1996 Barbagallo, S.; Lobetti Bodoni, M.; Medina, D.; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
Scan-Chain Intra-Cell Defects Grading
2015 A., Touati; A., Bosio; L., Dilillo; P., Girard; A., Virazel; Bernardi, Paolo; SONZA REORDA, Matteo
Citazione | Data di pubblicazione | Autori | File |
---|---|---|---|
Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections / Guerrero-Balaguera, Juan-David; Galasso, Luigi; Sierra, Robert Limas; Reorda, Matteo Sonza. - ELETTRONICO. - (2022), pp. 959-962. (Intervento presentato al convegno 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)) [10.1109/ISIE51582.2022.9831549]. | 1-gen-2022 | Guerrero-Balaguera, Juan-DavidReorda, Matteo Sonza + | Reliability_Assessment_of_Neural_Networks_in_GPUs_A_Framework_For_Permanent_Faults_Injections.pdf |
Reliability Estimation of Split DNN Models for Distributed Computing in IoT Systems / Guerrero-Balaguera, Juan-David; Harshbarger, Ian A.; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - (2023), pp. 1-4. (Intervento presentato al convegno 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE) tenutosi a Helsinki (FIN) nel 19-21 June 2023) [10.1109/ISIE51358.2023.10227928]. | 1-gen-2023 | Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo + | Reliability_Estimation_of_Split_DNN_Models_for_Distributed_Computing_in_IoT_Systems.pdf |
RESCUE: Cross-Sectoral PhD Training Concept for Interdependent Reliability, Security and Quality / Vierhaus, Heinrich Theodor; Jenihhin, Maksim; Reorda, Matteo Sonza. - STAMPA. - (2018), pp. 45-50. (Intervento presentato al convegno 2018 12th European Workshop on Microelectronics Education (EWME)) [10.1109/EWME.2018.8629465]. | 1-gen-2018 | Reorda, Matteo Sonza + | ewme'18-rescue_camera.pdf |
Revealing GPUs Vulnerabilities by Combining Register-Transfer and Software-Level Fault Injection / Fernandes dos Santos, Fernando; Rodriguez Condia, Josie Esteban.; Carro, Luigi; Sonza Reorda, Matteo; Rech, Paolo. - ELETTRONICO. - (2021), pp. 292-304. (Intervento presentato al convegno 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2021 tenutosi a twn nel 2021) [10.1109/DSN48987.2021.00042]. | 1-gen-2021 | Rodriguez Condia, Josie Esteban.Carro, LuigiSonza Reorda, MatteoRech, Paolo + | dsn_2021_end.pdf; Revealing_GPUs_Vulnerabilities_by_Combining_Register-Transfer_and_Software-Level_Fault_Injection.pdf |
RoRA: a reliability-oriented place and route algorithm for SRAM-based FPGAs / Sterpone, Luca; SONZA REORDA, Matteo; Violante, Massimo. - 1:(2005), pp. 173-176. [10.1109/RME.2005.1543031] | 1-gen-2005 | STERPONE, LucaSONZA REORDA, MatteoVIOLANTE, MASSIMO | - |
RT-level Fault Simulation Techniques based on Simulation Command Scripts / Corno, Fulvio; G., Cumani; SONZA REORDA, Matteo; Squillero, Giovanni. - (2000), pp. 825-830. (Intervento presentato al convegno XV Conference on Design of Circuits and Integrated Systems tenutosi a Montpellier (F) nel November 21-24, 2000). | 1-gen-2000 | CORNO, FulvioSONZA REORDA, MatteoSQUILLERO, Giovanni + | - |
SAARA: a simulated annealing algorithm for test pattern generation for digital circuits / Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo. - (1997), pp. 228-232. (Intervento presentato al convegno SAC '97 Proceedings of the 1997 ACM symposium on Applied computing) [10.1145/331697.331745]. | 1-gen-1997 | CORNO, FulvioPRINETTO, Paolo ErnestoREBAUDENGO, MaurizioSONZA REORDA, Matteo | - |
Safety Evaluation of NanoFabrics / Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo. - (2007), pp. 418-426. (Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems tenutosi a Roma, Italy nel 26-28 September, 2007). | 1-gen-2007 | GROSSO, MICHELANGELOREBAUDENGO, MaurizioSONZA REORDA, Matteo | - |
Scan insertion criteria for low design impact / Barbagallo, S.; Lobetti Bodoni, M.; Medina, D.; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo. - STAMPA. - (1996), pp. 26-31. (Intervento presentato al convegno VTS 1996 : IEEE VLSI Test Symposium tenutosi a Princeton, NJ (USA) nel Apr 26 - May 1, 1996) [10.1109/VTEST.1996.510831]. | 1-gen-1996 | CORNO, FulvioPRINETTO, Paolo ErnestoSONZA REORDA, Matteo + | - |
Scan-Chain Intra-Cell Defects Grading / A., Touati; A., Bosio; L., Dilillo; P., Girard; A., Virazel; Bernardi, Paolo; SONZA REORDA, Matteo. - STAMPA. - (2015). (Intervento presentato al convegno 10th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)) [10.1109/DTIS.2015.7127349]. | 1-gen-2015 | BERNARDI, PAOLOSONZA REORDA, Matteo + | - |
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Opzioni
Scopri
Tipologia
- 4 Contributo in Atti di Convegno ... 472
- 4 Contributo in Atti di Convegno ... 472
Data di pubblicazione
- In corso di stampa 2
- 2020 - 2024 72
- 2010 - 2019 128
- 2000 - 2009 167
- 1990 - 1999 99
- 1988 - 1989 4
Editore
- IEEE 133
- IEEE Computer Society 44
- Springer 24
- Institute of Electrical and Elect... 19
- IEEE - INST ELECTRICAL ELECTRONIC... 17
- ACM Press 7
- IEEE-INST ELECTRICAL ELECTRONICS ... 6
- IEEE / Institute of Electrical an... 4
- ACM 3
- ieee 3
Rivista
- LECTURE NOTES IN COMPUTER SCIENCE 22
Serie
- ... IEEE ... INTERNATIONAL SYMPOS... 1
- IFIP ADVANCES IN INFORMATION AND ... 1
- LECTURE NOTES IN COMPUTER SCIENCE 1
- LECTURE NOTES IN COMPUTER SCIENCE 1
- PROCEEDINGS IEEE COMPUTER SOCIETY... 1
Keyword
- Graphics Processing Units (GPUs) 12
- Reliability 12
- SBST 12
- Safety 10
- Electrical and Electronic Enginee... 9
- Hardware and Architecture 8
- fault simulation 7
- Reliability and Quality 7
- Risk 7
- software-based self-test 7
Lingua
- eng 288
- ger 1
- ita 1
Accesso al fulltext
- no fulltext 359
- partially open 52
- reserved 39
- open 21
- mixed 1